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Diagnosis of realistic bridging faults with single stuck-at information

Authors:

F. Joel Ferguson,

Tracy LarrabeeAuthors Info & Claims

ICCAD '95: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design

Pages 185 - 192

Published: 01 December 1995 Publication History

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Abstract

Abstract: Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnosing bridging faults using single stuck-at dictionaries was applied only to small circuits, produced large and imprecise diagnoses, and did not take into account the Byzantine Generals Problem for bridging faults. We analyze the original technique and improve it by introducing the concepts of match restriction, match requirement, and failure recovery. Our new technique, which requires no information other than that used by standard stuck-at methods, produces diagnoses that are an order of magnitude smaller than those produced by the original technique and produces many fewer misleading diagnoses than that of traditional stuck-at diagnosis.

References

[1]

J. M. Acken and S. D. Millman. Accurate modeling and simulation of bridging faults. Proceedings of the Custom Integrated Circuits Co@rnce, pages 17.4.1-17.4.4, 1991.

[2]

J. M. Acken and S. D. Millman. Fault model evolution for diagnosis: Accuracy vs precision. Proceedings of the Custom Integrated Circuits Confernce, 1992.

[3]

R. C. Aitken and P. C. Maxwell. Better models or better algorithms? on techniques to improve fault diagnosis. Hewlett-Packard Journal, February 1995.

[4]

F. Brglez and H. Fujiwara. A neutral netlist of 10 combinational benchmark circuits and a target translator in fortran. In Proceedings of the IEEE International Symposium on Circuits and Systems, 1985.

[5]

S. Chakravarty and Y. Gong. An algorithm for diagnosing two-line bridging faults in combinational circuits. Proceedings of Design Automation Conference, pages 520-524, 1993.

Digital Library

[6]

B. Chess. Diagnostic test pattern generation and the creation of small fault dictionaries. Master's thesis, University of California, Santa Cruz, June 1995.

[7]

B. Chess and T. Larrabee. Bridge fault simulation strategies for CMOS integrated circuits. In Proceedings of Design Automation Co@fence, pages 458-462, 1993.

Digital Library

[8]

B. Chess, T. Larrabee, and C. Roth. On evaluating competing bridge fault models for CMOS ICs. In Proceedings of the 1992t VLSI Test Symposium, pages 446-451. IEEE, 1994.

[9]

D. Feltham and W. Maly. Physically realistic fault models for analog CMOS neural networks. IEEE Journal of Solid-State Circuits, 26(9):1223-1229, September 1991.

[10]

F. Joel Ferguson and Tracy Larrabee. Test pattern generation for realistic bridge faults in CMOS ICs. In Proceedings of International Test Co@rence, pages 492-499. IEEE, 1991.

Digital Library

[11]

T. Gruning, H. Koopmeiners, and U. Mahlstedt. DIATEST: A fast diagnostic test pattern generator for combinational circuits. In Proceedings of International Co@fence on Computer-Aided Design, pages 194-197. IEEE, 1991.

[12]

A. Jee and F. J. Ferguson. Carafe: A software tool for failure analysis. In Proceedings of International Symposium for Testing and Fault Analysis, pages 143-149, 1993.

[13]

A. Jee and F. J. Ferguson. Carafe: An inductive fault analysis tool for CMOS VLSI circuits. In Proceedings of the IEEE VLSI Test Symposium, pages 92-98, 1993.

[14]

T. Larrabee. Test pattern generation using boolean satisfiability. IEEE Transactions on Computer-Aided Design, pages 4-15, January 1992.

[15]

P. Maxwell and R. Aitken. Biased voting: a method for simulating CMOS bridging faults in the presence of variable gate logic thresholds. In Proceedings of International Test Co@fence, pages 63-72. IEEE, 1993.

Digital Library

[16]

K.C.Y. Mei. Bridging and stuck-at faults. IEEE Transactions on Computers, C-23(7):720- 727, July 1974.

Digital Library

[17]

S.D. Millman, E.J. McCluskey, and J.M. Acken. Diagnosising CMOS bridging faults with stuck-at fault dictionaries. In Proceedings of International Test Conference, pages 860-870. IEEE, 1990.

