Gas Gauge IC For Power-Assist Applications: Features General Description
Gas Gauge IC For Power-Assist Applications: Features General Description
Gas Gauge IC For Power-Assist Applications: Features General Description
1
bq2013H
SEG1– LED display segment outputs (dual func- This input monitors the scaled battery volt-
SEG5 tion with PROG1–PROG5 age through a high-impedance resistive di-
vider network for the end-of-discharge volt-
Each output may activate an LED to sink age (EDV) thresholds.
the current sourced from LCOM.
RBI Register backup input
PROG1– Programmed full count selection inputs
PROG6 (dual function with SEG1 - SEG5) This input is used to provide backup poten-
tial to the bq2013H registers during periods
These three-level input pins define the pro- when VCC < 3V. A storage capacitor can be
grammed full-count (PFC), display mode, connected to RBI.
self-discharge rate, offset compensation,
overload threshold, and charge compensa- HDQ Serial I/O pin
tion.
This is an open-drain bidirectional commu-
SR Sense resistor input nications port.
The voltage drop (VSR) across the sense re- REF Voltage reference output for regulator
sistor RS is monitored and integrated over
time to interpret charge and discharge activ- REF provides a voltage reference output for
ity. The SR input (see Figure 1) is connected an optional micro-regulator.
between the negative terminal of the battery VCC Supply voltage input
and ground. VSR > VSS indicates charge, and
VSR < VSS indicates discharge. The effective VSS Ground
voltage drop, VSRO, as seen by the bq2013H
is VSR + VOS.
2
bq2013H
R1
bq2013H Q1
Gas Gauge IC ZVNL110A
REF
C1
VCC RB1
LCOM
SEG1/PROG1 SB
SEG2/PROG2 RB2
SEG3/PROG3 DISP
SEG4/PROG4
100K
SR
SEG5/PROG5 0.1µF RS
VSS
H, Z, or L PROG6
To µC HDQ RBI
DONE
To µC or
Fast Charger
Notes: Charger
1. Indicates optional.
Load
2. The battery stack voltage can be directly connect to VCC across 4 nickel cells
(4.8V nominal and should not exceed 6.5V) with a resistor and a zener diode
to limit voltage during charge. Otherwise, R1and Q1 are needed for
regulation of > 4 nickel cells.
3
bq2013H
If VSB is below either of the two EDV thresholds for the Cx > 80°C
specified delay times in Table 1, the associated flag is
latched and remains latched, independent of VSB, until Layout Considerations
the next valid charge. EDV monitoring is disabled if the
OVLD bit in FLGS2 is set. The bq2013H measures the voltage differential between
the SR and VSS pins. VOS (the offset voltage at the SR
pin) is greatly affected by PC board layout. For optimal
results, the PC board layout should follow the strict rule of
Table 1. Delay Time in Seconds a single-point ground return. Sharing high-current
ground with small signal ground causes undesirable noise
Temperature on the small signal nodes. Additionally:
Capacity
< 10°C 10°C to 30°C > 30°C ■ The capacitors should be placed as close as possible
> 40% 7 6 5 to the SB and VCC pins and their paths to VSS should
be as short as possible. A high-quality ceramic
20% to 40% 4 3 2 capacitor of 0.1µf is recommended for VCC.
< 20% 2 2 2
■ The sense resistor (RS) should be as close as possible
to the bq2013H.
Reset
■ The R-C on the SR pin should be located as close as
The bq2013H can be reset by removing VCC and ground- possible to the SR pin. The maximum R should not
ing the RBI pin for 15 seconds or with a command over exceed 100K.
the serial port. The serial port reset command sequence
requires writing 00h to register PPFC (address = leh)
and the writing 00h to register LMD (address = 05h.)
Gas Gauge Operation
The operational overview diagram in Figure 2 illus-
trates the operation of the bq2013H. The bq2013H ac-
cumulates a measure of charge and discharge currents,
as well as an estimation of self-discharge. The bq2013H
compensates charge current for charge rate and tem-
4
bq2013H
perature. Discharge current is load compensated based 1. Last Measured Discharge (LMD) or learned
on the value stored in location LCOMP (address = 0eh). battery capacity:
LCOMP allows the bq2013H to automatically adjust for
continuous small discharge currents. The bq2013H com- LMD is the last measured discharge capacity of the
pensates self discharge for the load value as well as tem- battery. On initialization (application of VCC or bat-
perature. tery replacement), LMD = PFC. During subsequent
discharges, the LMD is updated with the latest
The main counter, Nominal Available Capacity (NAC), measured capacity in the Discharge Count Register
represents the available battery capacity at any given (DCR) representing a discharge from full to below
time. Battery charging increments the NAC register, EDV. The maximum decrease in LMD because of a
while battery discharging, self-discharge decrement the DCR update is 25% of LMD. A qualified discharge
NAC register and increment the DCR (Discharge Count is necessary for a capacity transfer from the DCR
Register). NAC is also corrected automatically for offset to the LMD register. The LMD also serves as the
error based on the value in the offset location OFFSET 100% reference threshold used by the relative dis-
(address = 0bh.) play mode.
