Buk555 100a
Buk555 100a
Buk555 100a
Product Specification
BUK555-100A/B
PINNING - TO220AB
PIN 1 2 3 tab gate drain source drain DESCRIPTION
PIN CONFIGURATION
tab
SYMBOL
d
1 23
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134) SYMBOL VDS VDGR VGS VGSM ID ID IDM Ptot Tstg Tj PARAMETER Drain-source voltage Drain-gate voltage Gate-source voltage Non-repetitive gate-source voltage Drain current (DC) Drain current (DC) Drain current (pulse peak value) Total power dissipation Storage temperature Junction Temperature CONDITIONS RGS = 20 k tp 50 s Tmb = 25 C Tmb = 100 C Tmb = 25 C Tmb = 25 C MIN. - 55 -100A 25 18 100 125 175 175 MAX. 100 100 15 20 -100B 22 15 88 UNIT V V V V A A A W C C
THERMAL RESISTANCES
SYMBOL Rth j-mb Rth j-a PARAMETER Thermal resistance junction to mounting base Thermal resistance junction to ambient CONDITIONS MIN. TYP. 60 MAX. 1.2 UNIT K/W K/W
April 1993
Rev 1.100
Philips Semiconductors
Product Specification
BUK555-100A/B
UNIT V V A mA nA
DYNAMIC CHARACTERISTICS
Tmb = 25 C unless otherwise specified SYMBOL gfs Ciss Coss Crss td on tr td off tf Ld Ld Ls PARAMETER Forward transconductance Input capacitance Output capacitance Feedback capacitance Turn-on delay time Turn-on rise time Turn-off delay time Turn-off fall time Internal drain inductance Internal drain inductance Internal source inductance CONDITIONS VDS = 25 V; ID = 13 A VGS = 0 V; VDS = 25 V; f = 1 MHz VDD = 30 V; ID = 3 A; VGS = 5 V; RGS = 50 ; Rgen = 50 Measured from contact screw on tab to centre of die Measured from drain lead 6 mm from package to centre of die Measured from source lead 6 mm from package to source bond pad MIN. 10 TYP. 13.5 1450 280 100 25 65 135 80 3.5 4.5 7.5 MAX. 1750 350 150 40 85 180 110 UNIT S pF pF pF ns ns ns ns nH nH nH
April 1993
Rev 1.100
Philips Semiconductors
Product Specification
BUK555-100A/B
PD%
10
BUKx55-lv
0.1
0.01
20
40
60
80 100 Tmb / C
120
140
160
180
0.001 1E-07
50
20
40
60
80 100 Tmb / C
120
140
160
180
4 VDS / V
10
Fig.2. Normalised continuous drain current. ID% = 100ID/ID 25 C = f(Tmb); conditions: VGS 5 V
ID / A BUK555-100A,B
1000
0.5 0.4
2.5
100
RD O S( N)
=V
/ DS
ID
A B tp = 10 us 100 us
4 4.5 5 10
20 ID / A
40
Fig.3. Safe operating area. Tmb = 25 C ID & IDM = f(VDS); IDM single pulse; parameter tp
April 1993
Rev 1.100
Philips Semiconductors
Product Specification
BUK555-100A/B
50
ID / A Tj / C = 25 150
BUK555-100A
2
VGS(TO) / V max.
40
typ.
30
1 min.
20
10
0 0 2 4 VGS / V 6 8
Fig.10. Gate threshold voltage. VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
ID / A SUB-THRESHOLD CONDUCTION
20
1E-01
1E-02
15
1E-03 2% typ 98 %
10
1E-04
1E-05
0 0 20 ID / A 40
2.4 2.2 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0
10000
1000
Ciss
-60
-20
20
60 Tj / C
100
140
180
10 0 20 VDS / V 40
Fig.12. Typical capacitances, Ciss, Coss, Crss. C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
April 1993
Rev 1.100
Philips Semiconductors
Product Specification
BUK555-100A/B
12 10 8 6 4 2 0
VGS / V
WDSS%
80
20 QG / nC
40
20
40
60
80
140
160
180
Fig.13. Typical turn-on gate-charge characteristics. VGS = f(QG); conditions: ID = 25 A; parameter VDS
IF / A BUK555-100A
50
+
40
VDD
L VDS
30
VGS
20 Tj / C = 150 10 25
0 RGS
0 0 1 VSDS / V 2
Fig.16. Avalanche energy test circuit. 2 WDSS = 0.5 LID BVDSS /(BVDSS VDD )
April 1993
Rev 1.100
Philips Semiconductors
Product Specification
BUK555-100A/B
3,7 2,8
5,9 min
15,8 max
3,0
13,5 min
1,3 max 1 2 3 (2x)
2,54 2,54
0,6 2,4
April 1993
Rev 1.100
Philips Semiconductors
Product Specification
BUK555-100A/B
This data sheet contains target or goal specifications for product development. This data sheet contains final product specifications.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. Philips Electronics N.V. 1996 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights.
April 1993
Rev 1.100
This datasheet has been download from: www.datasheetcatalog.com Datasheets for electronics components.