BS en Iso 22232-2-2020 PDF

BS EN ISO 22232‑2:2020
BSI Standards Publication
Non-destructive testing — Characterization and

verification o f ultrasonic test equipment
Part 2: Probes
BS EN ISO 22232‑2:2020 BRITISH STANDARD
National foreword
This British Standard is the UK implementation of EN ISO 22232‑2:2020.
It is identical to ISO 22232‑2:2020. It supersedes BS EN 12668‑2:2010,
which is withdrawn.
The UK participation in its preparation was entrusted to Technical
Committee WEE/46/3, Ultrasonic Testing.
A list of organizations represented on this committee can be obtained on
request to its committee manager.
This publication does not purport to include all the necessary provisions
of a contract. Users are responsible for its correct application.
© The British Standards Institution 2020
Published by BSI Standards Limited 2020
ISBN 978 0 580 99295 7
ICS 19.100
Compliance with a British Standard cannot con fer immunity from
legal obligations.
This British Standard was published under the authority of the
Standards Policy and Strategy Committee on 31 October 2020.
Amendments/corrigenda issued since publication

Date Text affected
EUROPEAN STANDARD EN ISO 22232‑2
NORME EUROPÉENNE
EUROPÄISCHE NORM September 2020
I CS 1 9 .1 0 0 Supersedes EN 1 2 668‑2 : 2 01 0
English Version
Non‑destructive testing ‑ Characterization and

verification of ultrasonic test equipment ‑ Part 2: Probes
(ISO 22232‑2:2020)
Essais non destructifs ‑ Caractérisation et Zerstörungsfreie Prüfung ‑ Charakterisierung
vérification de l'appareillage de contrôle par und Verifizierung der Ultraschall-Prü fausrüstung
ultrasons ‑ Partie 2: Traducteurs (ISO 22232‑2:2020) - Teil 2: Prüfköp fe (ISO 22232-2:2020)
This European Standard was approved by CEN on 21 September 2020.
CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving
this European Standard the status of a national standard without any alteration. Up‑to‑date lists and bibliographical
references concerning such national standards may be obtained on application to the CEN‑CENELEC Management Centre
or to any CEN member.
This European Standard exists in three o fficial versions (English, French, German) . A version in any other language
made by translation under the responsibility o f a CEN member into its own language and notified to the CEN-CENELEC
Management Centre has the same status as the o fficial versions.
CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark,
Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta,
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION

COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
CEN‑CENELEC Management Centre: Rue de la Science 23, B‑1040 Brussels
© 2 02 0 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 2 2 2 3 2 ‑2 : 2 02 0: E
worldwide for CEN national Members
BS EN ISO 22232‑2:2020
EN ISO 22232‑2:2020 (E)
European foreword
This document (EN ISO 22232‑2:2020) has been prepared by Technical Committee ISO/TC 135 "Non‑
destructive testing" in collaboration with Technical Committee CEN/TC 138 “Non‑destructive testing”
the secretariat of which is held by AFNOR.
This European Standard shall be given the status of a national standard, either by publication of an
identical text or by endorsement, at the latest by March 2021, and conflicting national standards shall
be withdrawn at the latest by March 2021.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN 12668‑2:2010.
According to the CEN‑CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic
of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the
United Kingdom.
Endorsement notice
The text of ISO 22232‑2:2020 has been approved by CEN as EN ISO 22232‑2:2020 without any
modification.
ii
BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Contents Page
Foreword .......................................................................................................................................................................................................................................... v
1 Scope ................................................................................................................................................................................................................................. 1
2 Normative re ferences ...................................................................................................................................................................................... 1
3 Terms and definitions ..................................................................................................................................................................................... 1
4 Symbols .......................................................................................................................................................................................................................... 3
5 General requirements o f con formity .............................................................................................................................................. 4
6 Technical information for probes ....................................................................................................................................................... 5
6.1 General ........................................................................................................................................................................................................... 5
6.2 Probe data sheet .................................................................................................................................................................................... 5
6.3 Probe test report ................................................................................................................................................................................... 5
7 Test equipment....................................................................................................................................................................................................... 7
7.1 Electronic equipment ........................................................................................................................................................................ 7
7.2 Test blocks and other equipment............................................................................................................................................ 7
8 Performance requirements for probes ...................................................................................................................................... 15
8.1 Physical aspects ................................................................................................................................................................................... 15
8.1.1 Procedure ............................................................................................................................................................................ 15
8.1.2 Acceptance criterion .................................................................................................................................................. 15
8.2 Pulse shape, amplitude and duration ............................................................................................................................... 15
8.2.1 Procedure ............................................................................................................................................................................ 15
8.3 Frequency spectrum and bandwidth ................................................................................................................................ 17
8.3.1 Procedure ............................................................................................................................................................................ 17
8.3.2 Acceptance criteria ..................................................................................................................................................... 17
8.4 Pulse‑echo sensitivity .................................................................................................................................................................... 17
8.4.1 Procedure ............................................................................................................................................................................ 17
8.5 Distance‑amplitude curve .......................................................................................................................................................... 18
8.5.1 General ................................................................................................................................................................................... 18
8.5.2 Procedure ............................................................................................................................................................................ 18
8.6 Beam parameters for immersion probes ...................................................................................................................... 20
8.6.1 General ................................................................................................................................................................................... 20
8.6.2 Beam profile — Measurements performed directly on the beam ...................................... 21
8.6.3 Beam profile — Measurements made using an automated scanning system .......... 28
8.7 Beam parameters for straight‑beam single‑transducer contact probes ............................................ 30
8.7.1 General ................................................................................................................................................................................... 30
8.7.2 Beam divergence and side lobes ..................................................................................................................... 31
8.7.3 Squint angle and offset for straight‑beam probes ............................................................................ 32
8.7.4 Focal distance (near field length) ................................................................................................................... 33
8.7.5 Focal width ......................................................................................................................................................................... 33
8.7.6 Length of the focal zone .......................................................................................................................................... 34
8.8 Beam parameters for angle‑beam single‑transducer contact probes .................................................. 34
8.8.1 General ................................................................................................................................................................................... 34
8.8.2 Index point ......................................................................................................................................................................... 34
8.8.3 Beam angle and beam divergence.................................................................................................................. 35
8.8.4 Squint angle and offset for angle‑beam probes .................................................................................. 38
8.8.5 Focal distance (near field length) ................................................................................................................... 41
8.8.6 Focal width ......................................................................................................................................................................... 42
8.8.7 Length of the focal zone .......................................................................................................................................... 42
8.9 Beam parameters for straight‑beam dual‑transducer contact probes ................................................ 43
8.9.1 General ................................................................................................................................................................................... 43
8.9.2 Delay line delay path ................................................................................................................................................. 43
© ISO 2020 – All rights reserved iii

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.9.3 Focal distance .................................................................................................................................................................. 43

8.9.4 Axial sensitivity range (focal zone) ............................................................................................................... 43
8.9.5 Lateral sensitivity range (focal width) ....................................................................................................... 44
8.10 Beam parameters for angle‑beam dual‑transducer contact probes ...................................................... 45
8.10.1 General ................................................................................................................................................................................... 45
8.10.2 Index point ......................................................................................................................................................................... 45
8.10.3 Beam angle and profiles ......................................................................................................................................... 45
8.10.4 Wedge delay path ......................................................................................................................................................... 46
8.10.5 Distance to sensitivity maximum (focal distance) ........................................................................... 46
8.10.6 Axial sensitivity range (length of the focal zone) .............................................................................. 46
8.10.7 Lateral sensitivity range (focal width) ....................................................................................................... 47
8.11 Crosstalk .................................................................................................................................................................................................... 47
8.11.1 Procedure ............................................................................................................................................................................ 47
Annex A (normative) Calculation o f the near field length o f non‑ focusing probes ........................................... 48
Annex B (informative) Calibration block for angle‑beam probes ....................................................................................... 51
Annex C (informative) Determination o f delay line and wedge delays .......................................................................... 54
Bibliography ............................................................................................................................................................................................................................. 55
iv © ISO 2020 – All rights reserved

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non‑governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development o f the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation o f the voluntary nature o f standards, the meaning o f ISO specific terms and
expressions related to con formity assessment, as well as in formation about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www.iso.
org/iso/foreword.html.
This document was prepared by Technical Committee ISO/TC 135, Non-destructive testing , Subcommittee
SC 3, Ultrasonic testing, in collaboration with the European Committee for Standardization (CEN)
Technical Committee CEN/TC 138, Non-destructive testing, in accordance with the Agreement on
technical cooperation between ISO and CEN (Vienna Agreement).
A list of all parts in the ISO 22232 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.
© ISO 2020 – All rights reserved v

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BS EN ISO 22232‑2:2020
INTERNATIONAL STANDARD ISO 22232‑2:2020
Non-destructive testing — Characterization and

verification o f ultrasonic test equipment —
Part 2:
Probes
1 Scope
This document specifies the characteristics o f probes used for non-destructive ultrasonic testing in the
following categories with centre frequencies in the range of 0,5 MHz to 15 MHz, focusing or without
focusing means:
a) single‑ or dual‑transducer contact probes generating longitudinal and/or transverse waves;
b) single‑transducer immersion probes.
Where material-dependent ultrasonic values are specified in this document they are based on
steels having a sound velocity of (5 920 ± 50) m/s for longitudinal waves, and (3 255 ± 30) m/s for
transverse waves.
This document excludes periodic tests for probes. Routine tests for the verification o f probes using on-
site procedures are given in ISO 22232‑3.
I f parameters in addition to those specified in ISO 22232-3 are to be verified during the probe’s li fe
time, as agreed upon by the contracting parties, the procedures o f verification for these additional
parameters can be selected from those given in this document.
This document also excludes ultrasonic phased array probes, therefore see ISO 18563‑2.
2 Normative re ferences
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 5577, Non-destructive testing — Ultrasonic testing — Vocabulary
ISO 7963, Non-destructive testing — Ultrasonic testing — Specification for calibration block No. 2
ISO 22232‑1, Non-destructive testing — Characterization
and verification of ultrasonic test equipment —
Part 1: Instruments
ISO/IEC 17050‑1, Con formity assessment — Supplier's declaration o f con formity — Part 1: General
requirements
3 Terms and definitions

For the purposes o f this document, the terms and definitions given in ISO 5577 and the following apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https://www.iso.org/obp
— IEC Electropedia: available at http://www.electropedia.org/
© ISO 2020 – All rights reserved 1