The Discharge Count Register (DCR) is used to update 2. Programmed Full Count (PFC) or initial bat-
the Last Measured Discharge (LMD) register only if a tery capacity:
complete battery discharge from full to empty occurs
without any partial battery charges. Therefore, the The initial LMD and gas gauge rate values are pro-
bq2013H adapts its capacity determination based on the grammed by using PFC. The PFC also provides the
actual conditions of discharge. 100% reference for the absolute display mode. The
bq2013H is configured for a given application by se-
The battery’s initial capacity is equal to the Pro- lecting a PFC value from Table 2. The correct PFC
grammed Full Count (PFC) shown in Table 2. Until may be determined by multiplying the rated bat-
LMD is updated, NAC counts up to but not beyond this tery capacity in mAh by the sense resistor value:
threshold during subsequent charges. This approach al-
lows the gas gauge to be charger-independent and com- Battery capacity (mAh) * sense resistor (Ω) =
patible with any type of charge regime.
PFC (mVh)
Selecting a PFC slightly less than the rated capac-
ity for absolute mode provides capacity above the
full reference for much of the battery’s life.
- - + +
Chip-Controlled Serial
Outputs Available Charge Port
LED Display
FG2013H2.eps
5
bq2013H
Programmed
Full Count (PFC) mVh Scale PROG1 PROG2
27136 84.8 1
320 H H
24064 75.2 1
320 H Z
41472 64.8 1
640 H L
35072 54.8 1
640 Z H
28672 44.8 1
640 Z Z
44800 35 1
1280 Z L
30720 24 1
1280 L H
38400 15 1
2560 L Z
12800 5 1
2560 L L
PROG3 Self-Discharge
6
bq2013H
Trickle Fast
PROG5
<30°C 30°C—50°C >50°C <30°C 30°C—50°C >50°C
PROG6 Offset
H -150µV
Z -75µV
L 0µV
7
bq2013H
The initial full battery capacity is 35mVh (4667mAh) until Discharge Counting
the bq2013H “learns” a new capacity with a qualified dis-
charge from full to EDV1. All discharge counts where VSRO < -250µV cause the
NAC register to decrement and the DCR to increment. If
3. Nominal Available Capacity (NAC): enabled, the display is activated when VSRO < -2mV.
NAC counts up during charge to a maximum value The display remains active for 10 seconds after VSRO
of LMD and down during discharge and self dis- rises above - 2mV.
charge to 0. NAC is reset to 0 on initialization and
on the first valid charge following discharge to Self-Discharge Estimation
EDV1. To prevent overstatement of charge during The bq2013H decrements NAC and increments DCR for
periods of overcharge, NAC stops incrementing self-discharge based on time and temperature. The self-
when NAC = LMD. When the DONE input is as- discharge count rate is programmed per Table 3. This is
serted high, indicating full charge completion, NAC the rate for a battery temperature between 20–30°C.
is set to LMD. The NAC register cannot be decremented below 0.
4. Discharge Count Register (DCR):
The DCR counts up during discharge independent
Count Compensations
of NAC and could continue increasing after NAC The bq2013H determines fast charge when the NAC up-
has decremented to 0. Prior to NAC = 0 (empty dates at a rate of ≥ 2 counts/s. Charge activity is com-
battery), both discharge and self-discharge incre- pensated for temperature and rate before updating
ment the DCR. After NAC = 0, only discharge in- NAC. Self-discharge estimation is compensated for tem-
crements the DCR. The DCR resets to 0 when NAC perature before updating NAC or DCR.
= LMD. The DCR does not roll over but stops
counting when it reaches FFFFh. Charge Compensation
The DCR value becomes the new LMD value on the Charge efficiency factors are selected using Table 5 for
first charge after a valid discharge to EDV1 if all of trickle charge and fast charge. Fast charge is defined as
the following conditions are met: a rate of charge resulting in ≥ 2 NAC counts/s (0.16C to
0.6C, depending on PFC selections; see Table 2).
