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Gate-level power and current simulation of CMOS integrated circuits

Published: 01 December 1997 Publication History

Abstract

In this paper, we present a new gate-level approach to power and current simulation. We propose a symbolic model of complementary metal-oxide-semiconductor (CMOS) gates to capture the dependence of power consumption and current flows on input patterns and fan-in/fan-out conditions. Library elements are characterized and their models are used during event-driven logic simulation to provide power information and construct time-domain current waveforms. We provide both global and local pattern-dependent estimates of power consumption and current peaks (with accuracy of 6 and 10% from SPICE, respectively), while keeping performance comparable with traditional gate-level simulation with unit delay. We use VERILOG-XL as simulation engine to grant compatibility with design tools based on Verilog HDL. A Web-based user interface allows our simulator (PPP) to be accessed through the Internet using a standard web browser.

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  • (2017)Energy Transparency for Deeply Embedded ProgramsACM Transactions on Architecture and Code Optimization10.1145/304667914:1(1-26)Online publication date: 21-Mar-2017
  • (2015)Static analysis of energy consumption for LLVM IR programsProceedings of the 18th International Workshop on Software and Compilers for Embedded Systems10.1145/2764967.2764974(12-21)Online publication date: 1-Jun-2015
  • (2013)Verification work reduction methodology in low-power chip implementationACM Transactions on Design Automation of Electronic Systems10.1145/2390191.239020318:1(1-15)Online publication date: 16-Jan-2013
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  1. Gate-level power and current simulation of CMOS integrated circuits

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      IEEE Educational Activities Department

      United States

      Publication History

      Published: 01 December 1997

      Author Tags

      1. current waveform
      2. gate-level simulation
      3. power consumption

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      Cited By

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      • (2017)Energy Transparency for Deeply Embedded ProgramsACM Transactions on Architecture and Code Optimization10.1145/304667914:1(1-26)Online publication date: 21-Mar-2017
      • (2015)Static analysis of energy consumption for LLVM IR programsProceedings of the 18th International Workshop on Software and Compilers for Embedded Systems10.1145/2764967.2764974(12-21)Online publication date: 1-Jun-2015
      • (2013)Verification work reduction methodology in low-power chip implementationACM Transactions on Design Automation of Electronic Systems10.1145/2390191.239020318:1(1-15)Online publication date: 16-Jan-2013
      • (2010)Fast and accurate analysis of supply noise effects in PLL with noise interactionsIEEE Transactions on Circuits and Systems Part I: Regular Papers10.1109/TCSI.2009.201618557:1(44-52)Online publication date: 1-Jan-2010
      • (2009)A SCORE macromodel for PLL designs to analyze supply noise interaction issues at behavioral levelProceedings of the 2009 Asia and South Pacific Design Automation Conference10.5555/1509633.1509755(516-521)Online publication date: 19-Jan-2009
      • (2008)Quick supply current waveform estimation at gate level using existed cell library informationProceedings of the 18th ACM Great Lakes symposium on VLSI10.1145/1366110.1366144(135-138)Online publication date: 4-May-2008
      • (2007)Efficient modeling techniques for dynamic voltage drop analysisProceedings of the 44th annual Design Automation Conference10.1145/1278480.1278657(706-711)Online publication date: 4-Jun-2007
      • (2005)Efficient algorithms for multilevel power estimation of VLSI circuitsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2004.84076913:2(238-254)Online publication date: 1-Feb-2005
      • (2005)Logic-Level fast current simulation for digital CMOS circuitsProceedings of the 15th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation10.1007/11556930_44(425-435)Online publication date: 21-Sep-2005
      • (2004)Fault Simulation Model for i{DDT} TestingProceedings of the 22nd IEEE VLSI Test Symposium10.5555/987684.987946Online publication date: 25-Apr-2004
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