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    EE380 EC Lab 2 Report

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    Abhishek meena
    The document summarizes the results of 5 sub-experiments conducted to measure various parameters of a PN junction diode (1N4007). In the first two sub-experiments, the reverse saturation current (Is) and ideality factor (n) were measured using two different circuit configurations. Both experiments found values of Is = 3.6-3.7 nA and n = 1.69. The third sub-experiment measured junction capacitance (Cjo), junction potential (Vj), and grading coefficient (m). The fourth sub-experiment determined the transit time (trr). The final sub-experiment specified resistor and capacitor values for positive/negative clampers and a peak detector.

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    EE380 EC Lab 2 Report

    Uploaded by

    Abhishek meena
    35 views8 pages
    The document summarizes the results of 5 sub-experiments conducted to measure various parameters of a PN junction diode (1N4007). In the first two sub-experiments, the reverse saturation current (Is) and ideality factor (n) were measured using two different circuit configurations. Both experiments found values of Is = 3.6-3.7 nA and n = 1.69. The third sub-experiment measured junction capacitance (Cjo), junction potential (Vj), and grading coefficient (m). The fourth sub-experiment determined the transit time (trr). The final sub-experiment specified resistor and capacitor values for positive/negative clampers and a peak detector.

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    The document summarizes the results of 5 sub-experiments conducted to measure various parameters of a PN junction diode (1N4007). In the first two sub-experiments, the reverse saturation current (Is) and ideality factor (n) were measured using two different circuit configurations. Both experiments found values of Is = 3.6-3.7 nA and n = 1.69. The third sub-experiment measured junction capacitance (Cjo), junction potential (Vj), and grading coefficient (m). The fourth sub-experiment determined the transit time (trr). The final sub-experiment specified resistor and capacitor values for positive/negative clampers and a peak detector.

    Copyright:

    © All Rights Reserved
    Download as DOCX, PDF, TXT or read online from Scribd
    Download as docx, pdf, or txt
    35 views8 pages

    EE380 EC Lab 2 Report

    Uploaded by

    Abhishek meena
    The document summarizes the results of 5 sub-experiments conducted to measure various parameters of a PN junction diode (1N4007). In the first two sub-experiments, the reverse saturation current (Is) and ideality factor (n) were measured using two different circuit configurations. Both experiments found values of Is = 3.6-3.7 nA and n = 1.69. The third sub-experiment measured junction capacitance (Cjo), junction potential (Vj), and grading coefficient (m). The fourth sub-experiment determined the transit time (trr). The final sub-experiment specified resistor and capacitor values for positive/negative clampers and a peak detector.

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    EE380 EC Lab 2 Report

    Name: Abhishek Dechalwad

    Roll No: 210038

    Group members: Shikhar singh,Sumit

    Objective : To measure parameters of PN junction Diode (1N4007)

    Discussion : The parameters of the model must be measured by designing suitable experiments such that a
    system of constraints is imposed on the device so that only one parameter manifests itself at a time.

    Sub-Experiment 1: To measure parameters 𝐼 𝑆 (Reverse Saturation Current), 𝑛 (Ideality Factor):


    PRE-LAB:

    Design Procedure and Simulation : The following constraints are imposed: 1.)

    DC measurements are used to eliminate time dependent terms

    2.) 𝐼𝑜 vs 𝑉𝐷 data is obtained using instruments like an oscilloscope, function generator and power supplies
    The circuit is chosen such that 𝑉𝐷 is less sensitive to measurement errors.
    Analysis : -

    Curve Fitting on x gives the equation of 𝑙𝑛(𝐼𝑜 ) vs 𝑉𝐷 gives the equation

    𝑙𝑛(𝐼𝑜 ) = 22.742 ∗ 𝑉𝑑 − 19.435

    Which implies ln(𝐼𝑠 ) = −19.435

    ⇒ 𝐼𝑠 = 3.62𝑛𝐴 and 1/𝑛𝑉𝑇 = 22.742

    ⇒ 𝑛 = 1.69

    Sub-Experiment 2: To measure parameters 𝐼 𝑆 (Reverse Saturation Current), 𝑛 (Ideality Factor) (Op-


