STM32L051K8T6

STM32L051x6 STM32L051x8
Access line ultra-low-power 32-bit MCU ARM®-based Cortex®-M0+,

up to 64 KB Flash, 8 KB SRAM, 2 KB EEPROM, ADC
Datasheet - production data
Features
 Ultra-low-power platform )%*$
– 1.65 V to 3.6 V power supply

– -40 to 125 °C temperature range
UFQFPN32
– 0.27 µA Standby mode (2 wakeup pins) 5x5 mm LQFP32 7x7 mm WLCSP36
LQFP48 7x7 mm TFBGA64
– 0.4 µA Stop mode (16 wakeup lines) LQFP64 10x10 mm 5x5mm
– 0.8 µA Stop mode + RTC + 8 KB RAM retention
– 88 µA/MHz in Run mode  Rich Analog peripherals
– 3.5 µs wakeup time (from RAM) – 12-bit ADC 1.14 Msps up to 16 channels (down
to 1.65 V)
– 5 µs wakeup time (from Flash memory)
– 2x ultra-low-power comparators (window mode
 Core: ARM® 32-bit Cortex®-M0+ with MPU and wake up capability, down to 1.65 V)
– From 32 kHz up to 32 MHz max.  7-channel DMA controller, supporting ADC, SPI,
– 0.95 DMIPS/MHz I2C, USART, Timers
 Reset and supply management  7x peripheral communication interfaces
– Ultra-safe, low-power BOR (brownout reset) – 2x USART (ISO 7816, IrDA), 1x UART (low
with 5 selectable thresholds power)
– Ultra-low-power POR/PDR – Up to 4x SPI 16 Mbits/s
– Programmable voltage detector (PVD) – 2x I2C (SMBus/PMBus)
 Clock sources  9x timers: 1x 16-bit with up to 4 channels, 2x 16-bit
– 1 to 25 MHz crystal oscillator with up to 2 channels, 1x 16-bit ultra-low-power
– 32 kHz oscillator for RTC with calibration timer, 1x SysTick, 1x RTC, 1x 16-bit basic, and 2x
– High speed internal 16 MHz factory-trimmed RC watchdogs (independent/window)
(+/- 1%)  CRC calculation unit, 96-bit unique ID
– Internal low-power 37 kHz RC
 All packages are ECOPACK®2
– Internal multispeed low-power 65 kHz to
4.2 MHz RC Table 1. Device summary
– PLL for CPU clock Reference Part number
 Pre-programmed bootloader
STM32L051C6,
– USART, SPI supported
STM32L051K6,
 Development support STM32L051x6
STM32L051R6,
– Serial wire debug supported STM32L051T6
 Up to 51 fast I/Os (45 I/Os 5V tolerant) STM32L051C8,
 Memories STM32L051x8
STM32L051K8,
– Up to 64 KB Flash memory with ECC STM32L051R8,
– 8KB RAM STM32L051T8
– 2 KB of data EEPROM with ECC
– 20-byte backup register
– Sector protection against R/W operation
March 2016 DocID025938 Rev 6 1/127

This is information on a product in full production. www.st.com
Contents STM32L051x6 STM32L051x8
Contents
1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.1 Device overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
2.2 Ultra-low-power device continuum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
3 Functional overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.1 Low-power modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3.2 Interconnect matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
3.3 ARM® Cortex®-M0+ core with MPU . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3.4 Reset and supply management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.4.1 Power supply schemes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.4.2 Power supply supervisor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
3.4.3 Voltage regulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.5 Clock management . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3.6 Low-power real-time clock and backup registers . . . . . . . . . . . . . . . . . . . 24
3.7 General-purpose inputs/outputs (GPIOs) . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.8 Memories . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.9 Boot modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.10 Direct memory access (DMA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.11 Analog-to-digital converter (ADC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.12 Temperature sensor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.12.1 Internal voltage reference (VREFINT) . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
3.13 Ultra-low-power comparators and reference voltage . . . . . . . . . . . . . . . . 27
3.14 System configuration controller . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
3.15 Timers and watchdogs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
3.15.1 General-purpose timers (TIM2, TIM21 and TIM22) . . . . . . . . . . . . . . . . 28
3.15.2 Low-power Timer (LPTIM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.15.3 Basic timer (TIM6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.15.4 SysTick timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.15.5 Independent watchdog (IWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.15.6 Window watchdog (WWDG) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
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STM32L051x6 STM32L051x8 Contents
3.16 Communication interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

3.16.1 I2C bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
3.16.2 Universal synchronous/asynchronous receiver transmitter (USART) . . 31
3.16.3 Low-power universal asynchronous receiver transmitter (LPUART) . . . 31
3.16.4 Serial peripheral interface (SPI)/Inter-integrated sound (I2S) . . . . . . . . 32
3.17 Cyclic redundancy check (CRC) calculation unit . . . . . . . . . . . . . . . . . . . 32
3.18 Serial wire debug port (SW-DP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
4 Pin descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
5 Memory mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
6 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1 Parameter conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.1 Minimum and maximum values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.2 Typical values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.3 Typical curves . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.4 Loading capacitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.5 Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
6.1.6 Power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
6.1.7 Current consumption measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
6.2 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
6.3 Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
6.3.1 General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
6.3.2 Embedded reset and power control block characteristics . . . . . . . . . . . 53
6.3.3 Embedded internal reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . 54
6.3.4 Supply current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
6.3.5 Wakeup time from low-power mode . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
6.3.6 External clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
6.3.7 Internal clock source characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
6.3.8 PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
6.3.9 Memory characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
6.3.10 EMC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
6.3.11 Electrical sensitivity characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
6.3.12 I/O current injection characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
6.3.13 I/O port characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
6.3.14 NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
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Contents STM32L051x6 STM32L051x8
6.3.15 12-bit ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

6.3.16 Temperature sensor characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
6.3.17 Comparators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
6.3.18 Timer characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
6.3.19 Communications interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
7 Package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

7.1 LQFP64 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
7.2 TFBGA64 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
7.3 LQFP48 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
7.4 WLCSP36 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .110
7.5 LQFP32 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .113
7.6 UFQFPN32 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116
7.7 Thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .119
7.7.1 Reference document . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
8 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
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STM32L051x6 STM32L051x8 List of tables
List of tables
Table 1. Device summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

Table 2. Ultra-low-power STM32L051x6/x8 device features and peripheral counts. . . . . . . . . . . . . 11
Table 3. Functionalities depending on the operating power supply range . . . . . . . . . . . . . . . . . . . . 15
Table 4. CPU frequency range depending on dynamic voltage scaling . . . . . . . . . . . . . . . . . . . . . . 16
Table 5. Functionalities depending on the working mode
(from Run/active down to standby) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Table 6. STM32L0xx peripherals interconnect matrix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Table 7. Temperature sensor calibration values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Table 8. Internal voltage reference measured values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Table 9. Timer feature comparison . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Table 10. Comparison of I2C analog and digital filters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 11. STM32L051x6/8 I2C implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 12. USART implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Table 13. SPI/I2S implementation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Table 14. Legend/abbreviations used in the pinout table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Table 15. STM32L051x6/8 pin definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Table 16. Alternate function port A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Table 17. Alternate function port B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Table 18. Alternate function port C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 19. Alternate function port D . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Table 20. Voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Table 21. Current characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Table 22. Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Table 23. General operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51
Table 24. Embedded reset and power control block characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 53
Table 25. Embedded internal reference voltage calibration values . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Table 26. Embedded internal reference voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54
Table 27. Current consumption in Run mode, code with data processing running from Flash. . . . . . 56
Table 28. Current consumption in Run mode vs code type, 
code with data processing running from Flash . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Table 29. Current consumption in Run mode, code with data processing running from RAM . . . . . . 58
Table 30. Current consumption in Run mode vs code type, 
code with data processing running from RAM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
Table 31. Current consumption in Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
Table 32. Current consumption in Low-power run mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
Table 33. Current consumption in Low-power sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Table 34. Typical and maximum current consumptions in Stop mode . . . . . . . . . . . . . . . . . . . . . . . . 62
Table 35. Typical and maximum current consumptions in Standby mode . . . . . . . . . . . . . . . . . . . . . 63
Table 36. Average current consumption during Wakeup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
Table 37. Peripheral current consumption in Run or Sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
Table 38. Peripheral current consumption in Stop and Standby mode . . . . . . . . . . . . . . . . . . . . . . . 65
Table 39. Low-power mode wakeup timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Table 40. High-speed external user clock characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
Table 41. Low-speed external user clock characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
Table 42. HSE oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Table 43. LSE oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Table 44. 16 MHz HSI16 oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 72
Table 45. LSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73
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List of tables STM32L051x6 STM32L051x8
Table 46. MSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73

Table 47. PLL characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Table 48. RAM and hardware registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Table 49. Flash memory and data EEPROM characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Table 50. Flash memory and data EEPROM endurance and retention . . . . . . . . . . . . . . . . . . . . . . . 76
Table 51. EMS characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 77
Table 52. EMI characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
Table 53. ESD absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
Table 54. Electrical sensitivities . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
Table 55. I/O current injection susceptibility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
Table 56. I/O static characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81
Table 57. Output voltage characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
Table 58. I/O AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84
Table 59. NRST pin characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
Table 60. ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
Table 61. RAIN max for fADC = 16 MHz . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Table 62. ADC accuracy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
Table 63. Temperature sensor calibration values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
Table 64. Temperature sensor characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
Table 65. Comparator 1 characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
Table 66. Comparator 2 characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92
Table 67. TIMx characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
Table 68. I2C analog filter characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
Table 69. USART/LPUART characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
Table 70. SPI characteristics in voltage Range 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
Table 73. I2S characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99
Table 74. LQFP64 - 64-pin, 10 x 10 mm low-profile quad flat 
package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
Table 75. TFBGA64 – 64-ball, 5 x 5 mm, 0.5 mm pitch, thin profile fine pitch ball 
grid array package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
Table 76. TFBGA64 recommended PCB design rules (0.5 mm pitch BGA). . . . . . . . . . . . . . . . . . . 105
Table 77. LQFP48 - 48-pin, 7 x 7 mm low-profile quad flat package mechanical data. . . . . . . . . . . 108
Table 78. WLCSP36 - 2.596 x 2.868 mm, 0.4 mm pitch wafer level chip scale
mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
Table 79. WLCSP36 recommended PCB design rules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111
Table 80. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package mechanical data. . . . . . . . . . . 114
Table 81. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat 
package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
Table 82. Thermal characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119
Table 83. STM32L051x6/8 ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
Table 84. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
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STM32L051x6 STM32L051x8 List of figures
List of figures
Figure 1. STM32L051x6/8 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Figure 2. Clock tree . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Figure 3. STM32L051x6/8 LQFP64 pinout - 10 x 10 mm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Figure 4. STM32L051x6/8 TFBGA64 ballout - 5x 5 mm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Figure 5. STM32L051x6/8 LQFP48 pinout - 7 x 7 mm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 6. STM32L051x6/8 WLCSP36 ballout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 7. STM32L051x6/8 LQFP32 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Figure 8. STM32L051x6/8 UFQFPN32 pinout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Figure 9. Memory map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Figure 10. Pin loading conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Figure 11. Pin input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Figure 12. Power supply scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Figure 13. Current consumption measurement scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Figure 14. IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from 
Flash memory, Range 2, HSE, 1WS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 15. IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from 
Flash memory, Range 2, HSI16, 1WS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
Figure 16. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running
from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Figure 17. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled 
and running on LSE Low drive . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Figure 18. IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop mode with RTC disabled, 
all clocks off . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62
Figure 19. High-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68
Figure 20. Low-speed external clock source AC timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69
Figure 21. HSE oscillator circuit diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
Figure 22. Typical application with a 32.768 kHz crystal . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71
Figure 23. HSI16 minimum and maximum value versus temperature . . . . . . . . . . . . . . . . . . . . . . . . . 72
Figure 24. VIH/VIL versus VDD (CMOS I/Os) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Figure 25. VIH/VIL versus VDD (TTL I/Os) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82
Figure 26. I/O AC characteristics definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 85
Figure 27. Recommended NRST pin protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
Figure 28. ADC accuracy characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
Figure 29. Typical connection diagram using the ADC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
Figure 30. Power supply and reference decoupling (VREF+ not connected to VDDA). . . . . . . . . . . . . . 90
Figure 31. Power supply and reference decoupling (VREF+ connected to VDDA). . . . . . . . . . . . . . . . . 91
Figure 32. SPI timing diagram - slave mode and CPHA = 0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
Figure 33. SPI timing diagram - slave mode and CPHA = 1(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Figure 34. SPI timing diagram - master mode(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
Figure 35. I2S slave timing diagram (Philips protocol)(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Figure 36. I2S master timing diagram (Philips protocol)(1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
Figure 37. LQFP64 - 64-pin, 10 x 10 mm low-profile quad flat package outline . . . . . . . . . . . . . . . . 101
Figure 38. LQFP64 - 64-pin, 10 x 10 mm low-profile quad flat recommended footprint . . . . . . . . . . 102
Figure 39. LQFP64 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
Figure 40. TFBGA64 – 64-ball, 5 x 5 mm, 0.5 mm pitch thin profile fine pitch ball 
grid array package outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
Figure 41. TFBGA64 – 64-ball, 5 x 5 mm, 0.5 mm pitch, thin profile fine pitch ball 
,grid array recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
DocID025938 Rev 6 7/127

8
List of figures STM32L051x6 STM32L051x8
Figure 42. TFBGA64 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106

Figure 43. LQFP48 - 48-pin, 7 x 7 mm low-profile quad flat package outline . . . . . . . . . . . . . . . . . . 107
Figure 44. LQFP48 - 48-pin, 7 x 7 mm low-profile quad flat recommended footprint . . . . . . . . . . . . 109
Figure 46. WLCSP36 - 2.596 x 2.868 mm, 0.4 mm pitch wafer level chip scale 
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
Figure 47. WLCSP36 - 2.596 x 2.868 mm, 0.4 mm pitch wafer level chip scale
recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111
Figure 48. WLCSP36 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112
Figure 49. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package outline . . . . . . . . . . . . . . . . . . 113
Figure 50. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat recommended footprint . . . . . . . . . . . . 114
Figure 52. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat 
package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
Figure 53. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat 
recommended footprint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117
Figure 54. UFQFPN32 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118
Figure 55. Thermal resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
8/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Introduction
1 Introduction
The ultra-low-power STM32L051x6/8 are offered in 6 different package types: from 32 pins
to 64 pins. Depending on the device chosen, different sets of peripherals are included, the
description below gives an overview of the complete range of peripherals proposed in this
family.
These features make the ultra-low-power STM32L051x6/8 microcontrollers suitable for a
wide range of applications:
 Gas/water meters and industrial sensors
 Healthcare and fitness equipment
 Remote control and user interface
 PC peripherals, gaming, GPS equipment
 Alarm system, wired and wireless sensors, video intercom
This STM32L051x6/8 datasheet should be read in conjunction with the STM32L0x1xx
reference manual (RM0377).
For information on the ARM® Cortex®-M0+ core please refer to the Cortex®-M0+ Technical
Reference Manual, available from the www.arm.com website.
Figure 1 shows the general block diagram of the device family.
DocID025938 Rev 6 9/127

32
Description STM32L051x6 STM32L051x8
2 Description
The access line ultra-low-power STM32L051x6/8 microcontrollers incorporate the high-

performance ARM® Cortex®-M0+ 32-bit RISC core operating at a 32 MHz frequency, a
memory protection unit (MPU), high-speed embedded memories (64 Kbytes of Flash
program memory, 2 Kbytes of data EEPROM and 8 Kbytes of RAM) plus an extensive range
of enhanced I/Os and peripherals.
The STM32L051x6/8 devices provide high power efficiency for a wide range of
performance. It is achieved with a large choice of internal and external clock sources, an
internal voltage adaptation and several low-power modes.
The STM32L051x6/8 devices offer several analog features, one 12-bit ADC with hardware
oversampling, two ultra-low-power comparators, several timers, one low-power timer
(LPTIM), three general-purpose 16-bit timers and one basic timer, one RTC and one
SysTick which can be used as timebases. They also feature two watchdogs, one watchdog
with independent clock and window capability and one window watchdog based on bus
clock.
Moreover, the STM32L051x6/8 devices embed standard and advanced communication
interfaces: up to two I2C, two SPIs, one I2S, two USARTs, a low-power UART (LPUART), .
The STM32L051x6/8 also include a real-time clock and a set of backup registers that
remain powered in Standby mode.
The ultra-low-power STM32L051x6/8 devices operate from a 1.8 to 3.6 V power supply
(down to 1.65 V at power down) with BOR and from a 1.65 to 3.6 V power supply without
BOR option. They are available in the -40 to +125 °C temperature range. A comprehensive
set of power-saving modes allows the design of low-power applications.
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STM32L051x6 STM32L051x8 Description
2.1 Device overview

Table 2. Ultra-low-power STM32L051x6/x8 device features and peripheral counts
STM32 STM32L STM32 STM32 STM32 STM32L STM32 STM32
Peripheral
L051K6 051T6 L051C6 L051R6 L051K8 051T8 L051C8 L051R8
Flash (Kbytes) 32 64
Data EEPROM (Kbytes) 2 2
RAM (Kbytes) 8 8
General-
3 3
purpose
Timers
Basic 1 1
LPTIMER 1 1
RTC/SYSTICK/IWDG/
1/1/1/1 1/1/1/1
WWDG
SPI/I2S 3(2)(1)/0 3(2)(1)/0 4(2)(1)/1 4(2)(1)/1 3(2)(1)/0 3(2)(1)/1 4(2)(1)/1 4(2)(1)/1
Communi- I2C 1 2 2 2 1 2 2 2
cation
interfaces USART 2 2
LPUART 0 1 1 1 0 1 1 1
GPIOs 27(2) 29 37 51(3) 27(2) 29 37 51(3)
Clocks:
0/1/1/1/1 0/1/1/1/1 1/1/1/1/1 1/1/1/1/1 0/1/1/1/1 0/1/1/1/1 1/1/1/1/1 1/1/1/1/1
HSE/LSE/HSI/MSI/LSI
12-bit synchronized ADC 1 1 1 1 1 1 1 1

Number of channels 10 10 10 16(3) 10 10 10 16(3)
Comparators 2 2
Max. CPU frequency 32 MHz
1.8 V to 3.6 V (down to 1.65 V at power-down) with BOR option

Operating voltage
1.65 V to 3.6 V without BOR option
Ambient temperature: –40 to +125 °C
Operating temperatures
Junction temperature: –40 to +130 °C
LQFP32, LQFP64 LQFP32, LQFP64
WLCSP WLCSP
Packages UFQFPN LQFP48 TFBGA UFQFPN LQFP48 TFBGA
36 36
32 64 32 64
1. 2 SPI interfaces are USARTs operating in SPI master mode.
2. LQFP32 has two GPIOs, less than UFQFPN32 (27).
3. TFBGA64 has one GPIO, one ADC input and one capacitive sensing channel less than LQFP64.
DocID025938 Rev 6 11/127

32
Description STM32L051x6 STM32L051x8
Figure 1. STM32L051x6/8 block diagram
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12/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Description
2.2 Ultra-low-power device continuum

The ultra-low-power family offers a large choice of core and features, from 8-bit proprietary
core up to ARM® Cortex®-M4, including ARM® Cortex®-M3 and ARM® Cortex®-M0+. The
STM32Lx series are the best choice to answer your needs in terms of ultra-low-power
features. The STM32 ultra-low-power series are the best solution for applications such as
gaz/water meter, keyboard/mouse or fitness and healthcare application. Several built-in
features like LCD drivers, dual-bank memory, low-power run mode, operational amplifiers,
128-bit AES, DAC, crystal-less USB and many other definitely help you building a highly
cost optimized application by reducing BOM cost. STMicroelectronics, as a reliable and
long-term manufacturer, ensures as much as possible pin-to-pin compatibility between all
STM8Lx and STM32Lx on one hand, and between all STM32Lx and STM32Fx on the other
hand. Thanks to this unprecedented scalability, your legacy application can be upgraded to
respond to the latest market feature and efficiency requirements.
DocID025938 Rev 6 13/127

32
Functional overview STM32L051x6 STM32L051x8
3 Functional overview
3.1 Low-power modes

The ultra-low-power STM32L051x6/8 support dynamic voltage scaling to optimize its power
consumption in Run mode. The voltage from the internal low-drop regulator that supplies
the logic can be adjusted according to the system’s maximum operating frequency and the
external voltage supply.
There are three power consumption ranges:
 Range 1 (VDD range limited to 1.71-3.6 V), with the CPU running at up to 32 MHz
 Range 2 (full VDD range), with a maximum CPU frequency of 16 MHz
 Range 3 (full VDD range), with a maximum CPU frequency limited to 4.2 MHz
Seven low-power modes are provided to achieve the best compromise between low-power
consumption, short startup time and available wakeup sources:
 Sleep mode
In Sleep mode, only the CPU is stopped. All peripherals continue to operate and can
wake up the CPU when an interrupt/event occurs. Sleep mode power consumption at
16 MHz is about 1 mA with all peripherals off.
 Low-power run mode
This mode is achieved with the multispeed internal (MSI) RC oscillator set to the low-
speed clock (max 131 kHz), execution from SRAM or Flash memory, and internal
regulator in low-power mode to minimize the regulator's operating current. In Low-
power run mode, the clock frequency and the number of enabled peripherals are both
limited.
 Low-power sleep mode
This mode is achieved by entering Sleep mode with the internal voltage regulator in
low-power mode to minimize the regulator’s operating current. In Low-power sleep
mode, both the clock frequency and the number of enabled peripherals are limited; a
typical example would be to have a timer running at 32 kHz.
When wakeup is triggered by an event or an interrupt, the system reverts to the Run
mode with the regulator on.
Stop mode with RTC
The Stop mode achieves the lowest power consumption while retaining the RAM and
register contents and real time clock. All clocks in the VCORE domain are stopped, the
PLL, MSI RC, HSE crystal and HSI RC oscillators are disabled. The LSE or LSI is still
running. The voltage regulator is in the low-power mode.
Some peripherals featuring wakeup capability can enable the HSI RC during Stop
mode to detect their wakeup condition.
The device can be woken up from Stop mode by any of the EXTI line, in 3.5 µs, the
processor can serve the interrupt or resume the code. The EXTI line source can be any
GPIO. It can be the PVD output, the comparator 1 event or comparator 2 event
(if internal reference voltage is on), it can be the RTC alarm/tamper/timestamp/wakeup
events, the USART/I2C/LPUART/LPTIMER wakeup events.
14/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Functional overview
 Stop mode without RTC

