This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles

for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

Designation: D7127 − 17

Standard Test Method for

Measurement of Surface Roughness of Abrasive Blast
Cleaned Metal Surfaces Using a Portable Stylus Instrument1
This standard is issued under the fixed designation D7127; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.

1. Scope 2. Referenced Documents

1.1 This test method describes a shop or field procedure for 2.1 ASTM Standards:2
determination of roughness characteristics of surfaces prepared D4417 Test Methods for Field Measurement of Surface
for painting by abrasive blasting. The procedure uses a portable Profile of Blast Cleaned Steel
skidded or non-skidded stylus profile tracing instrument. The E177 Practice for Use of the Terms Precision and Bias in
measured characteristics are: Rt and Rpc. Additional measures ASTM Test Methods
of profile height (Rmax and/or Rz) may also be obtained as E691 Practice for Conducting an Interlaboratory Study to
agreed upon by purchaser and seller. (The digitally-determined Determine the Precision of a Test Method
profile parameters Rt, Rmax, Ry and Rzlmax are extremely 2.2 SSPC Standard:3
similar in definition.) SSPC-PA 17 Procedure for Determining Conformance to
1.2 The values stated in SI units are to be regarded as the Steel Profile/Surface Roughness/Peak Count Require-
standard. The values given in parentheses are for information ments
only. 2.3 ASME Standard:
ASME B46.1-2002 Surface Texture, Surface Roughness
1.3 In general, this method should be limited to the mea- Waviness and Lay4
surement of surface roughness where Rt is in the range 10 to
2.4 ISO Standards:
150 µm (0.4 to 6 mil) and where the Peak Count, Rpc is less
ISO 4287: 1997 Geometrical Product Specifications
than 180 peaks/cm (450 peaks/in.).
(GPS)—Surface Texture: Profile Method—Terms,
1.4 SSPC standard SSPC-PA 17 provides additional guid- Definitions, and Surface Parameters5
ance for determining conformance with surface profile require-
ments. 3. Terminology
1.5 This standard does not purport to address all of the 3.1 Definitions—The following definitions are provided as
safety concerns, if any, associated with its use. It is the an aid to users of this document. Formal definitions of the
responsibility of the user of this standard to establish appro- surface roughness and instrument parameters below are con-
priate safety, health, and environmental practices and deter- tained in the referenced standards (Fig. 1).
mine the applicability of regulatory limitations prior to use. 3.1.1 deadband, n—that distance above and below the mean
1.6 This international standard was developed in accor- line that a continuous trace line must cross in both directions
dance with internationally recognized principles on standard- (up and down) to count as a single peak.
ization established in the Decision on Principles for the
Development of International Standards, Guides and Recom- 2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
mendations issued by the World Trade Organization Technical contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Barriers to Trade (TBT) Committee. Standards volume information, refer to the standard’s Document Summary page on
the ASTM website.
3
Available from The Society for Protective Coatings (SSPC), 800 Trumbull
1
This test method is under the jurisdiction of ASTM Committee D01 on Paint Drive, Pittsburgh, PA 15205-4365, http://www.sspc.org.
4
and Related Coatings, Materials, and Applications and is the direct responsibility of Available from American Society of Mechanical Engineers (ASME), ASME
Subcommittee D01.46 on Industrial Protective Coatings. International Headquarters, Three Park Ave., New York, NY 10016-5990, http://
Current edition approved Dec. 1, 2017. Published January 2018. Originally www.asme.org.
5
approved in 2005. Last previous edition approved in 2013 as D7127 – 13. DOI: Available from International Organization for Standardization (ISO), 1, ch. de
10.1520/D7127-17. la Voie-Creuse, CP 56, CH-1211 Geneva 20, Switzerland, http://www.iso.org.

Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
Copyright by ASTM Int'l (all rights reserved); Mon Jan 20 14:13:39 EST 2020
1
Downloaded/printed by
HUGO SANCHEZ MACIAS (ARGUS MFG) pursuant to License Agreement. No further reproductions authorized.
 D7127 − 17

Top — Illustration of stylus device terminology: sampling length,

evaluation length, traverse length.
Bottom — Expanded view of a single sampling length to illustrate
surface structure terminology:
Rt: difference between highest peak and lowest valley over the
evaluation length.
Rmax: difference between highest peak and lowest valley over the
sampling. length
Pc: number of peak/valley pairs, per unit length extending outside
a deadband centered on the mean line.

