Cited By
View all- Gong YChakravarty S(1997)Using fault sampling to compute I/sub DDQ/ diagnostic test setsProceedings of the 15th IEEE VLSI Test Symposium10.5555/832297.836394Online publication date: 27-Apr-1997
On adaptive diagnostic test generation
Pages 181 - 184
Abstract
Adaptive Diagnosis, a paradigm for diagnosis, is defined. A system based on this paradigm, for I_{DDQ} measurement based diagnosis of bridging faults, is reported. Experimental evaluation of the system shows it to be substantially superior to existing systems, especially for larger circuits.
References
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R. S. Reddy, I. Pomeranz, S. M. Reddy, and S. Kajihara, "Compact Test Generation for Bridging Faults under IDDQ Testing", VLSI Test Symposium, pp. 310-316, 1995.
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Index Terms
- On adaptive diagnostic test generation
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Copyright © Copyright (c) 1995 Institute of Electrical and Electronics Engineers, Inc. All rights reserved.
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- SIGDA: ACM Special Interest Group on Design Automation
- IEEE-CS: Computer Society
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IEEE Computer Society
United States
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Published: 01 December 1995
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ICCAD '95
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- SIGDA
- IEEE-CS
ICCAD '95: International Conference on Computer Aided Design
November 5 - 9, 1995
California, San Jose, USA
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Overall Acceptance Rate 457 of 1,762 submissions, 26%
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View all- Gong YChakravarty S(1997)Using fault sampling to compute I/sub DDQ/ diagnostic test setsProceedings of the 15th IEEE VLSI Test Symposium10.5555/832297.836394Online publication date: 27-Apr-1997
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