Tpic 6 C 596
Tpic 6 C 596
Tpic 6 C 596
8
The TPIC6C596 is a monolithic, medium-voltage, G EN3
low-current power 8-bit shift register designed for 10
RCK C2
use in systems that require relatively moderate 7 SRG8
load power such as LEDs. The device contains a CLR R
15
built-in voltage clamp on the outputs for inductive SRCK C1
transient protection. Power driver applications 2 3
SER IN 1D 2 DRAIN0
include relays, solenoids, and other low-current or 4
medium-voltage loads. DRAIN1
5
DRAIN2
This device contains an 8-bit serial-in, parallel-out 6
DRAIN3
shift register that feeds an 8-bit D-type storage 11
register. Data transfers through both the shift and DRAIN4
12
storage registers on the rising edge of the shift DRAIN5
13
register clock (SRCK) and the register clock DRAIN6
(RCK), respectively. The storage register trans- 14
2 DRAIN7
fers data to the output buffer when shift register 9
SER OUT
clear (CLR) is high. When CLR is low, all registers
in the device are cleared. When output enable (G) † This symbol is in accordance with ANSI/IEEE Std 91-1984
is held high, all data in the output buffers is held and IEC Publication 617-12.
low and all drain outputs are off. When G is held
low, data from the storage register is transparent to the output buffers. When data in the output buffers is low,
the DMOS transistor outputs are off. When data is high, the DMOS transistor outputs have sink-current
capability. The serial output (SER OUT) is clocked out of the device on the falling edge of SRCK to provide
additional hold time for cascaded applications. This will provide improved performance for applications where
clock signals may be skewed, devices are not located near one another, or the system must tolerate
electromagnetic interference.
This device contains circuits to protect its inputs and outputs against damage due to high static voltages or electrostatic fields. These
circuits have been qualified to protect this device against electrostatic discharges (ESD) of up to 2 kV according to MIL-STD-883C,
Method 3015; however, it is advised that precautions be taken to avoid application of any voltage higher than maximum-rated
voltages to these high-impedance circuits. During storage or handling, the device leads should be shorted together or the device
should be placed in conductive foam. In a circuit, unused inputs should always be connected to an appropriated logic voltage level,
preferably either VCC or ground. Specific guidelines for handling devices of this type are contained in the publication Guidelines for
Handling Electrostatic-Discharge-Sensitive (ESDS) Devices and Assemblies available from Texas Instruments.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Copyright 2000, Texas Instruments Incorporated
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
description (continued)
Outputs are low-side, open-drain DMOS transistors with output ratings of 33 V and 100 mA continuous
sink-current capability. Each output provides a 250-mA maximum current limit at TC = 25°C. The current limit
decreases as the junction temperature increases for additional device protection. The device also provides up
to 2500 V of ESD protection when tested using the human-body model and 200 V machine model.
The TPIC6C596 is characterized for operation over the operating case temperature range of – 40°C to 125°C.
logic diagram (positive logic)
G 8
10
RCK
3
7 DRAIN0
CLR
D D
15
SRCK C1 C2
CLR CLR 4
2 DRAIN1
SER IN
D D
C1 C2
CLR CLR 5
DRAIN2
D D
C1 C2
CLR CLR 6
DRAIN3
D D
C1 C2
CLR CLR 11
DRAIN4
D D
C1 C2
CLR CLR 12
DRAIN5
D D
C1 C2
CLR CLR 13
DRAIN6
D D
C1 C2
CLR CLR 14
DRAIN7
D D
C1 C2
CLR CLR 16
GND
D
C1
9
CLR SER OUT
VCC
DRAIN
33 V
Input
25 V
12 V 20 V
GND
GND
absolute maximum ratings over recommended operating case temperature range (unless
otherwise noted)†
Logic supply voltage, VCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Logic input voltage range, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to 7 V
Power DMOS drain-to-source voltage, VDS (see Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 V
Continuous source-to-drain diode anode current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 250 mA
Pulsed source-to-drain diode anode current (see Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500 mA
Pulsed drain current, each output, all outputs on, ID, TC = 25°C (see Note 3) . . . . . . . . . . . . . . . . . . . 250 mA
Continuous drain current, each output, all outputs on, ID, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
Peak drain current single output, IDM,TC = 25°C (see Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 250 mA
Single-pulse avalanche energy, EAS (see Figure 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mJ
Avalanche current, IAS (see Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200 mA
Continuous total dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Dissipation Rating Table
Operating virtual junction temperature range, TJ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 150°C
Operating case temperature range, TC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 125°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values are with respect to GND.
