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SingleSlitDiffraction

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Kingshuk Sarker
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0% found this document useful (0 votes)
6 views

SingleSlitDiffraction

Uploaded by

Kingshuk Sarker
Copyright
© © All Rights Reserved
Available Formats
Download as DOCX, PDF, TXT or read online on Scribd
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Experiment 19 Measurement of light intensity distribution of single

slit diffraction

[Aims of experiment]

1. Observe Fraunhofer diffraction of single slit to deepen the understanding


of diffraction theory.
2. Measure the relative light intensity distribution of single slit diffraction with
photoelectric elements and master its distribution pattern.
3. Learn to determine tiny quantities by diffraction method.

[Apparatus required]

He-Ne laser (wavelength 632.8nm, power 1.5mW ); single slit; optical bench;
observation screen; silicon photocell (photoelectric probe); micrometer drum;
photocurrent amplifier (power meter)

[Principle]

When light passes through obstacles during propagation, a portion of the light
energy propagates into geometric shadows, resulting in diffraction
phenomena. If the size of the obstacle is close to wavelength of the light,
diffraction phenomena are more easily observed.

Diffraction can be divided into Fresnel diffraction and Fraunhofer diffraction


based on the distances from a light source and an observation screen to a
diffraction obstacle (diffraction object). The former refers to diffraction when
either the distance from a light source to a diffraction object or that from an
observation screen to a diffraction object is finite. The latter refers to
diffraction when both distances from a light source and an observation screen
to a diffraction object are infinite. Thus, to achieve single slit Fraunhofer
diffraction, it is necessary to ensure that the distance from a light source to a
single slit and from a single slit to an observation screen are both infinite, that
is, both an incident light and a diffraction light generated on the single slit are
parallel light.

The laser is of good directionality and can be regarded as a parallel beam. By


irradiating a very fine slit (width a of 0.05~0.1mm) with a laser and placing an
observation screen further than 850mm behind the slit, the Fraunhofer
diffraction fringes can be seen.

Replace the observation screen with a silicon photocell (photoelectric probe),


which can move in a direction perpendicular to the diffraction pattern.
Therefore, the current displayed by the ammeter connected to the probe is
proportional to the light intensity falling on the probe. Experimental setup is
shown in Fig1.

Fig 1. Experimental setup of single slit diffraction

According to Huygens-Fresnel's principle, the intensity distribution of a single


slit diffraction is as follow.

( )
2
sinU , πa sin θ πax
I =I 0 U= ≈
U λ λD
Where I0 is light intensity at center point of the central brightest fringe;  is
wavelength of the incidental light;  is a diffraction angle; D is the distance
from single slit to silicon photocell; x is distance from center point to
measurement point and I is light intensity of position x.

Therefore, the diffraction fringes obtained are a series of stripes parallel to the
single slit. When x=0, I=I0, which is the highest light intensity and stands for
the central brightest fringe. When x=kD/a (k=1, 2…), I=0, which are the
lowest light intensity and stand for the dark fringes. Besides the central
brightest fringe, there is also a brighter fringe between two adjacent dark
fringes, which is called secondary maximum. The light intensity distribution
curve of single slit diffraction is shown in Fig2.

Fig 2. Light intensity distribution curve of single slit Fraunhofer diffractoin


The width of the central brightest fringe x=2D/ a. And the width of single slit
a can be expressed as:
a = kD/x.
If the position x of the kth dark fringe is measured, the width a of a single slit
can be obtained from the above equation.
[Procedures]

1. Turn on He-Ne laser and silicon photocell(photoelectric probe). Preheat for


10min.
2. Position the single slit 15cm in front of the laser. And place the observation
screen in front of the probe.
3. Pass the laser through the single slit. Adjust the level, height, and
inclination of the slit to make the diffraction pattern horizontally and
symmetrically. Then rotate the knob next to the single slit plate to change
the slit width and observe the variation of the diffraction pattern.
4. Remove the observation screen and allow the diffraction light to enter the
probe. Rotate the micrometer drum to move position of the probe
horizontally until the value shown on the photocurrent amplifier reaching
its maximum, which stands for the center of the central fringe.
5. Record the maximum light intensity value I 0, which is corresponding to the
center point of the light intensity curve (x=0). Continue rotating the
micrometer drum and record the light intensity value every 0.3mm until it
reaches the third dark fringe. Record the relevant data in Table 1.
6. Record the distance D from the single slit plate to the probe in Table 1, as
well.

[Datasheet]

Table 1 Datasheet for light intensity measurement of single slit diffraction

Distance from single slit to probe D= cm; Wavelength of laser = nm


N I
0~9
10~1
9
20~2
9
30~3
9
40~4
9

P.S. N is a serial number, corresponding to coordinates N * 0.3mm


[Data processing]

1. Light intensity of the central bright fringe is I 0, and the relative intensities
of other points are I/I0. Plot a relationship curve of I/I 0 ~x (single slit
diffraction relative intensity distribution curve) on a coordinate paper.

2. Calculate the single slit width a based on the recorded dark fringe
positions, and then get its average value.

[Notes]

1. Avoid staring into the laser beam.


2. Don’t directly illuminate laser on silicon photocell.
3. Preheat the laser and silicon photocell for 10~20min.
4. When adjusting the width of a single slit, the value of the drum knob
should not be lower than zero in order not to damage the cutting edge.

[Questions]

1. What conditions should single slit Fraunhofer diffraction meet? How are
those conditions satisfied in the experiment?
2. Why should the central brightest fringe be found?
3. How is light intensity distribution of single slit Fraunhofer diffraction?

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