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MAR S U R F MAR S U R F XC 2 / XC 20 MARWI N

PC-BAS E D STATIONARY CONTOU R M EAS U R I NG STATION S

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Ma r S u r f. Su r fa ce m e tro l o gy

THE NEW GENERATION OF CONTOUR MEASUREMENT SYSTEMS.

EVEN MORE FLEXIBILITY WITH MARWIN
The latest information on MarSurf products
can be found on our website:
w w w . m a h r . c o m , We b C o d e 15 8

It is becoming increasingly necessary in production metrology to ensure fast and simple measurement of workpiece profiles.
Measurement tasks are varied and call for ever greater precision and optimal measuring strategies for the entire system. We are
therefore delighted to be able to present the MarWin-based MarSurf XC 20 / MarSurf XC 2 contour measurement and evaluation
system. Decades of experience in contour metrology and numerous requests and information from our customers have shaped
this new generation of devices. What started over 30 years ago with the Conturograph consisting of a drive unit and x-y plotter
for drawing contours and comparing with templates has today developed into a state-of-the-art contour measurement system
with the very latest technology. This covers the entire measuring station, consisting of a measurement and evaluation system,
drive unit, probe, measuring stand, and equipment table. With MarSurf XC 20 und MarSurf XC 2, you are assured top quality and
reliability. We wish you every success and hope you enjoy your Mahr measurement technology.
 +

Ma rSu rf. Sur fa c e m et ro l o g y

MarSurf XC 2 / XC 20

PC -b a s e d St ationary Contour M easuring St ations 4

Ma rSu rf XC 2 5
Ma rSu rf XC 20 8
Ma rSu rf XC 20 CN C 12
Ma rSu rf XC R 20 13
Ma rSu rf LD 120 14
Ma rSu rf X P 20 CN C 16

Ma rWin . S o ft ware 17
C a lib ra tio n S oftware 21
Ma rSu rf. C o ntour Probes and Stylus Tips 22
Ma rSu rf. Twi n Stylus 23
Ma rSu rf. Sty lus Tip Pass 24
Ma rSu rf. Me asuring St ands 25
A cce s s o rie s 27
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4 Ma r S u r f. Su r fa ce m e tro l o gy

MarSurf. PC-based Stationary Contour Measuring Stations

VERSATILE, HIGH-PERFORMANCE UNITS FOR INSPECTION ROOM AND PRODUCTION
Measuring and evaluating geometries of workpieces and tools that are relevant for correct functioning is one of the primary
requirements of research, technology, and industry. The tried-and-tested 2D contour measuring system is increasingly winning
out over other systems, as it is fast, simple, and cost-effective compared to other methods. An evaluation can be produced in a
fast and user-friendly form from a measured profile that delivers reliable results in the face of ever greater demands in terms of
accuracy and evaluation criteria.

WOR KPI ECE M EAS U R E M E NT R E S U LT

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Ma rSu rf. Sur fa c e m et ro l o g y 5

MarSurf XC 2

Measuring contours made easy

Description Performs nominal/actual comparisons

Tolerance monitoring
The MarSurf XC 2 provides you with everything you need to move Automatic program runs
into Mahrs top-flight contour metrology. This PC-based unit sup- Imports profile data, e.g. DXF files (option)
plies all the required contour measurement and evaluation features
both in the inspection room and on the shop floor. These are just a few examples of the large range of functions of
Clear, well-arranged icons and straightforward aids to operation the MarSurf XC 2.
make this practical product easy to use. The MarSurf XC 2 is the Different user levels protect against operator error and ensure that
fruit of decades of contour metrology experience combined with no unauthorized operators are able to use the device.
up-to-the-minute, forward-looking technology.
MarSurf XC 2 is Mahrs future-focused contour evaluation soft-
ware.

Features
Features of the contour measuring software are as follows:

Creates regression straight lines and circles

Creates points, intersection points, free points,
center points, maximum points and minimum points
Creates coordinate systems
Determines radii, distances, angles, coordinates,
and line form deviations
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6 Ma r S u r f. Su r fa ce m e tro l o gy

MarSurf XC 2

The easy introduction to contour measurement

During the first few operating steps, users learn about the benefits
of logical and straightforward handling of the unit. A wide
selection of various probe arms and stylus tips are available for
external and internal measurements.

