Cited By
View all- Sukharev VHuang XChen HTan SChang Y(2014)IR-drop based electromigration assessmentProceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design10.5555/2691365.2691453(428-433)Online publication date: 3-Nov-2014
Accurate full-chip estimation of power map, current densities and temperature for EM assessment
Pages 440 - 445
Abstract
Full-chip power ground electro-migration assessment requires a power map, thermal map and checks for IR drops exceeding the design specifications. This paper provides a survey of the three main computation operations required to get these information.
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- Accurate full-chip estimation of power map, current densities and temperature for EM assessment
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Published: 03 November 2014
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ICCAD '14: IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN
November 3 - 6, 2014
California, San Jose
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Overall Acceptance Rate 457 of 1,762 submissions, 26%
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Cited By
View all- Sukharev VHuang XChen HTan SChang Y(2014)IR-drop based electromigration assessmentProceedings of the 2014 IEEE/ACM International Conference on Computer-Aided Design10.5555/2691365.2691453(428-433)Online publication date: 3-Nov-2014
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