    Amp Circuit):

    Pre-LAB:

    Design Procedure and Simulation : The IV characteristic of the diode is obtained by changing the value
    of Resistor (changing the current flowing through the diode and the Voltage across the diode)
    Analysis : -
    Curve Fitting on Microcap gives the equation of 𝑙𝑛(𝐼𝑜 ) vs 𝑉𝐷 gives the equation

    𝑙𝑛(𝐼𝑜 ) = 22.684 ∗ 𝑉𝑑 − 19.416

    Which implies ln(𝐼𝑠 ) = −19.416

    ⇒ 𝐼𝑠 = 3.69𝑛𝐴 and 1/𝑛𝑉𝑇 = (22.684)

    ⇒ 𝑛 = 1.69 (Similar to above sub experiment)

    Equations: 𝑉𝐼𝑁/R = 𝐼𝐷

    ⇒ 𝑙𝑛 𝑉𝐼𝑁 − 𝑙𝑛(𝑅) = 𝑙𝑛(𝐼𝑠 ) + 𝑉𝑑 𝑛𝑉𝑇

    ⇒ 𝑉𝑑 = −𝑛𝑉𝑇 𝑙𝑛(𝑅) + 𝑛𝑉𝑇 (𝑙𝑛(𝑉𝐼𝑁) − 𝑙𝑛(𝐼𝑠)


    INLAB

    R (in ohm) Io (in A) ln(Io) Vd (in V)


    1K 5 x 10-3 -5.298 0.659
    10K 5 x 10-4 -7.6 0.543
    100K 5 x 10-5 -9.903 0.437
    1M 5 x 10-6 -12.206 0.346
    10M 5 x 10-7 -14.508 0.246

    Corresponding equation: 𝑙𝑛(𝐼𝑜 ) = 22.464 ∗ 𝑉𝑑 − 19.916

    Is= 2.219 nA

    n=1.712
    Sub-Experiment 3: To measure Junction Parameters such as 𝐶 𝐽𝑂 (Junction capacitance at zero
    bias), 𝑉𝐽 (Junction Potential), 𝑀 (Grading Coefficient)

    Pre-LAB:

    Design Procedure and Simulation : AC analysis is carried out with frequency below the unity gain
    frequency of op-amp and a 90∘ phase difference between the input and output waveform is expected.

    Simulation Analysis :

    𝐶𝑗𝑜 = 34.27𝑝𝐹 and 𝑉𝑗 = 0.71 and 𝑚 = 0.473

    INLAB
    Offset V (in V) Vo ( in mV)
    0 39
    -1 27
    -1.5 25
    -2 21
    -2.5 19
    -3 19
    -3.5 19
    -4 17

    Cj0= 31.03 pF

    m= 1.244

    Vj= 0 -0.633V

    Sub-Experiment 4: To measure Transit Time (𝑟 )


    RR

    Pre-LAB:

    Design Procedure and Simulation :


    Analysis:

    𝐼𝐹𝑅 = 4.457𝑉

    𝐼𝑅𝑅 = 5.537𝑉

    𝑟𝑅𝑅 = 5μ𝑠

    Using equations:

    𝑟𝑅𝑅 = 𝑟𝑙𝑛 (1 + 𝐼𝐹 / 𝐼𝑅 ) ⇒ 𝑟 = 𝑟𝑅𝑅 / 𝑙𝑛 (1 + 𝐼𝐹/𝐼𝑅 ) = 8.467μ𝑠

    INLAB
    𝑟= 5.73 μs

    Sub-Experiment 5: to get the values of resistor and capacitor to form


    1. A positive clamper and a negative clamper

    2. Peak detector
    3. Doubler

    Pre-LAB:

    Design Procedure and Simulation : (A positive clamper and a negative clamper)

    Design Procedure and Simulation : (Peak detector)

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