Fast probe arm exchange without the need for tools is ensured by
the magnetically supported probe arms. The stored calibration data
is available for each probe arm that has been calibrated.

Setting up the measuring station and an initial measurement are

fast and straightforward. Mapping the measuring station by repre-
senting axis positions accelerates the setup process considerably.
All measuring conditions are selected in the "Measuring assistant
menu, enabling targeted measurement.

A start point to end point measurement function facilitates the

start of the first measurement. The path of the profile is displayed
on the screen during measurement.

Evaluation can be performed immediately after measurement.

Storing the profile data, evaluation, results, and the entire program
as a QE (Quick & Easy) offer the possibility of permanent docu-
mentation. A complete record with the key text and evaluation
contents is entered in the Measuring record menu by the
operator.

Description MarSurf XC 2 means you measure:

Simply
Quickly
The MarSurf XC 2 gives you everything you need to perform all Reliably
standard measurement tasks in contour metrology. Straightforward
and fast operation combined with peak performance.

MarSurf XC 2 Measuring Station

MarSurf XC 2 6268355
Consisting of:
MidRange Standard control unit
MarSurf XC 2 software (MarWin-based)
PC
Windows XP country package 62682xx
17 TFT monitor 5460041
Printer 5460030
USB cable 3018232
MCP 23 manual control panel (standard) 7035195
CD 120 drive unit 6720812
MarSurf ST 500 measuring stand
with 700 mm x 550 mm (27.56 in x 21.65 in) granite plate 6710250
PCV 200/CD 120 mount 6851362
CT 120 XY table 6710529
Rotary attachment for CT 120 6710547
Contour 2 calibration set (standard) 6820124
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Ma rSu rf. Sur fa c e m et ro l o g y 7

MarSurf XC 2

XC 2 with CD 120 drive unit and ST 500 or ST 750

measuring stand The CD 120 contour drive unit is a key component of the meas-
uring station. Precise calculation of radii, distances, angles, and
straightness largely depends on the quality and technical properties
of the drive unit. The quiet drive, combined with the software-
supported error correction, ensures reproducible measurements
with a high vertical and horizontal resolution.

ST 500 Measuring Stand (optionally ST 750)

Granite plate measuring 700 mm 550 mm (27.56 in x 21.65 in)

(L W) with three 10 mm (0.39 in) T-grooves
Measuring column with motorized vertical adjustment over range
of 500 mm (19.69 in) for the drive unit

Technical Data

Traversing length (in X) 0.2 mm to 120 mm (0.0079 in x 4.72 in)

Measuring range (in Z) 50 mm (1.97 in) for 350 mm (13.78 in) probe arm
25 mm (0.98 in) for 175 mm (6.89 in) probe arm
Measuring system (in X) Highly accurate incremental measuring system
(factory calibration with laser interferometer)
Measuring system (in Z) Inductive transducer* featuring high accuracy and linearity
Resolution (in Z) relative to stylus tip 0.38 m (15 in) for 350 mm (13.78 in) probe arm
0.19 m (7.5 in) for 175 mm (6.89 in) probe arm
Resolution (in Z) relative to measuring system 0.04 m (1.6 in)
Guide deviation < 1 m (40 in) (over 120 mm (4.72 in))
Measuring direction (in X) Forwards (+X), backwards (-X)
Contacting direction (in Z) Downwards (-Z), upwards (+Z)
Measuring force (in Z) 1 mN to 120 mN, downwards and upwards
(adjustable in MarSurf XC 2)
Tracing angle On smooth surfaces, depending on the deflection:
trailing edges to 88, rising edges to 77
Measuring speed (in X) 0.2 mm/s to 4 mm/s (0.0079 in/s to 0.16 in/s)
Contacting speed (in Z) 0.1 mm/s to 1 mm/s (0.0039 in/s to 0.039 in/s)
Positioning speed (in X)
and return travel speed 0.2 mm/s to 8 mm/s (0.0079 in/s to 0.31 in/s)
Positioning speed (in Z) 0.2 mm/s to 10 mm/s (0.0079 in/s to 0.39 in/s)
Probe arm length 175 mm (6.89 in), 350 mm (13.78 in)
Stylus tip radius 25 m (0.00098 in)

* patented
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8 Ma r S u r f. Su r fa ce m e tro l o gy