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
3.1
horizontal plane
<angle‑beam probes> plane perpendicular to the vertical plane (3.7) of the sound beam including the
beam axis in the material
3.2
peak‑to‑peak amplitude
difference between the highest positive and the lowest negative amplitude in a pulse
Note 1 to entry: See Figure 1.
Key
h peak‑to‑peak amplitude
L pulse duration
Figure 1 — Typical ultrasonic pulse
3.3
probe data sheet
document giving manu facturer's technical specifications o f the same type o f probes, i.e. probes
manufactured in series
Note 1 to entry: The data sheet does not necessarily need to be a test certificate o f per formance.
Note 2 to entry: For individually designed or manufactured probes, some parameters may not be accurately
known before manufacturing.
3.4
probe test report
document showing compliance with this document giving the measured values of the required
parameters o f one specific probe, including test equipment and conditions
3.5
re ference side
right side o f an angle-beam probe looking in the direction o f the beam, unless otherwise specified by
the manufacturer
3.6
squint angle for straight‑beam probes
deviation between the beam axis and the line perpendicular to the coupling surface at the point
of incidence
Note 1 to entry: See Figure 2 .
2 © ISO 2020 – All rights reserved

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 ultrasonic straight‑beam probe e offset
2 EMA receiver δ squint angle for straight‑beam probes
3 echo point Xc, Yc coordinates of the centre of the probe
4 hemicylindrical test block Xm coordinate of EMA receiver
Ym coordinate of the centre of the block
Figure 2 — Squint angle and o ffset for a straight‑beam probe
3.7
vertical plane
<angle‑beam probes> plane through the beam axis of a sound beam in the probe wedge and the beam
axis in the test object
3.8
wear allowance
maximum wear of the probe contact surface which does not affect the performance of the probe
Note 1 to entry: Wear allowance is typically expressed in millimetres.
4 Symbols
Symbol Unit Meaning
L us Pulse duration
h V Peak‑to‑peak amplitude
fo Hz Centre frequency
fu Hz Upper cut‑off frequency
fl Hz Lower cut‑off frequency
Δf Hz Bandwidth
Δ frel % Relative bandwidth
S dB Pulse‑echo sensitivity
N0 mm Near field length
FD mm Focal distance
FL mm Length o f focal zone at −6 dB using a reflector or −3 dB using a hydrophone
ZP mm Focal point
Wx mm Focal width on X‑axis

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Symbol Unit Meaning

Wy mm Focal width on Y‑axis
ΩX ° Angle of beam divergence in X direction
ΩY ° Angle of beam divergence in Y direction

X mm Probe index point
α ° Beam angle
δ ° Squint angle for straight‑beam probes
5 General requirements o f con formity

An ultrasonic probe complies with this document i f it fulfils all o f the following requirements:
a) the probe shall comply with Clause 8;
b) a declaration of conformity according to ISO/IEC 17050‑1 shall be available;
c) the ultrasonic probe shall be clearly marked to identify the manufacturer, and carry a unique serial
number or show a permanent reference number from which information can be traced to the data
sheet and probe test report;
d) a probe data sheet corresponding to the ultrasonic probe shall be available, which defines the
performance criteria for the items given in Clause 6;
e) a probe test report shall be delivered together with the probe, which includes at least the test
results given in Clause 6.
Table 1 summarises the tests to be performed on ultrasonic probes.
Table 1 — List o f tests for ultrasonic probes

Manu facturer’s tests
Title o f test
Subclause
Physical aspects 8.1
Pulse shape, amplitude and duration 8.2
Frequency spectrum and bandwidth 8.3
Pulse‑echo sensitivity 8.4
Distance‑amplitude curve 8.5
Beam parameters for immersion probes 8.6
Axial profile – Focal distance and length o f the focal zone 8.6.2.2
Transverse profile – Focal width 8.6.2 .3
Transverse profile – Beam divergence 8.6.2.4
Beam profile by scanning means – Focal distance and focal length 8.6.3.2
Beam profile by scanning means – Focal width and beam divergence 8.6.3.3

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Manu facturer’s tests

Title o f test
Subclause
Beam parameters for straight‑beam single‑transducer contact probes 8.7
Beam divergence and side lobes 8.7.2
Squint angle and offset for straight‑beam probes 8.7.3
Focal distance (near field length) 8.7.4
Focal width 8.7.5
Length of the focal zone 8.7.6
Beam parameters for angle‑beam single‑transducer contact probes 8.8
Index point 8.8.2
Beam angle and beam divergence 8.8.3
Squint angle and offset 8.8.4
Focal distance (near field length) 8.8.5
Focal width 8.8.6
Length of the focal zone 8.8.7
Beam parameters for straight‑beam dual‑transducer contact probes 8.9
Delay line delay path 8.9.2
Focal distance 8.9.3
Axial sensitivity range (focal width) 8.9.4
Lateral sensitivity range (focal width) 8.9.5
Beam parameters for angle‑beam dual‑transducer contact probes 8.10
Index point 8.10.2
Beam angle and profiles 8.10.3
Wedge delay path 8.10.4
Distance to sensitivity maximum (focal distance) 8.10.5
Axial sensitivity range (length of the focal zone) 8.10.6
Lateral sensitivity range (focal width) 8.10.7
Crosstalk 8.11
6 Technical in formation for probes
6.1 General
The test conditions and the equipment used for the evaluation of the probe parameters shall be listed
(see Table 2).
For individually designed or manufactured probes some parameters may not be accurately known
prior to manufacturing. In that case the measured values shall be used as reference values.
6.2 Probe data sheet

The probe data sheet gives the list of information to be reported for all probes within the scope of this
document (see Table 2) .
6.3 Probe test report

The probe test report gives the measured values o f the required parameters o f one specific probe and
other information from the probe data sheet (see Table 2).

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
The probe test report shall include the unique serial number or the permanent reference number to
provide a uniquely assignment between the specific probe and the probe test report.
Table 2 — List o f in formation to be given in a probe data sheet and a probe test report
Probe data Probe test
In formation to be given Comment
sheet report
Manu facturer's name I I —
Probe type I I —
Probe serial number — I —
Probe housing dimensions I I —
Probe weight I I —
Type of connectors I I —
Connectors interchangeability I I Only for dual‑transducer probes
Crosstalk I M Only for dual‑transducer probes
Transducer material I I —
Shape and size of transducer I I —
Roof angle of transducers I I Only for dual‑transducer probes
Wedge material I I Only for angle‑beam probes
Wedge delay path I I Only for angle‑beam probes,
Delay line material I I Only for straight‑beam probes
Delay line delay I I Only for straight‑beam probes,
Protection layer material I I —
Wear allowance I I —
Pulse shape I M —
Frequency spectrum I M —
Centre frequency I M —
Bandwidth I M —
Pulse duration I M —
Pulse‑echo sensitivity I M —
Beam angle I M Only for angle‑beam probes
Angles of divergence I I Not for focusing immersion probes
Squint angle I I —
Squint offset I I —
Only for angle‑beam probes
Probe index point I I Alternatively the distance between the probe
index point and the front of the probe can be given
Type of focus I I —
Focal distance or near field length I I —
Width of the focal zone I I Only for focusing probes
Length of the focal zone I I Only for focusing probes
Operating temperature range I I —
Storage temperature range I I —
DAC I — —
Distance‑amplitude curve available I — —
Key
I information
M measurement

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Probe data Probe test

In formation to be given Comment
sheet report
Used equipment I I —
Test conditions I I —
Physical aspects — I —
Key
I information
M measurement
7 Test equipment
7.1 Electronic equipment

The ultrasonic instrument (or laboratory pulser/receiver) used for the tests specified in Clause 8 shall
be of the type designated on the probe data sheet and shall comply with ISO 22232‑1 as applicable.
Where more than one type of ultrasonic instrument is designated the tests shall be repeated with each
of the additional designated types.
Testing shall be carried out with the probe cables and electrical matching devices specified on the
probe data sheet for use with the particular type of ultrasonic instrument.
NOTE Probe leads more than about 2 m long can have a significant e ffect on probe per formance.
In addition to the ultrasonic instrument or laboratory pulser/receiver the items of equipment essential
to assess probes in accordance with this document are as follows:
a) an oscilloscope with a minimum bandwidth of 100 MHz;
b) a frequency spectrum analyser with a minimum bandwidth of 100 MHz, or an oscilloscope/digitiser
or computer capable of performing discrete Fourier transforms (DFT).
The following additional equipment is optional:
c) for contact probes only:
1) an electromagnetic‑acoustic probe (EMA) and receiver;
2) a plotter to plot directivity diagrams;
d) for immersion probes only:
a hydrophone receiver with an active diameter less than two times the central ultrasonic
wavelength of the probe (centre frequency) under test but not less than 0,5 mm. The bandwidth of
the hydrophone and the amplifier shall cover the bandwidth o f the probe under test.
7.2 Test blocks and other equipment

For contact probes to be used on carbon steel, the test block quality shall be as defined in ISO 7963. For
contact probes to be used on other materials such as stainless steel, aluminum, titanium or plastics,
the test block material shall be documented in the probe data sheet or probe test report including
the measured sound velocity. The sound attenuation of other materials, especially plastics, shall
be considered.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
The following test blocks and additional equipment shall be used to carry out the specified range o f
tests, for contact probes:
a) Hemicylindrical blocks with different radii (R) in the range from 12 mm to 200 mm. Steps of R 2
are recommended. The length of each block shall be equal to or larger than its radius, up to a
maximum length of 100 mm. An example is shown in Figure 3.
b) Blocks with parallel faces and different thicknesses in the range from 12 mm to 200 mm. The
length and width of each block shall be equal to or larger than its thickness, up to a maximum
thickness of 100 mm.
c) Blocks with side‑drilled holes parallel to the test surface, of preferably 3 mm or 1,5 mm diameter
as shown in Figure 4 or Figure 5, respectively. For probes with centre frequencies up to 2 MHz
side‑drilled holes of 5 mm diameter are recommended. The blocks shall meet the following
requirements:
1) the length, height and width shall be such that the sides of the blocks do not interfere with the
ultrasonic beam;
2) the depth positions o f the holes shall be such that at least three holes fall outside the near field;
3) the position of the holes shall be such that the signals do not interfere, e. g. the amplitude shows
a drop of at least 26 dB between two adjacent holes.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Dimensions in millimetres
Key
1 centre line of slot
2 front surface
3 angle‑beam probe
X, Y, Z coordinate system of hemicylindrical‑stepped block
Figure 3 — Example o f a hemicylindrical‑stepped block

