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10.5555/648015.745723guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic

Published: 17 October 1993 Publication History

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  • (2017)A bridging fault model for line coverage in the presence of undetected transition faultsProceedings of the Conference on Design, Automation & Test in Europe10.5555/3130379.3130603(938-941)Online publication date: 27-Mar-2017
  • (2017)Link TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-017-5646-033:2(209-225)Online publication date: 1-Apr-2017
  • (2010)Parallel X-fault simulation with critical path tracing techniqueProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871139(879-884)Online publication date: 8-Mar-2010
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  1. Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic

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    Published In

    cover image Guide Proceedings
    Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
    October 1993
    1015 pages
    ISBN:0780314301

    Publisher

    IEEE Computer Society

    United States

    Publication History

    Published: 17 October 1993

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    • (2017)A bridging fault model for line coverage in the presence of undetected transition faultsProceedings of the Conference on Design, Automation & Test in Europe10.5555/3130379.3130603(938-941)Online publication date: 27-Mar-2017
    • (2017)Link TestingJournal of Electronic Testing: Theory and Applications10.1007/s10836-017-5646-033:2(209-225)Online publication date: 1-Apr-2017
    • (2010)Parallel X-fault simulation with critical path tracing techniqueProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871139(879-884)Online publication date: 8-Mar-2010
    • (2009)SUPERBACM Transactions on Design Automation of Electronic Systems10.1145/1562514.159683114:4(1-21)Online publication date: 28-Aug-2009
    • (2009)Partitioned n-detection test generationProceedings of the 19th ACM Great Lakes symposium on VLSI10.1145/1531542.1531566(93-98)Online publication date: 10-May-2009
    • (2008)A bridging fault model where undetectable faults imply logic redundancyProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403660(1166-1171)Online publication date: 10-Mar-2008
    • (2008)Resistive bridging fault simulation of industrial circuitsProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403527(628-633)Online publication date: 10-Mar-2008
    • (2008)Scan chain organization for embedded diagnosisProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403487(468-473)Online publication date: 10-Mar-2008
    • (2006)Extracting Defect Density and Size Distributions from Product ICsIEEE Design & Test10.1109/MDT.2006.11723:5(390-400)Online publication date: 1-Sep-2006
    • (2005)Fault Diagnosis and Fault Model AliasingProceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design10.1109/ISVLSI.2005.34(206-211)Online publication date: 11-May-2005
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