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Solution-based single-molecule fluorescence spectroscopy is a powerful new experimental approach with applications in all fields of natural sciences. Two typical geometries can be used for these experiments: point-like and widefield... more
Solution-based single-molecule fluorescence spectroscopy is a powerful new experimental approach with applications in all fields of natural sciences. Two typical geometries can be used for these experiments: point-like and widefield excitation and detection. In point-like geometries, the basic concept is to excite and collect light from a very small volume (typically femtoliter) and work in a concentration regime resulting in rare burst-like events corresponding to the transit of a single-molecule. Those events are accumulated over time to achieve proper statistical accuracy. Therefore the advantage of extreme sensitivity is somewhat counterbalanced by a very long acquisition time. One way to speed up data acquisition is parallelization. Here we will discuss a general approach to address this issue, using a multispot excitation and detection geometry that can accommodate different types of novel highly-parallel detector arrays. We will illustrate the potential of this approach with fluorescence correlation spectroscopy (FCS) and single-molecule fluorescence measurements. In widefield geometries, the same issues of background reduction and single-molecule concentration apply, but the duration of the experiment is fixed by the time scale of the process studied and the survival time of the fluorescent probe. Temporal resolution on the other hand, is limited by signal-to-noise and/or detector resolution, which calls for new detector concepts. We will briefly present our recent results in this domain.
ABSTRACT A CMOS imager that combines single photon sensitivity with photon timing capabilities has been developed for Time-Of-Flight (TOF) measurements and for Time-Correlated Single-Photon Counting (TCSPC) applications. A test structure... more
ABSTRACT A CMOS imager that combines single photon sensitivity with photon timing capabilities has been developed for Time-Of-Flight (TOF) measurements and for Time-Correlated Single-Photon Counting (TCSPC) applications. A test structure with 32×4 pixels is presented in this paper. Each pixel is based on a 30 μm diameter Single-Photon Avalanche Diode (SPAD) with low Dark Counting Rate (60 cps at room temperature) and a Time-to-Digital Converter (TDC) with 400 ps resolution. Some preliminary measurements confirm the possibility to use this SPAD array in a 3D TOF scanning system.
ABSTRACT The growing interest for fast, compact and cost-effective 3D ranging imagers for automotive applications has prompted to explore many different techniques for 3D imaging and to develop new system for this propose. CMOS imagers... more
ABSTRACT The growing interest for fast, compact and cost-effective 3D ranging imagers for automotive applications has prompted to explore many different techniques for 3D imaging and to develop new system for this propose. CMOS imagers that exploit phase-resolved techniques provide accurate 3D ranging with no complex optics and are rugged and costeffective. Phase-resolved techniques indirectly measure the round-trip return of the light emitted by a laser and backscattered from a distant target, computing the phase delay between the modulated light and the detected signal. Singlephoton detectors, with their high sensitivity, allow to actively illuminate the scene with a low power excitation (less than 10W with diffused daylight illumination). We report on a 4x4 array of CMOS SPAD (Single Photon Avalanche Diodes) designed in a high-voltage 0.35 μm CMOS technology, for pulsed modulation, in which each pixel computes the phase difference between the laser and the reflected pulse. Each pixel comprises a high-performance 30 μm diameter SPAD, an analog quenching circuit, two 9 bit up-down counters and memories to store data during the readout. The first counter counts the photons detected by the SPAD in a time window synchronous with the laser pulse and integrates the whole echoed signal. The second counter accumulates the number of photon detected in a window shifted with respect to the laser pulse, and acquires only a portion of the reflected signal. The array is readout with a global shutter architecture, using a 100 MHz clock; the maximal frame rate is 3 Mframe/s.
ABSTRACT Combined 2D imaging and 3D ranging sensors provide useful information for both long (some kms) and short (few tens of m) distance, in security applications. To this aim, we designed two different monolithic imagers in a 0.35 μm... more
ABSTRACT Combined 2D imaging and 3D ranging sensors provide useful information for both long (some kms) and short (few tens of m) distance, in security applications. To this aim, we designed two different monolithic imagers in a 0.35 μm costeffective CMOS technology, based on Single Photon Avalanche Diodes (SPADs), for long-range time-of-flight (TOF) and short-range phase-resolved depth ranging. The single pixel consists of a SPAD (30 μm diameter), a quenching circuit, and a Time-to-Digital Converter (TDC) for TOF measurements or three up/down synched counters for phaseresolved depth assessments. Such smart pixels operate in two different modalities: single photon-counting for 2D "intensity" images; while either photon-timing or phase-resolved photon-counting for 3D "depth" images. In 2D imaging, each pixel has a counter that accumulates the number of photons detected by the SPAD in the pixel, thus providing single-photon level sensitivity and high (100 kframe/s) frame-rate. In the TOF 3D imager, each pixel measures the photon arrival time with a 312 ps resolution, thanks to a two-stage TDC (with 6 bit coarse counter plus a 4 bit fine interpolator), with a 320 ns full-scale range. The resulting spatial resolution is 9 cm within a 50 m range, centered at any user-selectable distance (e.g. 100 m - 5 km), with linearity of DNLrms=4.9% LSB and INLrms=11.7% LSB, and 175 ps precision. In the phase-resolved 3D imager, the in-pixel electronics measures the phase difference between the modulated light emitted by a laser and the back-reflected light, with both continuous-wave and pulsed-light modulation techniques.