Lecture 4
Lecture 4
Lecture 4
Communications
A PragaTI (TI India Technical University) Course
July 18, 21, 22, 2008
Vishwani D. Agrawal
Foster Dai
Auburn University, Dept. of ECE, Auburn, AL 36849, USA
1
What is Noise?
2
Describing Noise
3
Thermal Noise
Given that for microwave frequencies, hf << kT, derive the following
Rayleigh-Jeans approximation:
v2 = 4kTBR
Show that at room temperature (T = 290K), thermal noise power
supplied by resistor R to a matched load is ktB or – 174 dBm/Hz.
Noisy R
resistor Matched
R load
v = (4kTBR)1/2
5
Other Noise Types
Shot noise [Schottky, 1928]: Broadband noise due to random behavior of charge
carriers in semiconductor devices.
Flicker (1/f) noise: Low-frequency noise in semiconductor devices, perhaps due to
material defects; power spectrum falls off as 1/f. Can be significant at audio
frequencies.
Quantization noise: Caused by conversion of continuous valued analog signal to
discrete-valued digital signal; minimized by using more digital bits.
Quantum noise: Broadband noise caused by the quantized nature of charge
carriers; significant at very low temperatures (~0K) or very high bandwidth ( >
1015 Hz).
Plasma noise: Caused by random motion of charges in ionized medium, possibly
resulting from sparking in electrical contacts; generally, not a concern.
6
Measuring Noise
Si/Ni G So/No
Input signal: low peak power, Output signal: high peak power,
good SNR poor SNR
Power (dBm)
G So/No
Si/Ni
Noise floor
Frequency (Hz)
8
Noise Factor and Noise Figure
9
Cascaded System Noise Factor
F2 – 1 F3 – 1 Fn – 1
Fsys = F1 + ——— + ——— + · · · · + ———————
G1 G1 G2 G1 G2 · · · G n – 1
10
Measuring Noise Figure: Cold Noise Method
Y – factor is the ratio of output noise in hot (power on) state to that in
cold (power off) state.
Y = Nh / Nc
= Nh / N0
Y is a simple ratio.
Consider, Nh = kThBG and Nc = kT0BG
Noise source provides hot and cold noise power levels and is
characterized by ENR (excess noise ratio).
Tester measures noise power, is characterized by its noise factor F2
and Y-factor Y2.
Device under test (DUT) has gain G1 and noise factor F1.
Two-step measurement:
■ Calibration: Connect noise source to tester, measure output power
for hot and cold noise inputs, compute Y2 and F2.
■ Measurement: Connect noise source to DUT and tester cascade,
measure output power for hot and cold noise inputs, compute
compute Y12, F12 and G1.
13
■ Use Friis equation to obtain F1.
Calibration
Noise Tester
source (power meter)
ENR F2, Y2
F2 = ENR / (Y2 – 1)
14
Cascaded System Measurement
Noise Tester
DUT
source (power meter)
F1, Y1, G1
ENR F2, Y2
F12, Y12
15
Problem to Solve
16
Phase Noise
t t
φ
phase
noise
V sin ωt [V + δ(t)] sin [ωt + φ(t)]
ω ω
Frequency (rad/s) Frequency (rad/s) 17
Effects of Phase Noise
18
Phase Noise Analysis
[V + δ(t)] sin [ωt + φ(t)] = [V + δ(t)] [sin ωt cos φ(t) + cos ωt sin φ(t)]
19
Phase Noise Measurement
Signal spectrum
Frequency (Hz)
20
Phase Noise Measurement
Pure tone
Input DUT
(carrier)
Hz
offset
21
Phase Noise Measurement Example
23