The Stop mode achieves the lowest power consumption while retaining the RAM and
register contents. All clocks are stopped, the PLL, MSI RC, HSI and LSI RC, HSE and
LSE crystal oscillators are disabled.
Some peripherals featuring wakeup capability can enable the HSI RC during Stop
mode to detect their wakeup condition.
The voltage regulator is in the low-power mode. The device can be woken up from Stop
mode by any of the EXTI line, in 3.5 µs, the processor can serve the interrupt or
resume the code. The EXTI line source can be any GPIO. It can be the PVD output, the
comparator 1 event or comparator 2 event (if internal reference voltage is on). It can
also be wakened by the USART/I2C/LPUART/LPTIMER wakeup events.
 Standby mode with RTC
The Standby mode is used to achieve the lowest power consumption and real time
clock. The internal voltage regulator is switched off so that the entire VCORE domain is
powered off. The PLL, MSI RC, HSE crystal and HSI RC oscillators are also switched
off. The LSE or LSI is still running. After entering Standby mode, the RAM and register
contents are lost except for registers in the Standby circuitry (wakeup logic, IWDG,
RTC, LSI, LSE Crystal 32 KHz oscillator, RCC_CSR register).
The device exits Standby mode in 60 µs when an external reset (NRST pin), an IWDG
reset, a rising edge on one of the three WKUP pins, RTC alarm (Alarm A or Alarm B),
RTC tamper event, RTC timestamp event or RTC Wakeup event occurs.
 Standby mode without RTC
The Standby mode is used to achieve the lowest power consumption. The internal
voltage regulator is switched off so that the entire VCORE domain is powered off. The
PLL, MSI RC, HSI and LSI RC, HSE and LSE crystal oscillators are also switched off.
After entering Standby mode, the RAM and register contents are lost except for
registers in the Standby circuitry (wakeup logic, IWDG, RTC, LSI, LSE Crystal 32 KHz
oscillator, RCC_CSR register).
The device exits Standby mode in 60 µs when an external reset (NRST pin) or a rising
edge on one of the three WKUP pin occurs.
Note: The RTC, the IWDG, and the corresponding clock sources are not stopped automatically by
entering Stop or Standby mode.
Table 3. Functionalities depending on the operating power supply range

Functionalities depending on the operating power supply range
Operating power supply
range Dynamic voltage
ADC operation I/O operation
scaling range
ADC only,
Range 2 or Degraded speed
VDD = 1.65 to 1.71 V conversion time up
range 3 performance
to 570 ksps
ADC only,
Range 1, range 2 or Degraded speed
VDD = 1.71 to 1.8 V(1) conversion time up
range 3 performance
to 1.14 Msps
Conversion time up Range1, range 2 or Degraded speed
VDD = 1.8 to 2.0 V(1)
to 1.14 Msps range 3 performance
DocID025938 Rev 6 15/127

32
Table 3. Functionalities depending on the operating power supply range (continued)

Functionalities depending on the operating power supply range
Operating power supply
range Dynamic voltage
ADC operation I/O operation
scaling range
Conversion time up Range 1, range 2 or

VDD = 2.0 to 2.4 V Full speed operation
to 1.14 Msps range 3
Conversion time up Range 1, range 2 or
VDD = 2.4 to 3.6 V Full speed operation
to 1.14 Msps range 3
1. CPU frequency changes from initial to final must respect "fcpu initial <4*fcpu final". It must also respect 5
μs delay between two changes. For example to switch from 4.2 MHz to 32 MHz, you can switch from 4.2
MHz to 16 MHz, wait 5 μs, then switch from 16 MHz to 32 MHz.
Table 4. CPU frequency range depending on dynamic voltage scaling
CPU frequency range Dynamic voltage scaling range
16 MHz to 32 MHz (1ws)

Range 1
32 kHz to 16 MHz (0ws)
8 MHz to 16 MHz (1ws)
Range 2
32 kHz to 8 MHz (0ws)
32 kHz to 4.2 MHz (0ws) Range 3
Table 5. Functionalities depending on the working mode

(from Run/active down to standby) (1)
Stop Standby
Low- Low-
IPs Run/Active Sleep power power
Wakeup Wakeup
run sleep
capability capability
CPU Y -- Y -- -- --
Flash memory O O O O -- --
RAM Y Y Y Y Y --
Backup registers Y Y Y Y Y Y
EEPROM O O O O -- --
Brown-out reset
O O O O O O O O
(BOR)
DMA O O O O -- --
Programmable
Voltage Detector O O O O O O -
(PVD)
Power-on/down
Y Y Y Y Y Y Y Y
reset (POR/PDR)
High Speed (2)
O O -- -- --
Internal (HSI)
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(from Run/active down to standby) (continued)(1)
Stop Standby
Low- Low-
Wakeup Wakeup
run sleep
High Speed
O O O O -- --
External (HSE)
Low Speed Internal
O O O O O O
(LSI)
Low Speed
O O O O O O
External (LSE)
Multi-Speed
O O Y Y -- --
Internal (MSI)
Inter-Connect
Y Y Y Y Y --
Controller
RTC O O O O O O O
RTC Tamper O O O O O O O O
Auto WakeUp
O O O O O O O O
(AWU)
USART O O O O O(3) O --
(3)
LPUART O O O O O O --
SPI O O O O -- --
I2C O O O O O(4) O --
ADC O O -- -- -- --
Temperature
O O O O O --
sensor
Comparators O O O O O O --
16-bit timers O O O O -- --
LPTIMER O O O O O O
IWDG O O O O O O O O
WWDG O O O O -- --
SysTick Timer O O O O --
GPIOs O O O O O O 2 pins
Wakeup time to
0 µs 0.36 µs 3 µs 32 µs 3.5 µs 50 µs
Run mode
DocID025938 Rev 6 17/127

32

(from Run/active down to standby) (continued)(1)
Stop Standby
Low- Low-
Wakeup Wakeup
run sleep
0.4 µA (No 0.28 µA (No

RTC) VDD=1.8 V RTC) VDD=1.8 V
Down to Down to 0.8 µA (with 0.65 µA (with

Consumption RTC) V =1.8 V RTC) VDD=1.8 V
140 µA/MHz 37 µA/MHz Down to Down to DD
VDD=1.8 to 3.6 V
(from Flash (from Flash 8 µA 4.5 µA 0.4 µA (No 0.29 µA (No
(Typ)
memory) memory) RTC) VDD=3.0 V RTC) VDD=3.0 V
1 µA (with RTC) 0.85 µA (with
VDD=3.0 V RTC) VDD=3.0 V
1. Legend: 
“Y” = Yes (enable). 
“O” = Optional can be enabled/disabled by software)
“-” = Not available
2. Some peripherals with wakeup from Stop capability can request HSI to be enabled. In this case, HSI is woken up by the
peripheral, and only feeds the peripheral which requested it. HSI is automatically put off when the peripheral does not need
it anymore.
3. UART and LPUART reception is functional in Stop mode. It generates a wakeup interrupt on Start. To generate a wakeup
on address match or received frame event, the LPUART can run on LSE clock while the UART has to wake up or keep
running the HSI clock.
4. I2C address detection is functional in Stop mode. It generates a wakeup interrupt in case of address match. It will wake up
the HSI during reception.
3.2 Interconnect matrix

Several peripherals are directly interconnected. This allows autonomous communication
between peripherals, thus saving CPU resources and power consumption. In addition,
these hardware connections allow fast and predictable latency.
Depending on peripherals, these interconnections can operate in Run, Sleep, Low-power

run, Low-power sleep and Stop modes.
Table 6. STM32L0xx peripherals interconnect matrix

Low- Low-
Interconnect Interconnect
Interconnect action Run Sleep power power Stop
source destination
run sleep
Timer input channel,

TIM2,TIM21,
trigger from analog Y Y Y Y -
TIM22
signals comparison
COMPx
Timer input channel,
LPTIM trigger from analog Y Y Y Y Y
signals comparison
Timer triggered by other
TIMx TIMx Y Y Y Y -
timer
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Table 6. STM32L0xx peripherals interconnect matrix (continued)

Low- Low-
Interconnect Interconnect
Interconnect action Run Sleep power power Stop
source destination
run sleep
Timer triggered by Auto

TIM21 Y Y Y Y -
wake-up
RTC
Timer triggered by RTC
LPTIM Y Y Y Y Y
event
Clock source used as
All clock input channel for RC
TIMx Y Y Y Y -
source measurement and
trimming
Timer input channel and
TIMx Y Y Y Y -
trigger
GPIO Timer input channel and
LPTIM Y Y Y Y Y
trigger
ADC Conversion trigger Y Y Y Y -
3.3 ARM® Cortex®-M0+ core with MPU

The Cortex-M0+ processor is an entry-level 32-bit ARM Cortex processor designed for a
broad range of embedded applications. It offers significant benefits to developers, including:
 a simple architecture that is easy to learn and program
 ultra-low power, energy-efficient operation
 excellent code density
 deterministic, high-performance interrupt handling
 upward compatibility with Cortex-M processor family
 platform security robustness, with integrated Memory Protection Unit (MPU).
The Cortex-M0+ processor is built on a highly area and power optimized 32-bit processor
core, with a 2-stage pipeline Von Neumann architecture. The processor delivers exceptional
energy efficiency through a small but powerful instruction set and extensively optimized
design, providing high-end processing hardware including a single-cycle multiplier.
The Cortex-M0+ processor provides the exceptional performance expected of a modern 32-
bit architecture, with a higher code density than other 8-bit and 16-bit microcontrollers.
Owing to its embedded ARM core, the STM32L051x6/8 are compatible with all ARM tools
and software.
DocID025938 Rev 6 19/127

32
Nested vectored interrupt controller (NVIC)

The ultra-low-power STM32L051x6/8 embed a nested vectored interrupt controller able to
handle up to 32 maskable interrupt channels and 4 priority levels.
The Cortex-M0+ processor closely integrates a configurable Nested Vectored Interrupt
Controller (NVIC), to deliver industry-leading interrupt performance. The NVIC:
 includes a Non-Maskable Interrupt (NMI)
 provides zero jitter interrupt option
 provides four interrupt priority levels
The tight integration of the processor core and NVIC provides fast execution of Interrupt
Service Routines (ISRs), dramatically reducing the interrupt latency. This is achieved
through the hardware stacking of registers, and the ability to abandon and restart load-
multiple and store-multiple operations. Interrupt handlers do not require any assembler
wrapper code, removing any code overhead from the ISRs. Tail-chaining optimization also
significantly reduces the overhead when switching from one ISR to another.
To optimize low-power designs, the NVIC integrates with the sleep modes, that include a
deep sleep function that enables the entire device to enter rapidly stop or standby mode.
This hardware block provides flexible interrupt management features with minimal interrupt
latency.
3.4 Reset and supply management
3.4.1 Power supply schemes

 VDD = 1.65 to 3.6 V: external power supply for I/Os and the internal regulator. Provided
externally through VDD pins.
 VSSA, VDDA = 1.65 to 3.6 V: external analog power supplies for ADC reset blocks, RCs
and PLL. VDDA and VSSA must be connected to VDD and VSS, respectively.
3.4.2 Power supply supervisor

The devices have an integrated ZEROPOWER power-on reset (POR)/power-down reset
(PDR) that can be coupled with a brownout reset (BOR) circuitry.
Two versions are available:
 The version with BOR activated at power-on operates between 1.8 V and 3.6 V.
 The other version without BOR operates between 1.65 V and 3.6 V.
After the VDD threshold is reached (1.65 V or 1.8 V depending on the BOR which is active or
not at power-on), the option byte loading process starts, either to confirm or modify default
thresholds, or to disable the BOR permanently: in this case, the VDD min value becomes
1.65 V (whatever the version, BOR active or not, at power-on).
When BOR is active at power-on, it ensures proper operation starting from 1.8 V whatever
the power ramp-up phase before it reaches 1.8 V. When BOR is not active at power-up, the
power ramp-up should guarantee that 1.65 V is reached on VDD at least 1 ms after it exits
the POR area.
Five BOR thresholds are available through option bytes, starting from 1.8 V to 3 V. To
reduce the power consumption in Stop mode, it is possible to automatically switch off the
20/127 DocID025938 Rev 6

internal reference voltage (VREFINT) in Stop mode. The device remains in reset mode when
VDD is below a specified threshold, VPOR/PDR or VBOR, without the need for any external
reset circuit.
Note: The start-up time at power-on is typically 3.3 ms when BOR is active at power-up, the start-
up time at power-on can be decreased down to 1 ms typically for devices with BOR inactive
at power-up.
The devices feature an embedded programmable voltage detector (PVD) that monitors the
VDD/VDDA power supply and compares it to the VPVD threshold. This PVD offers 7 different
levels between 1.85 V and 3.05 V, chosen by software, with a step around 200 mV. An
interrupt can be generated when VDD/VDDA drops below the VPVD threshold and/or when
VDD/VDDA is higher than the VPVD threshold. The interrupt service routine can then generate
a warning message and/or put the MCU into a safe state. The PVD is enabled by software.
3.4.3 Voltage regulator

The regulator has three operation modes: main (MR), low power (LPR) and power down.
 MR is used in Run mode (nominal regulation)
 LPR is used in the Low-power run, Low-power sleep and Stop modes
 Power down is used in Standby mode. The regulator output is high impedance, the
kernel circuitry is powered down, inducing zero consumption but the contents of the
registers and RAM are lost except for the standby circuitry (wakeup logic, IWDG, RTC,
LSI, LSE crystal 32 KHz oscillator, RCC_CSR).
3.5 Clock management

The clock controller distributes the clocks coming from different oscillators to the core and
the peripherals. It also manages clock gating for low-power modes and ensures clock
robustness. It features:
 Clock prescaler
To get the best trade-off between speed and current consumption, the clock frequency
to the CPU and peripherals can be adjusted by a programmable prescaler.
 Safe clock switching
Clock sources can be changed safely on the fly in Run mode through a configuration
register.
 Clock management
To reduce power consumption, the clock controller can stop the clock to the core,
individual peripherals or memory.
 System clock source
Three different clock sources can be used to drive the master clock SYSCLK:
– 1-25 MHz high-speed external crystal (HSE), that can supply a PLL
– 16 MHz high-speed internal RC oscillator (HSI), trimmable by software, that can
supply a PLLMultispeed internal RC oscillator (MSI), trimmable by software, able
to generate 7 frequencies (65 kHz, 131 kHz, 262 kHz, 524 kHz, 1.05 MHz, 2.1
MHz, 4.2 MHz). When a 32.768 kHz clock source is available in the system (LSE),
the MSI frequency can be trimmed by software down to a ±0.5% accuracy.
 Auxiliary clock source
Two ultra-low-power clock sources that can be used to drive the real-time clock:
DocID025938 Rev 6 21/127

32
– 32.768 kHz low-speed external crystal (LSE)

– 37 kHz low-speed internal RC (LSI), also used to drive the independent watchdog.
The LSI clock can be measured using the high-speed internal RC oscillator for
greater precision.
 RTC clock source
The LSI, LSE or HSE sources can be chosen to clock the RTC, whatever the system
clock.
 Startup clock
After reset, the microcontroller restarts by default with an internal 2 MHz clock (MSI).
The prescaler ratio and clock source can be changed by the application program as
soon as the code execution starts.
 Clock security system (CSS)
This feature can be enabled by software. If an HSE clock failure occurs, the master
clock is automatically switched to HSI and a software interrupt is generated if enabled.
Another clock security system can be enabled, in case of failure of the LSE it provides
an interrupt or wakeup event which is generated if enabled.
 Clock-out capability (MCO: microcontroller clock output)
It outputs one of the internal clocks for external use by the application.
Several prescalers allow the configuration of the AHB frequency, each APB (APB1 and
APB2) domains. The maximum frequency of the AHB and the APB domains is 32 MHz. See
Figure 2 for details on the clock tree.
22/127 DocID025938 Rev 6

Figure 2. Clock tree
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DocID025938 Rev 6 23/127

32
3.6 Low-power real-time clock and backup registers

The real time clock (RTC) and the 5 backup registers are supplied in all modes including
standby mode. The backup registers are five 32-bit registers used to store 20 bytes of user
application data. They are not reset by a system reset, or when the device wakes up from
Standby mode.
The RTC is an independent BCD timer/counter. Its main features are the following:
 Calendar with subsecond, seconds, minutes, hours (12 or 24 format), week day, date,
month, year, in BCD (binary-coded decimal) format
 Automatically correction for 28, 29 (leap year), 30, and 31 day of the month
 Two programmable alarms with wake up from Stop and Standby mode capability
 Periodic wakeup from Stop and Standby with programmable resolution and period
 On-the-fly correction from 1 to 32767 RTC clock pulses. This can be used to
synchronize it with a master clock.
 Reference clock detection: a more precise second source clock (50 or 60 Hz) can be
used to enhance the calendar precision.
 Digital calibration circuit with 1 ppm resolution, to compensate for quartz crystal
inaccuracy
 2 anti-tamper detection pins with programmable filter. The MCU can be woken up from
Stop and Standby modes on tamper event detection.
 Timestamp feature which can be used to save the calendar content. This function can
be triggered by an event on the timestamp pin, or by a tamper event. The MCU can be
woken up from Stop and Standby modes on timestamp event detection.
The RTC clock sources can be:
 A 32.768 kHz external crystal
 A resonator or oscillator
 The internal low-power RC oscillator (typical frequency of 37 kHz)
 The high-speed external clock
3.7 General-purpose inputs/outputs (GPIOs)

Each of the GPIO pins can be configured by software as output (push-pull or open-drain), as
input (with or without pull-up or pull-down) or as peripheral alternate function. Most of the
GPIO pins are shared with digital or analog alternate functions, and can be individually
remapped using dedicated alternate function registers. All GPIOs are high current capable.
Each GPIO output, speed can be slowed (40 MHz, 10 MHz, 2 MHz, 400 kHz). The alternate
function configuration of I/Os can be locked if needed following a specific sequence in order
to avoid spurious writing to the I/O registers. The I/O controller is connected to a dedicated
IO bus with a toggling speed of up to 32 MHz.
Extended interrupt/event controller (EXTI)

The extended interrupt/event controller consists of 28 edge detector lines used to generate
interrupt/event requests. Each line can be individually configured to select the trigger event
(rising edge, falling edge, both) and can be masked independently. A pending register
maintains the status of the interrupt requests. The EXTI can detect an external line with a
pulse width shorter than the Internal APB2 clock period. Up to 51 GPIOs can be connected
to the 16 configurable interrupt/event lines. The 12 other lines are connected to PVD, RTC,
USARTs, LPUART, LPTIMER or comparator events.
24/127 DocID025938 Rev 6

3.8 Memories
The STM32L051x6/8 devices have the following features:
 8 Kbytes of embedded SRAM accessed (read/write) at CPU clock speed with 0 wait
states. With the enhanced bus matrix, operating the RAM does not lead to any
performance penalty during accesses to the system bus (AHB and APB buses).
 The non-volatile memory is divided into three arrays:
– 32 or 64 Kbytes of embedded Flash program memory
– 2 Kbytes of data EEPROM
– Information block containing 32 user and factory options bytes plus 4 Kbytes of
system memory
The user options bytes are used to write-protect or read-out protect the memory (with
4 Kbyte granularity) and/or readout-protect the whole memory with the following options:
 Level 0: no protection
 Level 1: memory readout protected.
The Flash memory cannot be read from or written to if either debug features are
connected or boot in RAM is selected
 Level 2: chip readout protected, debug features (Cortex-M0+ serial wire) and boot in
RAM selection disabled (debugline fuse)
The firewall protects parts of code/data from access by the rest of the code that is executed
outside of the protected area. The granularity of the protected code segment or the non-
volatile data segment is 256 bytes (Flash memory or EEPROM) against 64 bytes for the
volatile data segment (RAM).
The whole non-volatile memory embeds the error correction code (ECC) feature.
3.9 Boot modes

At startup, BOOT0 pin and nBOOT1 option bit are used to select one of three boot options:
 Boot from Flash memory
 Boot from System memory
 Boot from embedded RAM
The boot loader is located in System memory. It is used to reprogram the Flash memory by
using SPI1(PA4, PA5, PA6, PA7) or SPI2 (PB12, PB13, PB14, PB15), USART1(PA9,
PA10) or USART2(PA2, PA3). See STM32™ microcontroller system memory boot mode
AN2606 for details.
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32
3.10 Direct memory access (DMA)

The flexible 7-channel, general-purpose DMA is able to manage memory-to-memory,
peripheral-to-memory and memory-to-peripheral transfers. The DMA controller supports
circular buffer management, avoiding the generation of interrupts when the controller
reaches the end of the buffer.
Each channel is connected to dedicated hardware DMA requests, with software trigger
support for each channel. Configuration is done by software and transfer sizes between
source and destination are independent.
The DMA can be used with the main peripherals: SPI, I2C, USART, LPUART,
general-purpose timers, and ADC.
3.11 Analog-to-digital converter (ADC)

A native 12-bit, extended to 16-bit through hardware oversampling, analog-to-digital
converter is embedded into STM32L051x6/8 device. It has up to 16 external channels and 3
internal channels (temperature sensor, voltage reference). Three channels, PA0, PA4 and
PA5, are fast channels, while the others are standard channels.
The ADC performs conversions in single-shot or scan mode. In scan mode, automatic
conversion is performed on a selected group of analog inputs.
The ADC frequency is independent from the CPU frequency, allowing maximum sampling
rate of 1.14 MSPS even with a low CPU speed. The ADC consumption is low at all
frequencies (~25 µA at 10 kSPS, ~200 µA at 1MSPS). An auto-shutdown function
guarantees that the ADC is powered off except during the active conversion phase.
The ADC can be served by the DMA controller. It can operate from a supply voltage down to
1.65 V.
The ADC features a hardware oversampler up to 256 samples, this improves the resolution
to 16 bits (see AN2668).
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all scanned channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start triggers, to allow the application to synchronize A/D conversions and timers.
3.12 Temperature sensor