■ No valid charge initiations (charges greater than
2 NAC updates) occurred during the period be- Temperature adapts the charge rate compensation
tween NAC = LMD and EDV1. factors over three ranges between nominal, warm, and
hot temperatures. Program pin 5 is used to select one of
■ The self-discharge count is less than 6% of NAC. three compensation programs. These values are shown
■ The temperature is ≥ 0°C when the EDV1 level in Table 5.
is reached during discharge.
■ VDQ is set.
Charge Counting
Charge activity is detected based on a positive voltage
on the VSR input. If charge activity is detected, the
bq2013H increments NAC at a rate proportional to VSRO
(VSR + VOS) and, if enabled, activates an LED display
if VSRO > 500µV. Charge actions increment the NAC af-
ter compensation for charge rate and temperature.
The bq2013H detects charge activity with VSRO > 250µV.
A valid charge equates to a sustained charge activity
greater than 2 NAC updates. Once a valid charge is de-
tected, charge counting continues until VSRO drops be-
low 250µV.
8
bq2013H
10–20°C NAC
128
NAC
256
NAC
1024
The interface uses a command-based protocol, where the
host processor sends a command byte to the bq2013H.
20–30°C NAC
64
NAC
128
NAC
512 The command directs the bq2013H to either store the
next eight bits of data received to a register specified by
30–40°C NAC
32
NAC
64
NAC
256
the command byte or output the eight bits of data speci-
40–50°C NAC
16
NAC
32
NAC
128
fied by the command byte. (See Figure 3.)
50–60°C NAC
8
NAC
16
NAC
64
The communication protocol is asynchronous re-
turn-to-one. Command and data bytes consist of a
60–70°C NAC
4
NAC
8
NAC
32 stream of eight bits that have a maximum transmission
> 70°C NAC NAC NAC rate of 5K bits/s. The least-significant bit of a command
2 4 16
or data byte is transmitted first. The protocol is simple
enough that it can be implemented by most host proces-
sors using either polled or interrupt processing. Data
Offset Compensation input from the bq2013H may be sampled using the
pulse-width capture timers available on some microcon-
The bq2013H uses a voltage to frequency converter to trollers.
measure the voltage across a resistor used to monitor
the current into and out of the battery. This converter If a communication error occurs, e.g., tCYCB > 250µs, the
has an offset value that can be influenced by the VCC bq2013H should be sent a BREAK to reinitiate the se-
supply and the bypassing of this supply. The typical rial interface. A BREAK is detected when the HDQ pin
value found on a well designed PCB is about -75µV. Pro- is driven to a logic-low state for a time, tB or greater.
gram pin 6 can be used to compensate for this offset, re- The HDQ pin should then be returned to its normal
ducing the effective VOS. Offset compensation occurs ready-high logic state for a time, tBR. The bq2013H is
when VSRO < -250µV or VSRO > 250µV. now ready to receive a command from the host proces-
sor.
Error Summary The return-to-one data bit frame consists of three dis-
tinct sections. The first section is used to start the trans-
The LMD is susceptible to error on initialization or if no
mission by either the host or the bq2013H taking the
updates occur. On initialization, the LMD value includes
HDQ pin to a logic-low state for a period, tSTRH;B. The
the error between the programmed full capacity and the
next section is the actual data transmission, where the
actual capacity. This error is present until a valid dis-
data should be valid by a period, tDSU;B, after the nega-
charge occurs and LMD is updated (see the DCR de-
tive edge used to start communication. The data should
scription in the “Layout Considerations” section). The
be held for a period, tDH;DV, to allow the host or bq2013H
other cause of LMD error is battery wear-out. As the
to sample the data bit.
battery ages, the measured capacity must be adjusted to
account for changes in actual battery capacity. The final section is used to stop the transmission by re-
turning the HDQ pin to a logic-high state by at least a
DONE Input period, tSSU;B, after the negative edge used to start com-
munication. The final logic-high state should be until a
A fast-charge controller IC or micro-controller uses the period tCYCH;B, to allow time to ensure that the bit
DONE input to communicate charge status to the transmission was stopped properly. The timings for data
bq2013H. When the DONE input is asserted high on and break communication are given in the serial com-
9
bq2013H
munication timing specification and illustration sec- The W/R location is:
tions.