MarSurf XC 20

High-performance contour measurement

Windows XP Professional country package en 62682xx

Description 17 TFT monitor 5460041
Printer 5460030
The MarSurf XC 20 significantly expands the range of functions USB cable 3018232
as compared to the MarSurf XC 2 measuring station described MCP 23 manual control panel (standard) 7035195
earlier. The measuring station displayed above shows the PCV 200 6720810
MarSurf XC 20 system with the PCV 200 drive unit and ST 500 MarSurf ST 500 measuring stand with 700 mm x 550 mm
measuring stand. (27.56 in x 21.65 in) granite plate 6710250
Decades of experience in contour metrology is put into practice PCV 200/CD 120 mount 6851362
with the MarSurf XC 20. Complex contour measurement tasks are CT 200 XY table 6710530
achieved from all areas. Contour 2 calibration set (standard) 6820124

Features PCV 200 Drive Unit

The PCV 200 drive unit features a measuring length of 200 mm Traversing length 1 mm to 200 mm (0.039 in to 7.87 in)
(7.87 in) and a 50 mm (1.97 in) stroke. Countless additional soft- Measuring range (in Z) 50 mm (1.97 in)
ware functions are supported as compared to the MarSurf XC 2
(see table on page 11). These include: The versatile probe arm and stylus tip range for various tasks also
Sections includes the twin stylus (see page 23), which, using multiple meas-
An unlimited number of sections can be displayed. Each section is urement, enables an upper and lower profile of a workpiece to be
shown as a separate field in the record. measured without changing the probe arm.

Measurement using a twin stylus

Opposing profiles, e.g. in bores but also in external geometries, can
be measured using the twin stylus. Both opposing profiles can be ST 500 Measuring Stand
evaluated as standard with XC 20 software, thereby also enabling
dimensions to be calculated that relate to the relationship between Granite plate measuring 700 mm 550 mm (27.56 in x 21.65 in)
both profiles. (L W) with three 10 mm (0.39 in) T-grooves
Measuring column with motorized vertical adjustment
MarSurf XC 20 Measuring Station over range of 500 mm (19.69 in) for the drive unit
Easily exchangeable mounts
The measuring stand incorporates a manual mechanical angle
MarSurf XC 20 6268360 adjuster for the drive unit
consisting of
MidRange Standard control unit
MarSurf XC 20 software (MarWin-based)
PC
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Ma rSu rf. Sur fa c e m et ro l o g y 9

MarSurf XC 20

PCV 200 contour drive unit

Advantages

Automatic lifting and lowering of the probe arm with adjustable

speed
Measuring force of 1 mN to 120 mN
High positioning speed
Patented probe arm mount with tool-free, reproducible probe
arm exchange
Collision protection
Outstanding dynamics thanks to rigid design and use of new
materials
Selection of various positioning and measuring speeds
No control elements on the drive unit
reliable results
Exchangeable probe arms for optimal adjustment to measurement tasks

Technical Data

Traversing length (in X) 0.2 mm to 200 mm (0.0079 in to 7.87 in)

Measuring range (in Z) 50 mm (1.97 in) for 350 mm (13.78 in) probe arm
25 mm (0.98 in) for 175 mm (6.89 in) probe arm
Measuring system (in X) Highly accurate incremental measuring system
(factory calibration with laser interferometer)
Measuring system (in Z) Inductive transducer* featuring high accuracy and linearity
Resolution in Z relative to stylus tip 0.38 m (15 in) for 350 mm (13.78 in) probe arm
0.19 m (7.5 in) for 175 mm (6.89 in) probe arm
Measuring point distance (in X) 1.0 m to 8.0 m (40 in to 315 in)
Resolution (in Z) relative to measuring system 0.04 m (1.6 in)
Guide deviation < 1 m (40 in) (over 200 mm (7.87 in))
Measuring force (in Z) 1 mN to 120 mN, downwards and upwards
(adjustable in MarSurf XC 20)
Tracing angle On smooth surfaces, depending on the deflection:
Trailing edges to 88, rising edges to 77
Measuring speed (in X) 0.2 mm/s to 4 mm/s (0.0079 in/s to 0.16 in/s),
adjustable in 0.1 mm/s (0.0039 in/s) steps
Contacting speed (in Z) 0.1 mm/s to 1 mm/s (0.0040 in/s to 0.039 in/s), adjustable
Positioning speed (in X)
and return travel speed 0.2 mm/s to 8 mm/s (0.0079 in/s to 0.31 in/s)
Positioning speed (in Z) 0.2 mm/s to 10 mm/s (0.0079 in/s to 0.39 in/s)
Probe arm length 175 mm (6.89 in), 350 mm (13.78 in)
Stylus tip radius 25 m (0.00098 in)

