Article

Robust extraction of spatial correlation

Authors:

Vladimir Zolotov,

Lei HeAuthors Info & Claims

ISPD '06: Proceedings of the 2006 international symposium on Physical design

Pages 2 - 9

https://doi.org/10.1145/1123008.1123011

Published: 09 April 2006 Publication History

Abstract

Increased variability of process parameters and recent progress in statistical static timing analysis make extraction of statistical characteristics of process variation and spatial correlation an important yet challenging problem in modern chip designs. Unfortunately, existing approaches either focus on extraction of only a deterministic component of spatial variation or do not consider actual difficulties in computing a valid spatial correlation function and matrix, simply ignoring the fact that not every function and matrix can be used to describe the spatial correlation. Based upon the mathematical theory of random fields and convex analysis, in this paper, we develop (1) a robust technique to extract a valid spatial correlation function by solving a constrained nonlinear optimization problem; and (2) a robust technique to extract a valid spatial correlation matrix by employing a modified alternative projection algorithm.Our novel techniques guarantee to extract a valid spatial correlation function and matrix that are closest to measurement data, even if those measurements are affected by unavoidable random noises. Experiment results based upon a Monte-Carlo model confirm the accuracy and robustness of our techniques, and show that we are able to recover the correlation function and matrix with very high accuracy even in the presence of significant random noises.

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Cited By

Karmokar NMadhusudan MSharma AHarjani RLin MSapatnekar S(2022)Common-Centroid Layout for Active and Passive Devices: A Review and the Road Ahead2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASP-DAC52403.2022.9712576(114-121)Online publication date: 17-Jan-2022
https://doi.org/10.1109/ASP-DAC52403.2022.9712576
Sharma AMadhusudan MBurns SMukherjee PYaldiz SHarjani RSapatnekar S(2021)Common-Centroid Layouts for Analog Circuits: Advantages and Limitations2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE51398.2021.9474244(1224-1229)Online publication date: 1-Feb-2021
https://doi.org/10.23919/DATE51398.2021.9474244
Champac VGarcia Gervacio JChampac VGarcia Gervacio J(2018)Process VariationsTiming Performance of Nanometer Digital Circuits Under Process Variations10.1007/978-3-319-75465-9_3(41-69)Online publication date: 19-Apr-2018
https://doi.org/10.1007/978-3-319-75465-9_3
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Index Terms

Robust extraction of spatial correlation
1. Applied computing
  1. Arts and humanities
    1. Architecture (buildings)
      1. Computer-aided design
  2. Physical sciences and engineering
    1. Engineering
      1. Computer-aided design

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cover image ACM Conferences

ISPD '06: Proceedings of the 2006 international symposium on Physical design

April 2006

232 pages

ISBN:1595932992

DOI:10.1145/1123008

General Chair:
Lou Scheffer
Cadence

Copyright © 2006 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 09 April 2006

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April 9 - 12, 2006

California, San Jose, USA

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Overall Acceptance Rate 62 of 172 submissions, 36%

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Cited By

Karmokar NMadhusudan MSharma AHarjani RLin MSapatnekar S(2022)Common-Centroid Layout for Active and Passive Devices: A Review and the Road Ahead2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASP-DAC52403.2022.9712576(114-121)Online publication date: 17-Jan-2022
https://doi.org/10.1109/ASP-DAC52403.2022.9712576
Sharma AMadhusudan MBurns SMukherjee PYaldiz SHarjani RSapatnekar S(2021)Common-Centroid Layouts for Analog Circuits: Advantages and Limitations2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)10.23919/DATE51398.2021.9474244(1224-1229)Online publication date: 1-Feb-2021
https://doi.org/10.23919/DATE51398.2021.9474244
Champac VGarcia Gervacio JChampac VGarcia Gervacio J(2018)Process VariationsTiming Performance of Nanometer Digital Circuits Under Process Variations10.1007/978-3-319-75465-9_3(41-69)Online publication date: 19-Apr-2018
https://doi.org/10.1007/978-3-319-75465-9_3
Szu-Pang Mu Wen-Hsiang Chang Chao MYi-Ming Wang Ming-Tung Chang Min-Hsiu Tsai (2016)Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)10.1145/2966986.2967076(1-8)Online publication date: 7-Nov-2016
https://dl.acm.org/doi/10.1145/2966986.2967076
Xu YTeich J(2016)Hierarchical Statistical Leakage Analysis and Its ApplicationACM Transactions on Design Automation of Electronic Systems10.1145/289682021:4(1-22)Online publication date: 2-Sep-2016
https://dl.acm.org/doi/10.1145/2896820
Sun JTalarico CGupta PRoveda J(2015)A New Uncertainty Budgeting-Based Method for Robust Analog/Mixed-Signal DesignACM Transactions on Design Automation of Electronic Systems10.1145/277895921:1(1-25)Online publication date: 2-Dec-2015
https://dl.acm.org/doi/10.1145/2778959
Liu BWang L(2015)Dynamic Statistical-Timing-Analysis-Based VLSI Path Delay Test Pattern GenerationIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2014.235293723:9(1577-1590)Online publication date: Sep-2015
https://doi.org/10.1109/TVLSI.2014.2352937
Majzoub S(2015)Reducing random-dopant fluctuation impact using footer transistors in many-core systemsIntegration, the VLSI Journal10.1016/j.vlsi.2014.06.00548:C(46-54)Online publication date: 1-Jan-2015
https://dl.acm.org/doi/10.1016/j.vlsi.2014.06.005
Janet M. Roveda J(2014)Robust Optimization for Gate Sizing Considering Non-Gaussian Local VariationsApplied Mathematics10.4236/am.2014.51624505:16(2558-2569)Online publication date: 2014
https://doi.org/10.4236/am.2014.516245
Liu XShao JZhao L(2014)A New Spatial Correlation Model Based on the Distributed RC-_∏ ModelAdvanced Materials Research10.4028/www.scientific.net/AMR.989-994.2204989-994(2204-2207)Online publication date: Jul-2014
https://doi.org/10.4028/www.scientific.net/AMR.989-994.2204
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