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Pentium Pro Processor Design for Test and Debug

Published: 01 July 1998 Publication History

Abstract

This article describes the Design for Test (DFT) and silicon debug features of the Pentium Pro processor, and its production test development methodology. The need to quickly ramp a complex, high-performance microprocessor into high-volume manufacturing with low defect rates led the design team to a custom low-area DFT approach, coupled with a manually-written test methodology which targeted several fault models. Results show that this approach was effective in balancing testability needs with other design constraints, while enabling excellent time to market and test quality.

References

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R. Colwell and R. Steck, "A 0.6um BiCMOS Processor with Dynamic Execution," Digest of Tech. Papers, Int'l Solid-State Circuits Conf., IEEE, Piscataway, N.J., Feb 1995, pp. 176-177.
[2]
Intel Pentium II Processor Web page, http://www.intel.com/pentiumII/home.htm.
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M. Levitt, "Designing UltraSparc for Testability," IEEE Design & Test of Computers, Vol. 14, No. 1, Jan.-Mar. 1997, pp. 10-17.
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D. Bhavsar and J. Edmondson, "Alpha 21164 Testability Strategy," IEEE Design & Test of Computers, Vol. 14, No. 1, Jan.-Mar. 1997, pp. 25-33.
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A. Crouch M. Pressly and J. Circello, "Testability Features of the MC68060 Microprocessor," Proc. IEEE Int'l Test Conf., IEEE Computer Society Press, Los Alamitos, Calif., 1994, pp. 60-69.
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C. Hunter E. Vida-Torku and J. LeBlanc, "Balancing Structured and Ad-Hoc Design for Test: Testing the PowerPC 603™ Microprocessor," Proc. IEEE Int'l Test Conf., IEEE CS Press, 1994, pp. 76-83.
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Cited By

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  • (2013)Deterministic Replay Using Global ClockACM Transactions on Architecture and Code Optimization10.1145/2445572.244557310:1(1-28)Online publication date: 1-Apr-2013
  • (2012)Formal-analysis-based trace computation for post-silicon debugIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2011.216641620:11(1997-2010)Online publication date: 1-Nov-2012
  • (2010)A multi-FPGA based platform for emulating a 100m-transistor-scale processor with high-speed peripherals (abstract only)Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays10.1145/1723112.1723160(283-283)Online publication date: 21-Feb-2010
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  1. Pentium Pro Processor Design for Test and Debug

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    Published In

    cover image IEEE Design & Test
    IEEE Design & Test  Volume 15, Issue 3
    July 1998
    124 pages

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    IEEE Computer Society Press

    Washington, DC, United States

    Publication History

    Published: 01 July 1998

    Author Tags

    1. Pentium Pro
    2. debugging
    3. design for test
    4. microprocessors
    5. production test

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    View all
    • (2013)Deterministic Replay Using Global ClockACM Transactions on Architecture and Code Optimization10.1145/2445572.244557310:1(1-28)Online publication date: 1-Apr-2013
    • (2012)Formal-analysis-based trace computation for post-silicon debugIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2011.216641620:11(1997-2010)Online publication date: 1-Nov-2012
    • (2010)A multi-FPGA based platform for emulating a 100m-transistor-scale processor with high-speed peripherals (abstract only)Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays10.1145/1723112.1723160(283-283)Online publication date: 21-Feb-2010
    • (2007)Fault tolerant systems design in VLSI using data compression under constraints of failure probabilitiesProceedings of the 6th WSEAS international conference on Computational intelligence, man-machine systems and cybernetics10.5555/1984502.1984559(329-337)Online publication date: 14-Dec-2007
    • (2006)PhoenixProceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture10.1109/MICRO.2006.41(26-37)Online publication date: 9-Dec-2006

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