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 side‑drilled hole (SDH) of diameter 3 mm
Figure 4 — Example o f a test block with 3 mm side‑drilled holes

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 side‑drilled hole (SDH) of diameter 1,5 mm SDH n side‑drilled hole at depth position n
2 front surface x width coordinate
3 top surface y length coordinate
4 right surface z depth coordinate
5 bottom surface
6 left surface
Figure 5 — Example o f a test block with side‑drilled holes (SDH)
d) Blocks with inclined faces with a notch as shown in Figure 6 and blocks with hemispherical‑
bottomed holes as in Figure 7. These blocks are used to measure the beam divergence in the vertical
and horizontal plane respectively.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
a tolerance of centre line position
Figure 6 — Example o f a test block with notches

BS EN ISO 2 2 23 2 ‑2 : 2 02 0
ISO 22232‑2:2020
Figure 7 — Examples o f test blocks with side‑drilled and hemispherical‑bottomed holes
© ISO 2 020 – All rights reserved 13

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
e) An alternative steel block to measure index point, beam angle and beam divergence for angle‑beam
probes as given in Annex B.
NOTE Not all blocks are required if only special kinds of probes are to be checked, e.g. blocks to measure the
index point and the beam angle are not necessary if only straight‑beam probes are measured.
For measuring distances, the following equipment shall be used:
f) A ruler.
g) Feeler gauges starting at 0,05 mm.
For testing immersion probes, the following reflectors and additional equipment shall be used:
h) A steel ball or rod with a hemispheric ended smooth reflective sur face. For each frequency range
the diameter of ball or rod to be used is given in Table 3.
Table 3 — Steel ball (rod) diameters for di fferent frequencies

Probe centre frequency Diameterdo f ball or rod
MHz mm
0,5 ≤ f ≤ 3 3 ≤ d≤ 5
3 < f ≤ 15 d≤ 3
i) A large plane and smooth reflector. The target’s lateral size shall be at least ten times wider than
the beam width o f the probe under test measured at the end o f the focal zone, as defined in 8.6.2 .4.1.
The reflector's lateral size shall be at least five times the wavelength calculated using the sound
velocity o f the fluid used and the centre frequency o f the probe under test.
j) An immersion tank equipped with a manual or automated scanning mechanism with five free axes:
— three linear axes X, Y, Z;
— two angular axes θ and ψ .
k) Automated recording means: if the amplitudes of ultrasonic signals are recorded automatically,
it is the responsibility o f the manu facturer to ensure that the system has su fficient accuracy. In
particular, consideration shall be given to the effects of the system bandwidth, spatial resolution,
data processing and data storage on the accuracy of the results.
Typical setups to measure the sound beam of immersion probes are shown in Figures 16, 17 and 18.
The scanning mechanism used with the immersion tank should be able to maintain alignment between
the reflector and the probe in the X and Y directions, i.e. within ±0,1 mm for 100 mm distance in the
Z direction.
The temperature of the water in the immersion tank should be maintained at room temperature
and shall not deviate by more than ±2 °C during the characterization of immersion probes described
in 8.2 to 8.6.
The water temperature shall be reported in the probe data sheet.
Care shall be taken about the influence o f sound attenuation in water, which, at high frequencies, causes
a downshift of the echo frequency when using broad‑band probes.
Table 4 shows the relation between frequency downshift and water path.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Table 4 — Frequency downshi ft in percent o f centre frequency fo depending on total water path
length, for relative bandwidths (Δ frel ) 50 % and 100 %
Total water path
fo Δ frel mm
MHz %
10 20 30 40 50 60 70 80 90 100 150 200 250 300 350 400
5 50 0 0 0 0 0 0 1 1 1 1 1 2 2 2 3 3
5 100 0 1 1 1 2 2 2 3 3 3 5 6 7 9 10 11
10 50 0 1 1 1 2 2 2 3 3 3 5 6 7 9 10 11
10 100 1 3 4 5 6 7 8 9 10 11 16 21 24 28 31 34
15 50 1 1 2 3 4 4 5 6 6 7 10 13 15 18 20 23
15 100 3 6 8 10 13 15 17 19 21 23 30 37 42 47 50 54
8 Performance requirements for probes
8.1 Physical aspects
8.1.1 Procedure
The outside o f the probe shall be visually inspected for correct identification, correct assembly and for
physical damage which can influence its current or future reliability. In particular, for contact probes
the flatness o f the contact sur face o f the probe shall be measured using a ruler and feeler gauges.
8.1.2 Acceptance criterion

For flat- faced probes, over the whole probe face, the gap between the ruler and the probe contact
surface shall not be larger than 0,05 mm.
No visible damage o f the probe contact sur face that could influence the ultrasonic beam is allowed.
8.2 Pulse shape, amplitude and duration
8.2.1 Procedure
The peak‑to‑peak amplitude of the echo shall be measured.
The 10 % peak-to-peak amplitude value defines levels symmetrically to the base line. The first and the
last crossing point o f the signal with these levels define the pulse duration as shown in Figure 1. The
pulse duration shall be determined with a measurement setup as shown in Figure 8 (contact probes) or
in Figure 16 (immersion probes):
a) For contact probes with a single transducer, a hemicylindrical block or a block with parallel faces
shall be used whose reflecting sur face is at a distance larger than 1,5 times o f the near field length
of the probe or within the focal zone of focused probes.
b) For dual‑transducer probes, a hemicylindrical block or a block with parallel faces shall be used
whose reflecting sur face is at a distance nearest to the focal point but within the focal zone
of the probe.
c) For immersion probes, a large flat reflector shall be used at the focal distance for focused probes or
at a distance larger than 1,5 times o f the near field length for flat probes.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
a) Method using an ultrasonic instrument
b) Method using an ultrasonic pulser with receiver stage

Key
1 ultrasonic a) instrument or b) pulser 5 reference block
2 oscilloscope 6 oscilloscope probe
3 probe connector 7 oscilloscope input
4 ultrasonic probe 8 pulser RF output
Figure 8 — Setup for measuring the pulse shape, amplitude and duration
It shall be stated, whether the measurement was done with wear plates, coupling membranes or other
equipment mounted or not.
The pulser setting shall be recorded. It is recommended to plot the transmitter pulse shape.

The pulse duration shall not be greater than the manu facturer's specification stated in the
probe data sheet.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
The plot of the transmitter pulse should be included in the probe data sheet.
8.3 Frequency spectrum and bandwidth
8.3.1 Procedure
The same setup as in 8.2 shall be used, but using a frequency spectrum analyser/digitiser instead of an
oscilloscope and oscilloscope probe. The reflector echo shall be gated and the frequency spectrum shall
be determined using a spectrum analyser or a Discrete Fourier Transform.
Spurious echoes from the probe’s wedge, e.g. from the housing or the damping, shall not be analysed
together with the echo from the semi‑cylinder or any other appropriate calibration block. The gate
width shall be twice the pulse duration as a minimum and centred on the maximum of the pulse.
The lower and upper cut‑off frequencies fl and fu shall be determined at a 6 dB drop from the
maximum value in the frequency spectrum. For the immersion technique the values shall be corrected
according to Table 4.
From these upper and lower cut‑off frequencies fu and fl , the centre frequency fo , the bandwitdth Δ f and
the relative bandwidth Δ frel shall be calculated as given in ISO 5577. See Formulae (1) to (3):
f +f
fo = u l (1)
2
∆f = fu − fl (2)
 ∆f 
∆frel =  ×100 % (3)
 fo 
8.3.2 Acceptance criteria

The measured centre frequency shall be within ±10 % of the frequency stated in the probe data sheet.
The measured –6 dB bandwidth shall be within ±15 % of the bandwidth stated in the probe data sheet.
If the spectrum between fl and fu has more than one maximum, the amplitude ratio between adjacent
minima and maxima shall not exceed 3 dB.
8.4 Pulse‑echo sensitivity
8.4.1 Procedure
Pulse-echo sensitivity is defined by Formula (4):
 Vout 
S = 20 log10   (4)
 Vin 
where
Vout is the peak-to-peak voltage o f the echo from a specified reflector, be fore amplification as measured in 8.2;
Vin is the peak‑to‑peak voltage applied to the probe with the ultrasonic instrument set to separate pulser/
receiver mode.
Probe sensitivity comparisons made with different types of ultrasonic instruments can vary, because
the probe sensitivity is influenced by the coupling conditions and by the impedances o f pulser, probe,
cable and receiver. There fore, the used equipment shall be specified in the probe data sheet.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020

For probes manufactured in series, the pulse‑echo sensitivity shall be within ±3 dB of the manufacturer’s
specification stated in the probe data sheet.
For individually designed or manufactured probes, the measured sensitivity shall be reported on the
probe test report.
8.5 Distance‑amplitude curve
8.5.1 General
The amplitude of ultrasonic pulses varies with distance from the probe. Therefore, to evaluate echoes
from reflectors, for all kinds o f probes, distance-amplitude curves are needed using the reflectors
listed in Table 5.
Table 5 — Reflectors for distance‑amplitude curves

Reflector shape Contact technique Immersion technique
Disk Flat‑bottomed holes Flat‑ended rods
Cylindrical Side‑drilled holes Cylindrical rods
Spherical Hemispherical‑bottomed holes Hemispherical‑ended rods or balls
8.5.2 Procedure
When using contact probes flat-bottomed holes, side-drilled holes and hemispherical-bottomed holes
are used as reflectors when using contact probes. With immersion probes, usually a small-sized steel
ball is used to measure a distance‑amplitude curve (see 8.6.2).
For dual‑transducer probes, the axis of the side‑drilled holes shall be perpendicular to the separation
layer. Contoured probes should be evaluated on reference blocks having the same curvature as the
sample the probe shoe was fitted to. I f this is not possible, they can only be evaluated on re ference
blocks with flat contact sur faces be fore applying the contour to the probe shoe.
Using a series o f reflectors o f constant size but at di fferent distances from the probe the received echo
amplitudes shall be plotted against distance. At least eight measurement points on each curve shall be
available, except for highly focused probes. The distances used shall cover the focal range of focusing
probes or the range including the near field length o f non- focusing probes.
Distances and amplitudes shall be determined on the calibrated screen of an ultrasonic instrument
mentioned in the probe data sheet.
The distance‑amplitude curve and the distance‑noise curve should only be made on request of the client.
A diagram showing at least one distance‑amplitude curve shall be available for each probe type,
attached to the manu facturer’s specification stated in the probe data sheet. This diagram shall also
include a distance‑noise curve.
Figure 9 shows an example o f di fferent distance-amplitude curves, calculated for disk-shaped reflectors
in steel (distance-gain-size diagram — DGS-diagram). Figure 10 shows an example of a measured
distance‑amplitude curve for 3 mm side‑drilled holes in steel, with the associated distance‑noise curve.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 back wall echo
2 noise level
X distance (mm)
Y gain (dB)
S reflector size (mm)
Figure 9 — Calculated distance‑amplitude curves for disk‑shaped reflectors in steel

