research-article

Precise error determination of approximated components in sequential circuits with model checking

Authors:

Arun Chandrasekharan,

Mathias Soeken,

Rolf DrechslerAuthors Info & Claims

DAC '16: Proceedings of the 53rd Annual Design Automation Conference

Article No.: 129, Pages 1 - 6

https://doi.org/10.1145/2897937.2898069

Published: 05 June 2016 Publication History

Abstract

Error metrics are used to evaluate the quality of an approximated circuit or to trade-off several approximated candidates in design exploration. Precisely determining the error of an approximated circuit is a hard problem since the errors accumulate over time depending on the composition and nature of individual components. In this paper, we present methods based on model checking to precisely determine error behavior in sequential circuits that contain approximated combinational components. Our experiments show that such an analysis is very significant and crucial to properly deduce the effects of approximations.

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Cited By

LU JMASUDA YISHIHARA T(2024)Identification of Redundant Flip-Flops Using Fault Injection for Low-Power Approximate Computing CircuitsIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.2023VLP0008E107.A:3(540-548)Online publication date: 1-Mar-2024
https://doi.org/10.1587/transfun.2023VLP0008
Chao WKourfali ALylina NWu JYang JWang CHsieh TWunderlich H(2024)Pattern Generation for Efficient Acceptability Verification of Approximate Circuits2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)10.1109/VLSITSA60681.2024.10546386(1-4)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VLSITSA60681.2024.10546386
MASUDA YHONDA YISHIHARA T(2023)Dynamic Verification Framework of Approximate Computing Circuits using Quality-Aware Coverage-Based Grey-Box FuzzingIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.2022VLP0002E106.A:3(514-522)Online publication date: 1-Mar-2023
https://doi.org/10.1587/transfun.2022VLP0002
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cover image ACM Other conferences

DAC '16: Proceedings of the 53rd Annual Design Automation Conference

June 2016

1048 pages

ISBN:9781450342360

DOI:10.1145/2897937

Copyright © 2016 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 05 June 2016

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Research-article

Funding Sources

German Excellence Initiative
Bundesministerium für Bildung und Forschung
German Academic Exchange Service
Deutsche Forschungsgemeinschaft

Conference

DAC '16

DAC '16: The 53rd Annual Design Automation Conference 2016

June 5 - 9, 2016

Texas, Austin

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Overall Acceptance Rate 1,770 of 5,499 submissions, 32%

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Cited By

LU JMASUDA YISHIHARA T(2024)Identification of Redundant Flip-Flops Using Fault Injection for Low-Power Approximate Computing CircuitsIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.2023VLP0008E107.A:3(540-548)Online publication date: 1-Mar-2024
https://doi.org/10.1587/transfun.2023VLP0008
Chao WKourfali ALylina NWu JYang JWang CHsieh TWunderlich H(2024)Pattern Generation for Efficient Acceptability Verification of Approximate Circuits2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)10.1109/VLSITSA60681.2024.10546386(1-4)Online publication date: 22-Apr-2024
https://doi.org/10.1109/VLSITSA60681.2024.10546386
MASUDA YHONDA YISHIHARA T(2023)Dynamic Verification Framework of Approximate Computing Circuits using Quality-Aware Coverage-Based Grey-Box FuzzingIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1587/transfun.2022VLP0002E106.A:3(514-522)Online publication date: 1-Mar-2023
https://doi.org/10.1587/transfun.2022VLP0002
Rajput MAlyami SAhmed QAlshahrani HAsiri YShaikh A(2023)Improved Learning-Based Design Space Exploration for Approximate Instance GenerationIEEE Access10.1109/ACCESS.2023.324730311(18291-18299)Online publication date: 2023
https://doi.org/10.1109/ACCESS.2023.3247303
Wang ZXu RChen JXiao J(2023)A Survey of Reliability Issues Related to Approximate CircuitsJournal of Computer Science and Technology10.1007/s11390-023-2554-x38:2(273-288)Online publication date: 30-Mar-2023
https://doi.org/10.1007/s11390-023-2554-x
Froehlich SDrechsler R(2022)Unlocking approximation for in-memory computing with Cartesian genetic programming and computer algebra for arithmetic circuitsit - Information Technology10.1515/itit-2021-004264:3(99-107)Online publication date: 16-Feb-2022
https://doi.org/10.1515/itit-2021-0042
Strnadel J(2022)Analyzing Dynamic Aspects of AxC Systems by Means of Statistical Model Checking2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)10.1109/DDECS54261.2022.9770166(88-93)Online publication date: 6-Apr-2022
https://doi.org/10.1109/DDECS54261.2022.9770166
Echavarria JKeszocze OTeich J(2022)Probability-Based DSE of Approximated LUT-Based FPGA Designs2022 IEEE 15th Dallas Circuit And System Conference (DCAS)10.1109/DCAS53974.2022.9845591(1-5)Online publication date: 17-Jun-2022
https://doi.org/10.1109/DCAS53974.2022.9845591
Minhas MHasan OAbed S(2021)HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital CircuitsJournal of Electronic Testing10.1007/s10836-021-05956-yOnline publication date: 26-Jun-2021
https://doi.org/10.1007/s10836-021-05956-y
Strnadel JDi Natale GFummi F(2020)Statistical model checking of approximate circuitsProceedings of the 23rd Conference on Design, Automation and Test in Europe10.5555/3408352.3408709(1574-1577)Online publication date: 9-Mar-2020
https://dl.acm.org/doi/10.5555/3408352.3408709
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