Article

Auto-Calibrating Analog Timer for On-Chip Testing

Authors:

B. Provost,

E. Sánchez-SinencioAuthors Info & Claims

ITC '99: Proceedings of the 1999 IEEE International Test Conference

Page 541

Published: 28 September 1999 Publication History

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Abstract

A practical approach for generating precise andslow analog ramps to be used for time-domain analogtesting and for monotonicity and histogram test of ADCsis presented. The technique uses a discrete-time adaptivescheme to calibrate the ramp generator. Twoimplementations of the approach are proposed: one isentirely single-ended and the second uses a pseudo-differential-based offset cancellation scheme. The firstimplementation has been implemented in 2µm technologyand experimental results are in agreement withsimulations yielding a slope error of 1.5% and distortionof 0.2%.

References

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Cited By

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Parthasarathy KKuyel TPrice DJin LChen DGeiger R(2003)BIST and production testing of ADCs using imprecise stimulusACM Transactions on Design Automation of Electronic Systems10.1145/944027.9440358:4(522-545)Online publication date: 1-Oct-2003
https://dl.acm.org/doi/10.1145/944027.944035
Bernard SAzaïs FBertrand YRenovell M(2003)On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BISTJournal of Electronic Testing: Theory and Applications10.1023/A:102465232857819:4(469-479)Online publication date: 1-Aug-2003
https://dl.acm.org/doi/10.1023/A%3A1024652328578

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Published In

ITC '99: Proceedings of the 1999 IEEE International Test Conference

September 1999

ISBN:0780357531

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IEEE Computer Society

United States

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Published: 28 September 1999

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Parthasarathy KKuyel TPrice DJin LChen DGeiger R(2003)BIST and production testing of ADCs using imprecise stimulusACM Transactions on Design Automation of Electronic Systems10.1145/944027.9440358:4(522-545)Online publication date: 1-Oct-2003
https://dl.acm.org/doi/10.1145/944027.944035
Bernard SAzaïs FBertrand YRenovell M(2003)On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BISTJournal of Electronic Testing: Theory and Applications10.1023/A:102465232857819:4(469-479)Online publication date: 1-Aug-2003
https://dl.acm.org/doi/10.1023/A%3A1024652328578

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High-accuracy and low signal distortion on-chip auto-calibrating architecture for continuous-time filters

A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing

Low-power low-noise analog signal conditioning chip with on-chip drivers for healthcare applications

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