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 back wall echo X distance (mm)
2 distance‑amplitude curve for 3 mm side‑drilled holes FL length of focal zone
3 distance‑noise curve Y gain (dB)
Figure 10 — Measured distance‑amplitude curve for 3‑mm side‑drilled holes with

distance-noise curve

Within the focal zone the distance‑amplitude curve and the distance‑noise curve shall not deviate by
more than 3 dB from the curves given in the manu facturer’s specification stated in the probe data sheet.
8.6 Beam parameters for immersion probes
8.6.1 General
The measurement technique consists o f studying the probe's sound beam in water, using a target. This
target is a small, almost point source reflector, or a hydrophone receiver. The beam parameters are
determined by scanning the reflector or hydrophone relative to the beam, either by moving the target
or the probe.
I f the target is a reflector, echo mode is used. Both transmitter and receiver characteristics o f the probe
are verified. I f the target is a hydrophone transmission mode is used, and then only the transmitting
characteristics o f the probe is verified.
The same reflector or hydrophone shall be used for all the beam parameter measurements associated
with one particular probe.
Small variations in the measured position of maximum signals occur as measured by a hydrophone or
di fferent reflector types. Consequently, for reasons o f repeatability, the equipment and the parameters
of the target used shall be recorded with the results.
Targets are listed in 7.1 and 7.2 , h) .

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Settings of the ultrasonic instrument or pulser/receiver (pulse energy, damping, bandwidth, gain) shall
be the same as those defined in 8.2 . However, if the settings are changed during the measurement (gain
for example), the new values shall be recorded on the result sheet.
Two equitable procedures are given for beam measurements. They differ only in the methods used to
record the measurement results:
a) Direct measurement o f specific beam parameters:

This technique, described in 8.6.2 , is based on direct readings at specific points within the beam
(see Figures 11 to 15).
b) Measurements performed with an automated scanning system:
This technique, described in 8.6.3, is based on the automated collection of data during scanning.
If measurement results of the beam parameters are provided, the C‑Scan image shall be provided.
This copy shall include a scale o f the acoustic levels defined in 8.6.3.
Before performing beam measurements described below, the squint angle shall be compensated for, by
setting the beam axis perpendicular to the XY‑plane as shown on Figures 16, 17 and 18. This operation
is performed by adjusting both angles θ and ψ o f the probe holder to maximize the echo from a flat
target in the XY‑plane.
8.6.2 Beam profile — Measurements performed directly on the beam
8.6.2.1 General
Either one of the following methods shall be used to record the ultrasonic peak echo voltage:
a) manual recording of the amplitude displayed on an oscilloscope;
b) automated recording of the amplitude synchronized to the scanner movement.
In this last case, the focal distance, the focal length, the focal width, the transverse profile and the beam
divergence shall be deduced from the graphs obtained.
Figure 17 shows the equipment setup used when the target is a ball reflector and Figure 18 shows the
equipment used when the target is a hydrophone.
The focal distance and the focal length (see Figure 11) shall be determined from axial profiles (see
Figure 12 and 13 ) and the focal width and beam divergence are measured from transverse profiles (see
Figure 14 and 15).

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 probe Zo sound exit point
X distance (mm) ZL1 , ZL2 boundaries of focal zone
FD focal distance FL length of focal zone
ZP focal point
Figure 11 — Significant points on the beam axis o f immersion probes
Key
A amplitude (dB) ZL1 , ZL2 boundaries of focal zone
X distance (mm) FL length of focal zone
FD focal distance ZP focal point
Figure 12 — Axial profile o f a non‑ focused immersion probe

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
A amplitude (dB) ZL1 , ZL2 boundaries of focal zone
X distance (mm) FL length of focal zone
FD focal distance ZP focal point
VP amplitude at focal distance
Figure 13 — Axial profile o f a focused immersion probe
a) Pulse‑echo technique b) Hydrophone technique

Key
X, Y X or Y axis
A amplitude
W focal width
x1, x2, y1, y2, coordinates on X‑ and Y‑axis
Figure 14 — Transverse profiles o f immersion probes

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
a) At the focal point b) At the far end o f the focal zone

Key
1 X or Y axis
A amplitude
Z Z axis (in sound path direction)
Figure 15 — Transverse profiles in the focal zone o f an immersion probe
Key
1 ultrasonic instrument X lateral position
2 positioning interface Z sound path in water
3 display
4 probe
5 plate reflector
Figure 16 — Setup to measure the sound beam o f immersion probes — Adjustment o f

the beam axis

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 ultrasonic instrument X lateral position
3 display
4 probe
5 ball reflector
Figure 17 — Setup to measure the sound beam o f immersion probes using a ball reflector
Key
1 ultrasonic instrument 6 hydrophone
2 hydrophone receiver X lateral position
4 display
5 probe
Figure 18 — Setup to measure the sound beam o f immersion probes using a hydrophone

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.6.2.2 Axial profile — Focal distance and length o f the focal zone
8.6.2.2.1 Procedure
The target shall be placed on the probe axis and the target and the probe shall be placed in contact. The
coordinate of the front face of the probe or its acoustic lens is Z0 , see Figure 19.
Key
1 beam axis
2 probe
Z distance
Z0 zero point
Figure 19 — The point Z0 o f the coordinate system for immersion probes
The target (or probe) shall be moved along the Z‑axis, increasing probe‑target distance. The distance at
which the signal is maximized shall be determined, see Figures 11, 12 and 13.
X‑and Y‑positions shall be adjusted to further maximize the signal amplitude. The related distance
coordinate is Zp and the related voltage is Vp .
The focal distance is given by Formula (5):
FD = Zp − Z0 (5)
By increasing and reducing the distance between the probe and the target the limits of the focal zone
shall be found, i. e. the two points where Vp is reduced by 6 dB, i f a reflector is used, or by 3 dB, i f a
hydrophone is used. ZL1 and ZL2 are the coordinates of these points on the Z‑axis.
The length of the focal zone is given by Formula (6):
FL = ZL 2 − ZL 1 (6)
8.6.2.2.2 Acceptance criteria
The focal distance and length o f the focal zone shall be within ±15 % o f the manu facturer’s specifications
stated in the probe data sheet.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.6.2.3 Transverse profile — Focal width
8.6.2.3.1 Procedure
The same setup and the same mechanical settings as in 8.6.2 .2 .1 shall be used. The target shall be
placed at the focal point of the probe, as found in 8.6.2 .2 .1.
To measure the focal width in the X direction the probe (or hydrophone) shall be moved in the X
direction to find the two points X1 and X2 , where the amplitude from the target has decreased by 6 dB
(by 3 dB when a hydrophone is used).
To measure the focal width in the Y direction the X position shall be returned to the focal point and the
measurement shall be repeated, but this time with movement in the Y direction to find the two points
Y1 and Y2 , where the amplitude of the signal from the target has decreased by 6 dB (by 3 dB when a
hydrophone is used) .
Both beam widths on X‑axis and on Y‑axis at focal point (see Figure 15) are given by the differences
according to Formula (7):
W = X −X
X1 2 1
WY1 = Y2 −Y1 (7)
8.6.2.3.2 Acceptance criterion

Both focal widths shall be within ±15 % o f the manu facturer’s specifications stated in the
probe data sheet.
8.6.2.4 Transverse profile — Beam divergence
8.6.2.4.1 Procedure
The measurement o f the beam divergence is only required for probes that have no artificial focusing
means, such as acoustic lenses or curved piezoelectric transducers, see Figure 12 . The beam divergence
shall be deduced from the measurement o f the beam width, as defined in 8.6.2 .3, but measured in the
far field, see Figure 14.
The measurement shall be performed as follows:
a) the beam widths WX1 and WY1 at the focal distance as described in 8.6.2 .3.1 shall be measured first;
b) the target (or probe) then shall be placed at the far end of the focal zone (ZL2 ), as measured
in 8.6.2 .2 .1.
The corresponding values X’ 1 , X’ 2 and Y’ 1 , Y’ 2 shall be recorded, i. e. the target (or probe) positions on
X‑axis and on Y-axis where the peak voltage decreases by 6 dB (reflector) or 3 dB (hydrophone) from
the maximum value VL , which is obtained on the beam axis.
The beam widths at the end of the focal zone (see Figure 14) are given by Formula (8):
W = X' − X'
X2 2 1
W = Y ' −Y '
Y2 2 1 (8)
The angles of beam divergence in X and Y directions are calculated using Formula (9):

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
WX 2 −WX 1
Ω X = arctan
( )
2 ZL 2 − Zp
W −W
Ω Y = arctan
(Z −Z )
Y2 Y1
(9)
2 L2 p
8.6.2.4.2 Acceptance criterion
The angles o f divergence shall not di ffer from the manu facturer’s specified values as stated on the
probe data sheet by either ±10 % or by 1°, whichever is larger.
8.6.3 Beam profile — Measurements made using an automated scanning system
8.6.3.1 General
The ultrasonic echo peak voltage shall be recorded in different planes during an automated scan of
the probe (or the reflector). The variations o f amplitude with position shall be recorded under the
following conditions:
a) The sensitivity, the amplitude resolution of data processing, the motion speed and the motion
resolution shall be su fficient to avoid any loss o f in formation.
The system shall have su fficient dynamic range to collect the high-amplitude signals (obtained
at the focal point) without saturation and the low-amplitude signals with a su fficient signal-
to‑noise ratio.
b) The maximum peak voltage Vp , detected at the focal point, defines the 0 dB level. The coding used
for the 0 dB, −3 dB, −6 dB, −12 dB levels shall appear on a scale on the scan recording.
The verification is based on per forming three scans:
c) One scan in the XZ‑ or YZ‑plane shall be performed including the beam axis to determine the focal
distance and the length of the focal zone;
d) Two scans shall be performed in the transverse plane XY at the focal distance and at the far end of
the focal zone. These scans provide the focal width and the beam widths in the X and Y directions.
The angles of beam divergence shall be calculated from the beam widths measured in the XY‑plane.
8.6.3.2 Beam profile by scanning means — Focal distance and focal length
8.6.3.2.1 Procedure
The same setup as described in Figure 17 shall be used when the target is a reflector and when the
target is a hydrophone Figure 18 applies.
The focal distance and the length of focal zone shall be deduced from the scans in the plane containing
the beam axis.
The scanner shall be adjusted so that:
a) its motion plane contains the beam axis;
b) the XZ‑ or YZ‑plane covered by the scanning is wide enough to include the ends of the focal zone
and the two points of transverse axes (X and Y) where the amplitude is 6 dB (reflector) or 3 dB
(hydrophone) lower than on the beam axis.
From the images the following parameters shall be determined:
c) the focal distance FD , as defined in 8.6.3.2;