The temperature sensor (TSENSE) generates a voltage VSENSE that varies linearly with
temperature.
The temperature sensor is internally connected to the ADC_IN18 input channel which is
used to convert the sensor output voltage into a digital value.
The sensor provides good linearity but it has to be calibrated to obtain good overall
accuracy of the temperature measurement. As the offset of the temperature sensor varies
from chip to chip due to process variation, the uncalibrated internal temperature sensor is
suitable for applications that detect temperature changes only.
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To improve the accuracy of the temperature sensor measurement, each device is

individually factory-calibrated by ST. The temperature sensor factory calibration data are
stored by ST in the system memory area, accessible in read-only mode.
Table 7. Temperature sensor calibration values

Calibration value name Description Memory address
TS ADC raw data acquired at

TSENSE_CAL1 temperature of 30 °C,  0x1FF8 007A - 0x1FF8 007B
VDDA= 3 V
TSENSE_CAL2 temperature of 130 °C 0x1FF8 007E - 0x1FF8 007F
VDDA= 3 V
3.12.1 Internal voltage reference (VREFINT)

The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for the
ADC and Comparators. VREFINT is internally connected to the ADC_IN17 input channel. It
enables accurate monitoring of the VDD value (when no external voltage, VREF+, is available
for ADC). The precise voltage of VREFINT is individually measured for each part by ST during
production test and stored in the system memory area. It is accessible in read-only mode.
Table 8. Internal voltage reference measured values

Raw data acquired at

VREFINT_CAL temperature of 25 °C 0x1FF8 0078 - 0x1FF8 0079
VDDA = 3 V
3.13 Ultra-low-power comparators and reference voltage

The STM32L051x6/8 embed two comparators sharing the same current bias and reference
voltage. The reference voltage can be internal or external (coming from an I/O).
 One comparator with ultra low consumption
 One comparator with rail-to-rail inputs, fast or slow mode.
 The threshold can be one of the following:
– External I/O pins
– Internal reference voltage (VREFINT)
– submultiple of Internal reference voltage(1/4, 1/2, 3/4) for the rail to rail
comparator.
Both comparators can wake up the devices from Stop mode, and be combined into a
window comparator.
The internal reference voltage is available externally via a low-power / low-current output
buffer (driving current capability of 1 µA typical).
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32
3.14 System configuration controller

The system configuration controller provides the capability to remap some alternate
functions on different I/O ports.
The highly flexible routing interface allows the application firmware to control the routing of
different I/Os to the TIM2, TIM21, TIM22 and LPTIM timer input captures. It also controls the
routing of internal analog signals to ADC, COMP1 and COMP2 and the internal reference
voltage VREFINT.
3.15 Timers and watchdogs

The ultra-low-power STM32L051x6/8 devices include three general-purpose timers, one
low- power timer (LPTIM), one basic timer, two watchdog timers and the SysTick timer.
Table 9 compares the features of the general-purpose and basic timers.
Table 9. Timer feature comparison

DMA
Counter Capture/compare Complementary
Timer Counter type Prescaler factor request
resolution channels outputs
generation
Up, down, Any integer between

TIM2 16-bit Yes 4 No
up/down 1 and 65536
TIM21, Up, down, Any integer between
16-bit No 2 No
TIM22 up/down 1 and 65536
Any integer between
TIM6 16-bit Up Yes 0 No
1 and 65536
3.15.1 General-purpose timers (TIM2, TIM21 and TIM22)

There are three synchronizable general-purpose timers embedded in the STM32L051x6/8
devices (see Table 9 for differences).
TIM2
TIM2 is based on 16-bit auto-reload up/down counter. It includes a 16-bit prescaler. It
features four independent channels each for input capture/output compare, PWM or one-
pulse mode output.
The TIM2 general-purpose timers can work together or with the TIM21 and TIM22 general-
purpose timers via the Timer Link feature for synchronization or event chaining. Their
counter can be frozen in debug mode. Any of the general-purpose timers can be used to
generate PWM outputs.
TIM2 has independent DMA request generation.
This timer is capable of handling quadrature (incremental) encoder signals and the digital
outputs from 1 to 3 hall-effect sensors.
TIM21 and TIM22

TIM21 and TIM22 are based on a 16-bit auto-reload up/down counter. They include a 16-bit
prescaler. They have two independent channels for input capture/output compare, PWM or
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one-pulse mode output. They can work together and be synchronized with the TIM2, full-
featured general-purpose timers.
They can also be used as simple time bases and be clocked by the LSE clock source
(32.768 kHz) to provide time bases independent from the main CPU clock.
3.15.2 Low-power Timer (LPTIM)

The low-power timer has an independent clock and is running also in Stop mode if it is
clocked by LSE, LSI or an external clock. It is able to wakeup the devices from Stop mode.
This low-power timer supports the following features:
 16-bit up counter with 16-bit autoreload register
 16-bit compare register
 Configurable output: pulse, PWM
 Continuous / one shot mode
 Selectable software / hardware input trigger
 Selectable clock source
– Internal clock source: LSE, LSI, HSI or APB clock
– External clock source over LPTIM input (working even with no internal clock
source running, used by the Pulse Counter Application)
 Programmable digital glitch filter
 Encoder mode
3.15.3 Basic timer (TIM6)

This timer can be used as a generic 16-bit timebase.
3.15.4 SysTick timer

This timer is dedicated to the OS, but could also be used as a standard downcounter. It is
based on a 24-bit downcounter with autoreload capability and a programmable clock
source. It features a maskable system interrupt generation when the counter reaches ‘0’.
3.15.5 Independent watchdog (IWDG)

The independent watchdog is based on a 12-bit downcounter and 8-bit prescaler. It is
clocked from an independent 37 kHz internal RC and, as it operates independently of the
main clock, it can operate in Stop and Standby modes. It can be used either as a watchdog
to reset the device when a problem occurs, or as a free-running timer for application timeout
management. It is hardware- or software-configurable through the option bytes. The counter
can be frozen in debug mode.
3.15.6 Window watchdog (WWDG)

The window watchdog is based on a 7-bit downcounter that can be set as free-running. It
can be used as a watchdog to reset the device when a problem occurs. It is clocked from
the main clock. It has an early warning interrupt capability and the counter can be frozen in
debug mode.
DocID025938 Rev 6 29/127

32
3.16 Communication interfaces
3.16.1 I2C bus

two I2C interface (I2C1, I2C2) can operate in multimaster or slave modes.
Each I2C interface can support Standard mode (Sm, up to 100 kbit/s), Fast mode (Fm, up to
400 kbit/s) and Fast Mode Plus (Fm+, up to 1 Mbit/s) with 20 mA output drive on some I/Os.
7-bit and 10-bit addressing modes, multiple 7-bit slave addresses (2 addresses, 1 with
configurable mask) are also supported as well as programmable analog and digital noise
filters.
Table 10. Comparison of I2C analog and digital filters

Analog filter Digital filter
Pulse width of Programmable length from 1 to 15

≥ 50 ns
suppressed spikes I2C peripheral clocks
1. Extra filtering capability vs.
Benefits Available in Stop mode standard requirements.
2. Stable length
Wakeup from Stop on address
Variations depending on
Drawbacks match is not available when digital
temperature, voltage, process
filter is enabled.
In addition, I2C1 provides hardware support for SMBus 2.0 and PMBus 1.1: ARP capability,
Host notify protocol, hardware CRC (PEC) generation/verification, timeouts verifications and
ALERT protocol management. I2C1 also has a clock domain independent from the CPU
clock, allowing the I2C1 to wake up the MCU from Stop mode on address match.
Each I2C interface can be served by the DMA controller.
Refer to Table 11 for an overview of I2C interface features.
Table 11. STM32L051x6/8 I2C implementation

I2C features(1) I2C1 I2C2
7-bit addressing mode X X

10-bit addressing mode X X
Standard mode (up to 100 kbit/s) X X
Fast mode (up to 400 kbit/s) X X
Fast Mode Plus with 20 mA output drive I/Os (up to 1 Mbit/s) X X(2)
Independent clock X -
SMBus X -
Wakeup from STOP X -
1. X = supported.
2. See for the list of I/Os that feature Fast Mode Plus capability
30/127 DocID025938 Rev 6

3.16.2 Universal synchronous/asynchronous receiver transmitter (USART)

The two USART interfaces (USART1, USART2) are able to communicate at speeds of up to
4 Mbit/s.
They provide hardware management of the CTS, RTS and RS485 driver enable (DE)
signals, multiprocessor communication mode, master synchronous communication and
single-wire half-duplex communication mode. They also support SmartCard communication
(ISO 7816), IrDA SIR ENDEC, LIN Master/Slave capability, auto baud rate feature and has
a clock domain independent from the CPU clock, allowing to wake up the MCU from Stop
mode using baudrates up to 42 Kbaud.
All USART interfaces can be served by the DMA controller.
Table 12 for the supported modes and features of USART interfaces.
Table 12. USART implementation

USART modes/features(1) USART1 and USART2
Hardware flow control for modem X

Continuous communication using DMA X
Multiprocessor communication X
Synchronous mode(2) X
Smartcard mode X
Single-wire half-duplex communication X
IrDA SIR ENDEC block X
LIN mode X
Dual clock domain and wakeup from Stop mode X
Receiver timeout interrupt X
Modbus communication X
Auto baud rate detection (4 modes) X
Driver Enable X
1. X = supported.
2. This mode allows using the USART as an SPI master.
3.16.3 Low-power universal asynchronous receiver transmitter (LPUART)

The devices embed one Low-power UART. The LPUART supports asynchronous serial
communication with minimum power consumption. It supports half duplex single wire
communication and modem operations (CTS/RTS). It allows multiprocessor
communication.
The LPUART has a clock domain independent from the CPU clock. It can wake up the
system from Stop mode using baudrates up to 46 Kbaud. The Wakeup events from Stop
mode are programmable and can be:
 Start bit detection
 Or any received data frame
 Or a specific programmed data frame
DocID025938 Rev 6 31/127

32
Only a 32.768 kHz clock (LSE) is needed to allow LPUART communication up to 9600
baud. Therefore, even in Stop mode, the LPUART can wait for an incoming frame while
having an extremely low energy consumption. Higher speed clock can be used to reach
higher baudrates.
LPUART interface can be served by the DMA controller.
3.16.4 Serial peripheral interface (SPI)/Inter-integrated sound (I2S)

Up to two SPIs are able to communicate at up to 16 Mbits/s in slave and master modes in
full-duplex and half-duplex communication modes. The 3-bit prescaler gives 8 master mode
frequencies and the frame is configurable to 8 bits or 16 bits. The hardware CRC
generation/verification supports basic SD Card/MMC modes.
The USARTs with synchronous capability can also be used as SPI master.
One standard I2S interfaces (multiplexed with SPI2) is available. It can operate in master or
slave mode, and can be configured to operate with a 16-/32-bit resolution as input or output
channels. Audio sampling frequencies from 8 kHz up to 192 kHz are supported. When the
I2S interfaces is configured in master mode, the master clock can be output to the external
DAC/CODEC at 256 times the sampling frequency.
The SPIs can be served by the DMA controller.
Refer to Table 13 for the differences between SPI1 and SPI2.
Table 13. SPI/I2S implementation

SPI features(1) SPI1 SPI2
Hardware CRC calculation X X

I2S mode - X
TI mode X X
1. X = supported.
3.17 Cyclic redundancy check (CRC) calculation unit

The CRC (cyclic redundancy check) calculation unit is used to get a CRC code using a
configurable generator polynomial value and size.
Among other applications, CRC-based techniques are used to verify data transmission or
storage integrity. In the scope of the EN/IEC 60335-1 standard, they offer a means of
verifying the Flash memory integrity. The CRC calculation unit helps compute a signature of
the software during runtime, to be compared with a reference signature generated at
linktime and stored at a given memory location.
3.18 Serial wire debug port (SW-DP)

An ARM SW-DP interface is provided to allow a serial wire debugging tool to be connected
to the MCU.
32/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Pin descriptions
4 Pin descriptions
Figure 3. STM32L051x6/8 LQFP64 pinout - 10 x 10 mm
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966
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966
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966
069
1. The above figure shows the package top view.

2. I/O supplied by VDDIO2.
DocID025938 Rev 6 33/127

45
Pin descriptions STM32L051x6 STM32L051x8
Figure 4. STM32L051x6/8 TFBGA64 ballout - 5x 5 mm

3&
$ 26& 3& 3% 3% 3% 3$ 3$ 3$
B,1
3& %227
% 26& 9'' 3%

3' 3& 3& 3$
B287
3+ 966 3% 3% 3& 3$ 3$ 3$

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3+
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+ 9''$ 3$ 3$ 3$ 3& 3& 3% 3%
06Y9

34/127 DocID025938 Rev 6

Figure 5. STM32L051x6/8 LQFP48 pinout - 7 x 7 mm
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966
3$
3$
3%
3%
3%
3%
3%
3%
3%
9''

9'' 9'',2
3& 966
3&26&B,1 3$
3&26&B287 3$
3+26&B,1 3$
3+26&B287 /4)3 3$
1567 3$
966$ 3$
9''$ 3%
3$ 3%
3$ 3%
3$ 3%

3%
3%
3$
3$
3$
3$
3$
3%
3%
3%
9''
966
069

Figure 6. STM32L051x6/8 WLCSP36 ballout

$ 3&
3$ 3$ 3% 3% 9'' 26&
B,1
% 3$ 3$ 3% 3% 3%

3&
26&
B287
& 3$ 3$ 3% 3% %22 1567

7
' 3$ 3% 3% 3$ 9''$ 966
( 3$ 3% 3$ 3$ 3$ 95()

) 9'' 3% 3$ 3$ 3$ 3$
06Y9
DocID025938 Rev 6 35/127

45
Figure 7. STM32L051x6/8 LQFP32 pinout
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3$
966
3%
3%
3%
3%
3%

9'' 3$
3&26&B,1 3$
3&26&B287 3$
1567 /4)3 3$
9''$ 3$
3$ 3$
3$ 3$
3$ 9''
3%
3%
966
3$
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3$
3$
06Y9
Figure 8. STM32L051x6/8 UFQFPN32 pinout

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36/127 DocID025938 Rev 6

Table 14. Legend/abbreviations used in the pinout table

Name Abbreviation Definition
Unless otherwise specified in brackets below the pin name, the pin function during
Pin name
and after reset is the same as the actual pin name
S Supply pin
Pin type I Input only pin
I/O Input / output pin
FT 5 V tolerant I/O
FTf 5 V tolerant I/O, FM+ capable
I/O structure TC Standard 3.3V I/O
B Dedicated BOOT0 pin
RST Bidirectional reset pin with embedded weak pull-up resistor
Unless otherwise specified by a note, all I/Os are set as floating inputs during and
Notes
after reset.
Alternate
Functions selected through GPIOx_AFR registers
functions
Pin functions
Additional
Functions directly selected/enabled through peripheral registers
functions
Table 15. STM32L051x6/8 pin definitions

Pin Number
I/O structure
Pin type
Pin name
WLCSP36(1)
UFQFPN32
Notes
Additional
TFBGA64
LQFP64
LQFP48
LQFP32
(function Alternate functions

functions
after reset)
1 B2 1 - - - VDD S - - - -
RTC_TAMP1/
RTC_TS/
2 A2 2 - - - PC13 I/O FT - -
RTC_OUT/
WKUP2
PC14-
3 A1 3 A6 2 2 OSC32_IN I/O FT - - OSC32_IN
(PC14)
DocID025938 Rev 6 37/127

45
Table 15. STM32L051x6/8 pin definitions (continued)

Pin Number
I/O structure
Pin type
WLCSP36(1) Pin name
UFQFPN32
Notes
Additional
TFBGA64
LQFP64
LQFP48
LQFP32
functions
after reset)
PC15-
4 B1 4 B6 3 3 OSC32_OUT I/O TC - - OSC32_OUT
(PC15)
PH0-OSC_IN
5 C1 5 - - - I/O TC - - OSC_IN
(PH0)
PH1-
6 D1 6 - - - OSC_OUT I/O TC - - OSC_OUT
(PH1)
7 E1 7 C6 4 4 NRST I/O RST - - -
LPTIM1_IN1,
8 E3 - - - - PC0 I/O FT - ADC_IN10
EVENTOUT
LPTIM1_OUT,
9 E2 - - - - PC1 I/O FT - ADC_IN11
EVENTOUT
LPTIM1_IN2,
10 F2 - - - - PC2 I/O FT - SPI2_MISO/I2S2_M ADC_IN12
CK
LPTIM1_ETR,
11 - - - - - PC3 I/O FT - ADC_IN13
SPI2_MOSI/I2S2_SD
12 F1 8 - - - VSSA S - - -
- G1 - E6 - - VREF+ S - - -
13 H1 9 D5 5 5 VDDA S - - -
TIM2_CH1, COMP1_INM6,
USART2_CTS, ADC_IN0,
14 G2 10 D4 6 6 PA0 I/O TC -
TIM2_ETR, RTC_TAMP2/WKU
COMP1_OUT P1
EVENTOUT,
TIM2_CH2, COMP1_INP,
15 H2 11 F6 7 7 PA1 I/O FT -
USART2_RTS_DE, ADC_IN1
TIM21_ETR
TIM21_CH1,
TIM2_CH3, COMP2_INM6,
16 F3 12 E5 8 8 PA2 I/O FT -
USART2_TX, ADC_IN2
COMP2_OUT
38/127 DocID025938 Rev 6


Pin Number
I/O structure
Pin type
WLCSP36(1) Pin name
UFQFPN32
Notes
Additional
TFBGA64
LQFP64
LQFP48
LQFP32
functions
after reset)
TIM21_CH2,
COMP2_INP,
17 G3 13 F5 9 9 PA3 I/O FT - TIM2_CH4,
ADC_IN3
USART2_RX
18 C2 - - - - VSS S - - -
19 D2 - - - - VDD S - - -
SPI1_NSS, COMP1_INM4,
(2)
20 H3 14 E4 10 10 PA4 I/O TC USART2_CK, COMP2_INM4,
TIM22_ETR ADC_IN4
SPI1_SCK, COMP1_INM5,
21 F4 15 F4 11 11 PA5 I/O TC - TIM2_ETR, COMP2_INM5,
TIM2_CH1 ADC_IN5
SPI1_MISO,
LPUART1_CTS,
22 G4 16 E3 12 12 PA6 I/O FT - TIM22_CH1, ADC_IN6
EVENTOUT,
COMP1_OUT
SPI1_MOSI,
TIM22_CH2,
23 H4 17 F3 13 13 PA7 I/O FT - ADC_IN7
EVENTOUT,
COMP2_OUT
EVENTOUT,
24 H5 - - - - PC4 I/O FT - ADC_IN14
LPUART1_TX
25 H6 - - - - PC5 I/O FT - LPUART1_RX, ADC_IN15
ADC_IN8,
26 F5 18 D3 14 14 PB0 I/O FT - EVENTOUT
VREF_OUT
ADC_IN9,
27 G5 19 C3 15 15 PB1 I/O FT - LPUART1_RTS_DE
VREF_OUT
28 G6 20 F2 - 16 PB2 I/O FT - LPTIM1_OUT -
TIM2_CH3,
LPUART1_TX,
29 G7 21 E2 - - PB10 I/O FT - -
SPI2_SCK,
I2C2_SCL
DocID025938 Rev 6 39/127

45

Pin Number
I/O structure
Pin type
WLCSP36(1) Pin name
UFQFPN32
Notes
Additional
TFBGA64
LQFP64
LQFP48
LQFP32
functions
after reset)
EVENTOUT,
TIM2_CH4,
30 H7 22 D2 - - PB11 I/O FT - -
LPUART1_RX,
I2C2_SDA
31 D6 23 - 16 - VSS S - - - -
32 E6 24 F1 17 17 VDD S - - - -
SPI2_NSS/I2S2_WS,
33 H8 25 - - - PB12 I/O FT - LPUART1_RTS_DE, -
EVENTOUT
SPI2_SCK/I2S2_CK,
LPUART1_CTS,
34 G8 26 - - - PB13 I/O FTf - -
I2C2_SCL,
TIM21_CH1
SPI2_MISO/I
2S2_MCK,
RTC_OUT,
35 F8 27 - - - PB14 I/O FTf - -
LPUART1_RTS_DE,
I2C2_SDA,
TIM21_CH2
SPI2_MOSI/I2S2_SD
36 F7 28 - - - PB15 I/O FT - -
, RTC_REFIN
37 F6 - - - - PC6 I/O FT - TIM22_CH1 -
38 E7 - - - - PC7 I/O FT - TIM22_CH2 -
39 E8 - - - - PC8 I/O FT - TIM22_ETR -
40 D8 - - - - PC9 I/O FT - TIM21_ETR -
MCO, EVENTOUT,
41 D7 29 E1 18 18 PA8 I/O FT - -
USART1_CK
42 C7 30 D1 19 19 PA9 I/O FT - MCO, USART1_TX -
43 C6 31 C1 20 20 PA10 I/O FT - USART1_RX -
SPI1_MISO,
EVENTOUT,
44 C8 32 C2 21 21 PA11 I/O FT - -
USART1_CTS,
COMP1_OUT
40/127 DocID025938 Rev 6