* patented
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10 Ma r S u r f. Su r fa ce m e tro l o gy

MarSurf XC 2/ XC 20. Configuration of a Standard Measuring Station

MarSurf XC 2 measuring station

MarSurf XC 20 measuring station

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Ma rSu rf. Sur fa c e m et ro l o g y 11

MarSurf XC 2/ XC 20. Configuration of a Standard Measuring Station

The advantages of MarWin technology extend beyond software-related solutions to the

entire coordinated measuring station concept, e.g. control unit, control elements and many
other items. For a standard measuring station or a 7-axis CNC measuring station, all manner
of solutions are possible with the fully coordinated MarWin technology. DRIVE UNIT

PCV 200
(CD 120)

M EAS U R I N G
STA N D
PC CO N TR O L U N IT
ST 500
WINDOWS XP MidRange Alternatively:
Standard ST 750
XC 20 (XC 2) USB 2.0
software
MANUAL
CONTROL PANEL

MCP 23
Alternatively:
MCP 21

XC 2 / XC 20 Systems. The Key Features

MarSurf XC 2 MarSurf XC 20
Drive unit connection CD 120 PCV 200 / LD 120
Creation of sections - 9
Twin stylus - 9
Measuring assistant Reduced, simplified version 9
DXF import function As an option via license 9
Surface profile and parameters - 9
Multiple measurement - 9
Operating sequence - 9
Tolerance zone 1 tolerance zone Unlimited number
Can be extended to XCR 20 - 9
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12 Ma r S u r f. Su r fa ce m e tro l o gy

MarSurf XC 20 CNC

Automates measurement with several axes

Description

The XC 20 CNC measuring station can be connected to the

ST 750 CNC measuring stand and other additional axes to be
controlled, e.g. for workpiece positioning.
The measuring assistant can be used to set measuring conditions
such as positioning movements before or after the measurement.
Operators can complete their measurement tasks quickly and sim-
ply thanks to the clear, comprehensive layout. The MCP 21 manual
control panel allows quick and easy joystick-based axis control.

Scope of Delivery

Depends on the relevant configuration.

Configuration of an XC 20 CNC Measuring Station

DRIVE UNIT

PCV 200

PC CO N T R O L U N IT

WINDOWS XP MidRange M EAS U R I N G

CNC STA N D
Software
XC 20 CNC ST 750 CNC
Alternatively:
ST 500 CNC

A D D IT I O NA L
AXIS

MANUAL e.g. Y table

CONTROL PANEL

MCP 21
or
MCP 23
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Ma rSu rf. Sur fa c e m et ro l o g y 13

Other PC-based Measuring Stations. MarSurf XCR 20

The new generation of combined roughness and contour measurement systems

Description Versions

The MarSurf XCR 20 is ideal for combining contour and rough- Combi-measuring station with one measuring stand and two
ness depth evaluation. drive units (PCV 200 and GD 25)
MarSurf XC 20 + MarSurf XR 20 = MarSurf XCR 20
The MarSurf LD 120 measuring station enables high-precision
This system includes absolutely everything you need, saving both
contour and roughness evaluation on components
time and space. There are separate operating levels for the rough-
ness-depth and contour programs. The MarSurf XCR 20 is Mahrs
top surface measurement system.
MarSurf XCR 20 Measuring Station
MarSurf XCR 20 standard consisting of:

Features PC and MidRange Standard control unit Order no. 6268380

Windows XP Professional country package en Order no. 62682XX
17 TFT monitor Order no. 5460041
Saves space because both drive units (PCV 200 contour drive Printer Order no. 5460030
unit and GD 25 roughness drive unit) can be adapted using the USB cable Order no. 3018232
corresponding combi-mount on the ST 500 or ST 750 measuring MCP 23 Order no. 7035195
stand GD 25 Order no. 6721006
MFW-250 Order no. 6111404
High-precision contour and roughness evaluation with the PCV 200 Order no. 6720810
MarSurf LD 120 measuring system on components requiring a Contour 2 calibration set (standard) Order no. 6820124
large stroke and very high resolution MarSurf ST 500 measuring stand with
700 mm x 550 mm (27.56 x 21.65 in) granite plate
Option of rapidly changing between roughness and contour Order no. 6710250
GD 25/PCV 200 combi-mount Order no. 6851369
measurements, realized through straightforward changeover
CT 200 XY table Order no. 6710530
within the software and changing of the mechanical components
such as the drive unit and probe Note: It is possible to upgrade the MarSurf XR 20 measuring
station to a MarSurf XCR 20.
The CT 200-MOT Y-drive and XT 20 topography software option
make it expandable into a topography measuring station.
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14 Ma r S u r f. Su r fa ce m e tro l o gy