Communication with the bq2013H is always performed Command Code Bits
with the least-significant bit being transmitted first. Fig- 7 6 5 4 3 2 1 0
ure 3 shows an example of a communication sequence to
read the bq2013H NACH register. W/R - - - - - - -
Break 1 1 0 0 0 0 0 0 1 0 1 0 0 11 0
DQ
tRSPS
TD2013H.eps
10
bq2013H
Temperature and
TMPGG 02h R TMP3 TMP2 TMP1 TMP0 GG3 GG2 GG1 GG0
gas gauge register
Nominal available
NACH capacity high byte 03h R/W NACH7 NACH6 NACH5 NACH4 NACH3 NACH2 NACH1 NACH0
register
Nominal available
NACL capacity low byte 17h R/W NACL7 NACL6 NACL5 NACL4 NACL3 NACL2 NACL1 NACL0
register
Battery
BATID identification 04h R/W BATID7 BATID6 BATID5 BATID4 BATID3 BATID2 BATID1 BATID0
register
LMD Last measured 05h R/W LMD7 LMD6 LMD5 LMD4 LMD3 LMD2 LMD1 LMD0
discharge register
FLGS2 Secondary
status
flags register 06h R CR RSVD RSVD RSVD RSVD RSVD RSVD OVLD
Program pull
PPD 07h R RSVD RSVD PPD6 PPD5 PPD4 PPD3 PPD2 PPD1
down register
Program pull up
PPU 08h R RSVD RSVD PPU6 PPU5 PPU4 PPU3 PPU2 PPU1
register
Output control
OCTL 0ah R/W OC6 OC5 OC4 OC3 OC2 OC1 OCE OCC
register
OFFSET Offset
adjustment
regisiter 0bh R/W OFS7 OFS6 OFS5 OFS4 OFS3 OFS2 OFS1 OFS0
SDR Self discharge rate 0ch R/W SDR7 SDR6 SDR5 SDR4 SDR3 SDR2 SDR1 SDR0
DMF Digital magnitude 0dh R/W DMF7 DMF6 DMF5 DMF4 DMF3 DMF2 DMF1 DMF0
filter
LCOMP Load
compensa-
0eh R/W LC7 LC6 LC5 LC4 LC3 LC2 LC1 LC0
tion
Fast charge
CCOMP 0fh R/W CC7 CC6 CC5 CC4 CC3 CC2 CC1 CC0
compensation
PPFC Program pin data leh R/W RSVD RSVD RSVD RSVD RSVD RSVD RSVD RSVD
Battery voltage
VSB 7eh R VSB7 VSB6 VSB5 VSB4 VSB3 VSB2 VSB1 VSB0
register
11
bq2013H
12
bq2013H
TMP3 TMP2 TMP1 TMP0 - - - The charge rate flag (CR) is used to denote the fast
charge regime. Fast charge is assumed whenever a
The read-only TMPGG register (address=02h) contains charge action is initiated. The CR flag remains asserted
two data fields. The first field contains the battery tem- if the charge rate does not fall below 2 NAC counts/s.
perature. The second field contains the available charge
from the battery. The CR location is:
13
bq2013H
tors are used. The time to change CR varies due to the tion. OCE may be cleared by either writing the bit to a
user-selectable count rates. logic zero via the serial port or by resetting the bq2013H.
The overload flag (OVLD) is asserted when a discharge Offset Adjustment Register
overload is detected. PROG4 defines the overload
threshold, as defined in Table 4. OVLD remains as- The value in this register (address = 0bh) is used to cor-
serted as long as the condition is valid. rect NAC for the offset of the VFC. This register is ini-
tialized from the state of PROG6. The following are the
The OVLD location is: initial values:
7 6 5 4 3 2 1 0 ■ 46 = -75µV correction
- - - - - - - OVLD ■ 23 = -150µV correcton
14
bq2013H
VSB = 1.2V ∗
Load Compensation VSB
256
The load compensation value (address = 0eh) allows the
bq2013H to compensate for small discharge loads that
are below the digital filter. Each increment in the Display
LCOMP register represents 2µVh. The value in LCOMP The bq2013H can directly display capacity information
represents the additional amount of discharge applied to using low-power LEDs. If LEDs are used, the segment
NAC and DCR at a constant rate when VSRO < VSRQ. pins should be tied to VCC, the battery, or the LCOM pin
LCOMP compensation is applied in addition to self- through resistors for programming the bq2013H.
discharge. LCOMP is set to 0 on a full reset. The value
is set by the equation: The bq2013H displays the battery charge state in either
1 absolute or relative mode. In relative mode, the battery
LCOMP = charge is represented as a percentage of the LMD. Each
289∗ VCLD LED segment represents 20% of the LMD.
where VCLD is the desired load correction in volts. In absolute mode, each segment represents a fixed
amount of charge, based on the initial PFC. In absolute
Charge Compensation mode, each segment represents 20% of the PFC. As the
battery wears out over time, it is possible for the LMD
The charge-compensation value (address = 0fh) allows
to be below the initial PFC. In this case, all of the LEDs
the bq2013H to compensate for battery charge ineffi-
may not turn on, representing the reduction in the ac-
ciencies. This value is initialized from the state of
tual battery capacity.
