Chapter 6 - Optical Detectors
Chapter 6 - Optical Detectors
Device types:
Photodiodes
Phototransistors
Photoconductive detectors
Photomultiplier tubes
Phototube
The high electric field present in the depletion region causes the
carrier to separate and be collected across the reversed biased
junction.
The high electric field present in the depletion region causes the
carriers to separate and be collected across the reverse biased
junction
Absorption
Photodiode Material
Example
Quantum efficiency
To
One
The
Responsivity
Example
Photodiodes
PIN Photodiode
the thickness of the depletion region is controlled by i-layer, not by the reverse
voltage
most of the incident photons absorbed in the thick i-layer - high
large electric field across the i-layer - efficient separation of the generated
electrons & holes
The p and n layers are extremely thin compare to i-layer - diffusion current is
very small
The increase in the i-width reduces the speed of a photodiode
Photodiodes
p-n Photodiode
p-i-n Photodiode
Dark Current
Impact Ionization
Impact Ionization
Hole Impact
Ionization
Electron Impact
Ionization
hv
Ec
h
Hole
Ev
Multiplication Factor
PiN or APD
Characteristics of common P-i-N Photodiodes