This document provides an overview of specimen holders for X-ray diffraction that are compatible with the D8 family and D2 PHASER X-ray diffractometers. It describes specimen holders for powder samples, solid samples, and thin film samples, including sample holders for various sample sizes and types, as well as sample spinners, tilt stages, and vacuum chucks for precise sample mounting. A range of low background sample holders are also presented for obtaining accurate analytical results. This document does not include all available specimen holders but tailored solutions can be customized upon request.
This document provides an overview of specimen holders for X-ray diffraction that are compatible with the D8 family and D2 PHASER X-ray diffractometers. It describes specimen holders for powder samples, solid samples, and thin film samples, including sample holders for various sample sizes and types, as well as sample spinners, tilt stages, and vacuum chucks for precise sample mounting. A range of low background sample holders are also presented for obtaining accurate analytical results. This document does not include all available specimen holders but tailored solutions can be customized upon request.
This document provides an overview of specimen holders for X-ray diffraction that are compatible with the D8 family and D2 PHASER X-ray diffractometers. It describes specimen holders for powder samples, solid samples, and thin film samples, including sample holders for various sample sizes and types, as well as sample spinners, tilt stages, and vacuum chucks for precise sample mounting. A range of low background sample holders are also presented for obtaining accurate analytical results. This document does not include all available specimen holders but tailored solutions can be customized upon request.
X-ray diffraction is the non-destructive analytical method
which determines the structural properties of solid or fluid matter on a micron and a nm length scale. In contrast to various complementary methods X-ray diffraction does not require any complex sample preparation. However, depending on e.g. sample consistency, volume, or other property, an appropriate specimen holder is required. Fixing the material under investigation precisely in the measurement position is mandatory for obtaining accurate analytical results. Bruker AXS offers numerous dedicated solutions for the different types of specimen. These are fitted to the analytical requirements and guarantee best possible data quality. This spec sheet gives an overview of the different compatible specimen holders for the D8 family and the D2 PHASER with single position sample stage, their applications and order numbers. This document does not present all available specimen holders and samples stages. Upon request tailored solutions can be realized to further optimize the analytical results. Solutions for Powder specimen
Set of 10 specimen holder, PMMA or Set of 10 specimen holder, PMMA or Set of 10 specimen holder, PMMA, steel, 8.5 mm height, sample reception steel, 8.5 mm height, sample reception 20 mm height, sample reception Ø 25 mm, for [1][2][3][7]. Ø 40 mm, for [1][2][3][7]. Ø 40 mm, for [1][3].
C79298A3244D81 C79298A3244D97 C79298A3244D98
Set of 10 specimen holder rings for Set of 10 specimen holder PMMA, Set of 10 specimen holder PMMA, transmission, for [2][3]. 8.5 mm height, airtight, sample 8.5 mm height, airtight, sample reception Ø 25 mm, 1 mm depth, for reception Ø 25 mm, 4 mm depth, for [1][2][3][7]. [1][2][3][7].
C79298A3244D88/D89 A100D16 A100D13
Set of 10 specimen holder rings made Set of 10 specimen holder rings for Set of 10 specimen holder rings for of PMMA or steel for back loading Ø 25 mm filter samples, 8.5 mm clays. The PMMA made ring carries a sample preparation. For [1][2][3][7]. height, for [1][2][3][7]. height adjustable glass slide, on which the clay is prepared. For [1][2][3][7].
C79298A3244B249 C79298A3244B261 A13B77
Si low background sample holder for Si low background sample holder, SRM 1976b based Corundum small sample amounts, Ø 51.5 mm, Ø 51.5 mm, with Ø 20 mm x 0.5 mm standard sample supplied by the Ø 24.5 mm Si crystal, for [1][2][3][7]. sample cavity, for [1][2][3][7]. NIST fitted in a steel ring. Used for instrument performance verification. A100B33 A100B36/B37 A100B138-B141 Airtight specimen holder with Low background, airtight Low background, airtight dome like x-ray transparent cap, for specimen holder for small amounts specimen holder for small amounts of environmentally sensitive materials, of environmentally sensitive material. environmental sensitive materials. The sample reception Ø 25 mm, 1 mm Sample reception is a 20 mm diameter dome like cap is equipped with a knife depth, for [2][7]. silicon wafer without (B36) or with edge beam stop. (B37) cavity.
Low background sample holder for Set of 9 specimen holder rings steel, Universal sample cup for rotating rotating sample stage, with a 25 mm sample reception Ø 20 mm, airtight, sample stage, for samples up to diameter silicon wafer. for [1][2][7]. 51.5 mm diameter and 40 mm height, minimum 2Theta is 0° without sample rotation, 20° with rotation.
C79298A3158B65 A24B95 7KP90018BS
Universal sample cup for rotating Transmission sample cup for rotating Steel ring with 51,5 mm diameter. sample stage, for samples up to sample stage with a powder-on-foil Sample reception Ø 35 mm 51.5 mm diameter and 40 mm height, sample preparation tool and a glass Height: 8,5 mm. allows measurements with sample alignment slit, allows transmission rotation down to 3° 2Theta. measurements from -10° to 110° 2Theta. Solutions for solid specimen
A100B38 A24D294 A24D295
Capillary spinner Fast sample spinner Wobbler Device enabling permanent spinning Device for continuous spinning with Device for continuous oscillation of a for capillary investigations with 30 rpm, mounted on UMC stages or solid sample. Mounted on UMC stages diffraction system equipped with Eulerian cradles [4][5][6][9]. or Eulerian cradles [4][5][6][9]. Eulerian cradles [4][5][6][9]. Max. sample dimension: Max. sample dimension: 51.5 x 8.5 mm². 51.5 x 8.5 mm².
A19B57 A19B56 A24D225/D226
Clamp holder Thin film sample holder Tilt stage
All configurations and specifications are subject to change without notice.
Device for mounting irregular bulk This noozle enables holding of small Device for mounting and motorized samples. The position of the clamp thin film samples through vacuum, aligning of thin film samples for IP-GID, jaws can be adapted to the shape of for [8]. For mounting on [4][5][6][9] HRXRD, or XRR, for [4][5][6][9]. the sample, for [4][5][6][8][9]. the adapter plate A19B59 is required Optionally with Knife Edge Collimator to pass the vacuum. (D226).
A24D221 A24D223 A19B210/B200 5“ Vacuum chuck 6“ Laminar chuck Wafer Chuck Device for precise mounting of wafers, Laminar sucking chuck for accurate Devices for stress free mounting of glass plates or other flat samples by mounting of flat samples. The 2 – 6 inch (B210) wafers with [4][5][6]. vacuum [4][5][6][9]. micro-porous sucking plate allows Or for 2 – 12 inch (B200) wafers on simultaneous fixing of a number of [4][6]. small samples. For [4][5][6][9].