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    Microelectronic Circuits - Fifth Edition Sedra/Smith 1: Characteristic of A Silicon Junction Diode

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    Qamar Zahoor
    The document contains 14 figures from the textbook "Microelectronic Circuits Fifth Edition Sedra/Smith" that illustrate and explain semiconductor device physics concepts. Figure 4.9 shows the cross-section of a CMOS integrated circuit with NMOS and PMOS transistors. Figures 4.10 and 4.11 show the circuit symbol and iD-vDS characteristics of an n-channel enhancement-type MOSFET.

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    Microelectronic Circuits - Fifth Edition Sedra/Smith 1: Characteristic of A Silicon Junction Diode

    Uploaded by

    Qamar Zahoor
    117 views14 pages
    The document contains 14 figures from the textbook "Microelectronic Circuits Fifth Edition Sedra/Smith" that illustrate and explain semiconductor device physics concepts. Figure 4.9 shows the cross-section of a CMOS integrated circuit with NMOS and PMOS transistors. Figures 4.10 and 4.11 show the circuit symbol and iD-vDS characteristics of an n-channel enhancement-type MOSFET.

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    Lecture 1

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    The document contains 14 figures from the textbook "Microelectronic Circuits Fifth Edition Sedra/Smith" that illustrate and explain semiconductor device physics concepts. Figure 4.9 shows the cross-section of a CMOS integrated circuit with NMOS and PMOS transistors. Figures 4.10 and 4.11 show the circuit symbol and iD-vDS characteristics of an n-channel enhancement-type MOSFET.

    Copyright:

    Attribution Non-Commercial (BY-NC)
    Download as PPTX, PDF, TXT or read online from Scribd
    Download as pptx, pdf, or txt
    117 views14 pages

    Microelectronic Circuits - Fifth Edition Sedra/Smith 1: Characteristic of A Silicon Junction Diode

    Uploaded by

    Qamar Zahoor
    The document contains 14 figures from the textbook "Microelectronic Circuits Fifth Edition Sedra/Smith" that illustrate and explain semiconductor device physics concepts. Figure 4.9 shows the cross-section of a CMOS integrated circuit with NMOS and PMOS transistors. Figures 4.10 and 4.11 show the circuit symbol and iD-vDS characteristics of an n-channel enhancement-type MOSFET.

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    Attribution Non-Commercial (BY-NC)
    Download as PPTX, PDF, TXT or read online from Scribd
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    Figure 3.7 The iv characteristic of a silicon junction diode.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 3.8 The diode iv relationship with some scales expanded and others compressed in order to reveal details.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.1 Physical structure of the enhancement-type NMOS transistor: (a) perspective view; (b) cross-section. Typically L = 0.1 to 3 mm, W = 0.2 to 100 mm, and the thickness of the oxide layer (tox) is in the range of 2 to 50 nm.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.2 The enhancement-type NMOS transistor with a positive voltage applied to the gate. An n channel is induced at the top of the substrate beneath the gate.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.3 An NMOS transistor with vGS > Vt and with a small vDS applied. The device acts as a resistance whose value is determined by vGS. Specifically, the channel conductance is proportional to vGS Vt and thus iD is proportional to (vGS Vt) vDS. Note that the depletion region is not shown (for simplicity).

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.4 The iDvDS characteristics of the MOSFET in Fig. 4.3 when the voltage applied between drain and source, vDS, is kept small. The device operates as a linear resistor whose value is controlled by vGS.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.5 Operation of the enhancement NMOS transistor as vDS is increased. The induced channel acquires a tapered shape, and its resistance increases as vDS is increased. Here, vGS is kept constant at a value > Vt.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.6 The drain current iD versus the drain-to-source voltage vDS for an enhancement-type NMOS transistor operated with vGS > Vt.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.7 Increasing vDS causes the channel to acquire a tapered shape. Eventually, as vDS reaches vGS Vt the channel is pinched off at the drain end. Increasing vDS above vGS Vt has little effect (theoretically, no effect) on the channels shape.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    Figure 4.8 Derivation of the iDvDS characteristic of the NMOS transistor.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    10

    Figure 4.9 Cross-section of a CMOS integrated circuit. Note that the PMOS transistor is formed in a separate n-type region, known as an n well. Another arrangement is also possible in which an n-type body is used and the n device is formed in a p well. Not shown are the connections made to the p-type body and to the n well; the latter functions as the body terminal for the p-channel device.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    11

    Assignment # 1
    Explain the Common-Base and Common-Emitter characteristics of BJT qualitatively, graphically and quantitatively. Due Date: 27 Sep 2011

    Figure 4.10 (a) Circuit symbol for the n-channel enhancement-type MOSFET. (b) Modified circuit symbol with an arrowhead on the source terminal to distinguish it from the drain and to indicate device polarity (i.e., n channel). (c) Simplified circuit symbol to be used when the source is connected to the body or when the effect of the body on device operation is unimportant.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    13

    Figure 4.11 (a) An n-channel enhancement-type MOSFET with vGS and vDS applied and with the normal directions of current flow indicated. (b) The iDvDS characteristics for a device with kn (W/L) = 1.0 mA/V2.

    Microelectronic Circuits Fifth Edition Sedra/Smith

    14

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