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Binning optimization based on SSTA for transparently-latched circuits

Published: 02 November 2009 Publication History

Abstract

With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transparent latches are widely used. In this paper, we formulate and solve the binning optimization problem that decides the bin boundaries and their testing order to maximize the benefit (considering the test cost) for a transparently-latched circuit. The problem is decomposed into three sub-problems which are solved sequentially. First, to compute the clock period distribution of the transparently-latched circuit, a sample-based SSTA approach is developed which is based on the generalized stochastic collocation method (gSCM) with Sparse Grid technique. The minimal clock period on each sample point is found by solving a minimal cycle ratio problem in the constraint graph. Second, a greedy algorithm is proposed to maximize the sales profit by iteratively assigning each boundary to its optimal position. Then, an optimal algorithm of O(n log n) runtime is used to generate the optimal testing order of bin boundaries to minimize the test cost, based on alphabetic tree. Experiments on all the ISCAS'89 sequential benchmarks with 65-nm technology show 6.69% profit improvement and 14.00% cost reduction in average. The results also demonstrate that the proposed SSTA method achieves an error of 0.70% and speedup of 110X in average compared with the Monte Carlo simulation.

References

[1]
S. Borkar, T. Kamik, S. Narendra, J. Tschanz, A. Keshavarzi, and V. De, "Parameter variations and impact on circuits and microarchitecture," in IEEE Proc. DAC, June 2003, pp. 338--342.
[2]
B. D. Cory, R. Kapur, and B. Underwood, "Speed binning with path delay test in 150-nm technology," IEEE Design Test Comput., vol. 20, no. 5, pp. 41--45, Oct. 2003.
[3]
C. Ebeling and B. Lockyear, "On the performance of level-clocked circuits," in Proc. Advanced Research VLSI, Mar. 1995, pp. 342--356.
[4]
A. Davoodi and A. Srivastava, "Variability driven gate sizing for binning yield optimization," IEEE Trans. on VLSI, vol. 16, no. 6, pp. 683--692, June 2008.
[5]
A. Datta, S. Bhunia, J. H. Choi, S. Mukhopadhyay, and K. Roy, "Profit aware circuit design under process variations considering speed binning," IEEE Trans. on VLSI, vol. 16, no. 7, pp. 806--815, July 2008.
[6]
R. Chen and H. Zhou, "Statistical timing verification of transparently latched circuits," IEEE Trans. on CAD, vol. 25, no. 9, pp. 1847--1855, Sep. 2006.
[7]
M. C.-T. Chao, L.-C. Wang, K.-T. Cheng, and S. Kundu, "Static statistical timing analysis for latch-based pipeline designs," in IEEE Proc. ICCAD, Nov. 2004, pp. 468--472.
[8]
L. Zhang, J. Tsai, W. Chen, Y. Hu, and C. C.-P. Chen, "Convergence-provable statistical timing analysis with level-sensitive latches and feedback loops," in IEEE Proc. ASPDAC, Jan. 2006, pp. 941--946.
[9]
T. C. Hu and A. C. Tucker, "Optimal computer search trees and variable-length alphabetical codes," SIAM Journal on Applied Mathematics, vol. 21, no. 4, pp. 514--532, Dec. 1971.
[10]
R. Rao, A. Devgan, D. Blaauw, and D. Sylvester, "Parametric yield estimation considering leakage variability," in IEEE Proc. DAC, June 2004, pp. 442--447.
[11]
K. A. Sakallah, T. N. Mudge, and O. a. Olukotun, "Analysis and design of latch-controlled synchronous digital circuits," IEEE Trans. on CAD, vol. 11, no. 3, pp. 322--333, Mar. 1992.
[12]
T. G. Szymanski and N. Shenoy, "Verifying clock schedules," in IEEE Proc. ICCAD, Nov. 1992, pp. 124--131.
[13]
S. Bhardwaj, P. Ghanta, and S. Vrudhulat, "A framework for statistical timing analysis using non-linear delay and slew models," in IEEE Proc. ICCAD, Nov. 2006, pp. 225--230.
[14]
Y. Wang, X. Zeng, J. Tao, H. Zhu, X. Luo, C. Yan, and W. Cai, "Adaptive stochastic collocation method (ascm) for parameterized statistical timing analysis with quadratic delay model," in IEEE Proc. ISQED, Mar. 2008, pp. 62--67.
[15]
H. Zhu, X. Zeng, X. Luo, and W. Cai, "Generalized stochastic collocation method for variation-aware capacitance extraction of interconnects considering arbitrary random probability," IEICE Trans. Electron, vol. E92-C, no. 4, pp. 508--516, Apr. 2009.
[16]
X. Wan and G. E. Karniadakis, "Multi-element generalized polynomial chaos for arbitrary probability measures," SIAM J. Sci. Comput., vol. 28, no. 3, pp. 901--938, 2006.
[17]
Y. Zhan, A. J. Strojwas, X. Li, L. T. Pileggi, D. Newmark, and M. Sharma, "Correlation-aware statistical timing analysis with non-gaussian delay distributions," in IEEE Proc. DAC, June 2005, pp. 77--82.
[18]
J. Singh and S. Sapatnekar, "Statistical timing analysis with correlated non-gaussian parameters using independent component analysis," in IEEE Proc. DAC, July 2006, pp. 155--160.
[19]
D. B. Xiu and J. S. Hesthaven, "High order collocation method for differential equations with random inputs," SIAM Journal of Sci. Comput, vol. 27, no. 3, pp. 1118--1139, 2005.
[20]
E. Novak and K. Ritter, "Simple cubature formulas with high polynomial exactness," Constructive Approximation, vol. 15, no. 4, pp. 449--522, Dec. 1999.
[21]
T. G. Szymanski, "Computing optimal clock schedules," in IEEE Proc. DAC, June 1992, pp. 399--404.
[22]
A. Dasdan, "Experimental analysis of the fastest optimum cycle ratio and mean algorithms," ACM Trans. on Design Automation of Electronic Systems, vol. 9, no. 4, pp. 385--418, Oct. 2004.
[23]
R. A. Howard, Dynamic Programming and Markov Process. The M.I.T. Press, Cambridge, 1960.
[24]
P. Athanasios, Probability, Random Variables, and Stochastic Processes, 2nd ed. New York: McGraw-Hill, 1984.

Cited By

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  • (2019)Binning Optimization for Transparently-Latched CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.208187030:2(270-283)Online publication date: 4-Jan-2019
  • (2014)Efficient Statistical Timing Analysis for Circuits with Post-Silicon Tunable BuffersIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E97.A.2227E97.A:11(2227-2235)Online publication date: 2014

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    cover image ACM Conferences
    ICCAD '09: Proceedings of the 2009 International Conference on Computer-Aided Design
    November 2009
    803 pages
    ISBN:9781605588001
    DOI:10.1145/1687399
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 02 November 2009

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    Author Tags

    1. SSTA
    2. binning optimization
    3. latched circuits

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    • (2019)Binning Optimization for Transparently-Latched CircuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.208187030:2(270-283)Online publication date: 4-Jan-2019
    • (2014)Efficient Statistical Timing Analysis for Circuits with Post-Silicon Tunable BuffersIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.E97.A.2227E97.A:11(2227-2235)Online publication date: 2014

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