P-Channel Enhancement Mode BSH205 MOS Transistor: Features Symbol Quick Reference Data
P-Channel Enhancement Mode BSH205 MOS Transistor: Features Symbol Quick Reference Data
P-Channel Enhancement Mode BSH205 MOS Transistor: Features Symbol Quick Reference Data
Product specification
BSH205
SYMBOL
s
QUICK REFERENCE DATA VDS = -12 V ID = -0.75 A RDS(ON) 0.5 (VGS = -2.5 V) VGS(TO) 0.4 V
d
GENERAL DESCRIPTION
P-channel, enhancement mode, logic level, field-effect power transistor. This device has low threshold voltage and extremely fast switching making it ideal for battery powered applications and high speed digital interfacing. The BSH205 is supplied in the SOT23 subminiature surface mounting package.
PINNING
PIN 1 2 3 gate source drain DESCRIPTION
SOT23
3 Top view
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134) SYMBOL VDS VDGR VGS ID IDM Ptot Tstg, Tj PARAMETER Drain-source voltage Drain-gate voltage Gate-source voltage Drain current (DC) Drain current (pulse peak value) Total power dissipation Storage & operating temperature CONDITIONS RGS = 20 k Ta = 25 C Ta = 100 C Ta = 25 C Ta = 25 C Ta = 100 C MIN. - 55 MAX. -12 -12 8 -0.75 -0.47 -3 0.417 0.17 150 UNIT V V V A A A W W C
THERMAL RESISTANCES
SYMBOL Rth j-a PARAMETER Thermal resistance junction to ambient CONDITIONS FR4 board, minimum footprint TYP. 300 MAX. UNIT K/W
August 1998
Rev 1.000
Philips Semiconductors
Product specification
BSH205
gfs IGSS IDSS Qg(tot) Qgs Qgd td on tr td off tf Ciss Coss Crss
-0.68 0.18 0.4 0.32 0.5 0.42 0.6 0.48 0.75 1.6 10 100 -50 -100 -11 -100 3.8 0.4 1.0 2 4.5 45 20 200 95 41 -
VDD = -10 V; ID = -0.5 A; VGS = -8 V; RG = 6 Resistive load VGS = 0 V; VDS = -9.6 V; f = 1 MHz
August 1998
Rev 1.000
Philips Semiconductors
Product specification
BSH205
BSH105
0.1 1E-06
1E-05
1E-04
1E-03
1E-02
1E-01
1E+00 1E+01
0 0 25 50 75 100 125 150 0 0 -0.5 -1 -1.5 Drain-Source Voltage, VDS (V) -2 Ambient Temperature, Ta (C)
Fig.2. Normalised continuous drain current. ID% = 100ID/ID 25 C = f(Ta); conditions: VGS -10 V
Drain-Source On Resistance, RDS(on) (Ohms) 100 Peak Pulsed Drain Current, IDM (A) BSH205 3 2.8 2.6 2.4 2.2 2 1.8 1.6 1.4 1.2 1 0.8 0.6 0.4 0.2 0 0 -0.9 V -1V -1.1 V -1.2 V -1.3 V -1.4 V
BSH205 Tj = 25 C
10
RDS(on) = VDS/ ID
tp = 100 us 1 ms
10 ms 100 ms
-2.5 V
0.1
d.c.
-1.8 V
VGS = -4.5V -0.2 -0.4 -0.6 -0.8 Drain Current, ID (A) -1 -1.2 -1.4
Fig.3. Safe operating area. Ta = 25 C ID & IDM = f(VDS); IDM single pulse; parameter tp
August 1998
Rev 1.000
Philips Semiconductors
Product specification
BSH205
Drain Current, ID (A) -3 -2.5 -2 -1.5 -1 -0.5 0 0 -0.5 -1 -1.5 -2 Gate-Source Voltage, VGS (V) VDS > ID X RDS(on) Tj = 25 C 150 C
typical
minimum 0.3 0.2 0.1 0 0 -2.5 -3 25 50 75 100 125 150 Junction Temperature, Tj (C)
Fig.10. Gate threshold voltage. VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
Transconductance, gfs (S) 3.5 VDS > ID X RDS(on) 3 2.5 2 1.5 1 0.5 0 0 Tj = 25 C
BSH205 VDS = -5 V Tj = 25 C
-0.2 -0.4 -0.6 -0.8 -1 -1.2 -1.4 -1.6 -1.8 -2 -2.2 -2.4 -2.6 Drain Current, ID (A)
1E-07 -1 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 Gate-Source Voltage, VGS (V) 0
BSH205
25
50
75
100
125
150
10 -0.1
-100.0
Fig.12. Typical capacitances, Ciss, Coss, Crss. C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
August 1998
Rev 1.000
Philips Semiconductors
Product specification
BSH205
BSH205
150 C
Tj = 25 C
0 5
0.2
0.4
0.6
0.8
1.2
1.4
August 1998
Rev 1.000
Philips Semiconductors
Product specification
BSH205
HE
v M A
Q A A1
1
e1 e bp
2
w M B detail X Lp
1 scale
2 mm
DIMENSIONS (mm are the original dimensions) UNIT mm A 1.1 0.9 A1 max. 0.1 bp 0.48 0.38 c 0.15 0.09 D 3.0 2.8 E 1.4 1.2 e 1.9 e1 0.95 HE 2.5 2.1 Lp 0.45 0.15 Q 0.55 0.45 v 0.2 w 0.1
EUROPEAN PROJECTION
August 1998
Rev 1.000
Philips Semiconductors
Product specification
BSH205
This data sheet contains target or goal specifications for product development. This data sheet contains final product specifications.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. Philips Electronics N.V. 1998 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
August 1998
Rev 1.000