Pin Number
I/O structure
Pin type
WLCSP36(1) Pin name
UFQFPN32
Notes
Additional
TFBGA64
LQFP64
LQFP48
LQFP32
functions
after reset)
SPI1_MOSI,
EVENTOUT,
45 B8 33 B1 22 22 PA12 I/O FT - -
USART1_RTS_DE,
COMP2_OUT
46 A8 34 A1 23 23 PA13 I/O FT - SWDIO -
47 D5 35 - - - VSS S - - -
48 E5 36 - - - VDDIO2 S - - -
SWCLK,
49 A7 37 B2 24 24 PA14 I/O FT -
USART2_TX
SPI1_NSS,
TIM2_ETR,
50 A6 38 A2 25 25 PA15 I/O FT - EVENTOUT, -
USART2_RX,
TIM2_CH1
51 B7 - - - - PC10 I/O FT - LPUART1_TX -
52 B6 - - - - PC11 I/O FT - LPUART1_RX -
53 C5 - - - - PC12 I/O FT - - -
54 B5 - - - - PD2 I/O FT - LPUART1_RTS_DE -
SPI1_SCK,
55 A5 39 B3 26 26 PB3 I/O FT - TIM2_CH2, COMP2_INN
EVENTOUT
SPI1_MISO,
56 A4 40 A3 27 27 PB4 I/O FT - EVENTOUT, COMP2_INP
TIM22_CH1
SPI1_MOSI,
LPTIM1_IN1,
57 C4 41 C4 28 28 PB5 I/O FT - COMP2_INP
I2C1_SMBA,
TIM22_CH2
USART1_TX,
58 D3 42 B4 29 29 PB6 I/O FTf - I2C1_SCL, COMP2_INP
LPTIM1_ETR
USART1_RX,
COMP2_INP,
59 C3 43 A4 30 30 PB7 I/O FTf - I2C1_SDA,
PVD_IN
LPTIM1_IN2
DocID025938 Rev 6 41/127

45

Pin Number
I/O structure
Pin type
WLCSP36(1) Pin name
UFQFPN32
Notes
Additional
TFBGA64
LQFP64
LQFP48
LQFP32
functions
after reset)
60 B4 44 C5 31 31 BOOT0 B - - -
61 B3 45 B5 - 32 PB8 I/O FTf - I2C1_SCL -
EVENTOUT,
62 A3 46 - - - PB9 I/O FTf - I2C1_SDA, -
SPI2_NSS/I2S2_WS
63 D4 47 D6 32 - VSS S - - - -
64 E4 48 A5 1 1 VDD S - - - -
1. PB9/12/13/14/15, PH0/1 and PC13 GPIOs should be configured as output and driven Low, even if they are not available on
this package.
2. PA4 offers a reduced touch sensing sensitivity. It is thus recommended to use it as sampling capacitor I/O.
42/127 DocID025938 Rev 6

Table 16. Alternate function port A
AF0 AF1 AF2 AF3 AF4 AF5 AF6 AF7
Port
SPI1/TIM21/SYS_A TIM2/
- EVENTOUT USART1/2/3 TIM2/21/22 EVENTOUT COMP1/2
F/EVENTOUT/ EVENTOUT/
PA0 - - TIM2_CH1 - USART2_CTS TIM2_ETR - COMP1_OUT

USART2_RTS_
PA1 EVENTOUT - TIM2_CH2 - TIM21_ETR - -
DE
PA2 TIM21_CH1 - TIM2_CH3 - USART2_TX - - COMP2_OUT
PA3 TIM21_CH2 - TIM2_CH4 - USART2_RX - - -
PA4 SPI1_NSS - - - USART2_CK TIM22_ETR - -
PA5 SPI1_SCK - TIM2_ETR - - TIM2_CH1 - -
PA6 SPI1_MISO - - - LPUART1_CTS TIM22_CH1 EVENTOUT COMP1_OUT
DocID025938 Rev 6
PA7 SPI1_MOSI - - - - TIM22_CH2 EVENTOUT COMP2_OUT

Port A
PA8 MCO - - EVENTOUT USART1_CK - - -
PA9 MCO - - - USART1_TX - - -
PA10 - - - - USART1_RX - - -
PA11 SPI1_MISO - EVENTOUT - USART1_CTS - - COMP1_OUT
USART1_RTS_
PA12 SPI1_MOSI - EVENTOUT - - - COMP2_OUT
DE
PA13 SWDIO - - - - - - -
PA14 SWCLK - - - USART2_TX - - -
PA15 SPI1_NSS - TIM2_ETR EVENTOUT USART2_RX TIM2_CH1 - -
Pin descriptions
43/127
Table 17. Alternate function port B
Pin descriptions
44/127 AF0 AF1 AF2 AF3 AF4 AF5 AF6
Port SPI1/SPI2/I2S2/ LPUART1/LPTIM I2C1/TIM22/

I2C2/TIM21/
USART1/ I2C1 /TIM2/SYS_AF/ I2C1 EVENTOUT/ SPI2/I2S2/I2C2
EVENTOUT
EVENTOUT/ EVENTOUT LPUART1
PB0 EVENTOUT - - - - - -
LPUART1_RTS_
PB1 - - - - - -
DE
PB2 - - LPTIM1_OUT - - - -
PB3 SPI1_SCK - TIM2_CH2 - EVENTOUT - -
PB4 SPI1_MISO - EVENTOUT - TIM22_CH1 - -
PB5 SPI1_MOSI - LPTIM1_IN1 I2C1_SMBA TIM22_CH2 - -
DocID025938 Rev 6
PB6 USART1_TX I2C1_SCL LPTIM1_ETR - - - -

PB7 USART1_RX I2C1_SDA LPTIM1_IN2 - - - -
Port B PB8 - - - - I2C1_SCL - -

SPI2_NSS/I2S2_
PB9 - - EVENTOUT - I2C1_SDA -
WS
PB10 - - TIM2_CH3 - LPUART1_TX SPI2_SCK I2C2_SCL
PB11 EVENTOUT - TIM2_CH4 - LPUART1_RX - I2C2_SDA
LPUART1_RTS_
PB12 SPI2_NSS/I2S2_WS - - - - EVENTOUT
DE
PB13 SPI2_SCK/I2S2_CK - - - LPUART1_CTS I2C2_SCL TIM21_CH1
LPUART1_RTS_
PB14 SPI2_MISO/I2S2_MCK - RTC_OUT - I2C2_SDA TIM21_CH2
DE
PB15 SPI2_MOSI/I2S2_SD - RTC_REFIN - - -
Table 18. Alternate function port C
AF0 AF1 AF2
Port
LPUART1/LPTIM/TIM21/12/EVENTOUT - SPI2/I2S2/LPUART1/EVENTOUT
PC0 LPTIM1_IN1 - EVENTOUT

PC1 LPTIM1_OUT - EVENTOUT
PC2 LPTIM1_IN2 - SPI2_MISO/I2S2_MCK
PC3 LPTIM1_ETR - SPI2_MOSI/I2S2_SD
PC4 EVENTOUT - LPUART1_TX
PC5 - LPUART1_RX
PC6 TIM22_CH1 - -
PC7 TIM22_CH2 - -
Port C
DocID025938 Rev 6
PC8 TIM22_ETR - -
PC9 TIM21_ETR - -
PC10 LPUART1_TX - -
PC11 LPUART1_RX - -
PC12 - - -
PC13 - - -
PC14 - - -
PC15 - - -
Table 19. Alternate function port D

AF0 AF1
Port
Pin descriptions
LPUART1 -
Port D PD2 LPUART1_RTS_DE -

45/127
Memory mapping STM32L051x6 STM32L051x8
5 Memory mapping
Figure 9. Memory map
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46/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Electrical characteristics
6 Electrical characteristics
6.1 Parameter conditions

Unless otherwise specified, all voltages are referenced to VSS.
6.1.1 Minimum and maximum values

Unless otherwise specified the minimum and maximum values are guaranteed in the worst
conditions of ambient temperature, supply voltage and frequencies by tests in production on
100% of the devices with an ambient temperature at TA = 25 °C and TA = TAmax (given by
the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics
are indicated in the table footnotes and are not tested in production. Based on
characterization, the minimum and maximum values refer to sample tests and represent the
mean value plus or minus three times the standard deviation (mean±3σ).
6.1.2 Typical values

Unless otherwise specified, typical data are based on TA = 25 °C, VDD = 3.6 V (for the
1.65 V VDD 3.6 V voltage range). They are given only as design guidelines and are not
tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from
a standard diffusion lot over the full temperature range, where 95% of the devices have an
error less than or equal to the value indicated (mean±2σ).
6.1.3 Typical curves

Unless otherwise specified, all typical curves are given only as design guidelines and are
not tested.
6.1.4 Loading capacitor

The loading conditions used for pin parameter measurement are shown in Figure 10.
6.1.5 Pin input voltage

The input voltage measurement on a pin of the device is described in Figure 11.
Figure 10. Pin loading conditions Figure 11. Pin input voltage
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DocID025938 Rev 6 47/127

100
Electrical characteristics STM32L051x6 STM32L051x8
6.1.6 Power supply scheme
Figure 12. Power supply scheme
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Figure 13. Current consumption measurement scheme

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48/127 DocID025938 Rev 6

6.2 Absolute maximum ratings

Stresses above the absolute maximum ratings listed in Table 20: Voltage characteristics,
Table 21: Current characteristics, and Table 22: Thermal characteristics may cause
permanent damage to the device. These are stress ratings only and functional operation of
the device at these conditions is not implied. Exposure to maximum rating conditions for
extended periods may affect device reliability.
Table 20. Voltage characteristics

Symbol Definition Min Max Unit
External main supply voltage 

VDD–VSS –0.3 4.0
(including VDDA, VDDIO2, VDD)(1)
Input voltage on FT and FTf pins VSS  0.3 VDD+4.0
V
Input voltage on TC pins VSS  0.3 4.0
VIN(2)
Input voltage on BOOT0 VSS VDD 4.0
Input voltage on any other pin VSS 0.3 4.0
|VDD| Variations between different VDDx power pins - 50
Variations between any VDDx and VDDA power
|VDDA-VDDx| - 300 mV
pins(3)
|VSS| Variations between all different ground pins - 50
VREF+ –VDDA Allowed voltage difference for VREF+ > VDDA - 0.4 V
Electrostatic discharge voltage 
VESD(HBM) see Section 6.3.11
(human body model)
1. All main power (VDD,VDDIO2, VDDA) and ground (VSS, VSSA) pins must always be connected to the external
power supply, in the permitted range.
2. VIN maximum must always be respected. Refer to Table 21 for maximum allowed injected current values.
3. It is recommended to power VDD and VDDA from the same source. A maximum difference of 300 mV
between VDD and VDDA can be tolerated during power-up and device operation. VDDIO2 is independent
from VDD and VDDA: its value does not need to respect this rule.
DocID025938 Rev 6 49/127

100
Table 21. Current characteristics

Symbol Ratings Max. Unit
ΣIVDD(2) Total current into sum of all VDD power lines (source)(1) 105
ΣIVSS(2) Total current out of sum of all VSS ground lines (sink) (1)
105
ΣIVDDIO2 Total current into VDDIO2 power line (source) 25
IVDD(PIN) Maximum current into each VDD power pin (source)(1) 100
(1)
IVSS(PIN) Maximum current out of each VSS ground pin (sink) 100
Output current sunk by any I/O and control pin except FTf
16
pins
IIO
Output current sunk by FTf pins 22
Output current sourced by any I/O and control pin -16
mA
Total output current sunk by sum of all IOs and control pins
90
except PA11 and PA12(2)
ΣIIO(PIN) Total output current sunk by PA11 and PA12 25
Total output current sourced by sum of all IOs and control
-90
pins(2)
Injected current on FT, FFf, RST and B pins -5/+0(3)
IINJ(PIN)
Injected current on TC pin ± 5(4)
ΣIINJ(PIN) Total injected current (sum of all I/O and control pins)(5) ± 25
1. All main power (VDD, VDDA) and ground (VSS, VSSA) pins must always be connected to the external power
supply, in the permitted range.
2. This current consumption must be correctly distributed over all I/Os and control pins. The total output
current must not be sunk/sourced between two consecutive power supply pins referring to high pin count
LQFP packages.
3. Positive current injection is not possible on these I/Os. A negative injection is induced by VIN<VSS. IINJ(PIN)
must never be exceeded. Refer to Table 20 for maximum allowed input voltage values.
4. A positive injection is induced by VIN > VDD while a negative injection is induced by VIN < VSS. IINJ(PIN)
must never be exceeded. Refer to Table 20: Voltage characteristics for the maximum allowed input voltage
values.
5. When several inputs are submitted to a current injection, the maximum IINJ(PIN) is the absolute sum of the
positive and negative injected currents (instantaneous values).
Table 22. Thermal characteristics

Symbol Ratings Value Unit
TSTG Storage temperature range –65 to +150 °C

TJ Maximum junction temperature 150 °C
50/127 DocID025938 Rev 6

6.3 Operating conditions
6.3.1 General operating conditions
Table 23. General operating conditions

Symbol Parameter Conditions Min Max Unit
fHCLK Internal AHB clock frequency - 0 32

fPCLK1 Internal APB1 clock frequency - 0 32 MHz
fPCLK2 Internal APB2 clock frequency - 0 32
BOR detector disabled 1.65 3.6
BOR detector enabled, at power
1.8 3.6
VDD Standard operating voltage on V
BOR detector disabled, after
1.65 3.6
power on
Must be the same voltage as
VDDA Analog operating voltage (all features) 1.65 3.6 V
VDD(1)
VDDIO2 Standard operating voltage - 1.65 3.6 V
2.0 V  VDD  3.6 V -0.3 5.5
Input voltage on FT, FTf and RST pins(2)
1.65 V  VDD  2.0 V -0.3 5.2
VIN V
Input voltage on BOOT0 pin - 0 5.5
Input voltage on TC pin - -0.3 VDD+0.3
TFBGA64 package - 327
LQFP64 package - 444
Power dissipation at TA = 85 °C (range 6) LQFP48 package - 363

or TA =105 °C (rage 7) (3) WLCSP36 package - 318
UFQFPN32 - 526
PD mW
TFBGA64 package - 81
Power dissipation at TA = 125 °C (range LQFP48 package - 91

3) (3) WLCSP36 package - 79
LQFP32 package - 88
UFQFPN32 - 132
DocID025938 Rev 6 51/127

100
Table 23. General operating conditions (continued)

Maximum power dissipation

–40 85
(range 6)
Maximum power dissipation
TA Temperature range –40 105
(range 7)
Maximum power dissipation °C
–40 125
(range 3)
Junction temperature range (range 6) -40 °C  TA  85 ° –40 105
TJ Junction temperature range (range 7) -40 °C  TA  105 °C –40 125
Junction temperature range (range 3) -40 °C  TA  125 °C –40 130
1. It is recommended to power VDD and VDDA from the same source. A maximum difference of 300 mV between VDD and
VDDA can be tolerated during power-up and normal operation.
2. To sustain a voltage higher than VDD+0.3V, the internal pull-up/pull-down resistors must be disabled.
3. If TA is lower, higher PD values are allowed as long as TJ does not exceed TJ max (see Table 22: Thermal characteristics
on page 50).
52/127 DocID025938 Rev 6

6.3.2 Embedded reset and power control block characteristics

The parameters given in the following table are derived from the tests performed under the
ambient temperature condition summarized in Table 23.
Table 24. Embedded reset and power control block characteristics

Symbol Parameter Conditions Min Typ Max Unit
BOR detector enabled 0 - 

VDD rise time rate
BOR detector disabled 0 - 1000
tVDD(1) µs/V
BOR detector enabled 20 - 
VDD fall time rate
BOR detector disabled 0 - 1000
VDD rising, BOR enabled - 2 3.3
TRSTTEMPO(1) Reset temporization ms
VDD rising, BOR disabled(2) 0.4 0.7 1.6
Power on/power down reset Falling edge 1 1.5 1.65

VPOR/PDR
threshold Rising edge 1.3 1.5 1.65
Falling edge 1.67 1.7 1.74
VBOR0 Brown-out reset threshold 0
Rising edge 1.69 1.76 1.8
Rising edge 1.96 2.03 2.07
Rising edge 2.31 2.41 2.44
V
Programmable voltage detector Falling edge 1.8 1.85 1.88
VPVD0
threshold 0 Rising edge 1.88 1.94 1.99
VPVD1 PVD threshold 1
Rising edge 2.08 2.14 2.18
Rising edge 2.28 2.34 2.38
Rising edge 2.47 2.54 2.58
Rising edge 2.68 2.74 2.79
Rising edge 2.87 2.94 2.99
DocID025938 Rev 6 53/127

100
Table 24. Embedded reset and power control block characteristics (continued)

VPVD6 PVD threshold 6 V
Rising edge 3.08 3.15 3.20
BOR0 threshold - 40 -
Vhyst Hysteresis voltage All BOR and PVD thresholds mV
- 100 -
excepting BOR0
1. Guaranteed by characterization results.
2. Valid for device version without BOR at power up. Please see option "D" in Ordering information scheme for more details.
6.3.3 Embedded internal reference voltage

The parameters given in Table 26 are based on characterization results, unless otherwise
specified.
Table 25. Embedded internal reference voltage calibration values

Raw data acquired at

VREFINT_CAL temperature of 25 °C 0x1FF8 0078 - 0x1FF8 0079
VDDA= 3 V
Table 26. Embedded internal reference voltage(1)

VREFINT out(2) Internal reference voltage – 40 °C < TJ < +125 °C 1.202 1.224 1.242 V
TVREFINT Internal reference startup time - - 2 3 ms
VDDA and VREF+ voltage during
VVREF_MEAS - 2.99 3 3.01 V
VREFINT factory measure
Including uncertainties
Accuracy of factory-measured
AVREF_MEAS due to ADC and - - ±5 mV
VREFINT value(3)
VDDA/VREF+ values
TCoeff(4) Temperature coefficient –40 °C < TJ < +125 °C - 25 100 ppm/°C
ACoeff(4) Long-term stability 1000 hours, T= 25 °C - - 1000 ppm
VDDCoeff(4) Voltage coefficient 3.0 V < VDDA < 3.6 V - - 2000 ppm/V
ADC sampling time when
TS_vrefint(4)(5) reading the internal reference - 5 10 - µs
voltage
Startup time of reference
TADC_BUF(4) - - - 10 µs
voltage buffer for ADC
Consumption of reference
IBUF_ADC(4) - - 13.5 25 µA
voltage buffer for ADC
IVREF_OUT(4) VREF_OUT output current(6) - - - 1 µA
(4)
CVREF_OUT VREF_OUT output load - - - 50 pF
54/127 DocID025938 Rev 6

Table 26. Embedded internal reference voltage(1) (continued)

Consumption of reference
ILPBUF(4) voltage buffer for VREF_OUT - - 730 1200 nA
and COMP
VREFINT_DIV1(4) 1/4 reference voltage - 24 25 26
%
VREFINT
1. Refer to Table 38: Peripheral current consumption in Stop and Standby mode for the value of the internal reference current
consumption (IREFINT).
2. Guaranteed by test in production.
3. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes.
4. Guaranteed by design.
5. Shortest sampling time can be determined in the application by multiple iterations.
6. To guarantee less than 1% VREF_OUT deviation.
6.3.4 Supply current characteristics

The current consumption is a function of several parameters and factors such as the
operating voltage, temperature, I/O pin loading, device software configuration, operating
frequencies, I/O pin switching rate, program location in memory and executed binary code.
The current consumption is measured as described in Figure 13: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to Dhrystone 2.1 code if not specified
otherwise.
The current consumption values are derived from the tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 23: General operating
conditions unless otherwise specified.
The MCU is placed under the following conditions:
 All I/O pins are configured in analog input mode
 All peripherals are disabled except when explicitly mentioned
 The Flash memory access time and prefetch is adjusted depending on fHCLK
frequency and voltage range to provide the best CPU performance unless otherwise
specified.
 When the peripherals are enabled fAPB1 = fAPB2 = fAPB
 When PLL is on, the PLL inputs are equal to HSI = 16 MHz (if internal clock is used) or
HSE = 16 MHz (if HSE bypass mode is used)
 The HSE user clock applied to OSCI_IN input follows the characteristic specified in
Table 40: High-speed external user clock characteristics
 For maximum current consumption VDD = VDDA = 3.6 V is applied to all supply pins
 For typical current consumption VDD = VDDA = 3.0 V is applied to all supply pins if not
specified otherwise
The parameters given in Table 47, Table 23 and Table 24 are derived from tests performed
under ambient temperature and VDD supply voltage conditions summarized in Table 23.
DocID025938 Rev 6 55/127

100
Table 27. Current consumption in Run mode, code with data processing running from Flash
Symbol Parameter Conditions fHCLK Typ Max(1) Unit
1 MHz 165 230

Range 3, VCORE=1.2 V
2 MHz 290 360 µA
VOS[1:0]=11
4 MHz 555 630
fHSE = fHCLK up to 4 MHz 0.665 0.74
16 MHz included, Range 2, VCORE=1.5 V,
8 MHz 1.3 1.4
fHSE = fHCLK/2 above VOS[1:0]=10,
16 MHz (PLL on)(2) 16 MHz 2.6 2.8
Supply mA
IDD current in 8 MHz 1.55 1.7
(Run Run mode, Range 1, VCORE=1.8 V,
16 MHz 3.1 3.4
from code VOS[1:0]=01
Flash) executed 32 MHz 6.3 6.8
from Flash 65 kHz 36.5 110
Range 3, VCORE=1.2 V,
MSI clock 524 kHz 99.5 190 µA
VOS[1:0]=11
4.2 MHz 620 700
16 MHz 2.6 2.9
VOS[1:0]=10,
HSI clock mA
32 MHz 6.25 7
VOS[1:0]=01
1. Guaranteed by characterization results at 125 °C, unless otherwise specified.
2. Oscillator bypassed (HSEBYP = 1 in RCC_CR register).
Table 28. Current consumption in Run mode vs code type,

code with data processing running from Flash
Symbol Parameter Conditions fHCLK Typ Unit
Dhrystone 555
CoreMark 585
Range 3,
Fibonacci 440
VCORE=1.2 V, 4 MHz µA
VOS[1:0]=11 while(1) 355
Supply
IDD current in fHSE = fHCLK up to while(1), prefetch
353
(Run Run mode, 16 MHz included, off
from code fHSE = fHCLK/2 above Dhrystone 6.3
Flash) executed 16 MHz (PLL on)(1)
from Flash CoreMark 6.3
Range 1,
Fibonacci 6.55
VCORE=1.8 V, 32 MHz mA
VOS[1:0]=01 while(1) 5.4
while(1), prefetch
5.2
off
56/127 DocID025938 Rev 6