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
d) the length of the focal zone FL , as defined in 8.6.3.2 .
An example of this plot is given in Figure 20.
Key
FD focal distance (mm)
FL length of focal zone (mm)
Z distance on beam axis (mm)
Y distance perpendicular to beam axis (mm)
Gray scale amplitude value in dB, with 0 dB as maximum amplitude
Figure 20 — C‑scan image o f the sound beam profile o f a non‑ focusing immersion probe

The focal distance and the length of the focal zone shall be within ±15 % of the manufacturer’s
8.6.3.3 Beam profile by scanning means — Focal width and beam divergence
8.6.3.3.1 Procedure
The mechanical setup is the same as in 8.6.3.2 .1 and described in Figures 17 and 18.
The first scan shall be per formed at the focal distance. The scanner shall be adj usted as follows:
a) The Z‑axis of the scanner shall be adjusted so that the target is at the focal point, as it was
determined in 8.6.3.2 .1. The scanner displacements shall be in the XY plane containing the focal
point and shall be perpendicular to the beam axis.
b) The XY scanning area shall be adjusted to include the positions where the amplitudes drop by 20 dB
from Vp i f using a reflector, or by 10 dB i f using a hydrophone.
WX1 and WY1 shall be determined as diameters of the zones measured in the X or
At the focal distance,
Y direction where the displayed amplitudes are 6 dB (reflector) or 3 dB (hydrophone) lower than the
value Vp measured on the beam axis (see Figure 21 for an example) .

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
WX focal width on X axis (mm)
WY focal width on Y axis (mm)
X, Y distance perpendicular to beam axis (mm)
Gray scale Amplitude value in dB, with 0 dB as maximum amplitude
Figure 21 — C‑Scan image o f a sound beam o f a focusing immersion probe
The second scan shall be performed at the far end of the focal zone.
The mechanical setup and the bridge adjustment are the same as for the previous scanning, except that
the target is placed at the far end of the focal zone (ZL2 ), as defined in 8.6.3.2 .1.
From the image the focal widths WX2 and WY2 shall be determined by the same method used to
determine WX1 and WY1 at the focal distance.
The angles of divergence in the X and Y direction are determined by the same calculations used
in 8.6.2 .4.1.
The angles o f divergence shall not di ffer from the manu facturer’s specified values stated on the probe
data sheet by either ±10 % or by ±1°, whichever is larger.
The focal widths shall be within ±15 % o f the manu facturer’s specification stated in the probe data sheet.
8.7 Beam parameters for straight‑beam single‑transducer contact probes
8.7.1 General
The procedures given in this clause are for probes with flat contact sur faces only.
Contoured probes should be evaluated on reference blocks having the same curvature as the sample
the probe shoe was fitted to. I f this is not possible, they can only be evaluated on re ference blocks with
flat contact sur faces be fore applying the contour to the probe shoe.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.7.2 Beam divergence and side lobes
8.7.2.1 Procedure
One of the following equitable methods shall be used to measure the directivity pattern:
a) Using an electromagnetic‑acoustic (EMA) receiver.
The probe shall be coupled to a semi‑cylinder (see Figure 22).
When scanning the cylindrical surface of the block the EMA receiver shall be positioned as close
as possible to the surface with a constant distance to optimize the received signals signal to
noise ratio.
The signal amplitude shall be plotted against the scanning angle of the EMA receiver.
The plot shall include the main lobe and the adjacent side lobes. The angles for the −3 dB positions
of the main lobe give the divergence angles (Figure 22).
The angles of divergence shall be measured in two perpendicular planes.
For rectangular transducers these planes shall be parallel to the larger side a and the smaller side b
of the transducer.
Key
1 sound beam 5 main lobe
2 half cylinder 6 straight‑beam probe
3 beam axis X angle in degrees (°)
4 EMA receiver Y amplitude in decibels (dB)
Figure 22 — Measurement o f beam divergence and beam angle
b) Using reference blocks with side‑drilled holes.
Test blocks containing 3 mm side‑drilled holes at various depths parallel to the test surface, as
shown in Figure 4, shall be used to determine the angles of divergence and the side lobes in the two
perpendicular planes of the probe by rotating the probe by 90° on the test surface.
For each hole the position of the probe to receive the maximum echo and for the forward and
backward position o f the 6 dB drop and side lobe positions shall be marked in a final plot.
The beam axis shall be determined as the straight line through the marks of the maximum echo
together with the normal to the sur face o f the block. The straight lines fitted to the edge points o f
the beam together with the beam angle gives the 6 dB divergence angles.
Note the change in echo amplitude in relation to probe movement when the beam is scanned over
each hole in turn.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
I f a side lobe is detected in the amplitude profile from two or more holes, the side lobe shall be
maximized and its position in relation to that of the main lobe shall be plotted. Also the amplitude
of the side lobe in relation to that of the main lobe shall be recorded.
c) Using reference blocks with hemispherical‑bottomed holes.
Test blocks containing hemispherical‑bottomed holes, maximum 10 mm diameter at various depths

from the test surface, as shown in Figure 7 shall be used to determine the angles of divergence in
two perpendicular planes.
This shall be done by moving the probe in two perpendicular directions if the block is wide enough
or by rotating the probe by 90° on the test surface.
For each hole, the position of the probe to receive the maximum echo and for the forward and
backward position of the 6 dB drop shall be marked.
8.7.2.2 Acceptance criteria
The angles o f divergence shall not di ffer from the manu facturer’s specified values stated in the probe
data sheet by more than 10 % or by ±1°, whichever is larger.
Side lobes shall be ≥20 dB below the main lobe for reflection techniques and ≥10 dB below the main
lobe for the EMA technique.
8.7.3 Squint angle and o ffset for straight‑beam probes
8.7.3.1 Procedure
With straight-beam probes the o ffset is defined as the distance between the geometrical centre point o f
the probe and the measured acoustical centre point of the probe (Figure 2).
One of the following equitable methods shall be used:
To measure the squint angle and the offset for straight‑beam probes the setup in Figure 2
shall be used.
First the probe shall be connected to the ultrasonic instrument which is switched to pulse‑echo
mode. By rotating and moving the probe on a semi‑cylindrical block the echoes of the multiple
echoes series from the block shall be maximized. This occurs when, at all reflections, the beam hits
the cylindrical surface perpendicularly and the acoustical centre point of the probe is positioned on
the centre line of the block.
Keeping the probe at this position, in the second step, the EMA receiver use the probe acting only as
a transmitter.
By moving the EMA receiver on the cylindrical sur face find the position o f the maximum signal at
the location where the beam hits the cylindrical sur face the first time.
The measured angle is the squint angle for straight‑beam probes δ.
The coordinates Xc and Yc of the geometrical centre point of the probe together with the
coordinates Ym of the centre line of the block and Xm of the EMA receiver give the offset e according
to Formula (10):
e = ( Xm − Xc )2 + (Ym −Yc )2 (10)

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
The position of the side‑drilled hole (SDH) relative to a reference point of the block is used as
Xm and Ym . Connect the probe is connected to the ultrasonic instrument which is switched to
pulse‑echo mode.
By moving the probe perpendicular to the SDH the echo of the SDH shall be maximized. Then
determine the position of the geometrical centre point of the probe, Xc or Yc depending on the
orientation of the probe or take it from the measurement of the beam axis in 8.7.2 .1, b).
The offset e can be calculated using Formula (10).
Squint angles for straight‑beam probes δx and δy shall be determined in the two perpendicular
directions independently by geometrical calculation using Xc or Yc depending on the orientation of
the probe, Xm = Ym and the depth position of the SDH.
The resulting angle δ is calculated according to Formula (11):
δ = arctan tan2 δ y + tan2 δ x (11)
The squint angle for straight-beam probes shall be ≤2°. The o ffset from the centre point o f the probe
shall be less than 1 mm.
8.7.4 Focal distance (near field length)
8.7.4.1 Procedure
For a non- focusing probe the focal distance is identical with the near field length. For these probes it is
di fficult to directly measure the focal distance. There fore, for these probes the near field length should
be calculated using the methods given in Annex A from the measured centre frequency fo and the
measured angles of divergence γ ⊥ and γ in two perpendicular directions.
The divergence shall be measured at the depth of the expected focal distance. Because Annex A does
not take a delay path into account, alternative measurements or calculations may be used.
Focused straight-beam probes for direct contact shall be measured on re ference blocks containing flat-
bottomed holes or side‑drilled holes of a constant diameter within the focal zone of the probe.
Reflectors o f a 2 mm or 3 mm diameter shall be used to generate a distance-amplitude curve (best fit to

the measurement points).
A measurement point shall be close to the peak of this curve, which gives the focal distance in the
applied material. Focal distances caused by lenses or curved transducers are shorter than the near field
length of a plane transducer of the same shape and frequency, unless defocusing is intentionally used.
8.7.4.2 Acceptance criterion
The focal distance shall be within ±20 % o f the manu facturer’s specification stated in the
probe data sheet.
8.7.5 Focal width
8.7.5.1 Procedure
The focal width of focused straight‑beam probes for direct contact can be determined using an EM A
receiver or blocks with side‑drilled holes or hemispherical‑bottomed holes, analogous to 8.7.2 .

