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review-article

Conference Reports

Published: 01 July 2006 Publication History

Abstract

Reports from Workshop on System Effects of Logic Soft Errors (SELSE II), IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS 06), European Test Symposium (ETS 06), and International Test Conference (ITC 05).

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  1. Conference Reports

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    cover image IEEE Design & Test
    IEEE Design & Test  Volume 23, Issue 4
    July 2006
    64 pages

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    IEEE Computer Society Press

    Washington, DC, United States

    Publication History

    Published: 01 July 2006

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    1. Logic Soft Errors
    2. conference report

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