Figure 14. IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from
Flash memory, Range 2, HSE, 1WS
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Figure 15. IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code running from
Flash memory, Range 2, HSI16, 1WS
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DocID025938 Rev 6 57/127

100
Table 29. Current consumption in Run mode, code with data processing running from RAM
1 MHz 135 170

Range 3,
VCORE=1.2 V, 2 MHz 240 270 µA
VOS[1:0]=11
4 MHz 450 480
fHSE = fHCLK up to 16 4 MHz 0.52 0.6
Range 2,
MHz included,
VCORE=1.5 ,V, 8 MHz 1 1.2
fHSE = fHCLK/2 above
VOS[1:0]=10
16 MHz (PLL on)(2) 16 MHz 2 2.3
mA
8 MHz 1.25 1.4
Supply current in Range 1,
IDD (Run Run mode, code VCORE=1.8 V, 16 MHz 2.45 2.8
from executed from VOS[1:0]=01
32 MHz 5.1 5.4
RAM) RAM, Flash
switched off 65 kHz 34.5 75
Range 3,
MSI clock VCORE=1.2 V, 524 kHz 83 120 µA
VOS[1:0]=11
4.2 MHz 485 540
Range 2,
VCORE=1.5 V, 16 MHz 2.1 2.3
HSI16 clock source VOS[1:0]=10
mA
(16 MHz) Range 1,
VCORE=1.8 V, 32 MHz 5.1 5.6
VOS[1:0]=01
Table 30. Current consumption in Run mode vs code type,

code with data processing running from RAM(1)
Symbol Parameter Conditions fHCLK Typ Unit
Dhrystone 450
Range 3, CoreMark 575
VCORE=1.2 V, 4 MHz µA
Supply current in VOS[1:0]=11 Fibonacci 370
fHSE = fHCLK up to
IDD (Run Run mode, code while(1) 340
16 MHz included,
from executed from
fHSE = fHCLK/2 above Dhrystone 5.1
RAM) RAM, Flash
16 MHz (PLL on)(2)
switched off Range 1, CoreMark 6.25
VCORE=1.8 V, 32 MHz mA
VOS[1:0]=01 Fibonacci 4.4
while(1) 4.7
1. Guaranteed by characterization results, unless otherwise specified.
58/127 DocID025938 Rev 6

Table 31. Current consumption in Sleep mode

1 MHz 43.5 90
Range 3,
VCORE=1.2 V, 2 MHz 72 120
VOS[1:0]=11
4 MHz 130 180
fHSE = fHCLK up to 4 MHz 160 210
Range 2,
16 MHz included,
VCORE=1.5 V, 8 MHz 305 370
VOS[1:0]=10
16 MHz (PLL on)(2) 16 MHz 590 710
8 MHz 370 430
Range 1,
Supply current VCORE=1.8 V, 16 MHz 715 860
in Sleep VOS[1:0]=01
mode, Flash 32 MHz 1650 1900
off 65 kHz 18 65
Range 3,
MSI clock VCORE=1.2 V, 524 kHz 31.5 75
VOS[1:0]=11
4.2 MHz 140 210
Range 2,
VCORE=1.5 V, 16 MHz 665 830
(16 MHz) Range 1,
VCORE=1.8 V, 32 MHz 1750 2100
VOS[1:0]=01
IDD (Sleep) µA
1 MHz 57.5 130
Range 3,
VCORE=1.2 V, 2 MHz 84 170
VOS[1:0]=11
4 MHz 150 280
fHSE = fHCLK up to 4 MHz 170 310
Range 2,
16 MHz included,
CORE=1.5 V, 8 MHz 315 420
(2) VOS[1:0]=10
16 MHz (PLL on) 16 MHz 605 770
8 MHz 380 460
Range 1,
Supply current VCORE=1.8 V, 16 MHz 730 950
in Sleep VOS[1:0]=01
mode, Flash 32 MHz 1650 2400
on 65 kHz 29.5 110
Range 3,
MSI clock VCORE=1.2 V, 524 kHz 44.5 130
VOS[1:0]=11
4.2 MHz 150 270
Range 2,
VCORE=1.5 V, 16 MHz 680 950
(16 MHz) Range 1,
VCORE=1.8 V, 32 MHz 1750 2100
VOS[1:0]=01
DocID025938 Rev 6 59/127

100
Table 32. Current consumption in Low-power run mode

Symbol Parameter Conditions Typ Max(1) Unit
TA = − 40 to 25°C 8.5 10
MSI clock = 65 kHz, TA = 85 °C 11.5 48

fHCLK = 32 kHz TA = 105 °C 15.5 53
TA = 125 °C 27.5 130
All peripherals TA =-40 °C to 25 °C 10 15

off, code
MSI clock= 65 kHz, TA = 85 °C 15.5 50
executed from
RAM, Flash fHCLK = 65 kHz TA = 105 °C 19.5 54
switched off,
TA = 125 °C 31.5 130
VDD from 1.65
to 3.6 V TA = − 40 to 25°C 20 25
TA = 55 °C 23 50
MSI clock= 131 kHz,
TA = 85 °C 25.5 55
fHCLK = 131 kHz
TA = 105 °C 29.5 64
Supply
IDD current in TA = 125 °C 40 140
µA
(LP Run) Low-power TA = − 40 to 25°C 22 28
run mode
MSI clock= 65 kHz, TA = 85 °C 26 68
fHCLK = 32 kHz TA = 105 °C 31 75
TA = 125 °C 44 95
TA = − 40 to 25°C 27.5 33
All peripherals
off, code MSI clock = 65 kHz, TA = 85 °C 31.5 73
executed from fHCLK = 65 kHz TA = 105 °C 36.5 80
Flash, VDD
from 1.65 V to TA = 125 °C 49 100
3.6 V
TA = − 40 to 25°C 39 46
TA = 55 °C 41 80
MSI clock =
131 kHz, TA = 85 °C 44 86
fHCLK = 131 kHz
TA = 105 °C 49.5 100
TA = 125 °C 60 120
60/127 DocID025938 Rev 6

Figure 16. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running
from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS
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Table 33. Current consumption in Low-power sleep mode

MSI clock = 65 kHz,

fHCLK = 32 kHz, TA = − 40 to 25°C 4.7(2) -
Flash off
TA = − 40 to 25°C 17 23
MSI clock = 65 kHz, TA = 85 °C 19.5 63
fHCLK = 32 kHz,
Flash on TA = 105 °C 23 69
TA = 125 °C 32.5 90
Supply TA = − 40 to 25°C 17 23
All peripherals
IDD current in
off, VDD from MSI clock =65 kHz, TA = 85 °C 20 63 µA
(LP Sleep) Low-power
1.65 to 3.6 V fHCLK = 65 kHz,
sleep mode TA = 105 °C 23.5 69
Flash on
TA = 125 °C 32.5 90
TA = − 40 to 25°C 19.5 36
TA = 55 °C 20.5 64
MSI clock = 131 kHz,
fHCLK = 131 kHz, TA = 85 °C 22.5 66
Flash on
TA = 105 °C 26 72
TA = 125 °C 35 95
2. As the CPU is in Sleep mode, the difference between the current consumption with Flash on and off (nearly 12 µA) is the
same whatever the clock frequency.
DocID025938 Rev 6 61/127

100
Table 34. Typical and maximum current consumptions in Stop mode

TA = − 40 to 25°C 0.41 1
TA = 55°C 0.63 2.1
IDD (Stop) Supply current in Stop mode TA= 85°C 1.7 4.5 µA
TA = 105°C 4 9.6
TA = 125°C 11 24(2)
Figure 17. IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled
and running on LSE Low drive
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Figure 18. IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop mode with RTC disabled,
all clocks off
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62/127 DocID025938 Rev 6

Table 35. Typical and maximum current consumptions in Standby mode

TA = − 40 to 25°C 1.3 1.7

TA = 55 °C - 2.9
Independent watchdog
TA= 85 °C - 3.3
and LSI enabled
TA = 105 °C - 4.1
IDD Supply current in Standby TA = 125 °C - 8.5

µA
(Standby) mode TA = − 40 to 25°C 0.29 0.6
TA = 55 °C 0.32 0.9
Independent watchdog
TA = 85 °C 0.5 2.3
and LSI off
TA = 105 °C 0.94 3
TA = 125 °C 2.6 7
1. Guaranteed by characterization results at 125 °C, unless otherwise specified
Table 36. Average current consumption during Wakeup

Current
Symbol parameter System frequency consumption Unit
during wakeup
HSI 1
HSI/4 0,7
IDD (Wakeup from Supply current during Wakeup from
MSI clock = 4,2 MHz 0,7
Stop) Stop mode
MSI clock = 1,05 MHz 0,4
MSI clock = 65 KHz 0,1
mA
IDD (Reset) Reset pin pulled down - 0,21
IDD (Power-up) BOR on - 0,23
IDD (Wakeup from With Fast wakeup set MSI clock = 2,1 MHz 0,5
StandBy) With Fast wakeup disabled MSI clock = 2,1 MHz 0,12
DocID025938 Rev 6 63/127

100
On-chip peripheral current consumption

The current consumption of the on-chip peripherals is given in the following tables. The
MCU is placed under the following conditions:
 all I/O pins are in input mode with a static value at VDD or VSS (no load)
 all peripherals are disabled unless otherwise mentioned
 the given value is calculated by measuring the current consumption
– with all peripherals clocked off
– with only one peripheral clocked on
Table 37. Peripheral current consumption in Run or Sleep mode(1)

Typical consumption, VDD = 3.0 V, TA = 25 °C
Peripheral Range 1, Range 2, Range 3, Low-power Unit

VCORE=1.8 V VCORE=1.5 V VCORE=1.2 V sleep and
VOS[1:0] = 01 VOS[1:0] = 10 VOS[1:0] = 11 run
CRS 2.5 2 2 2
I2C1 11 9.5 7.5 9

I2C2 4 3.5 3 2.5
LPTIM1 10 8.5 6.5 8
LPUART1 8 6.5 5.5 6
SPI2 9 4.5 3.5 4
USART2 14.5 12 9.5 11
TIM2 10.5 8.5 7 9
µA/MHz
APB1 TIM6 3.5 3 2.5 2 (fHCLK)
WWDG 3 2 2 2
ADC1(2) 5.5 5 3.5 4
SPI1 4 3 3 2.5
USART1 14.5 11.5 9.5 12
TIM21 7.5 6 5 5.5 µA/MHz
APB2
TIM22 7 6 5 6 (fHCLK)
FIREWALL 1.5 1 1 0.5

DBGMCU 1.5 1 1 0.5
SYSCFG 2.5 2 2 1.5
64/127 DocID025938 Rev 6

Table 37. Peripheral current consumption in Run or Sleep mode(1) (continued)

Typical consumption, VDD = 3.0 V, TA = 25 °C
Peripheral Range 1, Range 2, Range 3, Low-power Unit

VCORE=1.8 V VCORE=1.5 V VCORE=1.2 V sleep and
VOS[1:0] = 01 VOS[1:0] = 10 VOS[1:0] = 11 run
GPIOA 3.5 3 2.5 2.5

Cortex- GPIOB 3.5 2.5 2 2.5 µA/MHz
M0+ core
(fHCLK)
I/O port GPIOC 8.5 6.5 5.5 7
GPIOD 1 0.5 0.5 0.5
CRC 1.5 1 1 1
µA/MHz
AHB FLASH 0(3) 0(3) 0(3) 0(3)
(fHCLK)
DMA1 10 8 6.5 8.5
µA/MHz
All enabled 279 221.5 219.5 215
(fHCLK)
µA/MHz
PWR 2.5 2 2 1
(fHCLK)
1. Data based on differential IDD measurement between all peripherals off an one peripheral with clock
enabled, in the following conditions: fHCLK = 32 MHz (range 1), fHCLK = 16 MHz (range 2), fHCLK = 4 MHz
(range 3), fHCLK = 64kHz (Low-power run/sleep), fAPB1 = fHCLK, fAPB2 = fHCLK, default prescaler value for
each peripheral. The CPU is in Sleep mode in both cases. No I/O pins toggling. Not tested in production.
2. HSI oscillator is off for this measure.
3. Current consumption is negligible and close to 0 µA.
Table 38. Peripheral current consumption in Stop and Standby mode(1)

Typical consumption, TA = 25 °C
Symbol Peripheral Unit
VDD=1.8 V VDD=3.0 V
IDD(PVD / BOR) - 0.7 1.2

IREFINT - - 1.4
(2)
- LSE Low drive 0,1 0,1
- LPTIM1, Input 100 Hz 0,01 0,01
µA
- LPTIM1, Input 1 MHz 6 6
- LPUART1 0,2 0,2
- RTC 0,3 0,48

1. LPTIM peripheral cannot operate in Standby mode.
DocID025938 Rev 6 65/127

100
2. LSE Low drive consumption is the difference between an external clock on OSC32_IN and a quartz between OSC32_IN
and OSC32_OUT.-
6.3.5 Wakeup time from low-power mode

The wakeup times given in the following table are measured with the MSI or HSI16 RC
oscillator. The clock source used to wake up the device depends on the current operating
mode:
 Sleep mode: the clock source is the clock that was set before entering Sleep mode
 Stop mode: the clock source is either the MSI oscillator in the range configured before
entering Stop mode, the HSI16 or HSI16/4.
 Standby mode: the clock source is the MSI oscillator running at 2.1 MHz
All timings are derived from tests performed under ambient temperature and VDD supply
voltage conditions summarized in Table 23.
Table 39. Low-power mode wakeup timings

Symbol Parameter Conditions Typ Max Unit
tWUSLEEP Wakeup from Sleep mode fHCLK = 32 MHz 7 8

fHCLK = 262 kHz Number
7 8
Wakeup from Low-power sleep mode, Flash memory enabled of clock
tWUSLEEP_LP cycles
fHCLK = 262 kHz fHCLK = 262 kHz
9 10
Flash memory switched OFF
fHCLK = fMSI = 4.2 MHz 5.0 8
Wakeup from Stop mode, regulator in Run
fHCLK = fHSI = 16 MHz 4.9 7
mode
fHCLK = fHSI/4 = 4 MHz 8.0 11
fHCLK = fMSI = 4.2 MHz
5.0 8
Voltage range 1
5.0 8
Voltage range 2
5.0 8
Voltage range 3
Wakeup from Stop mode, regulator in low-
tWUSTOP fHCLK = fMSI = 1.05 MHz 13 23 µs
power mode
fHCLK = fMSI = 524 kHz 28 38
fHCLK = MSI = 65 kHz 190 260
Wakeup from Stop mode, regulator in low-
power mode, code running from RAM
66/127 DocID025938 Rev 6

Table 39. Low-power mode wakeup timings (continued)

Wakeup from Standby mode, FWU bit = 1 fHCLK = MSI = 2.1 MHz 65 130 µs
tWUSTDBY
Wakeup from Standby mode, FWU bit = 0 fHCLK = MSI = 2.1 MHz 2.2 3 ms
6.3.6 External clock source characteristics

High-speed external user clock generated from an external source
In bypass mode the HSE oscillator is switched off and the input pin is a standard GPIO.The
external clock signal has to respect the I/O characteristics in Section 6.3.12. However, the
recommended clock input waveform is shown in Figure 19.
Table 40. High-speed external user clock characteristics(1)

CSS is on or
1 8 32 MHz
User external clock source PLL is used
fHSE_ext
frequency CSS is off, PLL
0 8 32 MHz
not used
VHSEH OSC_IN input pin high level voltage 0.7VDD - VDD
V
VHSEL OSC_IN input pin low level voltage VSS - 0.3VDD
tw(HSE)
OSC_IN high or low time 12 - -
tw(HSE)
- ns
tr(HSE)
OSC_IN rise or fall time - - 20
tf(HSE)
Cin(HSE) OSC_IN input capacitance - 2.6 - pF
DuCy(HSE) Duty cycle 45 - 55 %
IL OSC_IN Input leakage current VSS VIN VDD - - ±1 µA
DocID025938 Rev 6 67/127

100
Figure 19. High-speed external clock source AC timing diagram
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Low-speed external user clock generated from an external source

The characteristics given in the following table result from tests performed using a low-
speed external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 23.
Table 41. Low-speed external user clock characteristics(1)

User external clock source

fLSE_ext 1 32.768 1000 kHz
frequency
OSC32_IN input pin high level
VLSEH 0.7VDD - VDD
voltage
V
OSC32_IN input pin low level
VLSEL - VSS - 0.3VDD
voltage
tw(LSE)
OSC32_IN high or low time 465 - -
tw(LSE)
ns
tr(LSE)
OSC32_IN rise or fall time - - 10
tf(LSE)
CIN(LSE) OSC32_IN input capacitance - - 0.6 - pF
DuCy(LSE) Duty cycle - 45 - 55 %
IL OSC32_IN Input leakage current VSS VIN VDD - - ±1 µA
1. Guaranteed by design, not tested in production
68/127 DocID025938 Rev 6

Figure 20. Low-speed external clock source AC timing diagram
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High-speed external clock generated from a crystal/ceramic resonator

The high-speed external (HSE) clock can be supplied with a 1 to 25 MHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on
characterization results obtained with typical external components specified in Table 42. In
the application, the resonator and the load capacitors have to be placed as close as
possible to the oscillator pins in order to minimize output distortion and startup stabilization
time. Refer to the crystal resonator manufacturer for more details on the resonator
characteristics (frequency, package, accuracy).
Table 42. HSE oscillator characteristics(1)

fOSC_IN Oscillator frequency - 1 25 MHz

RF Feedback resistor - - 200 - k
Maximum critical crystal µA
Gm Startup - - 700
transconductance /V
tSU(HSE)
(2) Startup time VDD is stabilized - 2 - ms
2. Guaranteed by characterization results. tSU(HSE) is the startup time measured from the moment it is
enabled (by software) to a stabilized 8 MHz oscillation is reached. This value is measured for a standard
crystal resonator and it can vary significantly with the crystal manufacturer.
For CL1 and CL2, it is recommended to use high-quality external ceramic capacitors in the
5 pF to 25 pF range (typ.), designed for high-frequency applications, and selected to match
the requirements of the crystal or resonator (see Figure 21). CL1 and CL2 are usually the
same size. The crystal manufacturer typically specifies a load capacitance which is the
series combination of CL1 and CL2. PCB and MCU pin capacitance must be included (10 pF
can be used as a rough estimate of the combined pin and board capacitance) when sizing
CL1 and CL2. Refer to the application note AN2867 “Oscillator design guide for ST
microcontrollers” available from the ST website www.st.com.
DocID025938 Rev 6 69/127

100
Figure 21. HSE oscillator circuit diagram
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Low-speed external clock generated from a crystal/ceramic resonator

The low-speed external (LSE) clock can be supplied with a 32.768 kHz crystal/ceramic
resonator oscillator. All the information given in this paragraph are based on
characterization results obtained with typical external components specified in Table 43. In
the application, the resonator and the load capacitors have to be placed as close as
possible to the oscillator pins in order to minimize output distortion and startup stabilization
time. Refer to the crystal resonator manufacturer for more details on the resonator
characteristics (frequency, package, accuracy).
Table 43. LSE oscillator characteristics(1)

Symbol Parameter Conditions(2) Min(2) Typ Max Unit
fLSE LSE oscillator frequency - 32.768 - kHz

LSEDRV[1:0]=00
- - 0.5
lower driving capability
LSEDRV[1:0]= 01
- - 0.75
Maximum critical crystal medium low driving capability
Gm µA/V
transconductance LSEDRV[1:0] = 10
- - 1.7
medium high driving capability
LSEDRV[1:0]=11
- - 2.7
higher driving capability
tSU(LSE)(3) Startup time VDD is stabilized - 2 - s
2. Refer to the note and caution paragraphs below the table, and to the application note AN2867 “Oscillator design guide for
ST microcontrollers”.
3. Guaranteed by characterization results. tSU(LSE) is the startup time measured from the moment it is enabled (by software)
to a stabilized 32.768 kHz oscillation is reached. This value is measured for a standard crystal resonator and it can vary
significantly with the crystal manufacturer. To increase speed, address a lower-drive quartz with a high- driver mode.
Note: For information on selecting the crystal, refer to the application note AN2867 “Oscillator
design guide for ST microcontrollers” available from the ST website www.st.com.
70/127 DocID025938 Rev 6

Figure 22. Typical application with a 32.768 kHz crystal
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Note: An external resistor is not required between OSC32_IN and OSC32_OUT and it is forbidden
to add one.
DocID025938 Rev 6 71/127

100
6.3.7 Internal clock source characteristics

The parameters given in Table 44 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 23.
High-speed internal 16 MHz (HSI16) RC oscillator
Table 44. 16 MHz HSI16 oscillator characteristics

fHSI16 Frequency VDD = 3.0 V - 16 - MHz
HSI16 user- Trimming code is not a multiple of 16 - 0.4 0.7 %

(1)(2)
TRIM trimmed resolution Trimming code is a multiple of 16 - - 1.5 %
VDDA = 3.0 V, TA = 25 °C -1(3) - 1(3) %
VDDA = 3.0 V, TA = 0 to 55 °C -1.5 - 1.5 %
Accuracy of the VDDA = 3.0 V, TA = -10 to 70 °C -2 - 2 %

ACCHSI16
(2) factory-calibrated VDDA = 3.0 V, TA = -10 to 85 °C -2.5 - 2 %
HSI16 oscillator
VDDA = 3.0 V, TA = -10 to 105 °C -4 - 2 %
VDDA = 1.65 V to 3.6 V
-5.45 - 3.25 %
TA = − 40 to 125 °C
HSI16 oscillator
tSU(HSI16)(2) - - 3.7 6 µs
startup time
HSI16 oscillator
IDD(HSI16)(2) - - 100 140 µA
power consumption
1. The trimming step differs depending on the trimming code. It is usually negative on the codes which are
multiples of 16 (0x00, 0x10, 0x20, 0x30...0xE0).
Figure 23. HSI16 minimum and maximum value versus temperature

