DARK SENSOR USING LDR PROJECT REPORT

Bulletin of the American Meteorological Society, 2006

Sensors, Cameras, and Systems for Industrial/Scientific Applications X, 2009

2018

Electrical parameters such as current, voltage and resistance are produced by the light-sensitive sensor elements depending on the light. Therefore, optically sensitive sensors are widely used in light measurement and light control systems. LDR (A Light Dependent Resistor) and Photodiode, which are widely used in light detection systems, have been discussed in the study, they have been exposed to different lighting values in an indoor environment. Their electrical reaction values have been measured and susceptibility analysis has been conducted. In the light of the findings obtained, it has been seen that with 9.44 standard deviation rate photodiode has shown more light sensitivity than LDR.

Earth Observing Systems XX, 2015

Sensors, Cameras, and Systems for Scientific/Industrial Applications VIII, 2007

2017

Asian Journal of Research in Computer Science

The main purpose of this paper is to build an intelligent electronic system based on LDR (Light Dependent Resistor) sensor. A very interesting but also very useful part of this scientific research is the measurement of electrical quantities with high precision as intelligent machines know and can achieve, and one of them in this case is the Arduino Uno microcontroller. These measurements of electrical quantities such as voltage, resistance, and current intensity are used in programmable logic in the microcontroller to decide when to light a light or more and when not to light. Of course, this problem has been solved by using the LDR sensor in the electronic system. Such an electronic and programmable system works perfectly. The work itself contains solutions of electrical circuits in an analytical way, connection of electronic circuits with the Arduino Uno module, communication with the input and output devices of the ATMEGA 328P microcontroller interface and the fusion of the sourc...

Proceedings of Spie the International Society For Optical Engineering, 2009

Digital single-lens reflex (DSLR) cameras are examined and their dark current behavior is presented. We examine the influence of varying temperature, exposure time, and gain setting on dark current. Dark current behavior unique to sensors within such cameras is observed. In particular, heat is trapped within the camera body resulting in higher internal temperatures and an increase in dark current after successive images. We look at the possibility of correcting for the dark current, based on previous work done for scientific grade imagers, where hot pixels are used as indicators for the entire chip's dark current behavior. Standard methods of dark current correction are compared to computed dark frames. Dark current is a concern for DSLR cameras as optimum conditions for limiting dark current, such as cooling the imager, are not easily obtained in the typical use of such imagers.

– In other to mitigate the short comings of mechanical switches, solid state switches such as the dark detectors are preferred. The aim of this paper is to develop a model for assessing the reliability of a designed and implemented dark detector switch using fault tree analysis. A model was developed for evaluating or assessing the failure rate of the locally developed and constructed dark detector. The paper also did a review of Fault tree analysis as a reliability prediction tool. For a low resistance value of the LDR due to illumination, the voltage to the non-inverting input becomes < 6V, hence, the Op-amp comparator saturates and the output at pin 6 is almost 12V leading to the transistor being cut off and consequently the switch is not energised. However, when the LDR is in darkness the resistance rises to several mega ohms causing the potential at pin 2 rises to >6V, thereby causing the transistor to saturates, that is turned ON and the connected relay is energised. MIL-HDBK-217F and statistical survey or analysis may be used to estimate the probability of failure of each component of the circuit