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Sungju Park
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2020 – today
- 2022
- [j21]Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park:
Highly Efficient Test Architecture for Low-Power AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(8): 2728-2738 (2022) - [j20]Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park:
Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 1537-1541 (2022) - 2021
- [j19]Umair Saeed Solangi, Muhammad Ibtesam, Muhammad Adil Ansari, Jinuk Kim, Sungju Park:
Test Architecture for Systolic Array of Edge-Based AI Accelerator. IEEE Access 9: 96700-96710 (2021) - [j18]Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park:
Master-slave based test cost reduction method for DNN accelerators. IEICE Electron. Express 18(24): 20210425 (2021) - [j17]Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park:
Time multiplexed LBIST for in-field testing of automotive AI accelerators. IEICE Electron. Express 18(24): 20210451 (2021) - 2020
- [j16]Jinuk Kim, Muhammad Ibtesam, Dooyoung Kim, Jihun Jung, Sungju Park:
CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience. IEEE Access 8: 22400-22410 (2020)
2010 – 2019
- 2018
- [j15]Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Time-Multiplexed 1687-Network for Test Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(8): 1681-1691 (2018) - [j14]Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Erratum to "Time-Multiplexed-Network for Test Cost Reduction". IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(9): 1912 (2018) - 2017
- [j13]Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
On Diagnosing the Aging Level of Automotive Semiconductor Devices. IEEE Trans. Circuits Syst. II Express Briefs 64-II(7): 822-826 (2017) - 2016
- [j12]Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park:
Time-multiplexed test access architecture for stacked integrated circuits. IEICE Electron. Express 13(14): 20160314 (2016) - 2015
- [c26]Dooyoung Kim, Muhammad Adil Ansari, Jihun Jung, Sungju Park:
Scan-Puf: Puf Elements Selection Methods for Viable IC Identification. ATS 2015: 121-126 - [c25]Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park:
Efficient diagnosis technique for aging defects on automotive semiconductor chips. ETS 2015: 1-2 - 2014
- [j11]Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park:
An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory. IEEE Trans. Computers 63(8): 2094-2098 (2014) - 2012
- [j10]Jongsun Bae, Sanghyeon Baeg, Sungju Park:
Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress. IEEE Trans. Instrum. Meas. 61(12): 3259-3272 (2012) - 2011
- [c24]Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park:
Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate. Asian Test Symposium 2011: 335-340 - 2010
- [j9]Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park:
A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. IEEE Trans. Circuits Syst. II Express Briefs 57-II(7): 561-565 (2010) - [j8]Hyunbean Yi, Sungju Park, Sandip Kundu:
On-Chip Support for NoC-Based SoC Debugging. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(7): 1608-1617 (2010) - [c23]Jeonghye Han, Seungmin Lee, Bokhyun Kang, Sungju Park, Jungkwan Kim, Myungsook Kim, Mihee Kim:
A trial english class with a teaching assistant robot in elementary school. HRI 2010: 335-336
2000 – 2009
- 2009
- [j7]Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park:
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs 56-II(1): 56-60 (2009) - [j6]Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park:
An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(3): 554-565 (2009) - [j5]Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park:
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs 56-II(5): 419-423 (2009) - 2008
- [j4]Hyunbean Yi, Jaehoon Song, Sungju Park:
Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. 57(5): 1071-1078 (2008) - [c22]Hyunbean Yi, Sungju Park, Sandip Kundu:
A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC. ATS 2008: 289-294 - [c21]Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park:
An Efficient Secure Scan Design for an SoC Embedding AES Core. ITC 2008: 1 - [c20]Eun-ja Hyun, So-yeon Kim, Siekyung Jang, Sungju Park:
Comparative study of effects of language instruction program using intelligence robot and multimedia on linguistic ability of young children. RO-MAN 2008: 187-192 - 2007
- [c19]Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park:
An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips. Asia-Pacific Computer Systems Architecture Conference 2007: 139-150 - [c18]Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park:
Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC. ATS 2007: 193-198 - [c17]Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park:
Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. VTS 2007: 375-380 - 2006
- [j3]Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park:
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2605-2608 (2006) - [c16]Hyunbean Yi, Jaehoon Song, Sungju Park:
Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. ITC 2006: 1-7 - 2005
- [c15]Jeonghye Han, Miheon Jo, Sungju Park, Sungho Kim:
The educational use of home robots for children. RO-MAN 2005: 378-383 - [c14]Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park:
Hybrid test data compression technique for SOC scan testing. SoCC 2005: 69-72 - 2004
- [c13]Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J. Ciesielski:
A new state assignment technique for testing and low power. DAC 2004: 510-513 - 2003
- [c12]Hyunbean Yi, Sungju Park, Misook Kim, Kiman Jeon:
An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks. Human.Society@Internet 2003 2003: 272-281 - 2002
- [j2]Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler:
A Genetic Algorithm for the Minimization of OPKFDDs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 85-A(12): 2943-2945 (2002) - [c11]Jaehoon Song, Sungju Park:
A Simple Wrapped Core Linking Module for SoC Test Access. Asian Test Symposium 2002: 344-349 - [c10]NamRye Son, YoJin Yang, Gueesang Lee, Sungju Park:
A New Boundary Matching Algorithm Based on Edge Detection. EurAsia-ICT 2002: 84-92 - 2001
- [c9]Dongkyu Youn, Taehyung Kim, Sungju Park:
A Microcode-Based Memory BIST Implementing Modified March Algorithm. Asian Test Symposium 2001: 391-395 - [c8]Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler:
Minimization of OPKFDDs Using Genetic Algorithms. DSD 2001: 72-78 - [c7]Sungju Park, Dongman Lee, Mingyu Lim, Chansu Yu:
Scalable data management using user-based caching and prefetching in distributed virtual environments. VRST 2001: 121-126 - 2000
- [c6]Sungju Park, Taehyung Kim:
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects. DATE 2000: 458-462 - [c5]Jongwook Park, Sang-Hoon Shin, Sungju Park:
A partial scan design by unifying structural analysis and testabilities. ISCAS 2000: 88-91
1990 – 1999
- 1996
- [c4]Sungju Park:
A New Complete Diagnosis Patterns for Wiring Interconnects. DAC 1996: 203-208 - 1992
- [j1]Sungju Park, Sheldon B. Akers:
Parity bit calculation and test signal compaction for BIST applications. J. Electron. Test. 3(1): 45-52 (1992) - [c3]Sungju Park, Sheldon B. Akers:
A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination. ITC 1992: 303-311 - 1991
- [c2]Sungju Park, Sheldon B. Akers:
Parity Bit Calculation and Test Signal Compaction for BIST Applications. ITC 1991: 1016-1023 - 1990
- [c1]Sheldon B. Akers Jr., Sungju Park, Balakrishnan Krishnamurthy, Ashok Swaminathan:
Why is less information from logic simulation more useful in fault simulation? ITC 1990: 786-800
Coauthor Index
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last updated on 2024-04-25 05:44 CEST by the dblp team
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