9PLQ

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72/127 DocID025938 Rev 6

Low-speed internal (LSI) RC oscillator
Table 45. LSI oscillator characteristics

Symbol Parameter Min Typ Max Unit
fLSI(1) LSI frequency 26 38 56 kHz

LSI oscillator frequency drift
DLSI(2) -10 - 4 %
0°C  TA  85°C
tsu(LSI)(3) LSI oscillator startup time - - 200 µs
(3)
IDD(LSI) LSI oscillator power consumption - 400 510 nA
2. This is a deviation for an individual part, once the initial frequency has been measured.
Multi-speed internal (MSI) RC oscillator
Table 46. MSI oscillator characteristics

Symbol Parameter Condition Typ Max Unit
MSI range 0 65.5 -

MSI range 1 131 -
kHz
MSI range 2 262 -
Frequency after factory calibration, done at
fMSI MSI range 3 524 -
VDD= 3.3 V and TA = 25 °C
MSI range 4 1.05 -
MSI range 5 2.1 - MHz
MSI range 6 4.2 -
ACCMSI Frequency error after factory calibration - 0.5 - %
MSI oscillator frequency drift
- 3 -
0 °C  TA  85 °C
MSI range 0 − 8.9 +7.0
MSI range 1 − 7.1 +5.0
DTEMP(MSI)(1) MSI range 2 − 6.4 +4.0 %

MSI range 3 − 6.2 +3.0
VDD = 3.3 V, − 40 °C  TA  110 °C
MSI range 4 − 5.2 +3.0
MSI range 5 − 4.8 +2.0
MSI range 6 − 4.7 +2.0
DVOLT(MSI)(1) - - 2.5 %/V
1.65 V  VDD  3.6 V, TA = 25 °C
DocID025938 Rev 6 73/127

100
Table 46. MSI oscillator characteristics (continued)

Symbol Parameter Condition Typ Max Unit
MSI range 0 0.75 -

MSI range 1 1 -
MSI range 2 1.5 -
IDD(MSI)(2) MSI oscillator power consumption MSI range 3 2.5 - µA
MSI range 4 4.5 -
MSI range 5 8 -
MSI range 6 15 -
MSI range 0 30 -
MSI range 1 20 -
MSI range 2 15 -
MSI range 3 10 -
MSI range 4 6 -
tSU(MSI) MSI oscillator startup time µs
MSI range 5 5 -
MSI range 6,
Voltage range 1 3.5 -
and 2
MSI range 6,
5 -
Voltage range 3
MSI range 0 - 40
MSI range 1 - 20
MSI range 2 - 10
MSI range 3 - 4
MSI range 4 - 2.5
tSTAB(MSI)(2) MSI oscillator stabilization time µs
MSI range 5 - 2
MSI range 6,
Voltage range 1 - 2
and 2
MSI range 3,
- 3
Voltage range 3
Any range to
- 4
range 5
fOVER(MSI) MSI oscillator frequency overshoot MHz
Any range to
- 6
range 6
1. This is a deviation for an individual part, once the initial frequency has been measured.
74/127 DocID025938 Rev 6

6.3.8 PLL characteristics

The parameters given in Table 47 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 23.
Table 47. PLL characteristics

Value
Symbol Parameter Unit
Min Typ Max(1)
PLL input clock(2) 2 - 24 MHz

fPLL_IN
PLL input clock duty cycle 45 - 55 %
fPLL_OUT PLL output clock 2 - 32 MHz
PLL input = 16 MHz
tLOCK - 115 160 µs
PLL VCO = 96 MHz
Jitter Cycle-to-cycle jitter -  600 ps
IDDA(PLL) Current consumption on VDDA - 220 450
µA
IDD(PLL) Current consumption on VDD - 120 150
2. Take care of using the appropriate multiplier factors so as to have PLL input clock values compatible with
the range defined by fPLL_OUT.
6.3.9 Memory characteristics

RAM memory
Table 48. RAM and hardware registers

VRM Data retention mode(1) STOP mode (or RESET) 1.65 - - V

1. Minimum supply voltage without losing data stored in RAM (in Stop mode or under Reset) or in hardware
registers (only in Stop mode).
Flash memory and data EEPROM
Table 49. Flash memory and data EEPROM characteristics

Symbol Parameter Conditions Min Typ Max(1) Unit
Operating voltage
VDD - 1.65 - 3.6 V
Read / Write / Erase
Programming time for Erasing - 3.28 3.94

tprog ms
word or half-page Programming - 3.28 3.94
DocID025938 Rev 6 75/127

100
Table 49. Flash memory and data EEPROM characteristics

Average current during

the whole programming / - 500 700 µA
erase operation
IDD Maximum current (peak) TA25 °C, VDD = 3.6 V
during the whole
- 1.5 2.5 mA
programming / erase
operation
Table 50. Flash memory and data EEPROM endurance and retention
Value
Symbol Parameter Conditions Unit
Min(1)
Cycling (erase / write)

10
Program memory
TA-40°C to 105 °C
100
EEPROM data memory
NCYC(2) kcycles
0.2
Program memory
TA-40°C to 125 °C
2
EEPROM data memory
Data retention (program memory) after
30
10 kcycles at TA = 85 °C
TRET = +85 °C
Data retention (EEPROM data memory)
30
after 100 kcycles at TA = 85 °C
10 kcycles at TA = 105 °C
tRET(2) TRET = +105 °C years
10
200 cycles at TA = 125 °C
TRET = +125 °C
2. Characterization is done according to JEDEC JESD22-A117.
6.3.10 EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.
76/127 DocID025938 Rev 6

Functional EMS (electromagnetic susceptibility)

While a simple application is executed on the device (toggling 2 LEDs through I/O ports).
the device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
 Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
 FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and
VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 51. They are based on the EMS levels and classes
defined in application note AN1709.
Table 51. EMS characteristics

Level/
Symbol Parameter Conditions
Class
VDD 3.3 V, LQFP64, TA +25 °C, 

Voltage limits to be applied on any I/O pin to
VFESD fHCLK 32 MHz 3B
induce a functional disturbance
conforms to IEC 61000-4-2
Fast transient voltage burst limits to be VDD3.3 V, LQFP64, TA +25 °C, 
VEFTB applied through 100 pF on VDD and VSS fHCLK 32 MHz 4A
pins to induce a functional disturbance conforms to IEC 61000-4-4
Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
 Corrupted program counter
 Unexpected reset
 Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
DocID025938 Rev 6 77/127

100
Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 52. EMI characteristics

Max vs. fosc/fCPU
Monitored
Symbol Parameter Conditions Unit
frequency band 8 MHz/ 8 MHz/ 8 MHz/
4 MHz 16 MHz 32 MHz
0.1 to 30 MHz -21 -15 -12

VDD 3.6 V,
30 to 130 MHz -14 -12 -1 dBµV
SEMI Peak level TA 25 °C,
compliant with IEC 130 MHz to 1GHz -10 -11 -7
61967-2
EMI Level 1 1 1 -
78/127 DocID025938 Rev 6

6.3.11 Electrical sensitivity characteristics

Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
Table 53. ESD absolute maximum ratings

Maximum
Symbol Ratings Conditions Class Unit
value(1)
TA +25 °C,
Electrostatic discharge
VESD(HBM) conforming to 2 2000
voltage (human body model)
ANSI/JEDEC JS-001
V
Electrostatic discharge TA +25 °C,
VESD(CDM) voltage (charge device conforming to C4 500
model) ANSI/ESD STM5.3.1.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
 A supply overvoltage is applied to each power supply pin
 A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 54. Electrical sensitivities

Symbol Parameter Conditions Class
LU Static latch-up class TA +125 °C conforming to JESD78A II level A
DocID025938 Rev 6 79/127

100
6.3.12 I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard pins) should be avoided during normal product operation.
However, in order to give an indication of the robustness of the microcontroller in cases
when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into
the I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (higher
than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out
of –5 µA/+0 µA range), or other functional failure (for example reset occurrence oscillator
frequency deviation).
The test results are given in the Table 55.
Table 55. I/O current injection susceptibility

Functional susceptibility
Symbol Description Unit
Negative Positive
injection injection
Injected current on BOOT0 -0 NA

Injected current on PA0, PA4, PA5, PA11,
-5 0
IINJ PA12, PC15, PH0 and PH1 mA
Injected current on any other FT, FTf pins -5 (1) NA
Injected current on any other pins -5 (1) +5
1. It is recommended to add a Schottky diode (pin to ground) to analog pins which may potentially inject
negative currents.
80/127 DocID025938 Rev 6

6.3.13 I/O port characteristics

General input/output characteristics
Unless otherwise specified, the parameters given in Table 56 are derived from tests
performed under the conditions summarized in Table 23. All I/Os are CMOS and TTL
compliant.
Table 56. I/O static characteristics
TC, FT, FTf, RST

- - 0.3VDD
VIL Input low level voltage I/Os
BOOT0 pin - - 0.14VDD(1)
V
VIH Input high level voltage All I/Os 0.7 VDD - -
I/O Schmitt trigger voltage hysteresis Standard I/Os - 10% VDD(3) -

Vhys (2)
BOOT0 pin - 0.01 -
VSS VIN VDD
All I/Os except for
- - ±50
PA11, PA12, BOOT0
and FTf I/Os
nA
VSS VIN VDD,
- - -50/+250
PA11 and PA12 I/Os
VSS VIN VDD
- - ±100
FTf I/Os
Ilkg Input leakage current (4) VDDVIN 5 V
All I/Os except for - - 200
PA11, PA12, BOOT0
and FTf I/Os nA
VDDVIN 5 V
- - 500
FTf I/Os
VDDVIN 5 V
PA11, PA12 and - - 10 µA
BOOT0
RPU Weak pull-up equivalent resistor(5) VIN VSS 30 45 60 k
RPD (5)
Weak pull-down equivalent resistor VIN VDD 30 45 60 k
CIO I/O pin capacitance - - 5 - pF
1. Guaranteed by characterization.
2. Hysteresis voltage between Schmitt trigger switching levels. Guaranteed by characterization results.
3. With a minimum of 200 mV. Guaranteed by characterization results.
4. The max. value may be exceeded if negative current is injected on adjacent pins.
5. Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This
MOS/NMOS contribution to the series resistance is minimum (~10% order).
DocID025938 Rev 6 81/127

100
Figure 24. VIH/VIL versus VDD (CMOS I/Os)
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Output driving current

The GPIOs (general purpose input/outputs) can sink or source up to ±8 mA, and sink or
source up to ±15 mA with the non-standard VOL/VOH specifications given in Table 57.
In the user application, the number of I/O pins which can drive current must be limited to
respect the absolute maximum rating specified in Section 6.2:
 The sum of the currents sourced by all the I/Os on VDD, plus the maximum Run
consumption of the MCU sourced on VDD, cannot exceed the absolute maximum rating
IVDD(Σ) (see Table 21).
 The sum of the currents sunk by all the I/Os on VSS plus the maximum Run
consumption of the MCU sunk on VSS cannot exceed the absolute maximum rating
IVSS(Σ) (see Table 21).
82/127 DocID025938 Rev 6

Output voltage levels

performed under ambient temperature and VDD supply voltage conditions summarized in
Table 23. All I/Os are CMOS and TTL compliant.
Table 57. Output voltage characteristics

Output low level voltage for an I/O

VOL(1) CMOS port(2), - 0.4
pin
IIO = +8 mA
Output high level voltage for an I/O 2.7 V VDD  3.6 V
VOH(3) VDD-0.4 -
pin
TTL port(2),
(1) Output low level voltage for an I/O
VOL IIO =+ 8 mA - 0.4
pin
2.7 V VDD  3.6 V
TTL port(2),
(3)(4) Output high level voltage for an I/O
VOH IIO = -6 mA 2.4 -
pin
2.7 V VDD  3.6 V
Output low level voltage for an I/O IIO = +15 mA
VOL(1)(4) - 1.3 V
pin 2.7 V VDD  3.6 V
Output high level voltage for an I/O IIO = -15 mA
VOH(3)(4) VDD-1.3 -
pin 2.7 V VDD  3.6 V
Output low level voltage for an I/O IIO = +4 mA
VOL(1)(4) - 0.45
pin 1.65 V VDD < 3.6 V
Output high level voltage for an I/O IIO = -4 mA
VOH(3)(4) V -0.45 -
pin 1.65 V VDD  3.6 V DD
IIO = 20 mA
- 0.4
Output low level voltage for an FTf 2.7 V VDD  3.6 V
VOLFM+(1)(4)
I/O pin in Fm+ mode IIO = 10 mA
- 0.4
1.65 V VDD  3.6 V
1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 21.
The sum of the currents sunk by all the I/Os (I/O ports and control pins) must always be respected and
must not exceed ΣIIO(PIN).
2. TTL and CMOS outputs are compatible with JEDEC standards JESD36 and JESD52.
3. The IIO current sourced by the device must always respect the absolute maximum rating specified in
Table 21. The sum of the currents sourced by all the I/Os (I/O ports and control pins) must always be
respected and must not exceed ΣIIO(PIN).
DocID025938 Rev 6 83/127

100
Input/output AC characteristics
The definition and values of input/output AC characteristics are given in Figure 26 and
Table 58, respectively.
Table 23.
Table 58. I/O AC characteristics(1)

OSPEEDRx[1:0]
Symbol Parameter Conditions Min Max(2) Unit
bit value(1)
CL = 50 pF, VDD = 2.7 V to 3.6 V - 400

fmax(IO)out Maximum frequency(3) kHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 100
00
tf(IO)out CL = 50 pF, VDD = 2.7 V to 3.6 V - 125
Output rise and fall time ns
tr(IO)out CL = 50 pF, VDD = 1.65 V to 2.7 V - 320
CL = 50 pF, VDD = 2.7 V to 3.6 V - 2
fmax(IO)out Maximum frequency(3) MHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 0.6
01
CL = 50 pF, VDD = 2.7 V to 3.6 V - 10
Fmax(IO)out Maximum frequency(3) MHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 2
10
CL = 30 pF, VDD = 2.7 V to 3.6 V - 35
Fmax(IO)out Maximum frequency(3) MHz
CL = 50 pF, VDD = 1.65 V to 2.7 V - 10
11
fmax(IO)out Maximum frequency(3) - 1 MHz
tf(IO)out Output fall time CL = 50 pF, VDD = 2.5 V to 3.6 V - 10
ns
Fm+ tr(IO)out Output rise time - 30
configuration(4) fmax(IO)out Maximum frequency(3) - 350 KHz
tf(IO)out Output fall time CL = 50 pF, VDD = 1.65 V to 3.6 V - 15
ns
tr(IO)out Output rise time - 60
Pulse width of external
- tEXTIpw signals detected by the - 8 - ns
EXTI controller
1. The I/O speed is configured using the OSPEEDRx[1:0] bits. Refer to the line reference manual for a description of GPIO Port
configuration register.
3. The maximum frequency is defined in Figure 26.
4. When Fm+ configuration is set, the I/O speed control is bypassed. Refer to the line reference manual for a detailed
description of Fm+ I/O configuration.
84/127 DocID025938 Rev 6

Figure 26. I/O AC characteristics definition

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6.3.14 NRST pin characteristics

The NRST pin input driver uses CMOS technology. It is connected to a permanent pull-up
resistor, RPU , except when it is internally driven low (see Table 59).
Table 23.
Table 59. NRST pin characteristics

VIL(NRST) (1) NRST input low level voltage - VSS - 0.8

VIH(NRST)(1) NRST input high level voltage - 1.4 - VDD
IOL = 2 mA V
- -
NRST output low level 2.7 V < VDD < 3.6 V
VOL(NRST)(1) 0.4
voltage IOL = 1.5 mA
- -
1.65 V < VDD < 2.7 V
NRST Schmitt trigger voltage
Vhys(NRST)(1) - - 10%VDD(2) - mV
hysteresis
Weak pull-up equivalent
RPU VIN VSS 30 45 60 k
resistor(3)
VF(NRST)(1) NRST input filtered pulse - - - 50 ns
VNF(NRST) (1) NRST input not filtered pulse - 350 - - ns
2. 200 mV minimum value
3. The pull-up is designed with a true resistance in series with a switchable PMOS. This PMOS contribution to
the series resistance is around 10%.
DocID025938 Rev 6 85/127

100
Figure 27. Recommended NRST pin protection
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1. The reset network protects the device against parasitic resets.

2. The user must ensure that the level on the NRST pin can go below the VIL(NRST) max level specified in
Table 59. Otherwise the reset will not be taken into account by the device.
6.3.15 12-bit ADC characteristics

performed under ambient temperature, fPCLK frequency and VDDA supply voltage conditions
summarized in Table 23: General operating conditions.
Note: It is recommended to perform a calibration after each power-up.
Table 60. ADC characteristics

Analog supply voltage for Fast channel 1.65 - 3.6

VDDA V
ADC on Standard channel 1.75(1) - 3.6
VREF+ Positive reference voltage - 1.65 VDDA V
Current consumption of the 1.14 Msps - 200 -

ADC on VDDA and VREF+ 10 ksps - 40 -
IDDA (ADC) µA
Current consumption of the 1.14 Msps - 70 -
ADC on VDD(2) 10 ksps - 1 -
Voltage scaling Range 1 0.14 - 16
fADC ADC clock frequency Voltage scaling Range 2 0.14 - 8 MHz
Voltage scaling Range 3 0.14 - 4
fS(3) Sampling rate 12-bit resolution 0.01 - 1.14 MHz
fADC = 16 MHz,
- - 941 kHz
fTRIG(3) External trigger frequency 12-bit resolution
- - - 17 1/fADC
VAIN Conversion voltage range - 0 - VREF+ V
See Equation 1 and
RAIN(3) External input impedance - - 50 k
Table 61 for details
RADC(3)(4) Sampling switch resistance - - - 1 k
86/127 DocID025938 Rev 6

Table 60. ADC characteristics (continued)

Internal sample and hold

CADC(3) - - - 8 pF
capacitor
fADC = 16 MHz 5.2 µs
tCAL(3)(5) Calibration time
- 83 1/fADC
1.5 ADC 1.5 ADC
ADC clock = HSI16 cycles + 2 - cycles + 3 -
fPCLK cycles fPCLK cycles
ADC_DR register write
WLATENCY(6) fPCLK
latency ADC clock = PCLK/2 - 4.5 -
cycle
fPCLK
ADC clock = PCLK/4 - 8.5 -
cycle
fADC = fPCLK/2 = 16 MHz 0.266 µs
fADC = fPCLK/2 8.5 1/fPCLK
tlatr(3) Trigger conversion latency fADC = fPCLK/4 = 8 MHz 0.516 µs
fADC = fPCLK/4 16.5 1/fPCLK
fADC = fHSI16 = 16 MHz 0.252 - 0.260 µs
ADC jitter on trigger
JitterADC fADC = fHSI16 - 1 - 1/fHSI16
conversion
fADC = 16 MHz 0.093 - 10.03 µs
tS(3) Sampling time
- 1.5 - 160.5 1/fADC
tUP_LDO(3)(5) Internal LDO power-up time - - - 10 µs
tSTAB(3)(5) ADC stabilization time - 14 1/fADC
fADC = 16 MHz,
0.875 - 10.81 µs
Total conversion time 12-bit resolution
tConV(3)
(including sampling time) 14 to 173 (tS for sampling +12.5
12-bit resolution 1/fADC
for successive approximation)
1. VDDA minimum value can be decreased in specific temperature conditions. Refer to Table 61: RAIN max for fADC = 16 MHz.
2. A current consumption proportional to the APB clock frequency has to be added (see Table 37: Peripheral current
consumption in Run or Sleep mode).
4. Standard channels have an extra protection resistance which depends on supply voltage. Refer to Table 61: RAIN max for
fADC = 16 MHz.
5. This parameter only includes the ADC timing. It does not take into account register access latency.
6. This parameter specifies the latency to transfer the conversion result into the ADC_DR register. EOC bit is set to indicate the
conversion is complete and has the same latency.
DocID025938 Rev 6 87/127

100
Equation 1: RAIN max formula
TS
R AIN  -------------------------------------------------------------
N+2
- – R ADC
f ADC  C ADC  ln  2 
The simplified formula above (Equation 1) is used to determine the maximum external
impedance allowed for an error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 61. RAIN max for fADC = 16 MHz(1)

RAIN max for standard channels (k)
RAIN max for
Ts tS
fast channels VDD > 1.65 V VDD > 1.65 V
(cycles) (µs) VDD > VDD > VDD > VDD > VDD >
(k) and and
2.7 V 2.4 V 2.0 V 1.8 V 1.75 V
TA > 10 °C TA > 25 °C
1.5 0.09 0.5 < 0.1 NA NA NA NA NA NA

3.5 0.22 1 0.2 < 0.1 NA NA NA NA NA
7.5 0.47 2.5 1.7 1.5 < 0.1 NA NA NA NA
12.5 0.78 4 3.2 3 1 NA NA NA NA
19.5 1.22 6.5 5.7 5.5 3.5 NA NA NA < 0.1
39.5 2.47 13 12.2 12 10 NA NA NA 5
79.5 4.97 27 26.2 26 24 < 0.1 NA NA 19
160.5 10.03 50 49.2 49 47 32 < 0.1 < 0.1 42
Table 62. ADC accuracy(1)(2)(3)

ET Total unadjusted error - 2 4

EO Offset error - 1 2.5
EG Gain error - 1 2 LSB
EL Integral linearity error - 1.5 2.5
ED Differential linearity error - 1 1.5
Effective number of bits 10.2 11
1.65 V < VDDA = VREF+ < 3.6 V,
ENOB Effective number of bits (16-bit mode range 1/2/3 bits
11.3 12.1 -
oversampling with ratio =256)(4)
SINAD Signal-to-noise distortion 63 69 -
Signal-to-noise ratio 63 69 -
SNR Signal-to-noise ratio (16-bit mode dB
70 76 -
oversampling with ratio =256)(4)
THD Total harmonic distortion - -85 -73
88/127 DocID025938 Rev 6

Table 62. ADC accuracy(1)(2)(3)

