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Stw14Nc50: N-Channel 500V - 0.31 - 14A To-247 Powermesh™Ii Mosfet

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STW14NC50

N-CHANNEL 500V - 0.31Ω - 14A TO-247


PowerMesh™II MOSFET

TYPE VDSS RDS(on) ID

STW14NC50 500V < 0.38Ω 14 A


■ TYPICAL RDS(on) = 0.31Ω
■ EXTREMELY HIGH dv/dt CAPABILITY
■ 100% AVALANCHE TESTED
■ NEW HIGH VOLTAGE BENCHMARK 3
■ GATE CHARGE MINIMIZED 2
1

DESCRIPTION TO-247
The PowerMESH™II is the evolution of the first
generation of MESH OVERLAY™. The layout re-
finements introduced greatly improve the Ron*area
figure of merit while keeping the device at the lead- INTERNAL SCHEMATIC DIAGRAM
ing edge for what concerns switching speed, gate
charge and ruggedness.

APPLICATIONS
■ SWITCH MODE POWER SUPPLIES (SMPS)
■ HIGH CURRENT, HIGH SPEED SWITCHING

■ DC-AC CONVERTERS FOR WELDING

EQUIPMENT AND UNINTERRUPTIBLE


POWER SUPPLIES AND MOTOR DRIVE

ABSOLUTE MAXIMUM RATINGS


Symbol Parameter Value Unit
VDS Drain-source Voltage (VGS = 0) 500 V
VDGR Drain-gate Voltage (RGS = 20 kΩ) 500 V
VGS Gate- source Voltage ±30 V
ID Drain Current (continuos) at TC = 25°C 14 A
ID Drain Current (continuos) at TC = 100°C 8.7 A
IDM (●) Drain Current (pulsed) 56 A
PTOT Total Dissipation at TC = 25°C 190 W
Derating Factor 1.5 W/°C
dv/dt(1) Peak Diode Recovery voltage slope 3.5 V/ns
Tstg Storage Temperature –65 to 150 °C
Tj Max. Operating Junction Temperature 150 °C
(•)Pulse width limited by safe operating area (1)ISD ≤14A, di/dt ≤100A/µs, V DD ≤ V(BR)DSS, Tj ≤ T JMAX.

May 2001 1/8


STW14NC50

THERMAL DATA
Rthj-case Thermal Resistance Junction-case Max 0.66 °C/W
Rthj-amb Thermal Resistance Junction-ambient Max 30 °C/W
Tl Maximum Lead Temperature For Soldering Purpose 300 °C

AVALANCHE CHARACTERISTICS
Symbol Parameter Max Value Unit
Avalanche Current, Repetitive or Not-Repetitive
IAR 14 A
(pulse width limited by Tj max)
Single Pulse Avalanche Energy
EAS 800 mJ
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)

ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)


OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
Drain-source
V(BR)DSS ID = 250 µA, VGS = 0 500 V
Breakdown Voltage
Zero Gate Voltage VDS = Max Rating 1 µA
IDSS
Drain Current (VGS = 0) VDS = Max Rating, TC = 125 °C 50 µA
Gate-body Leakage
IGSS VGS = ±30V ±100 nA
Current (VDS = 0)

ON (1)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 µA 2 3 4 V
Static Drain-source On VGS = 10V, ID = 7A 0.31 0.38 Ω
RDS(on)
Resistance

DYNAMIC
Symbol Parameter Test Conditions Min. Typ. Max. Unit
VDS > ID(on) x RDS(on)max,
gfs Forward Transconductance 13 S
ID =7A
Ciss Input Capacitance VDS = 25V, f = 1 MHz, VGS = 0 2000 pF
Coss Output Capacitance 300 pF
Reverse Transfer
Crss 43 pF
Capacitance

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STW14NC50

ELECTRICAL CHARACTERISTICS (CONTINUED)

SWITCHING ON
Symbol Parameter Test Conditions Min. Typ. Max. Unit
td(on) Turn-on Delay Time VDD = 250V, ID = 7 A 20 ns
RG = 4.7Ω, VGS = 10V
tr Rise Time (see test circuit, Figure 3) 23 ns

Qg Total Gate Charge VDD = 400V, ID = 14 A, 75 90 nC


VGS = 10V, RG = 4.7Ω
Qgs Gate-Source Charge 10 nC
Qgd Gate-Drain Charge 38 nC

SWITCHING OFF
Symbol Parameter Test Conditions Min. Typ. Max. Unit
tr(Voff) Off-voltage Rise Time VDD = 400V, ID = 14 A, 25 ns
RG = 4.7Ω, VGS = 10V
tf Fall Time 30 ns
(see test circuit, Figure 5)
tc Cross-over Time 62 ns

SOURCE DRAIN DIODE


Symbol Parameter Test Conditions Min. Typ. Max. Unit
ISD Source-drain Current 14 A
ISDM (2) Source-drain Current (pulsed) 56 A
VSD (1) Forward On Voltage ISD = 14 A, VGS = 0 1.6 V
trr Reverse Recovery Time ISD = 14 A, di/dt = 100A/µs, 670 ns
Qrr VDD = 100V, Tj = 150°C
Reverse Recovery Charge 6.7 µC
(see test circuit, Figure 5)
IRRM Reverse Recovery Current 20 A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.

Safe Operating Area Thermal Impedance

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STW14NC50

Output Characteristics Transfer Characteristics

Transconductance Static Drain-source On Resistance

Gate Charge vs Gate-source Voltage Capacitance Variations

4/8
STW14NC50

Normalized Gate Thereshold Voltage vs Temp. Normalized On Resistance vs Temperature

Source-drain Diode Forward Characteristics

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STW14NC50

Fig. 1: Unclamped Inductive Load Test Circuit Fig. 2: Unclamped Inductive Waveform

Fig. 3: Switching Times Test Circuit For Fig. 4: Gate Charge test Circuit
Resistive Load

Fig. 5: Test Circuit For Inductive Load Switching


And Diode Recovery Times

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STW14NC50

TO-247 MECHANICAL DATA

mm. inch
DIM.
MIN. TYP MAX. MIN. TYP. MAX.
A 4.85 5.15 0.19 0.20
D 2.20 2.60 0.08 0.10
E 0.40 0.80 0.015 0.03
F 1 1.40 0.04 0.05
F1 3 0.11
F2 2 0.07
F3 2 2.40 0.07 0.09
F4 3 3.40 0.11 0.13
G 10.90 0.43
H 15.45 15.75 0.60 0.62
L 19.85 20.15 0.78 0.79
L1 3.70 4.30 0.14 0.17
L2 18.50 0.72
L3 14.20 14.80 0.56 0.58
L4 34.60 1.36
L5 5.50 0.21
M 2 3 0.07 0.11
V 5º 5º
V2 60º 60º
Dia 3.55 3.65 0.14 0.143

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STW14NC50

Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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© 2000 STMicroelectronics – Printed in Italy – All Rights Reserved


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