Y34NB50
Y34NB50
Y34NB50
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
THERMAL DATA
o
R thj -case Thermal Resistance Junction-case Max 0.277 C/W
o
R thj -amb Thermal Resistance Junction-ambient Max 30 C/W
o
R thc-sink Thermal Resistance Case-sink Typ 0.1 C/W
o
Tl Maximum Lead Temperature F or Soldering Purpose 300 C
AVALANCHE CHARACTERISTICS
Symbo l Parameter Max Valu e Unit
IAR Avalanche Current, Repetitive or Not-Repetitive 34 A
(pulse width limited by Tj max)
E AS Single Pulse Avalanche Energy 1000 mJ
o
(starting Tj = 25 C, I D = IAR , VDD = 50 V)
ON (∗)
Symbo l Parameter Test Con ditions Min. T yp. Max. Unit
V GS(th) Gate Threshold V DS = V GS ID = 250 µA 3 4 5 V
Voltage
R DS(on) Static Drain-source O n V GS = 10 V I D = 17 A 0.11 0.14 Ω
Resistance
I D(o n) On State Drain Current V DS > ID(o n) x R DS(on )ma x 34 A
V GS = 10 V
DYNAMIC
Symbo l Parameter Test Con ditions Min. T yp. Max. Unit
g f s (∗) Forward V DS > ID(o n) x R DS(on )ma x I D = 17 A 27 S
Transconductance
C iss Input Capacitance V DS = 25 V f = 1 MHz V GS = 0 5.9 nF
C os s Output Capacitance 880 pF
C rss Reverse T ransfer 80 pF
Capacitance
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STY34NB50F
SWITCHING OFF
Symbo l Parameter Test Con ditions Min. T yp. Max. Unit
tr (Voff) Off-voltage Rise Time V DD = 400 V I D = 17 A 28 ns
tf Fall Time R G = 4.7 Ω V GS = 15 V 30 ns
tc Cross-over Time (see test circuit, figure 5) 60 ns
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STY34NB50F
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STY34NB50F
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STY34NB50F
Fig. 1: Unclamped Inductive Load Test Circuit Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Fig. 4: Gate Charge test Circuit
Resistive Load
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STY34NB50F
mm inch
DIM.
MIN. TYP. MAX. MIN. TYP. MAX.
A 4.70 5.30
A1 2.20 2.60
b 1.00 1.40
b1 2.00 2.40
b2 3.00 3.40
c 0.40 0.80
D 19.70 20.30
e 5.35 5.55
E 15.30 15.90
L 14.20 15.20
L1 3.70 4.30
P025Q
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STY34NB50F
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specific ation mentioned in this publication are
subjec t to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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