ET Total unadjusted error - 2 5

EO Offset error - 1 2.5
EG Gain error - 1 2 LSB
EL Integral linearity error - 1.5 3
1.65 V < VREF+ < VDDA < 3.6 V,
ED Differential linearity error - 1 2
range 1/2/3
ENOB Effective number of bits 10.0 11.0 - bits
SINAD Signal-to-noise distortion 62 69 -
SNR Signal-to-noise ratio 61 69 - dB
THD Total harmonic distortion - -85 -65
1. ADC DC accuracy values are measured after internal calibration.
2. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-robust) analog input
pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog
input. It is recommended to add a Schottky diode (pin to ground) to standard analog pins which may potentially inject
negative current. 
Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 6.3.12 does not affect the ADC
accuracy.
3. Better performance may be achieved in restricted VDDA, frequency and temperature ranges.
4. This number is obtained by the test board without additional noise, resulting in non-optimized value for oversampling mode.
Figure 28. ADC accuracy characteristics
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Figure 29. Typical connection diagram using the ADC
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1. Refer to Table 60: ADC characteristics for the values of RAIN, RADC and CADC.
2. Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
pad capacitance (roughly 7 pF). A high Cparasitic value will downgrade conversion accuracy. To remedy
this, fADC should be reduced.
General PCB design guidelines

Power supply decoupling should be performed as shown in Figure 30 or Figure 31,
depending on whether VREF+ is connected to VDDA or not. The 10 nF capacitors should be
ceramic (good quality). They should be placed as close as possible to the chip.
Figure 30. Power supply and reference decoupling (VREF+ not connected to VDDA)
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90/127 DocID025938 Rev 6

Figure 31. Power supply and reference decoupling (VREF+ connected to VDDA)
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6.3.16 Temperature sensor characteristics
Table 63. Temperature sensor calibration values


TS_CAL1 0x1FF8 007A - 0x1FF8 007B
temperature of 30 °C, VDDA= 3 V
TS_CAL2 0x1FF8 007E - 0x1FF8 007F
temperature of 130 °C, VDDA= 3 V
Table 64. Temperature sensor characteristics

Symbol Parameter Min Typ Max Unit
TL(1) VSENSE linearity with temperature - 1 2 °C

(1)
Avg_Slope Average slope 1.48 1.61 1.75 mV/°C
V130 Voltage at 130°C ±5°C(2) 640 670 700 mV
IDDA(TEMP)(3) Current consumption - 3.4 6 µA
tSTART(3) Startup time - - 10
µs
TS_temp(4)(3) ADC sampling time when reading the temperature 10 - -
2. Measured at VDD = 3 V ±10 mV. V130 ADC conversion result is stored in the TS_CAL2 byte.
4. Shortest sampling time can be determined in the application by multiple iterations.
DocID025938 Rev 6 91/127

100
6.3.17 Comparators
Table 65. Comparator 1 characteristics

Symbol Parameter Conditions Min(1) Typ Max(1) Unit
VDDA Analog supply voltage - 1.65 3.6 V

R400K R400K value - - 400 -
k
R10K R10K value - - 10 -
Comparator 1 input voltage
VIN - 0.6 - VDDA V
range
tSTART Comparator startup time - - 7 10
µs
td Propagation delay(2) - - 3 10
Voffset Comparator offset - - 3 10 mV
Comparator offset variation in VDDA 3.6 V, VIN+ 0 V,
dVoffset/dt 0 1.5 10 mV/1000 h
worst voltage stress conditions VIN- VREFINT, TA = 25 C
ICOMP1 Current consumption(3) - - 160 260 nA
1. Guaranteed by characterization.
2. The delay is characterized for 100 mV input step with 10 mV overdrive on the inverting input, the non-inverting input set to
the reference.
3. Comparator consumption only. Internal reference voltage not included.
Table 66. Comparator 2 characteristics

VDDA Analog supply voltage - 1.65 - 3.6 V

VIN Comparator 2 input voltage range - 0 - VDDA V
Fast mode - 15 20
tSTART Comparator startup time
Slow mode - 20 25
1.65 V  VDDA  2.7 V - 1.8 3.5
td slow Propagation delay(2) in slow mode µs
2.7 V  VDDA  3.6 V - 2.5 6
1.65 V  VDDA  2.7 V - 0.8 2
td fast Propagation delay(2) in fast mode
2.7 V  VDDA  3.6 V - 1.2 4
Voffset Comparator offset error - 4 20 mV
VDDA 3.3V, TA = 0 to 50 C, 
V- = VREFINT,
dThreshold/ Threshold voltage temperature ppm
3/4 VREFINT, - 15 30
dt coefficient /°C
1/2 VREFINT,
1/4 VREFINT.
Fast mode - 3.5 5
ICOMP2 Current consumption(3) µA
Slow mode - 0.5 2
2. The delay is characterized for 100 mV input step with 10 mV overdrive on the inverting input, the non-inverting input set to
the reference.
3. Comparator consumption only. Internal reference voltage (required for comparator operation) is not included.
92/127 DocID025938 Rev 6

6.3.18 Timer characteristics

TIM timer characteristics
The parameters given in the Table 67 are guaranteed by design.
Refer to Section 6.3.13: I/O port characteristics for details on the input/output alternate
function characteristics (output compare, input capture, external clock, PWM output).
Table 67. TIMx characteristics(1)

1 - tTIMxCLK
tres(TIM) Timer resolution time
fTIMxCLK = 32 MHz 31.25 - ns
Timer external clock frequency on CH1 0 fTIMxCLK/2 MHz

fEXT
to CH4 fTIMxCLK = 32 MHz 0 16 MHz
ResTIM Timer resolution - 16 bit
16-bit counter clock period when - 1 65536 tTIMxCLK
tCOUNTER internal clock is selected (timer’s
prescaler disabled) fTIMxCLK = 32 MHz 0.0312 2048 µs
- - 65536 × 65536 tTIMxCLK

tMAX_COUNT Maximum possible count
fTIMxCLK = 32 MHz - 134.2 s
1. TIMx is used as a general term to refer to the TIM2, TIM6, TIM21, and TIM22 timers.
6.3.19 Communications interfaces

I2C interface characteristics
The I2C interface meets the timings requirements of the I2C-bus specification and user
manual rev. 03 for:
 Standard-mode (Sm) : with a bit rate up to 100 kbit/s
 Fast-mode (Fm) : with a bit rate up to 400 kbit/s
 Fast-mode Plus (Fm+) : with a bit rate up to 1 Mbit/s.
The I2C timing requirements are guaranteed by design when the I2C peripheral is properly
configured (refer to the reference manual for details). The SDA and SCL I/O requirements
are met with the following restrictions: the SDA and SCL I/O pins are not "true" open-drain.
When configured as open-drain, the PMOS connected between the I/O pin and VDDIOx is
disabled, but is still present. Only FTf I/O pins support Fm+ low level output current
maximum requirement (refer to Section 6.3.13: I/O port characteristics for the I2C I/Os
characteristics).
All I2C SDA and SCL I/Os embed an analog filter (see Table 68 for the analog filter
characteristics).
DocID025938 Rev 6 93/127

100
The analog spike filter is compliant with I2C timings requirements only for the following
voltage ranges:
 Fast mode Plus: 2.7 V VDD 3.6 V and voltage scaling Range 1
 Fast mode:
– 2 V  VDD  3.6 V and voltage scaling Range 1 or Range 2.
– VDD < 2 V, voltage scaling Range 1 or Range 2, Cload < 200 pF.
In other ranges, the analog filter should be disabled. The digital filter can be used instead.
Note: In Standard mode, no spike filter is required.
Table 68. I2C analog filter characteristics(1)

Range 1 100(3)
Maximum pulse width of spikes that
tAF Range 2 50(2) - ns
are suppressed by the analog filter
Range 3 -
2. Spikes with widths below tAF(min) are filtered.
3. Spikes with widths above tAF(max) are not filtered
USART/LPUART characteristics
The parameters given in the following table are guaranteed by design.
Table 69. USART/LPUART characteristics

Stop mode with main regulator in

- 8.7
Run mode, Range 2 or 3
Wakeup time needed to Stop mode with main regulator in

- 8.1
calculate the maximum Run mode, Range 1
tWUUSART USART/LPUART baudrate µs
allowing to wake up from
Stop mode Stop mode with main regulator in
- 12
low-power mode, Range 2 or 3
Stop mode with main regulator in

- 11.4
low-power mode, Range 1
94/127 DocID025938 Rev 6

SPI characteristics
Unless otherwise specified, the parameters given in the following tables are derived from
tests performed under ambient temperature, fPCLKx frequency and VDD supply voltage
conditions summarized in Table 23.
Refer to Section 6.3.12: I/O current injection characteristics for more details on the
input/output alternate function characteristics (NSS, SCK, MOSI, MISO).
Table 70. SPI characteristics in voltage Range 1 (1)

Master mode 16
Slave mode - -
16
receiver
fSCK Slave mode

SPI clock frequency Transmitter - - 12(2) MHz
1/tc(SCK)
1.71<VDD<3.6V
Slave mode
Transmitter - - 16(2)
2.7<VDD<3.6V
Duty cycle of SPI clock
Duty(SCK) Slave mode 30 50 70 %
frequency
Slave mode, SPI
tsu(NSS) NSS setup time 4*Tpclk - -
presc = 2
Slave mode, SPI
th(NSS) NSS hold time 2*Tpclk - -
presc = 2
tw(SCKH) Tpclk+
SCK high and low time Master mode Tpclk-2 Tpclk
tw(SCKL) 2
tsu(MI) Master mode 0 - -

Data input setup time
tsu(SI) Slave mode 3 - -
th(MI) Master mode 7 - -
Data input hold time
th(SI) Slave mode 3.5 - - ns
ta(SO Data output access time Slave mode 15 - 36
tdis(SO) Data output disable time Slave mode 10 - 30
Slave mode
- 18 41
1.65 V<VDD<3.6 V
tv(SO)
Data output valid time Slave mode
- 18 25
2.7 V<VDD<3.6 V
tv(MO) Master mode - 4 7
th(SO) Slave mode 10 - -
Data output hold time
th(MO) Master mode 0 - -
2. The maximum SPI clock frequency in slave transmitter mode is determined by the sum of tv(SO) and tsu(MI)
which has to fit into SCK low or high phase preceding the SCK sampling edge. This value can be
achieved when the SPI communicates with a master having tsu(MI) = 0 while Duty(SCK) = 50%.
DocID025938 Rev 6 95/127

100

Master mode 8
Slave mode Transmitter
fSCK 8
SPI clock frequency 1.65<VDD<3.6V - - MHz
1/tc(SCK)
Slave mode Transmitter
8(2)
2.7<VDD<3.6V
frequency
tsu(NSS) NSS setup time Slave mode, SPI presc = 2 4*Tpclk - -
th(NSS) NSS hold time Slave mode, SPI presc = 2 2*Tpclk - -
tw(SCKH)
SCK high and low time Master mode Tpclk-2 Tpclk Tpclk+2
tw(SCKL)
tsu(MI) Master mode 0 - -
th(MI) Master mode 11 - -
Data input hold time ns
th(SI) Slave mode 4.5 - -
tv(SO) Slave mode - 20 56.5

Data output valid time
2. The maximum SPI clock frequency in slave transmitter mode is determined by the sum of tv(SO) and tsu(MI) which has to fit
into SCK low or high phase preceding the SCK sampling edge. This value can be achieved when the SPI communicates
with a master having tsu(MI) = 0 while Duty(SCK) = 50%.
96/127 DocID025938 Rev 6


fSCK Master mode 2

SPI clock frequency - - MHz
1/tc(SCK) Slave mode 2(2)
frequency
tsu(NSS) NSS setup time Slave mode, SPI presc = 2 4*Tpclk - -
th(NSS) NSS hold time Slave mode, SPI presc = 2 2*Tpclk - -
tw(SCKH)
SCK high and low time Master mode Tpclk-2 Tpclk Tpclk+2
tw(SCKL)
tsu(MI) Master mode 1.5 - -
th(MI) Master mode 13.5 - -
Data input hold time ns
th(SI) Slave mode 16 - -
tv(SO) Slave mode - 30 70

2. The maximum SPI clock frequency in slave transmitter mode is determined by the sum of tv(SO) and tsu(MI) which has to fit
into SCK low or high phase preceding the SCK sampling edge. This value can be achieved when the SPI communicates
with a master having tsu(MI) = 0 while Duty(SCK) = 50%.
Figure 32. SPI timing diagram - slave mode and CPHA = 0
166LQSXW
W68 166 WF 6&. WK 166
&3+$
6&.,QSXW
&32/
WZ 6&.+
&3+$ WZ 6&./
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WD 62 WI 6&.
0,62 06%287 %,7287 /6%287

287387
WVX 6,
026,
,1387 06%,1 %,7,1 /6%,1
WK 6,
DLF
DocID025938 Rev 6 97/127

100
Figure 33. SPI timing diagram - slave mode and CPHA = 1(1)
166LQSXW
W68 166 WF 6&. WK 166
&3+$
6&.,QSXW
&32/
WZ 6&.+
&3+$ WZ 6&./
&32/
WY 62 WK 62 WU 6&. WGLV 62
WD 62 WI 6&.
0,62
287 3 87 06 % 2 87 %, 7 287 /6% 287
WVX 6, WK 6,
026,
0 6% ,1 % , 7 ,1 /6% ,1
, 1387
DL
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
Figure 34. SPI timing diagram - master mode(1)
+LJK
166LQSXW
WF 6&.
6&.2XWSXW
&3+$
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6&.2XWSXW
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WZ 6&.+ WU 6&.
WVX 0, WZ 6&./ WI 6&.
0,62
,13 87 06%,1 %,7,1 /6%,1
WK 0,
026,
06%287 % , 7287 /6%287
287387
WY 02 WK 02
DLF
1. Measurement points are done at CMOS levels: 0.3VDD and 0.7VDD.
98/127 DocID025938 Rev 6

I2S characteristics
Table 73. I2S characteristics(1)

fMCK I2S Main clock output - 256 x 8K 256xFs (2) MHz

Master data: 32 bits - 64xFs
fCK I2S clock frequency MHz
Slave data: 32 bits - 64xFs
I2S clock frequency duty
DCK Slave receiver 30 70 %
cycle
tv(WS) WS valid time Master mode - 15
th(WS) WS hold time Master mode 11 -
tsu(WS) WS setup time Slave mode 6 -
th(WS) WS hold time Slave mode 2 -
tsu(SD_MR) Master receiver 0 -
tsu(SD_SR) Slave receiver 6.5 -
ns
th(SD_MR) Master receiver 18 -
Data input hold time
th(SD_SR) Slave receiver 15.5 -
tv(SD_ST) Slave transmitter (after enable edge) - 77
tv(SD_MT) Master transmitter (after enable edge) - 8
th(SD_ST) Slave transmitter (after enable edge) 18 -
th(SD_MT) Master transmitter (after enable edge) 1.5 -
2. 256xFs maximum value is equal to the maximum clock frequency.
Note: Refer to the I2S section of the product reference manual for more details about the sampling
frequency (Fs), fMCK, fCK and DCK values. These values reflect only the digital peripheral
behavior, source clock precision might slightly change them. DCK depends mainly on the
ODD bit value, digital contribution leads to a min of (I2SDIV/(2*I2SDIV+ODD) and a max of
(I2SDIV+ODD)/(2*I2SDIV+ODD). Fs max is supported for each mode/condition.
DocID025938 Rev 6 99/127

100
Figure 35. I2S slave timing diagram (Philips protocol)(1)

WF &.
&.,QSXW &32/
&32/
WZ &.+ WZ &./ WK :6
:6LQSXW
WVX :6 WY 6'B67 WK 6'B67

6'WUDQVPLW
/6%WUDQVPLW 06%WUDQVPLW %LWQWUDQVPLW /6%WUDQVPLW
WVX 6'B65 WK 6'B65
6'UHFHLYH /6%UHFHLYH 06%UHFHLYH %LWQUHFHLYH /6%UHFHLYH
DLE
1. Measurement points are done at CMOS levels: 0.3 × VDD and 0.7 × VDD.
2. LSB transmit/receive of the previously transmitted byte. No LSB transmit/receive is sent before the first
byte.
Figure 36. I2S master timing diagram (Philips protocol)(1)
TF#+ TR#+
TC#+
#+ OUTPUT
#0/,
TW#+(
#0/,
TV73 TW#+, TH73
73 OUTPUT
TV3$?-4 TH3$?-4
3$TRANSMIT ,3" TRANSMIT -3" TRANSMIT "ITN TRANSMIT ,3" TRANSMIT
TSU3$?-2 TH3$?-2
3$RECEIVE ,3" RECEIVE -3" RECEIVE "ITN RECEIVE ,3" RECEIVE
AIB

2. LSB transmit/receive of the previously transmitted byte. No LSB transmit/receive is sent before the first
byte.
100/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Package information
7 Package information
In order to meet environmental requirements, ST offers these devices in different grades of

ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at www.st.com.
ECOPACK® is an ST trademark.
7.1 LQFP64 package information

Figure 37. LQFP64 - 64-pin, 10 x 10 mm low-profile quad flat package outline
6($7,1*3/$1(
&
$
$
PP
*$8*(3/$1(
$
F
FFF &
$
' .
' /
' /

E
(
(

3,1
,'(17,),&$7,21 H
:B0(B9
1. Drawing is not to scale.
Table 74. LQFP64 - 64-pin, 10 x 10 mm low-profile quad flat

package mechanical data
millimeters inches(1)
Symbol
Min Typ Max Min Typ Max
A - - 1.600 - - 0.0630
A1 0.050 - 0.150 0.0020 - 0.0059
A2 1.350 1.400 1.450 0.0531 0.0551 0.0571
b 0.170 0.220 0.270 0.0067 0.0087 0.0106
DocID025938 Rev 6 101/127

121
Package information STM32L051x6 STM32L051x8
Table 74. LQFP64 - 64-pin, 10 x 10 mm low-profile quad flat

package mechanical data (continued)
Symbol
c 0.090 - 0.200 0.0035 - 0.0079

D - 12.000 - - 0.4724 -
D1 - 10.000 - - 0.3937 -
D3 - 7.500 - - 0.2953 -
E - 12.000 - - 0.4724 -
E1 - 10.000 - - 0.3937 -
E3 - 7.500 - - 0.2953 -
e - 0.500 - - 0.0197 -
K 0° 3.5° 7° 0° 3.5° 7°
L 0.450 0.600 0.750 0.0177 0.0236 0.0295
L1 - 1.000 - - 0.0394 -
ccc - - 0.080 - - 0.0031
1. Values in inches are converted from mm and rounded to 4 decimal digits.
Figure 38. LQFP64 - 64-pin, 10 x 10 mm low-profile quad flat recommended footprint

AIC
1. Dimensions are expressed in millimeters.
102/127 DocID025938 Rev 6

Device marking for LQFP64

The following figure gives an example of topside marking versus pin 1 position identifier
location.
Figure 39. LQFP64 marking example (package top view)
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1. Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet
qualified and therefore not yet ready to be used in production and any consequences deriving from such
usage will not be at ST charge. In no event, ST will be liable for any customer usage of these engineering
samples in production. ST Quality has to be contacted prior to any decision to use these Engineering
samples to run qualification activity.
DocID025938 Rev 6 103/127

121
7.2 TFBGA64 package information

Figure 40. TFBGA64 – 64-ball, 5 x 5 mm, 0.5 mm pitch thin profile fine pitch ball
grid array package outline
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HHH 0 & % $
III 0 &
% $

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5B0(B9
Table 75. TFBGA64 – 64-ball, 5 x 5 mm, 0.5 mm pitch, thin profile fine pitch ball
grid array package mechanical data
Symbol
A - - 1.200 - - 0.0472
A1 0.150 - - 0.0059 - -
A2 - 0.200 - - 0.0079 -
A4 - - 0.600 - - 0.0236
b 0.250 0.300 0.350 0.0098 0.0118 0.0138
D 4.850 5.000 5.150 0.1909 0.1969 0.2028
D1 - 3.500 - - 0.1378 -
E 4.850 5.000 5.150 0.1909 0.1969 0.2028
E1 - 3.500 - - 0.1378 -
104/127 DocID025938 Rev 6

Table 75. TFBGA64 – 64-ball, 5 x 5 mm, 0.5 mm pitch, thin profile fine pitch ball
grid array package mechanical data (continued)
Symbol
e - 0.500 - - 0.0197 -
F - 0.750 - - 0.0295 -
ddd - - 0.080 - - 0.0031
eee - - 0.150 - - 0.0059
fff - - 0.050 - - 0.0020
Figure 41. TFBGA64 – 64-ball, 5 x 5 mm, 0.5 mm pitch, thin profile fine pitch ball
,grid array recommended footprint
'SDG
'VP 069
Table 76. TFBGA64 recommended PCB design rules (0.5 mm pitch BGA)
Dimension Recommended values
Pitch 0.5
Dpad 0.27 mm
0.35 mm typ. (depends on the soldermask
Dsm
registration tolerance)
Solder paste 0.27 mm aperture diameter.
Note: Non solder mask defined (NSMD) pads are recommended.

