74HC173
74HC173
74HC173
Features Description
• Three-State Buffered Outputs The Harris CD74HC173 and CD74HCT173 high speed
• Gated Input and Output Enables three-state quad D-type flip-flops are fabricated with silicon
[ /Title gate CMOS technology. They possess the low power con-
(CD74H • Fanout (Over Temperature Range) sumption of standard CMOS Integrated circuits, and can
- Standard Outputs . . . . . . . . . . . . . . . 10 LSTTL Loads operate at speeds comparable to the equivalent low power
C173, - Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads Schottky devices. The buffered outputs can drive 15 LSTTL
CD74H • Wide Operating Temperature Range . . . -55oC to 125oC loads. The large output drive capability and three-state fea-
CT173) • Balanced Propagation Delay and Transition Times ture make these parts ideally suited for interfacing with bus
/Subject lines in bus oriented systems.
• Significant Power Reduction Compared to LSTTL
(High Logic ICs The four D-type flip-flops operate synchronously from a com-
Speed • HC Types mon clock. The outputs are in the three-state mode when
CMOS - 2V to 6V Operation either of the two output disable pins are at the logic “1” level.
The input ENABLES allow the flip-flops to remain in their
Logic - High Noise Immunity: NIL = 30%, NIH = 30% of VCC
at VCC = 5V present states without having to disrupt the clock If either of
Quad D- the 2 input ENABLES are taken to a logic “1” level, the Q
• HCT Types outputs are fed back to the inputs, forcing the flip-flops to
Type - 4.5V to 5.5V Operation remain in the same state. Reset is enabled by taking the
- Direct LSTTL Input Logic Compatibility, MASTER RESET (MR) input to a logic “1” level. The data
VIL= 0.8V (Max), VIH = 2V (Min) outputs change state on the positive going edge of the clock.
- CMOS Input Compatibility, Il ≤ 1µA at VOL, VOH
The CD74HCT173 logic family is functionally, as well as pin
compatible with the standard 74LS logic family.
Pinout Ordering Information
CD74HC173, CD74HC173
(PDIP, SOIC) TEMP. RANGE PKG.
TOP VIEW PART NUMBER (oC) PACKAGE NO.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. File Number 1641.1
Copyright © Harris Corporation 1998
1
CD74HC173, CD74HCT173
Functional Diagram
E1
E2
10 9
14
D0 3
13 Q0
D1 4
12 Q1
D2 5
11 Q2
D3 6
7 Q3
CP
15 1 2
MR
OE1
OE2
TRUTH TABLE
INPUTS
MR CP E1 E2 D Qn
H X X X X L
L L X X X Q0
L ↑ H X X Q0
L ↑ X H X Q0
L ↑ L L L L
L ↑ L L H H
NOTE:
When either OE1 or OE2 (or both) is (are) high the output is disabled
to the high-impedance state, however, sequential operation of the
flip-flops is not affected.
H = High Voltage Level
L = Low Voltage Level
X = Irrelevant
↑ = Transition from Low to High Level
Q0 = Level Before the Indicated Steady-State Input Conditions Were
Established
2
CD74HC173, CD74HCT173
Logic Diagram
9
E1
10
E2
VCC
D Q
14 P
D0
3
Q0
7
CP CP Q
N
R
15
MR
1
OE1
2
OE2
13 4
D1 Q1
12 3 CIRCUITS IDENTICAL TO ABOVE CIRCUIT 5
D2 Q2
IN DASHED ENCLOSURE
11 6
D3 Q3
3
CD74HC173, CD74HCT173
Operating Conditions
Temperature Range (TA) . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, VCC
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to VCC
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
DC Electrical Specifications
TEST
CONDITIONS 25oC -40oC TO 85oC -55oC TO 125oC
PARAMETER SYMBOL VI (V) IO (mA) VCC (V) MIN TYP MAX MIN MAX MIN MAX UNITS
HC TYPES
4
CD74HC173, CD74HCT173
TEST
CONDITIONS 25oC -40oC TO 85oC -55oC TO 125oC
PARAMETER SYMBOL VI (V) IO (mA) VCC (V) MIN TYP MAX MIN MAX MIN MAX UNITS
HCT TYPES
High Level Output VOH VIH or -0.02 4.5 4.4 - - 4.4 - 4.4 - V
Voltage VIL
CMOS Loads
Low Level Output VOL VIH or 0.02 4.5 - - 0.1 - 0.1 - 0.1 V
Voltage VIL
CMOS Loads
NOTE:
4. For dual-supply systems theoretical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA.
D0-D3 0.15
E1 and E2 0.15
CP 0.25
MR 0.2
5
CD74HC173, CD74HCT173
6
CD74HC173, CD74HCT173
PARAMETER SYMBOL VCC (V) MIN MAX MIN MAX MIN MAX UNITS
HC TYPES
Maximum Clock Frequency fMAX 2 6 - 5 - 4 - MHz
4.5 30 - 24 - 20 - MHz
6 35 - 28 - 24 - MHz
4.5 16 - 20 - 24 - ns
6 14 - 17 - 20 - ns
4.5 16 - 20 - 24 - ns
6 14 - 17 - 20 - ns
6 10 - 13 - 15 - ns
4.5 3 - 3 - 3 - ns
6 3 - 3 - 3 - ns
4.5 0 - 0 - 0 - ns
6 0 - 0 - 0 - ns
4.5 12 - 15 - 18 - ns
6 10 - 13 - 15 - ns
HCT TYPES
Maximum Clock Frequency fMAX 4.5 20 - 16 - 13 - MHz
7
CD74HC173, CD74HCT173
VCC 3V
90% 2.7V
CLOCK 50% CLOCK 1.3V
50% 50% 1.3V 1.3V
10% 10% GND 0.3V 0.3V GND
NOTE: Outputs should be switching from 10% VCC to 90% VCC in NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For fMAX, input duty cycle = 50%. accordance with device truth table. For fMAX, input duty cycle = 50%.
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH PULSE WIDTH
90% 90%
50% 1.3V
INVERTING 10% INVERTING
10%
OUTPUT OUTPUT
tPHL tPLH tPHL tPLH
FIGURE 3. HC AND HCU TRANSITION TIMES AND PROPAGA- FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION
TION DELAY TIMES, COMBINATION LOGIC DELAY TIMES, COMBINATION LOGIC
VCC 3V
DATA DATA
50% INPUT 1.3V 1.3V 1.3V
INPUT
GND GND
tSU(H) tSU(L) tSU(H) tSU(L)
tREM tREM
VCC 3V
SET, RESET 50% SET, RESET 1.3V
OR PRESET OR PRESET
GND GND
IC IC
CL CL
50pF 50pF
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME, FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS TRIGGERED SEQUENTIAL LOGIC CIRCUITS
8
Test Circuits and Waveforms (Continued)
OTHER OUTPUT
INPUTS IC WITH RL = 1kΩ
TIED HIGH THREE- VCC FOR tPLZ AND tPZL
OR LOW STATE CL GND FOR tPHZ AND tPZH
OUTPUT 50pF
OUTPUT
DISABLE
NOTE: Open drain waveforms tPLZ and tPZL are the same as those for three-state shown on the left. The test circuit is Output RL = 1kΩ to
VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
9
IMPORTANT NOTICE
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.