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Opportunities and challenges for better than worst-case design

Published: 18 January 2005 Publication History

Abstract

The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, uncertainty in environmental and fabrication conditions, and single-event upsets all conspire to compromise system correctness and reliability. Recently, researchers have begun to advocate a new design strategy called Better Than Worst-Case design that couples a complex core component with a simple reliable checker mechanism. By delegating the responsibility for correctness and reliability of the design to the checker, it becomes possible to build provably correct designs that effectively address the challenges of deep submicron design. In this paper, we present the concepts of Better Than Worst-Case design and high light two exemplary designs: the DIVA checker and Razor logic. We show how this approach to system implementation relaxes design constraints on core components, which reduces the effects of physical design challenges and creates opportunities to optimize performance and power characteristics. We demonstrate the advantages of relaxed design constraints for the core components by applying typical-case optimization (TCO) techniques to an adder circuit. Finally, we discuss the challenges and opportunities posed to CAD tools in the context of Better Than Worst-Case design. In particular, we describe the additional support required for analyzing run-time characteristics of designs and the many opportunities which are created to incorporate typical-case optimizations into synthesis and verification.

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      cover image ACM Conferences
      ASP-DAC '05: Proceedings of the 2005 Asia and South Pacific Design Automation Conference
      January 2005
      1495 pages
      ISBN:0780387376
      DOI:10.1145/1120725
      • General Chair:
      • Ting-Ao Tang
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 18 January 2005

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      • (2020)Cross-Layer Reliability, Energy Efficiency, and Performance Optimization of Near-Threshold Data PathsJournal of Low Power Electronics and Applications10.3390/jlpea1004004210:4(42)Online publication date: 3-Dec-2020
      • (2020)Constant overhead quantum fault tolerance with quantum expander codesCommunications of the ACM10.1145/343416364:1(106-114)Online publication date: 17-Dec-2020
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