4 to 6 mils solder paste screen printing process.
DocID025938 Rev 6 105/127

121
Device marking for TFBGA64

The following figure gives an example of topside marking versus ball A 1 position identifier
location.
Figure 42. TFBGA64 marking example (package top view)
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DocID025938 Rev 6 107/127

121
Table 77. LQFP48 - 48-pin, 7 x 7 mm low-profile quad flat package mechanical data
Symbol
A - - 1.600 - - 0.0630
A1 0.050 - 0.150 0.0020 - 0.0059
A2 1.350 1.400 1.450 0.0531 0.0551 0.0571
b 0.170 0.220 0.270 0.0067 0.0087 0.0106
c 0.090 - 0.200 0.0035 - 0.0079
D 8.800 9.000 9.200 0.3465 0.3543 0.3622
D1 6.800 7.000 7.200 0.2677 0.2756 0.2835
D3 - 5.500 - - 0.2165 -
E 8.800 9.000 9.200 0.3465 0.3543 0.3622
E1 6.800 7.000 7.200 0.2677 0.2756 0.2835
E3 - 5.500 - - 0.2165 -
e - 0.500 - - 0.0197 -
L 0.450 0.600 0.750 0.0177 0.0236 0.0295
L1 - 1.000 - - 0.0394 -
k 0° 3.5° 7° 0° 3.5° 7°
ccc - - 0.080 - - 0.0031
108/127 DocID025938 Rev 6


AID

location.
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DocID025938 Rev 6 109/127

121
7.4 WLCSP36 package information

Figure 46. WLCSP36 - 2.596 x 2.868 mm, 0.4 mm pitch wafer level chip scale
package outline
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Table 78. WLCSP36 - 2.596 x 2.868 mm, 0.4 mm pitch wafer level chip scale
mechanical data
Symbol
A 0.525 0.555 0.585 0.0207 0.0219 0.0230

A1 - 0.175 - - 0.0069 -
A2 - 0.380 - - 0.0150 -
A3(2) - 0.025 - - 0.0010 -
b(3) 0.220 0.250 0.280 0.0087 0.0098 0.0110
D 2.561 2.596 2.631 0.1008 0.1022 0.1036
E 2.833 2.868 2.903 0.1115 0.1129 0.1143
e - 0.400 - - 0.0157 -
e1 - 2.000 - - 0.0787 -
e2 - 2.000 - - 0.0787 -
F - 0.298 - - 0.0117 -
110/127 DocID025938 Rev 6

Table 78. WLCSP36 - 2.596 x 2.868 mm, 0.4 mm pitch wafer level chip scale
mechanical data (continued)
Symbol
G - 0.434 - - 0.0171 -
aaa - - 0.100 - - 0.0039
bbb - - 0.100 - - 0.0039
ccc - - 0.100 - - 0.0039
ddd - - 0.050 - - 0.0020
eee - - 0.050 - - 0.0020
2. Back side coating.
3. Dimension is measured at the maximum bump diameter parallel to primary datum Z.
Figure 47. WLCSP36 - 2.596 x 2.868 mm, 0.4 mm pitch wafer level chip scale
recommended footprint
'SDG
'VP 069
Table 79. WLCSP36 recommended PCB design rules

Dimension Recommended values
Pitch 0.4 mm
260 µm max. (circular)
Dpad
220 µm recommended
Dsm 300 µm min. (for 260 µm diameter pad)
PCB pad design Non-solder mask defined via underbump allowed
DocID025938 Rev 6 111/127

121
Device marking for WLCSP36

The following figure gives an example of topside marking versus ball A 1 position identifier
location.
Figure 48. WLCSP36 marking example (package top view)
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DocID025938 Rev 6 113/127

121
Table 80. LQFP32 - 32-pin, 7 x 7 mm low-profile quad flat package mechanical data
Symbol
A - - 1.600 - - 0.0630
A1 0.050 - 0.150 0.0020 - 0.0059
A2 1.350 1.400 1.450 0.0531 0.0551 0.0571
b 0.300 0.370 0.450 0.0118 0.0146 0.0177
c 0.090 - 0.200 0.0035 - 0.0079
D 8.800 9.000 9.200 0.3465 0.3543 0.3622
D1 6.800 7.000 7.200 0.2677 0.2756 0.2835
D3 - 5.600 - - 0.2205 -
E 8.800 9.000 9.200 0.3465 0.3543 0.3622
E1 6.800 7.000 7.200 0.2677 0.2756 0.2835
E3 - 5.600 - - 0.2205 -
e - 0.800 - - 0.0315 -
L 0.450 0.600 0.750 0.0177 0.0236 0.0295
L1 - 1.000 - - 0.0394 -
k 0° 3.5° 7° 0° 3.5° 7°
ccc - - 0.100 - - 0.0039

6?&0?6
114/127 DocID025938 Rev 6


location.
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DocID025938 Rev 6 115/127

121
7.6 UFQFPN32 package information

Figure 52. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat
package outline
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H $
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'
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116/127 DocID025938 Rev 6

Table 81. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat
package mechanical data
Symbol
A 0.500 0.550 0.600 0.0197 0.0217 0.0236

A1 0.000 0.020 0.050 0.0000 0.0008 0.0020
A3 - 0.152 - - 0.0060 -
b 0.180 0.230 0.280 0.0071 0.0091 0.0110
D 4.900 5.000 5.100 0.1929 0.1969 0.2008
D1 3.400 3.500 3.600 0.1339 0.1378 0.1417
D2 3.400 3.500 3.600 0.1339 0.1378 0.1417
E 4.900 5.000 5.100 0.1929 0.1969 0.2008
E1 3.400 3.500 3.600 0.1339 0.1378 0.1417
E2 3.400 3.500 3.600 0.1339 0.1378 0.1417
e - 0.500 - - 0.0197 -
L 0.300 0.400 0.500 0.0118 0.0157 0.0197
ddd - - 0.080 - - 0.0031
Figure 53. UFQFPN32 - 32-pin, 5x5 mm, 0.5 mm pitch ultra thin fine pitch quad flat
recommended footprint

$%B)3B9
DocID025938 Rev 6 117/127

121
Device marking for UFQFPN32

location.
Figure 54. UFQFPN32 marking example (package top view)
/.
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118/127 DocID025938 Rev 6

7.7 Thermal characteristics

The maximum chip-junction temperature, TJ max, in degrees Celsius, may be calculated
using the following equation:
TJ max = TA max + (PD max × JA)
Where:
 TA max is the maximum ambient temperature in C,
 JA is the package junction-to-ambient thermal resistance, in C/W,
 PD max is the sum of PINT max and PI/O max (PD max = PINT max + PI/Omax),
 PINT max is the product of IDD and VDD, expressed in Watts. This is the maximum chip
internal power.
PI/O max represents the maximum power dissipation on output pins where:
PI/O max = (VOL × IOL) + ((VDD – VOH) × IOH),
taking into account the actual VOL / IOL and VOH / IOH of the I/Os at low and high level in the
application.
Table 82. Thermal characteristics

Symbol Parameter Value Unit
Thermal resistance junction-ambient
61
TFBGA64 - 5 x 5 mm / 0.5 mm pitch
45
LQFP64 - 10 x 10 mm / 0.5 mm pitch
63
WLCSP36 - 0.4 mm pitch
JA °C/W
55
57
38
UFQFPN32 - 5 x 5 mm / 0.5 mm pitch
DocID025938 Rev 6 119/127

121
Figure 55. Thermal resistance
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7.7.1 Reference document

JESD51-2 Integrated Circuits Thermal Test Method Environment Conditions - Natural
Convection (Still Air). Available from www.jedec.org.
120/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Part numbering
8 Part numbering
Table 83. STM32L051x6/8 ordering information scheme
Example: STM32 L 051 R 8 T 6 D TR
Device family
STM32 = ARM-based 32-bit microcontroller
Product type
L = Low power
Device subfamily
051 = Access line
Pin count
K = 32 pins
T = 36 pins
C = 48/49 pins
R = 64 pins
Flash memory size

6 = 32 Kbytes
8 = 64 Kbytes
Package
T = LQFP
H = TFBGA
U = UFQFPN
Y = WLCSP pins
Temperature range
6 = Industrial temperature range, –40 to 85 °C
Options
No character = VDD range: 1.8 to 3.6 V and BOR enabled
D = VDD range: 1.65 to 3.6 V and BOR disabled
Packing
TR = tape and reel
No character = tray or tube
For a list of available options (speed, package, etc.) or for further information on any aspect
of this device, please contact your nearest ST sales office.
DocID025938 Rev 6 121/127

121
Revision history STM32L051x6 STM32L051x8
9 Revision history
Table 84. Document revision history

Date Revision Changes
13-Feb-2014 1 Initial release.

Added WLCSP36 package. Updated Table 2: Ultra-low-power
STM32L051x6/x8 device features and peripheral counts
Updated Table 5: Functionalities depending on the working mode (from
Run/active down to standby). Added Section 3.2: Interconnect matrix.
Updated Figure 4: STM32L051x6/8 TFBGA64 ballout - 5x 5 mm
Replaced TTa I/O structure by TC, updated PA0/4/5, PC5/14, BOOT0
and NRST I/O structure in Table 15: STM32L051x6/8 pin definitions.
Updated Table 23: General operating conditions, Table 20: Voltage
characteristics and Table 21: Current characteristics.
Modified conditions in Table 26: Embedded internal reference voltage.
Updated Table 27: Current consumption in Run mode, code with data
processing running from Flash, Table 29: Current consumption in Run
mode, code with data processing running from RAM, Table 31: Current
consumption in Sleep mode, Table 32: Current consumption in Low-
power run mode, Table 33: Current consumption in Low-power sleep
mode, Table 34: Typical and maximum current consumptions in Stop
mode and Table 35: Typical and maximum current consumptions in
Standby mode. Added Figure 14: IDD vs VDD, at TA= 25/55/85/105 °C,
Run mode, code running from Flash memory, Range 2, HSE, 1WS,
Figure 15: IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code
29-Apr-2014 2 running from Flash memory, Range 2, HSI16, 1WS, Figure 16: IDD vs
VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running
from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS, Figure 17: IDD
vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled
and running on LSE Low drive and Figure 18: IDD vs VDD, at TA=
25/55/85/105/125 °C, Stop mode with RTC disabled, all clocks off.
Updated Table 42: HSE oscillator characteristics and Table 43: LSE
oscillator characteristics. Added Figure 23: HSI16 minimum and
maximum value versus temperature.
Updated Table 53: ESD absolute maximum ratings, Table 55: I/O
current injection susceptibility and Table 56: I/O static characteristics,
and added Figure 24: VIH/VIL versus VDD (CMOS I/Os) and Figure 25:
VIH/VIL versus VDD (TTL I/Os). Updated Table 57: Output voltage
characteristics, Table 58: I/O AC characteristics and Figure 26: I/O AC
characteristics definition.
Updated Table 60: ADC characteristics, Table 62: ADC accuracy, and
Figure 29: Typical connection diagram using the ADC. Updated
Table 64: Temperature sensor characteristics.
Updated Table 70: SPI characteristics in voltage Range 1 and Table 73:
I2S characteristics.
Added Figure 55: Thermal resistance.
122/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Revision history
Table 84. Document revision history (continued)

Cover page: changed LQFP32 size, updated core speed. updated core
speed, added minimum supply voltage for ADC and comparators.
ADC now guaranteed down to 1.65 V.
Updated list of applications in Section 1: Introduction. Changed number
of I2S interfaces to one in Section 2: Description.
Updated Table 2: Ultra-low-power STM32L051x6/x8 device features
and peripheral counts.
Updated Table 3: Functionalities depending on the operating power
supply range.
Updated RTC/TIM21 in Table 6: STM32L0xx peripherals interconnect
matrix.
Added note related to UFQFPN32 and note related to WLCSP36 in
Table 15: STM32L051x6/8 pin definitions. Split LQFP32/UFQFPN32
pinout schematics into two distinct figures: Figure 7 and Figure 8.
Updated VDDA in Table 23: General operating conditions.
Split Table Current consumption in Run mode, code with data
processing running from Flash into Table 27 and Table 28 and content
25-Jun-2014 3 updated. Split Table Current consumption in Run mode, code with data
processing running from RAM into Table 29 and Table 30 and content
updated. Updated Table 31: Current consumption in Sleep mode,
Table 32: Current consumption in Low-power run mode, Table 33:
Current consumption in Low-power sleep mode, Table 34: Typical and
maximum current consumptions in Stop mode, Table 35: Typical and
maximum current consumptions in Standby mode, and added Table 36:
Average current consumption during Wakeup.
Updated Table 37: Peripheral current consumption in Run or Sleep
mode and added Table 38: Peripheral current consumption in Stop and
Standby mode.
Updated tLOCK in Table 47: PLL characteristics.
Removed note 1 below Figure 21: HSE oscillator circuit diagram.
Updated Table 49: Flash memory and data EEPROM characteristics
and Table 50: Flash memory and data EEPROM endurance and
retention.
Updated Table 58: I/O AC characteristics.
Updated Table 60: ADC characteristics.
Updated Figure 55: Thermal resistance and added note 1.
DocID025938 Rev 6 123/127

126

Extended operating temperature range to 125 °C.

Updated minimum ADC operating voltage to 1.65 V.
Updated Section 3.4.1: Power supply schemes.
Replaced USART3 by LPUART1 and updated I/O structure for PC5
and PC15 pins in Table 15: STM32L051x6/8 pin definitions.
Replaced LPUART by LPUART1 in Table 16: Alternate function port A,
Table 17: Alternate function port B, Table 18: Alternate function port C
and Table 19: Alternate function port D.
Updated temperature range in Section 2: Description, Table 2: Ultra-
low-power STM32L051x6/x8 device features and peripheral counts.
Updated PD, TA and TJ to add range 3 in Table 23: General operating
conditions. Added range 3 in Table 50: Flash memory and data
EEPROM endurance and retention, Table 83: STM32L051x6/8
ordering information scheme. Update note 1 in Table 27: Current
consumption in Run mode, code with data processing running from
Flash, Table 29: Current consumption in Run mode, code with data
processing running from RAM, Table 31: Current consumption in Sleep
mode, Table 32: Current consumption in Low-power run mode,
Table 33: Current consumption in Low-power sleep mode, Table 34:
Typical and maximum current consumptions in Stop mode, Table 35:
Typical and maximum current consumptions in Standby mode and
05-Sep-2014 4 Table 39: Low-power mode wakeup timings. Updated Figure 55:
Thermal resistance and removed note 1. Updated Table 60: ADC
characteristics and Table 62: ADC accuracy.
Updated Figure 16: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-
power run mode, code running from RAM, Range 3, MSI (Range 0) at
64 KHz, 0 WS, Figure 17: IDD vs VDD, at TA= 25/55/ 85/105/125 °C,
Stop mode with RTC enabled and running on LSE Low drive,
Figure 18: IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop mode with
RTC disabled, all clocks off.
Updated Table 35: Typical and maximum current consumptions in
Standby mode.
Updated SYSCFG in Table 37: Peripheral current consumption in Run
or Sleep mode.
Updated Table 38: Peripheral current consumption in Stop and Standby
mode and Table 39: Low-power mode wakeup timings.
Updated ACCHSI16 temperature conditions in Table 44: 16 MHz HSI16
oscillator characteristics.
Updated VF(NRST) and VNF(NRST) in Table 59: NRST pin characteristics.
Updated Table 60: ADC characteristics and Table 62: ADC accuracy.
Added range 3 in Table 83: STM32L051x6/8 ordering information
scheme.
124/127 DocID025938 Rev 6

STM32L051x6 STM32L051x8 Revision history

Updated LQFP64, TFBGA64 and LQFP48 pinout/ballout schematics to

highlight pin/ball supplied through VDDIO2.
Updated current consumption in Run mode in Section : Features.
Updated Figure 6: STM32L051x6/8 WLCSP36 ballout and Figure 4:
STM32L051x6/8 TFBGA64 ballout - 5x 5 mm to change bump to top
view. Renamed BOOT1 into nBOOT1. Changed USARTx_RTS into
USARTx_RTS_DE and LPUARTx_RTS into LPUARTx_RTS_DE.
Changed I/O structure to FT for PC15 in Table 15: STM32L051x6/8 pin
definitions
ADC no more available in Low-power run and Low-power Sleep modes
in Table 5: Functionalities depending on the working mode (from
Run/active down to standby).
Updated Figure 7: STM32L051x6/8 LQFP32 pinout (PC14).
Suppressed I2C2_SMBA alternate function for PB12 in Table 15:
STM32L051x6/8 pin definitions and Table 17: Alternate function port B.
In whole Section 6: Electrical characteristics, modified notes related to
characteristics guaranteed by design and by tests during
characterization.
Added ΣIVDDIO2 and updated ΣIIO(PIN) in Table 21: Current
characteristics. Updated Table 20: Voltage characteristics.
Changed temperature condition in Table 8: Internal voltage reference
measured values and Table 25: Embedded internal reference voltage
calibration values.
Updated TCoeff in Table 26: Embedded internal reference voltage.
08-Sep-2015 5 Updated Figure 16: IDD vs VDD, at TA= 25/55/ 85/105/125 °C, Low-
power run mode, code running from RAM, Range 3, MSI (Range 0) at
64 KHz, 0 WS, Figure 17: IDD vs VDD, at TA= 25/55/ 85/105/125 °C,
Stop mode with RTC enabled and running on LSE Low drive and
Figure 18: IDD vs VDD, at TA= 25/55/85/105/125 °C, Stop mode with
RTC disabled, all clocks off.
Added note related to Standby mode in Table 38: Peripheral current
consumption in Stop and Standby mode.
Updated Table 39: Low-power mode wakeup timings
Updated MSI oscillator temperature frequency drift in Table 46: MSI
oscillator characteristics.
Updated Table 55: I/O current injection susceptibility, Table 56: I/O
static characteristics and Table 58: I/O AC characteristics.
Section : I2C interface characteristics: updated introduction, Table 68:
I2C analog filter characteristics.
updated Figure 32: SPI timing diagram - slave mode and CPHA = 0.
Updated Table 51: EMS characteristics and Table 52: EMI
characteristics.
Added tUP_LDO in Table 60: ADC characteristics.
Added Section : Device marking for LQFP64 and Section : Device
marking for WLCSP36. Updated Section : Device marking for
TFBGA64, Section : Device marking for LQFP48, Section : Device
marking for LQFP32 and Section : Device marking for UFQFPN32.
Updated note below marking schematics in Section 7: Package
information. Added Figure 46: WLCSP36 - 2.596 x 2.868 mm, 0.4 mm
pitch wafer level chip scale package outline.
DocID025938 Rev 6 125/127

126

Updated number of SPIs on cover page and in Table 2: Ultra-low-

power STM32L051x6/x8 device features and peripheral counts.
Changed minimum comparator supply voltage to 1.65 V on cover page.
Added number of fast and standard channels in Section 3.11: Analog-
to-digital converter (ADC).
Updated Section 3.16.2: Universal synchronous/asynchronous receiver
transmitter (USART) and Section 3.16.4: Serial peripheral interface
(SPI)/Inter-integrated sound (I2S) to mention the fact that USARTs with
synchronous mode feature can be used as SPI master interfaces.
Added baudrate allowing to wake up the MCU from Stop mode in
Section 3.16.2: Universal synchronous/asynchronous receiver
transmitter (USART) and Section 3.16.3: Low-power universal
asynchronous receiver transmitter (LPUART).
In Section 6: Electrical characteristics, updated notes related to values
guaranteed by characterization.
17-Mar-2016 6 Changed VDDA minimum value to 1.65 V in Table 23: General operating
conditions.
Section 6.3.15: 12-bit ADC characteristics:
– Table 60: ADC characteristics:
Distinction made between VDDA for fast and standard channels;
added note 1.
Added note 4. related to RADC.
Updated fTRIG. and VAIN maximum value.
Updated tS and tCONV.
Added VREF+.
– Updated equation 1 description.
– Updated Table 61: RAIN max for fADC = 16 MHz for fADC = 16 MHz
and distinction made between fast and standard channels.
Added Table 69: USART/LPUART characteristics.
Updated Figure 45: LQFP48 marking example (package top view).
126/127 DocID025938 Rev 6

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© 2016 STMicroelectronics – All rights reserved
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STM32L051x6 STM32L051x8

Access line ultra-low-power 32-bit MCU ARM®-based Cortex®-M0+,

– 1.65 V to 3.6 V power supply

March 2016 DocID025938 Rev 6 1/127

2/127 DocID025938 Rev 6

3.16 Communication interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

DocID025938 Rev 6 3/127

6.3.15 12-bit ADC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86

7 Package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101

8 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121

9 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122

4/127 DocID025938 Rev 6

Table 1. Device summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

DocID025938 Rev 6 5/127

Table 46. MSI oscillator characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73

6/127 DocID025938 Rev 6

Figure 1. STM32L051x6/8 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

DocID025938 Rev 6 7/127

Figure 42. TFBGA64 marking example (package top view) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 106

8/127 DocID025938 Rev 6

DocID025938 Rev 6 9/127

The access line ultra-low-power STM32L051x6/8 microcontrollers incorporate the high-

10/127 DocID025938 Rev 6

2.1 Device overview

Data EEPROM (Kbytes) 2 2

SPI/I2S 3(2)(1)/0 3(2)(1)/0 4(2)(1)/1 4(2)(1)/1 3(2)(1)/0 3(2)(1)/1 4(2)(1)/1 4(2)(1)/1

GPIOs 27(2) 29 37 51(3) 27(2) 29 37 51(3)

12-bit synchronized ADC 1 1 1 1 1 1 1 1

Max. CPU frequency 32 MHz

1.8 V to 3.6 V (down to 1.65 V at power-down) with BOR option

DocID025938 Rev 6 11/127

Figure 1. STM32L051x6/8 block diagram

3%>@ *3,23257% 7,0

3+>@ *3,23257+ 5;7;576

12/127 DocID025938 Rev 6

2.2 Ultra-low-power device continuum

DocID025938 Rev 6 13/127

3.1 Low-power modes

14/127 DocID025938 Rev 6

 Stop mode without RTC

Table 3. Functionalities depending on the operating power supply range

DocID025938 Rev 6 15/127

Table 3. Functionalities depending on the operating power supply range (continued)

Conversion time up Range 1, range 2 or

Table 4. CPU frequency range depending on dynamic voltage scaling

CPU frequency range Dynamic voltage scaling range

16 MHz to 32 MHz (1ws)

Table 5. Functionalities depending on the working mode

16/127 DocID025938 Rev 6

Table 5. Functionalities depending on the working mode

DocID025938 Rev 6 17/127

Table 5. Functionalities depending on the working mode

0.4 µA (No 0.28 µA (No

Down to Down to 0.8 µA (with 0.65 µA (with

3.2 Interconnect matrix

Depending on peripherals, these interconnections can operate in Run, Sleep, Low-power

Table 6. STM32L0xx peripherals interconnect matrix

Timer input channel,

3%>@ *3,23257% 7,0

3+>@ *3,23257+ 5;7;576

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