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A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration

Published: 01 December 2013 Publication History

Abstract

The ever increasing adoption of field programmable devices in various application domains for building complex embedded systems based on FPGA processors along with the reliability issues having emerged for FPGA devices built with the latest nanometer technologies, have raised the need for new fault tolerant techniques in order to improve dependability and extend system lifetime. In addition, the runtime partial reconfiguration technology highly mature in the modern FPGA families along with the availability of unused programmable resources in most FPGA designs provide new and interesting opportunities to build advanced fault tolerance mechanisms. In this paper, we exploit the dynamic reconfiguration potential of today's FPGA architectures and the advances in the related design support tools and we propose a fault-tolerant approach for FPGA embedded processors based on runtime partial reconfiguration. According to the proposed methodology, the processor core is partitioned into reconfigurable modules and each module is duplicated to implement a concurrent error detection mechanism. Precompiled configurations containing spare resources are generated for each duplicated module and are used to repair at runtime the defective modules. Also, a fault tolerance scheme for the proxy logic of the reconfigurable modules, which cannot move in the alternative configurations along with the rest logic, is proposed. Moreover, a compression method for the alternative partial bitstreams, which significantly reduces the high storage space requirements of the proposed approach, is presented. Two different hardware decompression schemes have been implemented in a Virtex-5 device and compared in terms of area overhead and decompression latency. Furthermore, a thorough examination has been performed, regarding how the percentage of the spare resources and their allocation in the reconfigurable regions affect the compression efficiency and the processor performance. Finally, the proposed approach has been demonstrated in three different components --- ALU, multiplier-accumulator, and instruction-fetch unit --- of an open-source embedded processor.

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  • (2018)Fault Tolerance Mechanisms for FPGA-Based Regular Expression MatchingJournal of Electronic Testing: Theory and Applications10.1007/s10836-018-5736-734:4(487-506)Online publication date: 1-Aug-2018
  • (2017)A novel BRAM content accessing and processing method based on FPGA configuration bitstreamMicroprocessors & Microsystems10.1016/j.micpro.2017.01.00949:C(64-76)Online publication date: 1-Mar-2017
  1. A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration

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      Published In

      cover image Journal of Electronic Testing: Theory and Applications
      Journal of Electronic Testing: Theory and Applications  Volume 29, Issue 6
      December 2013
      161 pages

      Publisher

      Kluwer Academic Publishers

      United States

      Publication History

      Published: 01 December 2013

      Author Tags

      1. FPGA processor
      2. Fault tolerant processor
      3. Field Programmable Gate Arrays (FPGAs)
      4. Runtime partial reconfiguration

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      • (2018)Fault Tolerance Mechanisms for FPGA-Based Regular Expression MatchingJournal of Electronic Testing: Theory and Applications10.1007/s10836-018-5736-734:4(487-506)Online publication date: 1-Aug-2018
      • (2017)A novel BRAM content accessing and processing method based on FPGA configuration bitstreamMicroprocessors & Microsystems10.1016/j.micpro.2017.01.00949:C(64-76)Online publication date: 1-Mar-2017

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