research-article

Deviation-based LFSR reseeding for test-data compression

Authors:

Krishnendu Chakrabarty,

Michael BienekAuthors Info & Claims

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 28, Issue 2

Pages 259 - 271

https://doi.org/10.1109/TCAD.2008.2009166

Published: 01 February 2009 Publication History

Abstract

Linear feedback shift register (LFSR) reseeding forms the basis for many test-compression solutions. A seed can be computed for each test cube by solving a system of linear equations based on the feedback polynomial of the LFSR. Despite the availability of numerous LFSR-reseeding-based compression methods in the literature, relatively little is known about the effectiveness of these seeds for unmodeled defects, particularly since there are often several candidate seeds for a test cube. We use the recently proposed output deviation measure of the resulting patterns as a metric to select appropriate LFSR seeds. Experimental results are reported using test patterns for stuck-at and transition faults derived from selected seeds for the ISCAS-89 and the IWLS-05 benchmark circuits. These patterns achieve higher coverage for transition and stuck-open faults than patterns obtained using other seed-generation methods for LFSR reseeding. Given a pattern pair (p₁, p₂) for transition faults, we also examine the transition-fault coverage for launch on capture by using p₁ and p₂ to separately compute output deviations. Results show that p₁ tends to be better when there is a high proportion of do-not-care bits in the test cubes, while p₂ is a more appropriate choice when the transition-fault coverage is high.

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Cited By

Seo SLee YKang S(2016)Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data CompressionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.241341635:2(274-284)Online publication date: 18-Jan-2016
https://dl.acm.org/doi/10.1109/TCAD.2015.2413416
Acevedo OKagaris D(2016)On The Computation of LFSR Characteristic Polynomials for Built-In Deterministic Test Pattern GenerationIEEE Transactions on Computers10.1109/TC.2015.242869765:2(664-669)Online publication date: 1-Feb-2016
https://dl.acm.org/doi/10.1109/TC.2015.2428697
Sivanantham SMallick PRaja Paul Perinbam J(2014)Low-power selective pattern compression for scan-based test applicationsComputers and Electrical Engineering10.1016/j.compeleceng.2013.11.02840:4(1053-1063)Online publication date: 1-May-2014
https://dl.acm.org/doi/10.1016/j.compeleceng.2013.11.028
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cover image IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 28, Issue 2

February 2009

138 pages

ISSN:0278-0070

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Copyright © 2009.

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IEEE Press

Publication History

Published: 01 February 2009

Revised: 16 August 2008

Received: 16 May 2008

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Cited By

Seo SLee YKang S(2016)Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data CompressionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.241341635:2(274-284)Online publication date: 18-Jan-2016
https://dl.acm.org/doi/10.1109/TCAD.2015.2413416
Acevedo OKagaris D(2016)On The Computation of LFSR Characteristic Polynomials for Built-In Deterministic Test Pattern GenerationIEEE Transactions on Computers10.1109/TC.2015.242869765:2(664-669)Online publication date: 1-Feb-2016
https://dl.acm.org/doi/10.1109/TC.2015.2428697
Sivanantham SMallick PRaja Paul Perinbam J(2014)Low-power selective pattern compression for scan-based test applicationsComputers and Electrical Engineering10.1016/j.compeleceng.2013.11.02840:4(1053-1063)Online publication date: 1-May-2014
https://dl.acm.org/doi/10.1016/j.compeleceng.2013.11.028
Fang HChakrabarty KJas APatil STirumurti C(2012)Functional test-sequence grading at register-transfer levelIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2011.216365120:10(1890-1894)Online publication date: 1-Oct-2012
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Chandrasekar MRahagude NHsiao M(2010)Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test GenerationJournal of Electronic Testing: Theory and Applications10.1007/s10836-010-5142-226:2(165-176)Online publication date: 1-Apr-2010
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Fang HChakrabarty KFujiwara H(2010)RTL DFT Techniques to Enhance Defect Coverage for Functional Test SequencesJournal of Electronic Testing: Theory and Applications10.1007/s10836-009-5135-126:2(151-164)Online publication date: 1-Apr-2010
https://dl.acm.org/doi/10.1007/s10836-009-5135-1

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