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
The following methods shall be used:
a) Using electromagnetic‑acoustic (EM A) receivers.
The probe shall be coupled to a semi‑cylinder with a radius close to the focal distance of the probe.
By moving the EM A on the surface in two perpendicular directions the angles of the 3 dB drop of
the signal amplitude shall be determined [see 8.7.2 .1, a)] . The focal widths of the probe shall be
calculated using these angles together with the known radius of the block.
To determine the divergence angles the probe shall be moved as shown in 8.7.2 .1, b) in two
perpendicular directions until the echo from a side‑drilled hole close to the focal distance of the
probe drops by 6 dB. This shift provides the focal widths of the beam.
To determine the divergence angles the probe shall be moved as shown in 8.7.2 .1, c) in two
perpendicular directions until the echo from a hemispherical‑bottomed hole close to the focal
distance of the probe drops by 6 dB. This shift provides the focal widths of the beam.
The focal width shall be within ±20 % o f the manu facturer’s specification stated in the probe data sheet.
8.7.6 Length o f the focal zone
8.7.6.1 Procedure
Determine the points where the amplitude drops by 6 dB as compared to the focal point from the
distance‑amplitude curve measured in 8.5 or 8.7.4.
The difference of their coordinates provides the length of the focal zone.
The length o f the focal zone shall be within ±20 % o f the manu facturer’s specification stated in the
probe data sheet.
8.8 Beam parameters for angle‑beam single‑transducer contact probes
8.8.1 General
The procedures given in this clause are for probes with flat contact sur faces only.
An example for a calibration block for angle‑beam probes is given in Annex B.
8.8.2 Index point
8.8.2.1 Procedure
To measure the index point a test block with a quadrant shall be used. The radius of the quadrant shall
be large enough that the reflecting cylindrical sur face is in the far field o f the probe.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
The probe shall be adjusted so that the echo from the cylindrical surface is maximized. At this position
the index point corresponds to the engraved centre line of the quadrant.

The index point shall be within ±1 mm o f the manu facturer's specification stated in the probe data sheet.
Angle-beam probes with transducer size ≤15 mm and frequencies ≤2 MHz generate a broad sound beam
where the position of the maximum echo can only be measured within a tolerance of ±2 mm.
8.8.3 Beam angle and beam divergence
8.8.3.1 Procedure
Similar to the methods used for straight‑beam probes in 8.7.2, one of the following methods shall be
used to measure the divergence angles and side lobes of angle‑beam probes:
a) Using electromagnetic‑acoustic (EMA) receivers.
The probe shall be coupled to a semi‑cylindrical block.
The signal amplitude shall be plotted against the scanning angle of the EMA receiver.
The plot shall include the main lobe and the adjacent side lobes. The angles for the −3 dB positions
of the main lobe provide the divergence angles (Figure 22).
The angles of divergence shall be measured in two perpendicular planes (azimuthal and horizontal).
The position of the maximum signal provides the angle of the beam axis (beam angle).
Parameters of inclined beams can also be taken from a C‑scan image in a plane perpendicular to
the beam axis. Figure 23 shows an example of a C‑scan image of a 45° angle‑beam probe measured
with an EMA receiver on a test block with a 45° surface.
Figure 23 — Measuring beam parameters o f an inclined sound beam using an EMA receiver

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
a) Re ference block b) C‑scan image

Key
1 EMA transducer α beam angle
2 angle‑beam probe ∆IIa , p projected length of focal zone
3 test block ∆Iw , s projected focal width
Gray scale amplitude value in dB, with 0 dB as maximum amplitude
A test block with a series of 3 mm side‑drilled holes at different depths, as shown in Figure 4, shall
be used to measure the beam angle, divergence angles and side lobes in the vertical plane.
For each hole the position of the probe to receive the maximum echo, and for the forward and
backward position o f the 6 dB drop and the side lobe positions shall be marked in a final plot.
The straight line through the marks of the maximum echo and the index point with the normal to
the sur face o f the block provides the beam angle in the vertical plane. The straight lines fitted to
the edge points o f the beam together with the beam angle provides the −6 dB divergence angles
in this plane.
An example for the longitudinal beam profile is given in Figure 24. Note the change in echo
amplitude in relation to the probe movement while the beam is scanned over each hole in turn. If a
side lobe is detected in the amplitude profile from two or more holes, maximize the side lobe and
plot its position in relation to that of the main lobe. Also record the amplitude of the side lobe in
relation to that of the main lobe.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 echo amplitude (dB)
2 angle‑beam probe
3 probe index point
4 test‑surface
Y length coordinate
Z depth coordinate
SDH i side‑drilled hole
Yi1 lower position on Y axis for 6 dB drop
Yi2 upper position on Y axis for 6 dB drop
Zi reflector depth
Zßi sound path
α angle of incidence
Figure 24 — Measurement o f the longitudinal beam profile o f an angle‑beam probe
An alternative method of measuring the beam angles also using side‑drilled holes is given in Annex B.
To measure the divergence angles in the horizontal plane a block with a notch is needed, as shown
in Figure 6 (for 45° probes and 60° probes). The same procedure is used to determine the positions
of the 6 dB drop, but the probe has to be moved laterally.
A test block with a series of the hemispherical‑bottomed holes, maximum 10 mm diameter at

different depths, as shown in Figure 7, shall be used to measure the beam angle and divergence
angles in the vertical and horizontal planes.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
For each hole the position of the probe to receive the maximum echo, and for the forward and
backward position o f the 6 dB drop shall be marked in a final plot.
The straight line through the marks of the maximum echo and the index point with the normal
to the surface of the block provides the beam angle in the vertical and horizontal plane. The
straight lines fitted to the edge points o f the beam together with the beam angle provide the −6 dB
divergence angles in those planes.
For nominal beam angles up to 60° the measured value shall be within ±3° of the nominal angle for
frequencies less than 2 MHz and ±2° of the nominal angle for frequencies equal to or greater than 2 MHz.
For nominal beam angles greater than 60° the measured value shall be within ±3° of the nominal angle.
The angles o f divergence shall not di ffer from the manu facturer’s specification stated in the probe data
sheet by more than 10 % or by more than ±1°, whichever is the larger.
When using the reflection technique, the side lobes amplitudes shall be ≥20 dB below the main lobes
amplitudes for nominal beam angles between 45° and 65°, and ≥15 dB for higher nominal beam angles.
When using the EMA technique, the side lobes amplitudes shall be ≥10 dB below the main lobes
amplitudes for nominal beam angles between 45° and 65°, and ≥8 dB for higher nominal beam angles.
8.8.4 Squint angle and o ffset for angle‑beam probes
8.8.4.1 Procedure
With angle-beam probes the o ffset is defined as distance between the geometrical centre line o f the
probe and the measured beam direction of the probe (Figure 25).

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 ultrasonic angle‑beam probe e offset
2 EMA receiver δ squint angle for angle‑beam probes
3 echo point Xc, Yc coordinates of the centre of the probe
4 hemicylindrical test block Xm coordinate of EMA receiver
α beam angle Ym coordinate of the centre of the block
Figure 25 — Squint angle and o ffset for an angle‑beam probe
The squint angle shall be checked for all angle‑beam probes. The offset shall only be checked if a possible
deviation larger than specified in the acceptance criteria 8.8.4.2 is to be expected.
One of the following equitable methods shall be used:
To measure the squint angle and the offset for an angle‑beam probe the same setup shall be used
as in 8.7.3 (Figure 25 ). The squint angle δ is defined as the angle between the re ference side o f the
probe and the measured beam axis projected onto the coupling surface (Figure 25).
First the probe shall be coupled to a semi‑cylindrical block and the ultrasonic instrument shall be
switched to echo mode.
By turning and moving the probe the echoes of the multiple echo series from the block shall
be maximized.
Then, at all reflections, the beam hits the cylindrical sur face perpendicularly and the index point o f
the probe is on the centre line of the block.
At this position the angle between the sides of the probe and the sides of the block provide the
squint angle.
Secondly the EM A receiver shall be used (the probe acting as a transmitter only). By moving the
EMA receiver the position of the maximum signal shall be determined where the beam hits the
cylindrical sur face for the first time.
Using Formula (12) the offset e shall be calculated as:

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
e = ( Xm − Xc ) cos δ (12)
where
Xm is the coordinate of the position of the EMA receiver
Xc is the coordinate of the intersection point of the centre line of the block with the designed
beam path
For probes with an intended high squint angle, e.g. for the detecting transverse discontinuities, Xc
is the coordinate of the intersection point of the centre line of the block with the theoretical beam
path (not necessarily parallel to its reference side). In that case the offset e shall be calculated using
the deviation from the intended beam path in Formula (12) instead of using squint angle δ to the
reference side of the probe.
b) Using reference blocks.
With side‑drilled holes, only the squint angle can be measured according to 8.7.3.1.
Adj ust the position o f the probe on the large flat sur face o f a suitable block to maximize the direct
echo from a straight corner of the block, as shown in Figure 26 . The corner reflector shall be in the
far field o f the probe.
Measure the direction in which the probe’s reference side is pointing relative to the normal to
the corner face by means of a straight edge and a protractor. This measurement provides the
squint angle δ.
I f the squint angle exceeds 1° on the first measurement, make a total o f three measurements and
take the mean value.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 probe a) side view
2 sound beam b) top view
3 ruler
δ squint angle
Figure 26 — Measuring the squint angle using the corner o f a calibration block
The squint angle shall be ≤2°. The o ffset shall be ≤1 mm from the centre line o f the probe.
8.8.5 Focal distance (near field length)
8.8.5.1 Procedure
Similar methods to those for straight‑beam probes shall be applied here (see 8.7.4). For unfocused
angle-beam probes the near field length shall be calculated using the measured values o f the centre
frequency fo and beam divergence angles γ ⊥ and γ using the Formulae given in Annex A.
The divergence angles shall be measured at the depth of the expected focal distance. Because Annex A
does not take a delay path into account, alternative measurements or calculations may be used.
With focused angle‑beam probes for direct contact the same methods as for straight‑beam probes shall
be used (see 8.7.5).
A distance-amplitude curve shall be generated with at least eight measurement points using small flat-
bottomed, hemispherical‑bottomed or side‑drilled holes is used. The point of peak amplitude provides
the focal distance.
It is recommended that the measurement points are within the focal zone of the transducer with a
measurement point close to the peak amplitude.
They shall cover the 6 dB drop compared to the peak amplitude.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Focal distances caused by lenses or curved transducers are shorter than the near field length o f a plane
transducer of the same shape and frequency, unless defocusing is intentionally used.
probe data sheet.
8.8.6 Focal width
8.8.6.1 Procedure
The focal widths shall be measured in a similar way to the angles of divergence (see 8.7.2) using an EMA
receiver, side‑drilled holes, or hemispherical‑bottomed holes.
The measurement shall be made in two perpendicular directions with one of the following methods:
a) Using electromagnetic‑acoustic (EM A) receivers.
The probe shall be coupled to a semi‑cylinder whose radius is close to the focal distance of the
probe. By moving the EMA probe on the surface the points are determined where the signal
amplitude drops by 3 dB compared to the peak amplitude.
With these angles and the known radius of the block the beam width at the focal distance shall
be calculated.
As described in 8.8.3.1, b) the probe shall be moved until the echo from a side‑drilled hole at the focal
distance drops by 6 dB. This shift provides the focal widths of the beam in the vertical direction.
The focal width in the horizontal plane can only be measured using the method described in
8.9.5.1, b).
As described in 8.8.3.1, c), the probe shall be moved until the echo from a hemispherical‑bottomed
hole at the focal distance drops by 6 dB. This shift provides the focal widths of the beam in the
vertical and horizontal direction.
The focal widths shall be within ±20 % o f the manu facturer’s specification stated in the probe data sheet.
8.8.7 Length o f the focal zone
8.8.7.1 Procedure
From the distance‑amplitude curve measured in 8.5 or 8.7.5 the points are determined where the
amplitude drops by 6 dB compared to the focal point. The difference of their coordinates gives the
length of the focal zone.
probe data sheet.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.9 Beam parameters for straight‑beam dual‑transducer contact probes
8.9.1 General
The procedures given in this subclause are for probes with flat contact sur faces only.
8.9.2 Delay line delay path

