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Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs

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Jin-Fu LiAuthors Info & Claims

ASP-DAC '05: Proceedings of the 2005 Asia and South Pacific Design Automation Conference

Pages 65 - 70

https://doi.org/10.1145/1120725.1120745

Published: 18 January 2005 Publication History

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Abstract

With the increasing demand for high-performance networking application, network components such as network interfaces and routers are built in dedicated hardware modulars. Content addressable memories (CAMs) play an important role in the network components. Testing CAMs is very complicated due to their special structure. This paper presents an efficient March-like test algorithm for detecting the comparison faults of ternary CAMs based on the comparison fault models of binary CAMs. The test algorithm requires 5N Write operations, 2N Erase operations, and (3N + 2B) Compare operations for an N x B-bit TCAM.

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Tsai TLi JHsu CSu CShibuya T(2019)Testing stuck-open faults of priority address encoder in content addressable memoriesProceedings of the 24th Asia and South Pacific Design Automation Conference10.1145/3287624.3287690(347-351)Online publication date: 21-Jan-2019
https://dl.acm.org/doi/10.1145/3287624.3287690

Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs
1. Hardware

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Testing ternary content addressable memories with comparison faults using march-like tests
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ASP-DAC '05: Proceedings of the 2005 Asia and South Pacific Design Automation Conference

January 2005

1495 pages

ISBN:0780387376

DOI:10.1145/1120725

General Chair:
Ting-Ao Tang
Fudan University, Shanghai, P. R. China

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 18 January 2005

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ASPDAC05: Asia and South Pacific Design Automation Conference

January 18 - 21, 2005

Shanghai, China

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Overall Acceptance Rate 466 of 1,454 submissions, 32%

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Tsai TLi JHsu CSu CShibuya T(2019)Testing stuck-open faults of priority address encoder in content addressable memoriesProceedings of the 24th Asia and South Pacific Design Automation Conference10.1145/3287624.3287690(347-351)Online publication date: 21-Jan-2019
https://dl.acm.org/doi/10.1145/3287624.3287690

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Testing Ternary Content Addressable Memories With Comparison Faults Using March-Like Tests

Testing Disturbance Faults in Various NAND Flash Memories

Testing ternary content addressable memories with comparison faults using march-like tests

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Testing Ternary Content Addressable Memories With Comparison Faults Using March-Like Tests

Testing Disturbance Faults in Various NAND Flash Memories

Testing ternary content addressable memories with comparison faults using march-like tests

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