Article

Statistical estimation of leakage current considering inter- and intra-die process variation

Authors:

Ashish Srivastava,

David Blaauw, and

Dennis SylvesterAuthors Info & Claims

ISLPED '03: Proceedings of the 2003 international symposium on Low power electronics and design

August 2003

Pages 84 - 89

https://doi.org/10.1145/871506.871530

Published: 25 August 2003 Publication History

Abstract

We develop a method to estimate the variation of leakage current due to both intra-die and inter-die gate length process variability. We derive an analytical expression to estimate the probability density function (PDF) of the leakage current for stacked devices found in CMOS gates. These distributions of individual gate leakage currents are then combined to obtain the mean and variance of the leakage current for an entire circuit. We also present an approach to account for both the inter- and intra-die gate length variations to ensure that the circuit leakage PDF correctly models both types of variation. The proposed methods were implemented and tested on a number of benchmark circuits. Comparison to Monte-Carlo simulation validates the accuracy of the proposed method and demonstrates the efficiency of the proposed analysis method. Comparison with traditional deterministic leakage current analysis demonstrates the need for statistical methods for leakage current analysis.

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Cited By

Papadimitriou GGizopoulos D(2022)Harnessing Voltage margins for Balanced Energy and PerformanceComputing at the EDGE10.1007/978-3-030-74536-3_3(51-90)Online publication date: 20-Sep-2022
https://doi.org/10.1007/978-3-030-74536-3_3
Chowdhury PGuin USingh AAgrawal V(2021)Estimating Operational Age of an Integrated CircuitJournal of Electronic Testing10.1007/s10836-021-05927-3Online publication date: 7-Jun-2021
https://doi.org/10.1007/s10836-021-05927-3
Kwon HLee SKim YKang S(2020)Additive Statistical Leakage Analysis Using Exponential Mixture ModelIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2020.2975154(1-1)Online publication date: 2020
https://doi.org/10.1109/TCAD.2020.2975154
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Index Terms

Statistical estimation of leakage current considering inter- and intra-die process variation
1. Computing methodologies
  1. Modeling and simulation
    1. Model development and analysis
      1. Modeling methodologies

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cover image ACM Conferences

ISLPED '03: Proceedings of the 2003 international symposium on Low power electronics and design

August 2003

502 pages

ISBN:158113682X

DOI:10.1145/871506

General Chairs:
Ingrid Verbauwhede
University of California, Los Angeles, CA
,
Hyung Roh
Samsung Electronics

Copyright © 2003 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 25 August 2003

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ISLPED03: International Symposium on Low Power Electronics and Design

August 25 - 27, 2003

Seoul, Korea

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ISLPED '03 Paper Acceptance Rate 90 of 221 submissions, 41%;

Overall Acceptance Rate 398 of 1,159 submissions, 34%

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Cited By

Papadimitriou GGizopoulos D(2022)Harnessing Voltage margins for Balanced Energy and PerformanceComputing at the EDGE10.1007/978-3-030-74536-3_3(51-90)Online publication date: 20-Sep-2022
https://doi.org/10.1007/978-3-030-74536-3_3
Chowdhury PGuin USingh AAgrawal V(2021)Estimating Operational Age of an Integrated CircuitJournal of Electronic Testing10.1007/s10836-021-05927-3Online publication date: 7-Jun-2021
https://doi.org/10.1007/s10836-021-05927-3
Kwon HLee SKim YKang S(2020)Additive Statistical Leakage Analysis Using Exponential Mixture ModelIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2020.2975154(1-1)Online publication date: 2020
https://doi.org/10.1109/TCAD.2020.2975154
Chowdhury PGuin USingh AAgrawal V(2019)Two-Pattern ∆IDDQ Test for Recycled IC Detection2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID)10.1109/VLSID.2019.00033(82-87)Online publication date: Jan-2019
https://doi.org/10.1109/VLSID.2019.00033
Guin UWang WHarper CSingh A(2019)Detecting Recycled SoCs by Exploiting Aging Induced Biases in Memory Cells2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)10.1109/HST.2019.8741032(72-80)Online publication date: May-2019
https://doi.org/10.1109/HST.2019.8741032
Helms DEilers RMetzdorf MNebel W(2018)Leakage Models for High-Level Power EstimationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2017.276051937:8(1627-1639)Online publication date: Aug-2018
https://doi.org/10.1109/TCAD.2017.2760519
Cho MJeon NKim TJeong MLee SHong JHong HYamada S(2018)An Innovative Indicator to Evaluate DRAM Cell Transistor Leakage Current DistributionIEEE Journal of the Electron Devices Society10.1109/JEDS.2017.27580266(494-499)Online publication date: 2018
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Cho MJeon NJeong MLee SYamada SHong H(2017)A novel method to characterize DRAM process variation by the analyzing stochastic properties of retention time distribution2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM)10.1109/EDTM.2017.7947550(132-133)Online publication date: Feb-2017
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Zhu ZChaturvedi VSingh AZhang WCui Y(2017)Two-stage thermal-aware scheduling of task graphs on 3D multi-cores exploiting application and architecture characteristics2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC)10.1109/ASPDAC.2017.7858343(324-329)Online publication date: Jan-2017
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Xu YTeich J(2016)Hierarchical Statistical Leakage Analysis and Its ApplicationACM Transactions on Design Automation of Electronic Systems10.1145/289682021:4(1-22)Online publication date: 2-Sep-2016
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