FIG. 1 Illustration of Terminology

3.1.1.1 Discussion—Use of a deadband diminishes the ef- 3.1.7 sampling length, n—the nominal distance parallel to
fect of small, spurious peaks due to noise. the surface being assessed within which a single value of a
3.1.2 evaluation length, n—a sequence of five consecutive surface parameter is determined.
sampling lengths. 3.1.8 surface preparation, n—the cleaning and profiling of a
metallic surface using an abrasive blast media or mechanical
3.1.3 Rpc, n—the number of peak/valley pairs, per unit of
means to prepare that surface for coating.
length, extending outside a “deadband” centered on the mean
line. 3.1.9 surface profile, n—for purposes of the standard, the
positive and negative vertical deviations (peaks and valleys)
3.1.4 Rt, n—the vertical distance between the highest peak are measured from a mean line approximately the center of the
and lowest valley within any given evaluation length. profile being evaluated.
3.1.5 Rmax, n—the greatest vertical distance between high- 3.1.10 surface roughness, n—the combined characteristics
est peak and lowest valley for any of the five sampling lengths of surface profile (height) and peak count (linear density) for a
that comprise an evaluation length. surface.
3.1.6 Rz, n—the vertical distance between the highest peak 3.1.11 traversing length, n—seven sampling lengths com-
and lowest valley in a sampling length averaged over the five prising the evaluation length and the pre-travel and post-travel
sampling lengths comprising the evaluation length. segments.

Copyright by ASTM Int'l (all rights reserved); Mon Jan 20 14:13:39 EST 2020
2
Downloaded/printed by
HUGO SANCHEZ MACIAS (ARGUS MFG) pursuant to License Agreement. No further reproductions authorized.
 D7127 − 17
4. Summary of Test Method 7.3 The traversing length of the apparatus should be set (or
4.1 This test method describes the proper use of a portable manufacturer preset) to include pre-travel and post-travel
stylus surface roughness measuring device to evaluate specific segments, usually equal to one sampling length at the begin-
surface parameters and evaluate their suitability for the appli- ning and one sampling length at the evaluation length. These
cation of the selected coating to the surface being prepared by portions of a traverse are, however, discarded by the instrument
abrasive blasting, or other mechanical means, prior to applica- in its calculation of surface parameters.
tion. 7.4 The low frequency (“long wavelength” or “cutoff”) filter
4.2 The method describes considerations relevant to setup should be set to “Gaussian” or “Gaussian 50 %.” In general, the
of stylus instruments for acquisition of required surface rough- default setting will be compliant.
ness parameters. 7.5 If the apparatus has a high frequency (“short wave-
length” or “Ls”) filter should be set to “off.”
5. Significance and Use
7.6 The apparatus should be adjusted (if necessary) to a
5.1 This method may be useful in assuring conformance of deadband width (C1 = –C2) in the range 0.5 to 2.0 µm (20 to
a prepared surface to profile requirements specified by the 80 µin.). The choice of deadband for profiles as large as those
manufacturer of a protective coating. discussed in this standard will have little effect on the mea-
5.2 This method includes determination of the peak density surements. In general, the default setting will be compliant.
(number of profile peaks in a specified distance). Some 7.7 The accuracy of the apparatus should be checked
workers in the field believe that optimizing peak height and regularly using a calibration block available from the equip-
peak density can improve coating adhesion. ment manufacturer using their written procedure and at their
5.3 This method allows specifiers to objectively define recommended interval.
surface texture after abrasive blast cleaning rather than using
subjective terms such as “angular pattern” or “dense and 8. Preparation of the Sample
uniform pattern.” 8.1 Select an area of the surface to be tested that is visibly
5.4 Because implicit and explicit definitions of “roughness” free from obvious defects such as scratches, deep marks, or
may differ substantially, numerical characterizations of profile other construction or corrosion defects.
cannot be compared directly across different methods. 8.2 Using a stiff nylon bristle brush, remove any dust or
abrasive particles from the surface in the selected sample
6. Apparatus evaluation area. If not removed, such dust and micronic
6.1 The apparatus consists of a portable skidded or non- metallic particles may cause damage to the stylus and errone-
skidded electronic surface roughness measurement instrument ous readings.
(“tester”) capable of measuring Rt in compliance with ISO
4287 and Rpc in compliance with ASME B46.1. The apparatus 9. Calibration and Standardization
should have a vertical range of at least 300 µm (12 mil) and 9.1 Precision reproductions of standard surface profiles such
permit a sampling length of 2.5 mm (0.1 in.) and an evaluation as those used by the manufacturer of the equipment, or
length of 12.5 mm (0.5 in.). (Laboratory experience suggests described in their operational literature, may be used as
this vertical range is a practical requirement to meet the calibration standards for the apparatus.
provisions of 6.2.) In 2009 there are believed to be at least three
manufactures of such devices.6 10. Procedure
6.2 The apparatus should include a stylus with a tip radius 10.1 Obtain an initial trace measurement (2 parameters),
of 5 µm (0.2 mil), and permit recording of Rt in the range 10 then four additional trace measurements taken in the compass
to 150 mm (0.4 to 6 mil) and Rpc up to 180/cm (450/in.). directions from the original measurement and about 3 cm (1
6.3 Surface deviations are sensed by the stylus and con- in.) away for a total of 5 traces, avoiding obvious surface
verted to electrical signals within the device. Internal process- defects.
ing converts these signals into standard surface characteriza- 10.2 If the stylus is prevented from making a complete trace
tion parameters, which are then displayed or printed. due to a physical interference, such as a deep scratch on the
surface, move the apparatus to a close adjacent area away from
7. Preparation of Apparatus the obvious defect and repeat the trace.
7.1 Set the apparatus to display, and, if so equipped, record 10.3 Record the 10 parameters resulting from these five
the chosen parameters in accordance with the manufacturers’ traces (2 parameters per trace).
instructions. NOTE 1—SSPC standard SSPC-PA 17 describes a procedure for
7.2 The evaluation length should be set to 5 sampling determining the number of locations to characterize the surface and for
determining compliance with specified profile range.
lengths. The sampling length and evaluation length should be
set to 2.5 mm (0.1 in.) and 12.5 mm (0.5 in.), respectively. 11. Calculation and Interpretation of Results
11.1 Calculate the five measurement average for each of the
6
Research Report to be developed with a listing of manufacturers. two parameters (Rt and Rpc).

