Design and test of self-checking asynchronous control circuit
Authors: 
Jian Ruan, Zhiying Wang, Kui Dai, Yong LiAuthors Info & Claims
Jian Ruan, Zhiying Wang, Kui Dai, Yong LiAuthors Info & ClaimsAbstract
The application of asynchronous circuit has been greatly restricted by reason of lacking effective technologies to test. Making use of the self-checking property of asynchronous control circuit, we may preferably solve this problem. In the paper, we put forward an improved, failstop David Cell, describe a way of designing self-checking asynchronous control circuits by the direct mapping technique, and propose the testing method for single stuck-at faults. The result shows that self-checking counterpart can be tested at normal operation speed and the area overhead is acceptable.
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- ERICSSON
- Chalmers University of Technology
- City of Göteborg: City of Göteborg
- Omnisys: Omnisys
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Springer-Verlag
Berlin, Heidelberg
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Published: 03 September 2007
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