2. Each power DMOS source is internally connected to GND.
3. Pulse duration ≤ 100 µs and duty cycle ≤ 2%.
4. DRAIN supply voltage = 15 V, starting junction temperature (TJS) = 25°C, L = 1.5 H, IAS = 200 mA (see Figure 4).
thermal resistance
PARAMETER TEST CONDITIONS MIN MAX UNIT
D package 115
RθJA Thermal resistance,
resistance junction-to-ambient
junction to ambient All 8 outputs with equal power °C/W
N package 85
16 15 V
DRAIN1
0.5 V
TEST CIRCUIT VOLTAGE WAVEFORMS
NOTES: A. The word generator has the following characteristics: tr ≤ 10 ns, tf ≤ 10 ns, tw = 300 ns, pulsed repetition rate (PRR) = 5 kHz,
ZO = 50 Ω.
B. CL includes probe and jig capacitance.
5V
G 50% 50%
0V
5V 15 V tPLH tPHL
1 24 V
90% 90%
7 VCC Output
CLR 10% 10%
ID 0.5 V
15 RL = 200 Ω
SRCK 3 – 6, tr tf
Word DUT Output
2 11 –14 SWITCHING TIMES
Generator SER IN DRAIN
(see Note A) 5V
10 CL = 30 pF 50%
RCK SRCK
8 (see Note B) 0V
G GND tsu
th
16 5V
SER IN 50% 50%
TEST CIRCUIT 0V
tw
tpd tpd
SER OUT
50% 50%
NOTES: A. The word generator has the following characteristics: tr ≤ 10 ns, tf ≤ 10 ns, tw = 300 ns, pulsed repetition rate (PRR) = 5 kHz,
ZO = 50 Ω.
B. CL includes probe and jig capacitance.
TP K
DRAIN
0.1 A
Circuit 2500 µF
Under 250 V di/dt = 10 A/µs
Test + IF
L = 0.85 mH 15 V
IF –
(see Note A) 0
TP A
25% of IRM
t2
t1 t3 Driver
IRM
RG
VGG ta
50 Ω
(see Note B) trr
NOTES: A. The DRAIN terminal under test is connected to the TP K test point. All other terminals are connected together and connected to the
TP A test point.
B. The VGG amplitude and RG are adjusted for di/dt = 10 A/µs. A VGG double-pulse train is used to set IF = 0.1 A, where t1 = 10 µs,
t2 = 7 µs, and t3 = 3 µs.
5V 15 V
tw
1 tav
7 VCC 30 Ω 5V
CLR Input
15 SRCK ID See Note B 0V
DUT IAS = 200 mA
2 1.5 H
Word SER IN
Generator 3 – 6, ID
(see Note A) 10 11 –14
RCK DRAIN VDS
8 V(BR)DSX = 33 V
G GND
VDS MIN
16
NOTES: A. The word generator has the following characteristics: tr ≤ 10 ns, tf ≤ 10 ns, ZO = 50 Ω.
B. Input pulse duration, tw, is increased until peak current IAS = 200 mA.
Energy test level is defined as EAS = IAS × V(BR)DSX × tav/2 = 30 mJ.
TYPICAL CHARACTERISTICS
5
0.4
I CC – Supply Current – mA
4
0.2
0.1 3
2
0.04
0.02 1
0.01 0
0.1 0.2 0.4 1 2 4 10 0.1 1 10 100
tav – Time Duration of Avalanche – ms f – Frequency – MHz
Figure 5 Figure 6
30 12
r DS(on) – Drain-to-Source On-State Resistance – Ω
VCC = 5 V ID = 50 mA
See Note A TC = 125°C See Note A
25 10
TC = 125°C
20 8
TC = 25°C
15 6
10 TC = 25°C 4 TC = – 40°C
5 2
TC = – 40°C
0 0
50 70 90 110 130 150 170 190 250 4 4.5 5 5.5 6 6.5 7
TYPICAL CHARACTERISTICS
SWITCHING TIME
vs
CASE TEMPERATURE
140
ID = 75 mA
See Note A tr
120
100 tr
Switching Time – ns
80 tPLH
60
tPHL
40
20
0
–50 –25 0 25 50 75 100 125
TC – Case Temperature – °C
Figure 9
NOTE A: Technique should limit TJ – TC to 10°C maximum.
THERMAL INFORMATION
VCC = 5 V d = 10%
0.25
0.2
d = 20%
0.2
of Each Output – A
0.15 d = 50%
TC = 25°C
0.15
d = 80%
0.1 TC = 100°C
0.1
VCC = 5 V
0.05 TC = 125°C
0.05 TC = 25°C
d = tw/tperiod
= 1 ms/tperiod
0 0
1 2 3 4 5 6 7 8 1 2 3 4 5 6 7 8
THERMAL INFORMATION
D PACKAGE†
NORMALIZED JUNCTION - TO -AMBIENT THERMAL RESISTANCE
vs
PULSE DURATION
10
R θJA – Normalized Junction-to-Ambient Thermal Resistance – °C/W
DC Conditions
1
d = 0.5
d = 0.2
d = 0.1
0.1
d = 0.05
d = 0.02
d = 0.01
0.01
Single Pulse
0.001
tc
tw
ID
0
0.0001
0.0001 0.001 0.01 0.1 1 10
tw – Pulse Duration – s
Figure 12
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