Other PC-based MarSurf Measuring Systems. MarSurf LD 120

MarSurf LD 120. Two in one. Contour and roughness depth in a single stroke

Software can be used to set measuring forces from 0.5 to 30 mN

which remain constant over the entire measuring stroke, thus
ensuring flexibility and reliability. You can select the optimum
measuring force to match the material characteristics of the
workpiece and the probe arm of your choice.

Probe arms changed without re-calibration. Storage of calibration

data for each probe arm and the magnetic probe mount ensure
high reproducibility.

For further information, please see the MarSurf LD 120 catalog.

Description

The MarSurf LD 120 is the high-quality, high-precision contour

and roughness measuring station with integrated optical
measuring system.

It performs roughness and contour evaluations in a single stroke.

To complete both these measurement tasks with a single measure-
ment, you need a high-precision measuring system that supports
both the relatively large measuring stroke for the contour in radii,
on slopes or in free form areas and a resolution in the nm range
for the roughness depth measurement.

Features

The magnetic probe mount ensures flexibility by supporting a

wide range of probes that can be easily exchanged, while
maintaining a high level of reliability

Positioning accuracy when exchanging probes in the m range

and collision protection, rigidity, and stability of the probes for
resolutions in the nm range

Reliable results thanks to a calibration procedure specially geared

to high accuracy
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Ma rSu rf. Sur fa c e m et ro l o g y 15

Other PC-based MarSurf Measuring Systems. MarSurf LD 120

MarSurf LD 120 with ST 500 Measuring Stand

MarSurf XC 20 consisting of: 6268362

MidRange LD 120 control unit
MarSurf XC 20 software (MarWin-based)
PC
Windows XP Professional country package en 62682xx
17 TFT monitor 5460041
MCP 21 (advanced) 7033935
LD 120 drive unit incl. probe system 6720814
Contour 1 calibration standard for MarSurf LD 120,
class 1 accuracy 6820121
CT 200 XY table 6710530
MarSurf ST 500 measuring stand with
700 mm x 550 mm (27.56 in x 21.65 in) granite plate 6710250
Damping elements set 6851368
Printer 5460030
USB cable 3018232
LD 120 mount 6851360
Mapping of various probes for MarSurf LD 120

Technical Data

Traversing length (in X) 0.1 mm to 120 mm (0.0039 in to 4.72 in)

Measuring range (in Z) 10 mm (0.39 in) with 100 mm (3.94 in) probe arm (standard)
20 mm (0.79 in) with 200 mm (7.87 in) probe arm
Measuring system Interference optical measuring system
Standard stylus tip LD A14-10-2, diamond 2 m (79 in), 90
and LD A-14-10-500 (contour)
Resolution in Z 2 nm (0.08 in)
Horizontal measuring axis Glass scale
Measuring point distance in X 0.05 m to 1 m (20 in to 40 in)
Contacting force 0.5 mN to 30 mN (adjustable via software)
Measuring speed 0.1 mm/s to 2.0 mm/s (0.0039 in/s to 0.079 in/s)
in 0.1 mm/s (0.0039 in/s) steps for contour measurement
0.1 mm/s to 0.5 mm/s (0.0039 in/s to 0.020 in/s)
for roughness measurement
Return travel speed and
positioning speed in X-direction Up to 4 mm/s (0.16 in/s)
Guide deviation 0.12 m/20mm (4.72 in/0.79 in)
0.25 m/60 mm (9.84 in/2.36 in)
0.4 m/120 mm (15.75 in/4.72 in)
Angle measurement u95 < 0.5
Radius measurement u95 = 0.01 % of nominal value for R 12.5 mm (0.49 in)
Distance measurement (1+L/100) m
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16 Ma r S u r f. Su r fa ce m e tro l o gy

CNC Measuring Stations. MarSurf XP 20

CNC measuring station with LD 120 and integrated rotary table for
high-precision measurement of contour and roughness depth
measuring tasks.