PROG5 and represents the fast-charge compensation
factor for < 30°C. The value can be overwritten via the When DISP is tied to VCC, the SEG1–5 outputs are inac-
serial port and is stored in percent. The bq2013H scales tive. When DISP is left floating, the display becomes ac-
the value in 0fh to determine the compensation at other tive during charge if the NAC registers are counting at a
rates and temperatures. For example, if PROG5 = H, rate equivalent to VSRO > 500µV or fast discharge if the
the applied efficiency drops by 5% for each temperature NAC registers are counting at a rate equivalent to VSRO
range, and the trickle rates are 15% below the fast- < -2mV. When DISP is pulled low and held, the segment
charge rates. If the value 55h (85%) is written to outputs become active continuously. When released to
CCOMP, the compensation for trickle charge at > 50°C high Z, the segment outputs will remain active for 4 sec-
is 60%. onds.
Program Pin Data (PPFC) The segment outputs are modulated as two banks, with
segments 1, 3, and 5 alternating with segments 2 and 4.
The PPFC register provides the means to perform a soft- The segment outputs are modulated at approximately
ware controlled reset of the device. The recommended 320Hz, with each bank active for 30% of the period.
reset method for the bq2013H is:
SEG1 blinks at a 4Hz rate whenever VSB has been de-
■ Write PPFC to zero tected to be below VEDV1 to indicate a low-battery condi-
tion or NAC is less than 10% of the LMD or PFC, de-
■ Write LMD to zero pending on the display mode.
After these operations, a software reset occurs.
Resetting the bq2013H sets the following:
Microregulator
The bq2013H can operate directly from 4 nickel or 3
■ LMD = PFC lead acid cells. To facilitate the power supply require-
■ VDQ, OCE, LCOMP, and NAC = 0 ments of the bq2013H, an REF output is provided to
regulate an external low-threshold n-FET. A micropower
■ BRP = 1 source for the bq2013H can be inexpensively built using
the FET and an external resistor.
Battery Voltage Register (VSB)
The battery voltage register is used to read the battery
voltage on the SB pin. The VSB register (address = 7eh)
is updated approximately once per second with the pres-
ent value of the battery voltage. The battery voltage on
the SB pin is determined by the equation:
15
bq2013H
Note: Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional
operation should be limited to the Recommended DC Operating Conditions detailed in this data sheet.
Exposure to conditions beyond the operational limits for extended periods of time may affect device reli-
ability.
Note: VOS is affected by PC board layout. Proper layout guidelines should be followed for optimal performance.
See “LayoutConsiderations.”
16
bq2013H
17
bq2013H
Note: The open-drain HDQ pin should be pulled to at least VCC by the host system for proper HDQ operation.
HDQ may be left floating if the serial interface is not used.
18
bq2013H
Break Timing
tB tBR
TD201803.eps
Host to bq2013H
Write "1"
Write "0"
tSTRH
tDSU
tDH
tSSU
tCYCH
bq2013H to Host
Read "1"
Read "0"
tSTRB
tDSUB
tDV
tSSUB
tCYCB
19
bq2013H
.004
L
20
bq2013H
21
bq2013H
Ordering Information
bq2013H
Temperature Range:
blank = Commercial (0 to +70°C)
Package Option:
SN = 16-pin narrow SOIC
Device:
bq2013H Gas Gauge IC
22
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
BQ2013HSN-A514 ACTIVE SOIC D 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR 0 to 70 2013H
A514
BQ2013HSN-A514G4 ACTIVE SOIC D 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR 0 to 70 2013H
A514
BQ2013HSN-A514TR NRND SOIC D 16 2500 RoHS & Green NIPDAU Level-2-260C-1 YEAR 0 to 70 2013H
A514
BQ2013HSN-A514TRG4 NRND SOIC D 16 2500 RoHS & Green NIPDAU Level-2-260C-1 YEAR 0 to 70 2013H
A514
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
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continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
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Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
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