Copyright by ASTM Int'l (all rights reserved); Mon Jan 20 14:13:39 EST 2020
3
Downloaded/printed by
HUGO SANCHEZ MACIAS (ARGUS MFG) pursuant to License Agreement. No further reproductions authorized.
 D7127 − 17
TABLE 1 Test Method D7127 Profile Measurement Statistics
Stylus Instrument Stylus Instrument
Profile –Rt Peak Count
Stylus Instrument Stylus Instrument
Coded Surface Reproducibility Reproducibility
Average Profile – Rt Average Peak Count
ID Number Standard Deviation Standard Deviation
(mils) (mils)
(mils) (mils)
Sr Sr
102 1.18 0.076 174.8 8.4
114 2.50 0.210 140.2 7.8
124 2.91 0.286 159.3 12.9
121 4.06 0.345 92.1 6.7
119 4.52 0.356 51.3 3.5

TABLE 2 Comparison of Test Method D7127 Profile Measurements with Test Methods D4417 Replica Tape Measurements for
Bias Estimation
Test Methods D7127
Test Methods D4417
Test Methods D7127 Stylus Instrument Test Methods D4417
Replica Tape Profile
Coded Surface Stylus Instrument Profile – Rt Average
Reproducibility
ID Number Average Profile – Rt Reproducibility Replica Tape Profile
Standard Deviation
(mils) Standard Deviation (mils)
(mils)
(mils)
102 1.18 0.076 1.29 0.12
114 2.50 0.210 2.65 0.23
124 2.91 0.286 2.79 0.18
121 4.06 0.345 3.75 0.15
119 4.52 0.356 4.22 0.18