CNC measuring station with MarSurf LD 120 and TWE probe arm Automatically changing the probe arm enables the CNC measuring
changer. run to be performed without interruption, thus saving you time.
Components with many different measurement characteristics can
be measured particularly well in this measuring station configura-
tion.
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Ma rSu rf. Sur fa c e m et ro l o g y 17

MarWin Software for MarSurf XC 2 / XC 20

Decades of application-based experience in the contour sector in combination with decades of experience in the production software
creates one of the most powerful contour measurement systems on the international market. On the basis of the MarWin software
platform created for Mahr system metrology, all opportunities for users are fulfilled for a performance class that goes far beyond the current
individual measuring task.

Standardized operating sequences in contour, roughness depth, topography, form

Modular software system enables other applications to be expanded at any time

Access to libraries that grow continuously

Different performance and operating levels From the simple "stand-alone XC 20 V.2.x version to the
professional XP 20 V2.x measuring station, everything is possible.
The XP solution opens the way up to the highest performance
level with the teach-in and editor modes. This version is particularly
interesting for CNC measuring stations and applications.

End-to-end hardware system for MarWin measuring stations MarWin-based measuring stations also mean integrated measuring
station components such as control units (MidRange), manual
control panels, and much more.

The MarWin philosophy: As simple as possible

As powerful as necessary

XC 20 and XC 2 software couple peak per-

formance with straightforward operation. For
MarEdit greater demands, expansion to a further level is
Everything is possible at any time.
possible

XP 20

Teach-in mode
Easy-to-learn, high-performance

XC 2 / XC 20

Simple operation
Click & Go
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18 Ma r S u r f. Su r fa ce m e tro l o gy

MarWin Software for MarSurf XC 2 / XC 20

MarWin-based software user benefits

Description

The user-friendly MarWin software platform features many dif-

ferent measuring and evaluation criteria. Standardized symbols,
operating sequences that are clearly structured even if applied dif-
ferently, and clear-cut assignment of user rights are just a few of
the many features making life easier for users.

It is possible to add further MarWin-based software applications

such as XR 20 or XT 20 at any time. Simple measuring station
displays showing the measuring setups axes make work quick and
easy.
The travel speed of the ST 500 / ST 750 measuring stand and of
the additional axes can be selected directly in 3 steps. To facilitate
zenith searches, the display area can be set to the optimal zoom.

Operation is made much easier thanks to easily recognizable icons.

As many users configure measuring runs in line with their
own priorities, icons can be selected as Preferences. The Help
function for the selected icon can be activated at any time.

Setting measurement conditions, positioning the probe in the

loading station and in the measuring position, and positioning
after measurement with all boundary conditions are all possible in
Measuring assistant view.

Multiple measurements, text information during a measurement

procedure, and many other features are supported in clear and
easy operating steps.
 +

Ma rSu rf. Sur fa c e m et ro l o g y 19

MarWin Software for MarSurf XC 2 / XC 20

Standard evaluation Line form evaluation

Fast and straightforward evaluation of geometrical basic elements Deviations of the actual geometry from the nominal geometry are
such as radii, angles, and distances to coordinate axes is made shown graphically with indication of the maximum deviation. The
possible without the slightest effort by means of tools from the preselected tolerance band shows at a glance whether the work-
action box. piece is inside or outside the tolerance.

Nominal/actual comparison Creation of auxiliary references

Comparing an actual profile to a nominal profile is one of the most Many technical drawings of workpieces contain dimensions that
demanding tasks in contour evaluation. In the example shown are not referenced solely to the visible edges but also to auxiliary
above, adaptation is performed in the profile section displayed. references. Creation of a parallel to a workpiece edge is shown in
Differences in dimensions can now be calculated that in this case this example.
reflect the wear and tear of a tool.
-

20 Ma r S u r f. S u rfa ce m e t rol og y

MarWin Software for MarSurf XC 2 / XC 20

Key information and control fields Documentation

Operators need an overview of all processes, particularly when per- All necessary text entries can be made in the Measuring record
forming complex measuring tasks with numerous evaluation steps. overview.
In the Operating sequence file card, they can see all individual
actions and change or delete these if required (XC 20 only).

