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A PV aware data placement scheme for read performance improvement on LDPC based flash memory: work-in-progress

Published: 15 October 2017 Publication History

Abstract

This paper proposes to improve read performance of LDPC based flash memory by exploiting process variation (PV). The work includes three parts. First, a block grouping approach is proposed to classify the flash blocks based on their reliability. Second, based on the grouping approach, a read data placement scheme is proposed, which is designed to place read-hot data on flash blocks with high reliability. However, simply placing read-hot data to high reliable blocks conflicts with recent PV-aware wear leveling schemes. In the third part of the work, a grouping partition scheme is proposed to limit the number of high reliable blocks for read-hot data. In this case, read performance can be well improved with little impact on the lifetime improvement.

References

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J Bucy and et al. 2008. The DiskSim Simulation Environment Version 4.0 Reference Manual. In Parallel Data Laboratory, Carnegie Mellon University.
[2]
Q Li, L Shi, and et al. Access characteristic guided read and write cost regulation for performance improvement on flash memory. In FAST '16. 125--132.
[3]
Y Pan, G Dong, and T Zhang. 2013. Error rate-based wear-leveling for NAND flash memory at highly scaled technology nodes. TVLSI (2013), 1350--1354.
[4]
R Pletka and S Tomić. 2016. Health-Binning: Maximizing the Performance and the Endurance of Consumer-Level NAND Flash. In SYSTOR '16. 31--40.
[5]
L Shi and et al. 2016. Exploiting process variation for write performance improvement on NAND flash memory storage systems. TVLSI (2016), 334--337.
[6]
Y Woo and J Kim. Diversifying wear index for MLC NAND flash memory to extend the lifetime of SSDs. In EMSOFT '13. 1--10.

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CODES '17: Proceedings of the Twelfth IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis Companion
October 2017
84 pages
ISBN:9781450351850
DOI:10.1145/3125502
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 15 October 2017

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ESWEEK'17
ESWEEK'17: THIRTEENTH EMBEDDED SYSTEM WEEK
October 15 - 20, 2017
Seoul, Republic of Korea

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Overall Acceptance Rate 280 of 864 submissions, 32%

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