IEEE Design & Test

A popular DATE keynote speaker and an award-winning author are among the contributors to this issue, which covers on-chip testing, the sociology of EDA, quiescent-signal analysis, and a survey of test vector compression techniques.

Reports from Workshop on System Effects of Logic Soft Errors (SELSE II), IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS 06), European Test Symposium (ETS 06), and International Test Conference (ITC 05).

This article describes a set of on-chip testing techniques and their application to integrated wireless RF transceivers. The objective is to reduce final product cost and accelerate time to market by providing means of testing the entire transceiver ...

Increasing leakage current makes single-threshold IDDQ testing ineffective for differentiating defective and defect-free chips. Quiescent-signal analysis is a new detection and diagnosis technique that uses IDDQ measurements at multiple chip supply ...

Test data compression consists of test vector compression on the input side and response compaction on the output side. Test vector compression has been an active area of research, yielding a wide variety of techniques. This article summarizes and ...

Walden C. Rhines, CEO and chairman of the board of Mentor Graphics, delivered this keynote address at the Design, Automation, and Test in Europe Conference and Exhibition (DATE 06).

A report on the IEEE VLSI Test Symposium (VTS 06) panel on "Real-time volume diagnostics: requirements and challenges.

THE IEEE Design Automation Standards Committee and the IEEE Corporate Advisory Group are cosponsoring an interesting new standards project. IEEE P1685 (www.eda-stds.org/spirit-p1685) aims to develop an XML-based standard for describing electronic ...

A review of Leakage in Nanometer CMOS Technologies, edited by Siva G. Narendra and Anantha Chandrakasan (Springer, 2006).

This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.

This newsletter covers news, research, and events related to the newly formed IEEE Council on Electronic Design Automation.

The need for a more accurate way to count citations.