Operating help Help

To also provide help to inexperienced operating staff at key stages Comprehensive help is available online to operators in each
of the measuring run, message texts supported by images can be operation. All key functions are described through texts and
shown at the necessary points. appropriate graphics.
 +

Ma rSu rf. Sur fa c e m et ro l o g y 21

MarSurf XC 2 / XC 20. Calibration

Calibration the basis for accurate results.

An intelligent calibration system enables measurements that are

accurate on a m scale. Geometry calibration, deflection, and mea-
suring force calibration are key elements. An easy-to-use measuring
program guides users easily and quickly through the calibration
steps. As soon as a probe arm is calibrated, the data is saved,
which means that, when changing probe arms,
calibration only needs to be performed once for each arm.

This standard is also suitable for calibrating the twin stylus.

Contour 1 calibration standard for MarSurf LD 120

Order no. 6820121

KN 100 contour standard

Order no. 6820125

A key benefit of CD 120 / PCV 200 / LD 120 probe arms is that The KN 100 contour standard is used for practical monitoring of
they can be changed without the need for tools, thanks to the use the measuring station. The standard contains the key geometrical
of the magnetic mount. The appropriate probe arms are therefore elements. The KN 100 is supplied with a DKD or Mahr certificate if
changed quickly and easily for different measuring tasks. required.

The calibration menu enables each probe arm to be calibrated and KN 100 DKD calibration Order no. 6980110
calibration data to be saved. Calibration is only necessary once for KN 100 Mahr calibration Order no. 9964316
each probe arm. No further calibration is required when changing
probe arms.
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22 Ma r S u r f. S u rfa ce m e t rol og y

MarSurf XC 2 / XC 20. Contour Probes and Stylus Tips

Wide selection of probe arms and stylus tips to solve various measuring tasks
 +

Ma rSu rf. Sur fa c e m et ro l o g y 23

Measurement Using a Twin Stylus

+Z measuring direction

-Z measuring direction

Measuring contours above and below

Many workpiece geometries require contour measurements in the
opposing direction.
With MarSurf XC 20 and the PCV 200 or LD 120 drive unit, this
measuring task is perfectly solved. The following properties are
basic requirements for this complex measurement task:

Switching measuring force

Calibrating a twin stylus
Saving multiple profiles
Evaluating multiple profiles
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24 Ma r S u r f. S u rfa ce m e t rol og y

MarSurf XC 2 / XC 20. Stylus Tip Pass

Only Mahr Stylus Tips Ensure You Measure Correctly

If you want high-quality workpieces, you have to be able to rely on the results of your contour measurement system. Stylus tips for
contour measuring instruments are absolute precision spare parts.

Only stylus tips with the original Mahr logo give you the measurement reliability that is vital for your workpieces. Use this pass and
immediately take advantage of lower prices when buying replacement contour stylus tips.

Benefit from the stylus tip pass from Mahr:

Measure with original tips
Full guarantee for the measuring station
Regular visual checks of stylus tips
Mahr service whenever you need it
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Ma rSu rf. Sur fa c e m et ro l o g y 25

Measuring Stands

ST 500 / 750 / 750 CNC measuring stands Measuring stand combinations

The MarSurf ST 500, ST 750 and ST 750 CNC measuring stands provide everything you ST 500 complete Order no. 6710250
need for a perfect surface measuring station. Decades of experience in surface metrology including granite plate,
500 mm (19.69 in) travel
have gone into this new design along with core expertise relating to vibration, smooth run-
Plate size in mm 700 x 550 x 90
ning and accommodation of environmental influences, thereby providing perfect conditions (27.56 in x 21.65 in x 3.54 in)
for a high-quality surface measuring station for roughness and contour measurements.
ST 500 column Order no. 6851350
Straightforward clamping of accessories with set of 10 mm (0.39 in) clamping slots
ST 750 complete Order no. 6710251
Straightforward installation. Quick-action clamping device thanks to eccentric clamp
including granite plate,
60 mm (2.36 in) adjustment in Y-direction 750 mm (29.53 in) travel
Plate size in mm 700 x 550 x 90
Optional: (27.56 in x 21.65 in x 3.54 in)
Damping elements set to absorb environmental vibrations
A centralized air supply allows controlled filling and refilling of the damping elements ST 750 column Order no. 6851351

Granite plate Order no. 6710580

Plate size in mm 1000 x 550 x 90

(39.37 in x 21.56 in x 3.54 in)