12. Report 13.1.2 The term “reproducibility standard deviation” is used

12.1 At a minimum, the report should contain the following as specified in Practice E177.
items: 13.1.3 Similarly, the Peak Count Standard Deviation (PC
12.1.1 The sampling length and evaluation length, SR), also documented in Table 1, is key to assessing whether a
12.1.2 Jobsite and location at which the measurement was given measurement is statistically different from either an
made, upper or lower peak count limit established in advance by the
12.1.3 The values of the five trace measurements for each of interested parties.
the parameters measured (Rt and Rpc at a minimum) and their 13.1.4 A measured profile or peak count that is within either
averages, and limit of a pre-specified range by an amount equal to SR has a
12.1.4 Instrument used to obtain the measurements, includ- 68 % probability of satisfying specification. A profile within
ing model number. Note whether a skidded or non-skidded 1.5 SR of a specified limit has an 86 % probability of satisfying
instrument is used. specification and a profile within 2.0 SR of a specified limit has
a 95 % probability of satisfying the specification. Fig. 2 is a
13. Precision and Bias plot, using the data in Table 1, of peak count versus measured
13.1 The precision of this test method is based on an profile.
intralaboratory study conducted in 2011. Eleven laboratories 13.2 Bias—At the time of this study, there was no generally
participated in this study, analyzing materials representing five accepted reference method suitable for determining either
different property types. Each “test result” reported represents profile or peak count bias for this test method, therefore no
an individual determination and the participating labs reported formal statement on bias is being made.
three replicate test results for each material type. Practice E691 13.2.1 Nevertheless, testing in support of Test Methods
was followed for the design and analysis of the data; the details D4417 relied on measurements of the same roughness test
are given in ASTM Research Report RR:D01-1169.7 Values in panels used to determine precision in Test Method D7127, the
tables appearing in this section are taken from the foregoing present standard. Comparison of data obtained using these two
report. procedures gives a measure of relative method bias. Table 2
13.1.1 The Profile Reproducibility Standard Deviation (Pro- presents these data.
file SR), documented in Table 1 for each of five levels of 13.2.2 A plot (Fig. 3) of the Portable-Stylus-Instrument-
profile, is key to assessing whether a given measurement is determined parameter Rt against replica tape-determined
statistically different from either an upper or lower profile limit profiles, shows good agreement within the error associated
established in advance by the interested parties. with each of the two methods. A least-square straight line fitted
to profiles for the five surfaces measured using both methods
7
has a slope of 1.1. Over the tested range, the straight line fit
Supporting data have been filed at ASTM International Headquarters and may
be obtained by requesting Research Report RR:D01-1169. Contact ASTM Customer suggests that profiles measured with the two methods no where
Service at service@astm.org. differ by more than about 0.3 mils (8 µm).

Copyright by ASTM Int'l (all rights reserved); Mon Jan 20 14:13:39 EST 2020
4
Downloaded/printed by
HUGO SANCHEZ MACIAS (ARGUS MFG) pursuant to License Agreement. No further reproductions authorized.
 D7127 − 17

FIG. 2 Electronic Roughness Testers – Peak Count

FIG. 3 Digital Roughness Testers versus Replica Tape

13.2.3 There is at present no alternative method for deter- 13.3 This precision statement was determined through sta-
mining peak count, so no equivalent conclusions can be drawn tistical examination of 160 test results, reported by eleven
about bias for this parameter. laboratories, on five surfaces of differing profile covering the

Copyright by ASTM Int'l (all rights reserved); Mon Jan 20 14:13:39 EST 2020
5
Downloaded/printed by
HUGO SANCHEZ MACIAS (ARGUS MFG) pursuant to License Agreement. No further reproductions authorized.
 D7127 − 17
approximate profile range 30 to 110 µm (1.2 to 4.4 mils). The
five surfaces used in the study bore the control code numbers
102, 114, 124, 121, and 119.
14. Keywords
14.1 abrasive; abrasive blast cleaning; anchor pattern; peak
count; surface profile; surface roughness

ASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentioned
in this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk
of infringement of such rights, are entirely their own responsibility.

This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years and
if not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standards
and should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of the
responsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you should
make your views known to the ASTM Committee on Standards, at the address shown below.

This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,
United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the above
address or at 610-832-9585 (phone), 610-832-9555 (fax), or service@astm.org (e-mail); or through the ASTM website
(www.astm.org). Permission rights to photocopy the standard may also be secured from the Copyright Clearance Center, 222
Rosewood Drive, Danvers, MA 01923, Tel: (978) 646-2600; http://www.copyright.com/

Copyright by ASTM Int'l (all rights reserved); Mon Jan 20 14:13:39 EST 2020
6
Downloaded/printed by
HUGO SANCHEZ MACIAS (ARGUS MFG) pursuant to License Agreement. No further reproductions authorized.