For straight‑beam dual‑transducer contact probes the echo out of a test block with a quadrant, a
hemicylindrical block or a block with parallel faces shall be used whose reflecting sur face is at a distance
nearest to the focal point but within the focal zone. If a test block with a quadrant or a hemicylindrical
block is used, the probe shall be optimized in position to obtain the maximum signal from the curved
surface of the block.
Set the horizontal axis of the display to sound path mode, using the sound velocity of the test block. Set
the position of the transmitting pulse to the zero position on the horizontal axis of the display. Read
the position o f the echo from the reflecting sur face o f the block, then subtract the distance in the test
block to obtain the delay path of the delay line. The delay line delay path is expressed in mm material
equivalent (e. g. steel) as near field equivalent sound path. A method for the determination o f the delay
path is given in Annex C.
8.9.3 Focal distance
8.9.3.1 Procedure
The point of maximum amplitude in the distance‑amplitude‑curve according to 8.5 is defined as the
focal distance.
The echo heights from reflectors (see Table 5) at distances within the expected focal zone shall be used
to establish a distance‑amplitude curve (with at least eight points).
The separation layer of the probe shall be perpendicular to the axis of the side‑drilled holes.

The position o f the maximum echo shall be within ±20 % o f the manu facturer’s specification stated in
the probe data sheet.
8.9.4 Axial sensitivity range (focal zone)
8.9.4.1 Procedure
From the curve measured in 8.6.2 .2 , the −6 dB points shall be determined.

The axial sensitivity range (length of the focal zone) shall be within ±20 % of the manufacturer’s

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.9.5 Lateral sensitivity range (focal width)
8.9.5.1 Procedure
To determine the lateral sensitivity range one of the following methods shall be used:
This test uses the same setup as that used for single‑transducer probes (see 8.8.3).
The beam profile for each transducer shall be measured separately and the combined profile shall
be calculated from the product o f the two beam profiles.
Select a semi‑cylindrical test block with its radius close to the focal distance of the probe under test.
Operating each transducer of the probe in turn, scan the EM A receiver over the cylindrical surface
of the test block.
Record the amplitudes of the signals from the two transducers for each position within the
beam profile.
At each point within the beam multiply (dB values shall be added) the amplitudes measured for
each transducer.
These products give the directional pattern of the dual‑transducer probe.
The −6 dB boundaries o f the combined beam occur where these products are reduced by a 6 dB
drop from the maximum.
The measurement shall be made in two perpendicular directions, parallel and perpendicular to the
separation layer of the probe.
b) Using test blocks with 3 mm side‑drilled holes.
A test block shall be used which has a 3 mm side‑drilled hole close to the position of the focus
of the probe.
The probe shall be shifted on the coupling surface until the echo of the side‑drilled hole
drops by 6 dB.
These positions o f the probe provide the −6 dB focal width perpendicular to the beam axis.
The scanning shall be done parallel and perpendicular to the separation layer of the probe to give
two perpendicular focal widths.
c) Using test blocks with hemispherical‑bottomed hole.
A test block shall be used which has a hemispherical‑bottomed hole, maximum 10 mm diameter,
close to the position of the focus of the probe.
The probe shall be shifted on the coupling surface until the echo from the hemispherical‑bottomed
hole drops by 6 dB.
These positions o f the probe provide the −6 dB focal width perpendicular to the beam axis.
The scanning shall be done parallel and perpendicular to the separation layer of the probe to give
two perpendicular focal widths.

The width of the focal zone parallel and perpendicular to the separation layer shall be within ±20 % of
the manu facturer’s specification stated in the probe data sheet.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.10 Beam parameters for angle‑beam dual‑transducer contact probes
8.10.1 General
The procedures given in this subclause are for probes with flat contact sur faces only.
For angle‑beam dual‑element contact probes that generate waves on or along the object surface, e.g.
creeping waves or Rayleigh waves, a notch at the contact surface shall be used in 8.10.5 (focal distance),
8.10.6 (length of the focal zone) and 8.10.7 (focal width).
8.10.2 Index point
8.10.2.1 Procedure
The index point shall be determined using a test block as for a single‑transducer angle‑beam probe
(see 8.8.2).
The index point shall be within ±1 mm of the point marked by the manufacturer.
8.10.3 Beam angle and profiles
8.10.3.1 Procedure
The beam angle o f a dual-transducer probe shall be determined using an EMA receiver, reflecting side-
drilled holes or hemispherical‑bottomed holes:
This test uses the same setup as that for single‑transducer probes (see 8.8.3 ). The beam profile
o f each transducer o f the probe shall be measured separately and the combined profile shall be
calculated from the product o f the two beam profiles.
Operating each transducer in turn, scan the EM A receiver over the cylindrical surface of
the test block.
Record the amplitudes of the signals from the two transducers for each position within the
beam profile.
At each point within the beam multiply the measured amplitudes (dB values are added) for the two
transducers.
These products give the directional pattern of the dual‑transducer probe.
The 6 dB angles of divergence for the beam occur where these products are reduced by 6 dB from
the maximum.
The beam angle shall be calculated from the arithmetic mean of the angles of divergence.
b) Using side‑drilled holes of 3 mm diameter.
The same setup as for a single‑transducer probe shall be used (see 8.8.3).

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
c) Using hemispherical‑bottomed holes, maximum 10 mm diameter.
The same setup as for a single‑transducer probe shall be used (see 8.8.3).

The calculated beam angle shall be within ±2° of the nominal angle.
8.10.4 Wedge delay path

For angle‑beam dual‑transducer contact probes the echo out of a test block with a quadrant or a
hemicylindrical block shall be used whose reflecting sur face is at a distance nearest to the focal point
but within the focal zone of focused probes. The probe position shall be optimized in position to obtain
the maximum signal from the radius.
8.10.4.1 Procedure
Set the horizontal axis of the display to sound path mode, using the sound velocity of the test block.
Set the position of the transmitting pulse to the zero position on the horizontal axis of the screen.
Read the position o f the echo from the reflecting sur face o f the block, then subtract the distance in the
test block to obtain the wedge delay path.
The wedge delay path is expressed in mm material equivalent (e. g. steel) as near field
equivalent sound path.

The wedge delay path shall be within ±10 % o f the manu facturer’s specification stated in the
probe data sheet.
8.10.5 Distance to sensitivity maximum (focal distance)
8.10.5.1 Procedure
The focal distance shall be determined as for a dual‑transducer straight‑beam probe (see 8.9.4), using at
least eight points for the distance‑amplitude curve.

probe data sheet.
8.10.6 Axial sensitivity range (length o f the focal zone)
8.10.6.1 Procedure
The axial sensitivity range shall be determined as for a dual‑transducer straight‑beam probe (see 8.9.5).

probe data sheet.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
8.10.7 Lateral sensitivity range (focal width)
8.10.7.1 Procedure
The lateral sensitivity range shall be determined as for a straight‑beam dual‑transducer probe (see
8.9.5) using an EMA receiver, echoes from 3 mm side‑drilled holes or hemispherical‑bottomed holes,
maximum 10 mm diameter.

The width o f the focal zone shall be within ±10 % o f the manu facturer’s specification stated in the
probe data sheet.
8.11 Crosstalk
8.11.1 Procedure
Switch the ultrasonic instrument to separate transmitter/receiver mode and connect the probe to the
transmitter and receiver sockets.
Couple the probe to a reference block whose dimensions allow a back wall echo to be obtained within
the focal zone of the probe.
Adjust this echo to 80 % of the full screen height (FSH) and note the gain.
If the echo from the coupling surface is visible on the display screen, increase the gain until its amplitude
reaches 80 % of the FSH.
The dB-di fference to the first setting expresses the crosstalk (CT) .
If the coupling echo is not visible, it is only possible to give a lower limit for the CT.