ST 500 CNC / HZ column

Order no. 6851392

ST 500 CNC / HZ+HB column

Order no. 6851393
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26 Ma r S u r f. S u rfa ce m e t rol og y

Measuring Stand Accessories

Mounts for ST 500 Measuring Stand

LD 120 Order no. 6851360

PGK 120 / GD 120 CNC Order no. 6851361
PCV 200 / CD 120 Order no. 6851362
GD 25 (PGK 20) standard mount Order no. 6851363
GD 25 (PGK 20) tube mount Order no. 6851364
GD 25 / PCV 200 combi-mount Order no. 6851369

Fixed mount for: PGK 20 / GD 25

6851364
Part to be removed for
the fixed mounts Exchangeable mounts for:
PGK 120 / GD 120 CNC PCV 200 / CD 120

6851361 6851362

LD 120

6851360

PGK 20 / GD 25

6851363
Combi-mount for:
PGK 20 or GD 25
with PCV 200

6851369

MarSurf. Damping Set (not illustrated) Manual Control Panels

Damping set for workpieces of 0 kg to 100 kg (0 lbs to 220 lbs). MCP 23 Order no. 7035195
MarSurf damping set 1 consists of: with emergency stop function and release button
4 pneumatic-spring elements
Supply line kit MCP 21 Order no. 7039135
Air pump (with pressure gage) With emergency stop function, release button,
Load capacity: 20 kg to 60 kg (44 lbs to 132 lbs) x 4 units = touchscreen and
80 kg to 240 kg (176 lbs to 528 lbs) joystick
Weight of granite plate + column: 80 kg + 50 kg = 130 kg
(176 lbs + 110 lbs = 286 lbs)
Max. permissible workpiece weight: approx. 100 kg (220 lbs)

Order no. 6851368

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Ma rSu rf. Sur fa c e m et ro l o g y 27

Accessories

PP V-block unit PPS parallel vise CT 120 XY table

Order no. 6710401 Order no. 6710604 Order no. 6710529

with four different V-blocks to mount for clamping workpieces. for mounting and aligning workpieces.
rotary parts for test diameters from 1 mm Can be moved 15 mm (0.59 in) in each of
to 160 mm (0.039 in to 6.30 in), including Jaw width: 70 mm (2.76 in) two coordinates.
tension springs to clamp lightweight work- Jaw height: 25 mm (0.98 in) Table surface: 120 mm x 120 mm
pieces in the V-block. Span: 40 mm (1.57 in) (4.72 in x 4.72 in),
Total height: 58 mm (2.28 in) with two quick-release jaws
Dimensions: 80 mm x 100 mm x 40 mm Weight: 2 kg (4.4 lbs)
(3.15 in x 3.94 in x 1.57 in) Option: Rotary attachment for CT 120
Weight: 1.5 kg (3.3 lbs) Order no. 6710547

PKS ball vise CT 200 XY table Equipment table

Order no. 6710610 Order no. 6710530 Order no. 6830139

This item is based on the above PPS Comes with versatile clamping options with continuous plate, PC base unit on left
parallel vise. The ball-and-socket joint can 3 clamping slots (6 mm (0.24 in)), 4 M5 and drawer unit on right
be swiveled precisely in any required threaded bores and 2 quick-release jaws.
direction and rotated about 360. Clamping area 200 mm x 200 mm Dimensions (L x W x H):
(7.87 in x 7.87 in) (option of extending to 1710 mm x 870 mm x 750 mm
Total height: 150 mm (5.91 in) 400 mm x 400 mm (15.75 in x 15.75 in) (67.32 in x 34.25 in x 29.53 in).
Weight: 3.5 kg (7.7 lbs) with an adapter plate). Max. load capacity: 250 kg (550 lbs)
XY adjustment by 25 mm (0.98 in) each,
using micrometer screws.
C-axis can be adjusted by 2.5 for high-
precision alignment of parts.
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WWW.MAH R.COM

3759691-23.01.2008

Mahr GmbH Gttingen

by Mahr GmbH, Gttingen
Postfach 1853, D-37008 Gttingen; Carl-Mahr-Str. 1, D-37073 We reserve the right to make changes to our products, especially due
Gttingen; Phone: +49 (551) 707 30, Fax +49 (551) 710 21; to technical improvements and further developments.
eMail: info@mahr.com All illustrations and technical data are therefore without guarantee.