Article

Adjustable Width Linear Combinational Scan Vector Decompression

Authors:

Nur A. ToubaAuthors Info & Claims

ICCAD '03: Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design

Page 863

Published: 09 November 2003 Publication History

Abstract

A new scheme for combinational linear expansion isproposed for decompression of scan vectors. It has thecapability to adjust the width of the linear expansion each clockcycle. This eliminates the requirement that every scan bit-slicebe in the output space of the linear decompressor. Depending onhow specified the current bit-slice is, the decompressor may loadall scan chains or may load only a subset of the scan chains.This provides the nice feature that any scan vector can begenerated using the proposed scheme regardless of the numberor distribution of the specified bits. Thus, the proposed schemeallows the use of any ATPG procedure without any constraints.Moreover, it allows greater compression to be achieved thanfixed width expansion techniques since the ratio of the number ofscan chains to the number of tester channels can be scaled muchlarger. A procedure for designing and optimizing the adjustablewidth decompression hardware and obtaining the compresseddata is described. Experimental data indicates that the proposedscheme is simple yet very effective.

References

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Cited By

Li JLiu XZhang YHu YLi XXu Q(2011)Capture-power-aware test data compression using selective encodingIntegration, the VLSI Journal10.1016/j.vlsi.2011.01.00544:3(205-216)Online publication date: 1-Jun-2011
https://dl.acm.org/doi/10.1016/j.vlsi.2011.01.005
Lee JTouba N(2010)Correlation-based rectangular encodingIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202588218:10(1483-1492)Online publication date: 1-Oct-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025882
Wang ZFang HChakrabarty KBienek M(2009)Deviation-based LFSR reseeding for test-data compressionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2008.200916628:2(259-271)Online publication date: 1-Feb-2009
https://dl.acm.org/doi/10.1109/TCAD.2008.2009166
Show More Cited By

Index Terms

Adjustable Width Linear Combinational Scan Vector Decompression
1. Information systems
  1. Data management systems
    1. Data structures
      1. Data layout
        Data compression
2. Mathematics of computing
  1. Discrete mathematics
    1. Combinatorics
      1. Combinatorial algorithms
  2. Mathematical analysis
    1. Numerical analysis
      1. Computations on polynomials

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Information & Contributors

Information

Published In

cover image ACM Conferences

ICCAD '03: Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design

November 2003

899 pages

ISBN:1581137621

Sponsors

SIGDA: ACM Special Interest Group on Design Automation

Publisher

IEEE Computer Society

United States

Publication History

Published: 09 November 2003

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ICCAD03

Sponsor:

SIGDA

ICCAD03: The International Conference on Computer-Aided Design

November 9 - 13, 2003

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ICCAD '03 Paper Acceptance Rate 129 of 490 submissions, 26%;

Overall Acceptance Rate 457 of 1,762 submissions, 26%

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IEEE/ACM International Conference on Computer-Aided Design

October 27 - 31, 2024

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Citations

Cited By

Li JLiu XZhang YHu YLi XXu Q(2011)Capture-power-aware test data compression using selective encodingIntegration, the VLSI Journal10.1016/j.vlsi.2011.01.00544:3(205-216)Online publication date: 1-Jun-2011
https://dl.acm.org/doi/10.1016/j.vlsi.2011.01.005
Lee JTouba N(2010)Correlation-based rectangular encodingIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202588218:10(1483-1492)Online publication date: 1-Oct-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025882
Wang ZFang HChakrabarty KBienek M(2009)Deviation-based LFSR reseeding for test-data compressionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2008.200916628:2(259-271)Online publication date: 1-Feb-2009
https://dl.acm.org/doi/10.1109/TCAD.2008.2009166
Tenentes VKavousianos XKalligeros ESciuto D(2008)State skip LFSRsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403488(474-479)Online publication date: 10-Mar-2008
https://dl.acm.org/doi/10.1145/1403375.1403488
Kavousianos XKalligeros ENikolos D(2008)Multilevel-Huffman test-data compression for IP cores with multiple scan chainsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2008.200044816:7(926-931)Online publication date: 1-Jul-2008
https://dl.acm.org/doi/10.1109/TVLSI.2008.2000448
Balakrishnan KTouba N(2006)Improving linear test data compressionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2006.88641714:11(1227-1237)Online publication date: 1-Nov-2006
https://dl.acm.org/doi/10.1109/TVLSI.2006.886417
Touba N(2006)Survey of Test Vector Compression TechniquesIEEE Design & Test10.1109/MDT.2006.10523:4(294-303)Online publication date: 1-Jul-2006
https://dl.acm.org/doi/10.1109/MDT.2006.105
Balakrishnan KTouba N(2005)Reconfigurable Linear Decompressors Using Symbolic Gaussian EliminationProceedings of the conference on Design, Automation and Test in Europe - Volume 210.1109/DATE.2005.255(1130-1135)Online publication date: 7-Mar-2005
https://dl.acm.org/doi/10.1109/DATE.2005.255
Rao WOrailoglu ASu G(2004)Frugal linear network-based test decompression for drastic test cost reductionsProceedings of the 2004 IEEE/ACM International conference on Computer-aided design10.1109/ICCAD.2004.1382670(721-725)Online publication date: 7-Nov-2004
https://dl.acm.org/doi/10.1109/ICCAD.2004.1382670

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