The measured difference between the back wall echo and the CT shall be larger than 30 dB, if applicable.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Annex A
(normative)
Calculation o f the near field length o f non‑ focusing probes
A.1 General
The near field length o f a non- focusing transducer is calculated from the measured values o f centre
frequency f0 and of the measured angles of beam divergence γ in two perpendicular directions ( γ ⊥
and ? γ ). Usually in pulse-echo mode the angles o f divergence are defined by as a 6 dB drop from the
maximum amplitude.
A.2 Straight‑beam probes

If γ is the divergence angle parallel and γ ⊥ the angle perpendicular then for a circular transducer the
near field length is calculated as:
(
N0 = vb / 15 , 16 f0 sin2 [ γ ] ) (A.1)
for both angles γ ⊥ and ? γ
where vb is the sound velocity of the test block.
The larger N0 is taken as the near field length o f the circular transducer.
For rectangular transducers the angles of divergence are measured parallel to the sides a and b,
where a ≥ b .
With the measured angle γa parallel to the larger side and the measured centre frequency f0 the
effective side aeff of the rectangular transducer is calculated as:
aeff = ( 0 , 442 vb ) / ( f0 sin γa ) (A.2)
With the measured angle γb parallel to the smaller side and the centre frequency fo the effective side
beff is calculated as:
beff = ( 0 , 442 vb ) / ( f0 sin γb ) (A.3)
The aspect ratio is calculated as b eff/aeff. With this ratio the factor k can be taken from the diagram
in Figure A.1.
Then the near field length o f the rectangular transducer is:
( )
N0 = kaeff2 f0 / ( 4 vb ) (A.4)
where vb is the sound velocity in the test block.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
A.3 Angle‑beam probes

The near field length shall be calculated for angle-beam probes with a plane transducer and a plane
contact surface using the measured centre frequency fo and the measured angles of divergence γ in two
perpendicular directions (vertical plane and horizontal plane).
If γa is the angle measured in the vertical plane and γh is the angle measured in the plane perpendicular
to it, the near field length o f a circular transducer is calculated with the known sound velocity vb in
the test block:
(
N0 h = vb / 15 , 16 f0 sin2 [ γh ] ) (A.5)
(in the horizontal plane)
(
N0 a = vb / 15 , 16 f0 sin2 [ γ ] ) (A.6)
(in the vertical plane)
where
γ = γa cos β /cos α ;
α is the beam angle in the wedge of the angle‑beam probe (angle of incidence);
β is the beam angle in the material to be tested (angle of refraction) .
The larger one of N0h and N0a is the near field length o f the probe.
For rectangular transducers the effective sides aeff and b eff shall be calculated first. I f a is the larger
side and b the smaller one there are two cases:
a) the large side a is in the horizontal plane:
aeff = ( 0 , 442 vb ) / ( f0 sin γa ) (A.7)
beff = ( 0 , 442 vb ) / ( f0 sin [ γ ] ) (A.8)
with γ = γh cos β /cos α ;
b) the large side a is in the vertical plane:
aeff = ( 0 , 442 vb ) / ( f0 sin [ γ ] ) (A.9)
beff = ( 0 , 442 vb ) / ( f0 sin [ γh ] ) (A.10)
with γ = γh cos β /cos α ;
The aspect ratio (b eff/a eff) is calculated. Corresponding to this ratio there is a shape factor k shown
in Figure A.1.
The near field length o f the rectangular transducer is then calculated as:
( )
N0 = kseff2 f0 / ( 4 vb ) (A.11)
with seff being the larger one out of a eff and b eff and vb being the sound velocity of the test block.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
k shape factor
b eff/ a eff aspect ratio
Figure A.1 — Shape factor k to calculate the near field length o f rectangular transducers

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Annex B
(informative)
Calibration block for angle‑beam probes
This steel block according to Figure B.1 has a quarter cylinder and side‑drilled holes of 4 mm diameter.
Steel quality and heat treatment are as for calibration block No. 2 according to ISO 7963.
Three different L‑shaped scales for the interval of beam angles from
— 35° to 65°;
— 60° to 75°;
— 70° to 85°
can be attached to the same block (Figure B.1 and Figure B.2).
In a first step the scale suited to the probe’s beam angle is chosen, e.g. for a 45° probe the scale No. 3
with a scale from 35° to 65° shall be used. This L‑shaped scale is attached to the steel block, where the
two bolts of the scale plug two of the three 4 mm side‑drilled holes in the block.
The remaining hole is used as a cylindrical reflector to determine the beam angle.
A magnetic pad on the scale fixes the scale to the steel block.
The edge of the scale is used as a ruler to guide the probe.
In a first step the probe is coupled to the block at the centre o f the quadrant. By shi fting the probe, the
echo from the 100 mm radius is maximized. The centre line of the quadrant then marks the index point
[Figure B.3, a)] .
In the next step the probe is coupled to the block so that the sound beam hits the empty 4 mm side‑
drilled hole [Figure B.3, b)] . By shifting the probe, the echo from the hole is maximized. The beam angle
is then read from the scale at the position of the index point of the probe.

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Key
1 magnetic pad
2 two b o lts which fit into the 4 mm ho les
3 4 mm side‑drilled holes
Figure B.1 — Steel calibration block with detachable scales for angle‑beam contact probes
Key
a distance between the centre line of the quadrant and the start of scale engravings
d distance between the start of the scale and the respective scale mark

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
NOTE For values of a and d, refer to Table B.1.
Figure B.2 — L‑shaped scales No 1, 2 and 3 to be attached to the calibration block in Figure B.1
Table B.1 — Measures o f the scale engravings in Figure B.2

Scale 1 Scale 2 Scale 3
angle a d angle a d angle a d
° mm mm ° mm mm ° mm mm
64 50,8 0 54 75,1 0 34 67,2 0
66 — 2 ,9 56 — 4,2 36 — 3,6
68 — 6,4 58 — 9,0 38 — 7,5
70 — 10,5 60 — 14,2 40 — 11,5
72 — 15,4 62 — 20,2 42 — 15,8
74 — 21,6 64 — 27,0 44 — 20,4
76 — 29,4 66 — 34,8 46 — 25,3
78 — 39,8 68 — 43,9 48 — 30,5
80 — 54,3 70 — 54,8 50 — 36,2
82 — 76,0 72 — 68,1 52 — 42 ,4
84 — 112 ,0 74 — 84,4 54 — 49,1
— — — — — — 56 — 56,6
— — — — — — 58 — 64,8
— — — — — — 60 — 74,0
— — — — — — 62 — 84,4
— — — — — — 64 — 96,3
a) Determination o f the index point
b) Determination o f the beam angle
Figure B.3 — Determination o f beam parameters o f angle‑beam probes

BS EN ISO 22232‑2:2020
ISO 22232‑2:2020
Annex C
(informative)
Determination o f delay line and wedge delays
C.1 General
Delay line and wedge delay can be determined by mechanical measurements together with the known
sound velocity of the delay line or wedge material.
Alternatively, an ultrasonic measurement can be performed as described in C.2 .
C.2 Single‑transducer probes
C.2.1 Delay line delay

For straight‑beam single‑transducer contact probes, the echo out of a test block with a quadrant, a
hemicylindrical block or a block with parallel faces is used whose reflecting sur face is at a distance
larger than 1,5 times o f the near field length o f the probe or within the focal zone o f focused probes. I f a
test block with a quadrant or a hemicylindrical block is used the probe shall be optimized in position to
obtain the maximum signal from the curved surface of the block.
Set the horizontal axis of the display to sound path mode, using the sound velocity of the test block. Set
the position of the transmitting pulse to the zero position on the horizontal axis of the screen. Read
the position o f the echo from the reflecting sur face o f the block, then subtract the actual distance (e. g.
radius or thickness) in the test block to obtain the delay line delay. The delay line delay path is expressed
in mm material equivalent (e. g. steel), as near field equivalent sound path.
C.2.2 Wedge delay

For angle‑beam single‑transducer contact probes, the echo out of a test block with a quadrant or a
hemicylindrical block is used whose reflecting sur face is at a distance larger than 1,5 times o f the near
field length o f the probe or within the focal zone o f the focused probes.
The probe position shall be optimized in position to obtain the maximum signal from the curved surface
of the block.
Set the horizontal axis of the display to sound path mode, using the sound velocity of the test block.
Set the position of the transmitting pulse to the zero position on the horizontal axis of the screen.
Read the position o f the echo from the reflecting sur face o f the block, then subtract the actual distance
(e. g. radius) in the test block to obtain the wedge delay. The wedge delay is expressed in mm material
equivalent (e. g. steel) sound path (near field equivalent).
C.3 Dual‑transducer probes

For dual‑transducer probes the same methods as for single‑transducer probes can be used provided
that the measurement is performed for each transducer separately in echo mode.

BS EN ISO 2 2 23 2 ‑2 : 2 02 0
ISO 22232‑2:2020
Bibliography
[1] ISO 22232‑3, Non-destructive testing — Characterization and verification o f ultrasonic test
equipment — Part 3: Combined equipment
[2] ISO 9001, Quality management systems — Requirements
[3] ISO/IEC 17025, General requirements for the competence o f testing and calibration laboratories
© ISO 2 020 – All rights reserved 55

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BS EN ISO 22232‑2:2020

BSI Standards Publication

Non-destructive testing — Characterization and

Amendments/corrigenda issued since publication

Non‑destructive testing ‑ Characterization and

This European Standard was approved by CEN on 21 September 2020.

EUROPEAN COMMITTEE FOR STANDARDIZATION

CEN‑CENELEC Management Centre: Rue de la Science 23, B‑1040 Brussels

© ISO 2020 – All rights reserved iii

8.9.3 Focal distance .................................................................................................................................................................. 43

iv © ISO 2020 – All rights reserved

© ISO 2020 – All rights reserved v

Non-destructive testing — Characterization and

3 Terms and definitions

© ISO 2020 – All rights reserved 1

Note 1 to entry: See Figure 1.

Figure 1 — Typical ultrasonic pulse

Note 1 to entry: See Figure 2 .

2 © ISO 2020 – All rights reserved

Figure 2 — Squint angle and o ffset for a straight‑beam probe

© ISO 2020 – All rights reserved 3

Symbol Unit Meaning

ΩY ° Angle of beam divergence in Y direction

5 General requirements o f con formity

Table 1 — List o f tests for ultrasonic probes

4 © ISO 2020 – All rights reserved

Manu facturer’s tests

6 Technical in formation for probes

6.2 Probe data sheet

6.3 Probe test report

© ISO 2020 – All rights reserved 5

6 © ISO 2020 – All rights reserved

Probe data Probe test

7.1 Electronic equipment

7.2 Test blocks and other equipment

© ISO 2020 – All rights reserved 7

8 © ISO 2020 – All rights reserved

Figure 3 — Example o f a hemicylindrical‑stepped block

© ISO 2020 – All rights reserved 9

Figure 4 — Example o f a test block with 3 mm side‑drilled holes

10 © ISO 2020 – All rights reserved

Figure 5 — Example o f a test block with side‑drilled holes (SDH)

© ISO 2020 – All rights reserved 11

Figure 6 — Example o f a test block with notches

12 © ISO 2020 – All rights reserved

Figure 7 — Examples o f test blocks with side‑drilled and hemispherical‑bottomed holes

© ISO 2 020 – All rights reserved 13

For measuring distances, the following equipment shall be used:

g) Feeler gauges starting at 0,05 mm.

Table 3 — Steel ball (rod) diameters for di fferent frequencies

The water temperature shall be reported in the probe data sheet.

14 © ISO 2020 – All rights reserved

8 Performance requirements for probes

8.1 Physical aspects

8.1.2 Acceptance criterion

8.2 Pulse shape, amplitude and duration

© ISO 2020 – All rights reserved 15

a) Method using an ultrasonic instrument

b) Method using an ultrasonic pulser with receiver stage