In this paper, we study the effect of increasing Ag content on the conduction phenomena of Ag x As 50− x Te 50 with 3≤x≤20 glass system with a thickness 150 nm. The currentvoltage (JV) characteristics in the voltage range 020 V are... more
In this paper, we study the effect of increasing Ag content on the conduction phenomena of Ag x As 50− x Te 50 with 3≤x≤20 glass system with a thickness 150 nm. The currentvoltage (JV) characteristics in the voltage range 020 V are measured for all films. The ...