[18]

J. Richman and K. R. Bowden. The modern fault dictionary. In Proceedings of International Test Conference, pages 696-702. IEEE, 1985.

Cited By

Pomeranz IReddy S(2010)Selection of a fault model for fault diagnosis based on unique responsesIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202550318:11(1533-1543)Online publication date: 1-Nov-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025503
Pomeranz IReddy S(2010)On undetectable faults and fault diagnosisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.205347629:11(1832-1837)Online publication date: 1-Nov-2010
https://dl.acm.org/doi/10.1109/TCAD.2010.2053476
Pomeranz IReddy SBenini LDe Micheli GAl-Hashimi BMueller W(2009)Selection of a fault model for fault diagnosis based on unique responsesProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874862(994-999)Online publication date: 20-Apr-2009
https://dl.acm.org/doi/10.5555/1874620.1874862
Show More Cited By

Index Terms

Diagnosis of realistic bridging faults with single stuck-at information
1. Hardware
  1. Hardware test
  2. Robustness
    1. Hardware reliability

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cover image ACM Conferences

ICCAD '95: Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design

December 1995

748 pages

ISBN:0818672137

Chairman:
Richard Rudell
Synopsys, Inc., Mountain View, CA

Copyright © Copyright (c) 1995 Institute of Electrical and Electronics Engineers, Inc. All rights reserved.

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SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS: Computer Society

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IEEE Computer Society

United States

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Published: 01 December 1995

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ICCAD '95

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ICCAD '95: International Conference on Computer Aided Design

November 5 - 9, 1995

California, San Jose, USA

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Overall Acceptance Rate 457 of 1,762 submissions, 26%

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Cited By

Pomeranz IReddy S(2010)Selection of a fault model for fault diagnosis based on unique responsesIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2009.202550318:11(1533-1543)Online publication date: 1-Nov-2010
https://dl.acm.org/doi/10.1109/TVLSI.2009.2025503
Pomeranz IReddy S(2010)On undetectable faults and fault diagnosisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2010.205347629:11(1832-1837)Online publication date: 1-Nov-2010
https://dl.acm.org/doi/10.1109/TCAD.2010.2053476
Pomeranz IReddy SBenini LDe Micheli GAl-Hashimi BMueller W(2009)Selection of a fault model for fault diagnosis based on unique responsesProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874862(994-999)Online publication date: 20-Apr-2009
https://dl.acm.org/doi/10.5555/1874620.1874862
Pomeranz IVenkataraman SReddy S(2005)Fault Diagnosis and Fault Model AliasingProceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design10.1109/ISVLSI.2005.34(206-211)Online publication date: 11-May-2005
https://dl.acm.org/doi/10.1109/ISVLSI.2005.34
Hora CSegers REichenberger SLousberg M(2003)On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-UpJournal of Electronic Testing: Theory and Applications10.1023/A:102463642403519:4(369-376)Online publication date: 1-Aug-2003
https://dl.acm.org/doi/10.1023/A%3A1024636424035
Venkataraman SDrummonds S(2001)PoirotIEEE Design & Test10.1109/54.90281918:1(19-30)Online publication date: 1-Jan-2001
https://dl.acm.org/doi/10.1109/54.902819
Venkataraman SDrummonds S(2000)POIROT1Proceedings of the 2000 IEEE International Test Conference10.5555/839295.843644Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843644
Shigeta KIshiyama T(2000)An Improved Fault Diagnosis Algorithm Based on Path Tracing with Dynamic Circuit ExtractionProceedings of the 2000 IEEE International Test Conference10.5555/839295.843641Online publication date: 3-Oct-2000
https://dl.acm.org/doi/10.5555/839295.843641
Boppana VFujita M(1998)Modeling the unknown! Towards model-independent fault and error diagnosisProceedings of the 1998 IEEE International Test Conference10.5555/648020.745623Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745623
Saxena JButler KBalachandran HLavo DLarrabee TFerguson FChess B(1998)On applying non-classical defect models to automated diagnosisProceedings of the 1998 IEEE International Test Conference10.5555/648020.745475(748-757)Online publication date: 18-Oct-1998
https://dl.acm.org/doi/10.5555/648020.745475
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