II-ImaS: -ImaS: ImaS: Intelligent Imaging Sensor for Industry, Health & Security & & , & : µµ -ImaS µµ II-ImaS “ ,, µ ” ,, .. ,, .. Phase 1 - Image analysis and signature extraction 4 : (AERC) (AERC) 6 Sensor/ASIC design & manufacture 7 9 DAQ design & manufacture X-ray camera design & manufacture 8 .. 10 System evaluation & fine tuning 11 .. ,, System integration & testing Dissemination & exploitation « »»,, ,, « line- scanning line line-scanning intelligent intelligent adaptive adaptive control control .. « » Top level system design 5 ,, Sensor/ASIC options & embedded code analysis ,, Phase 3 evaluation Phase 2 – design & manufacture 3 ,, .. Dental & mammographic end-user requirements 2 Image analysis and information signatures .. ,, » ,, CAD -Aided Diagnosis). (Computer CAD (Computer(Computer-Aided Diagnosis). I-ImaS Expert's Image Quality Evaluation (Global) : X-ray tube 1. 1. 3. 3. Heuristic Image Quality Evaluation (Combined) image (subject-background) (subject (subject-background) 4. 4. Heuristic Control Logic exposure parameters adjustments (feedback) ,, µ (image (image quality quality signature) signature) glob al image statistics X-ray Imag e ,, ,, µ 6. 6. (feedback) (feedback) .. Heu ristic Im age Qu ality Evaluation (Com bin ed) IQ I vector image image segm entation 7. 7. IQI vector Y-Axis 5. 5. X-ray Image (pixel (pixel rows) rows) 2. 2. design specifications + calibration feature extraction conten t-o riented image statistics Feature averaging (pixel (pixel column). column). X-axis scanning : (1) To -ImaS II-ImaS To I- .. ,, ,, , (2-4) 2004 2004 , , , (5-7) µµ µµ :: ,, 33 .. •• •• •• •• Scanning Scanning period: period: 16 16 ms ms Sensor Sensor size: size: 32 32 lines linesXX 512 512 pixels pixels Spatial Resolution: 32 m (pitch) Spatial Resolution: 32 µµm (pitch) Grey level depth (ADC): 12– –14 bits 12 Grey level depth (ADC): 12–14 bits http://www.i-imas.ucl.ac.uk http://www.i http://www.i-imas.ucl.ac.uk SIXTH FRAMEWORK PROGRAMME – PRIORITY 3 NMP (STREP) Nano-technologies and nano-sciences, knowledge-based multifunctional materials, and new production processes and devices I-ImaS – Proposal number: FP6-505593-1 •• •• •• •• •• •• •• •• •• – :: University University College College London, London, UK UK ACTA, ACTA, Netherlands Netherlands ANCO, ANCO, Greece Greece CCLRC CCLRC Rutherford Rutherford Appleton Appleton Laboratory, Laboratory, UK UK Computer Computer Technology Technology Institute, Institute, Greece Greece Imperial College, UK Imperial College, UK SINTEF, SINTEF, Norway Norway University Ioannina University of of Ioannina, Ioannina,, Greece Greece University University of of Trieste, Trieste, Italy Italy