Adxl 278
Adxl 278
Adxl 278
FEATURES
Complete dual-axis acceleration measurement system on a single monolithic IC Available in 35 g/35 g, 50 g/50 g, or 70 g/35 g output full-scale ranges Full differential sensor and circuitry for high resistance to EMI/RFI Environmentally robust packaging Complete mechanical and electrical self-test on digital command Output ratiometric to supply Sensitive axes in the plane of the chip High linearity (0.2% of full scale) Frequency response down to dc Low noise Low power consumption Tight sensitivity tolerance and 0 g offset capability Largest available prefilter clipping headroom 400 Hz, 2-pole Bessel filter Single-supply operation Compatible with Sn/Pb and Pb-free solder processes
GENERAL DESCRIPTION
The ADXL278 is a low power, complete, dual-axis accelerometer with signal conditioned voltage outputs that are on a single monolithic IC. This product measures acceleration with a full-scale range of (X-axis/Y-axis) 35 g/35 g, 50 g/ 50 g, or 70 g/35 g (minimum). The ADXL278 can also measure both dynamic acceleration (vibration) and static acceleration (gravity). The ADXL278 is the fourth-generation surface micromachined iMEMS accelerometer from ADI with enhanced performance and lower cost. Designed for use in front and side impact airbag applications, this product also provides a complete costeffective solution useful for a wide variety of other applications. The ADXL278 is temperature stable and accurate over the automotive temperature range, with a self-test feature that fully exercises all the mechanical and electrical elements of the sensor with a digital signal applied to a single pin. The ADXL278 is available in a 5 mm 5 mm 2 mm, 8-terminal ceramic LCC package.
APPLICATIONS
Vibration monitoring and control Vehicle collision sensing Shock detection
DIFFERENTIAL SENSOR
DEMOD AMP
XOUT
TIMING GENERATOR
EXC
DIFFERENTIAL SENSOR
DEMOD AMP
YOUT
SELF-TEST
Figure 1.
Rev. A Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 2005 Analog Devices, Inc. All rights reserved.
05365-001
REVISION HISTORY
5/05Rev. 0 to Rev. A
Rev. A | Page 2 of 12
ADXL278 SPECIFICATIONS 1
At TA = 40C to +105C, 5.0 V dc 5%, acceleration = 0 g, unless otherwise noted. Table 1.
Parameter SENSOR Output Full-Scale Range Nonlinearity Package Alignment Error Sensor-to-Sensor Alignment Error Cross-Axis Sensitivity Resonant Frequency Sensitivity, Ratiometric (Over Temperature) OFFSET Zero-g Output Voltage (Over Temperature) 2 NOISE Noise Density Conditions IOUT 100 A Model No. AD22284 Min Typ Max 37 0.2 1 0.1 5 VDD = 5 V, 100 Hz 52.25 24 55 2 Model No. AD22285 Min Typ Max 55 0.2 1 0.1 5 36.1 24 38 2 Model No. AD22286 Axis Min Typ Max X Y 70 37 0.2 1 0.1 5 X Y VOUT VDD/2, VDD = 5 V 150 +150 150 +150 X Y 10 Hz 400 Hz, 5V 1.1 3 1.4 3 X Y Clock Noise FREQUENCY RESPONSE 3 dB Frequency 3 dB Frequency Drift SELF-TEST Output Change (Cube vs. VDD) 3 Logic Input High Logic Input Low Input Resistance OUTPUT AMPLIFIER Output Voltage Swing Capacitive Load Drive PREFILTER HEADROOM CFSR @ 400 kHz POWER SUPPLY (VDD) Functional Range Quiescent Supply Current TEMPERATURE RANGE
1 2 3
+5 57.75
+5 39.9
5 2-pole Bessel 360 25C to TMIN or TMAX VDD = 5 V 440 400 2 440 360
400 2
440
550
660
304
380
456
X Y
270 550
324 660 1
mV mV V V k
3.5 1 30 50
3.5 1 30 50
50
VDD 0.25
VDD 0.25
VDD 0.25
V pF g V/V V/V V V mA C
VDD = 5 V 40
2.2
All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Zero g output is ratiometric. Self-test output at VDD = (Self-Test Output at 5 V) (VDD/5 V)3.
Rev. A | Page 3 of 12
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Rev. A | Page 4 of 12
VDD
ADXL278
ST NC = NO CONNECT
Rev. A | Page 5 of 12
05365-002
ADXL278
CRITICAL ZONE TL TO TP
TP RAMP-UP
TEMPERATURE
tP
TL
TSMAX TSMIN
tL
tS
PREHEAT
RAMP-DOWN
05365-003
t25C TO PEAK
TIME
PIN 8
XXXXX XXXX
XXXXX XXXX
22285
22285
EARTH'S SURFACE
Rev. A | Page 6 of 12
05365-004
XXXXX XXXX
FIXED PLATES
MOVING PLATE
ANCHOR
Rev. A | Page 7 of 12
05365-005
ADXL278 APPLICATIONS
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 F capacitor, CDC, adequately decouples the accelerometer from noise on the power supply. However, in some cases, particularly where noise is present at the 200 kHz internal clock frequency (or any harmonic thereof), noise on the supply can cause interference on the ADXL278s output. If additional decoupling is needed, a 50 (or smaller) resistor or ferrite bead cany be inserted in the supply line. Additionally, a larger bulk bypass capacitor (in the 1 F to 4.7 F range) can be added in parallel to CDC. 100 Hz. If the power supply clock is at exactly the same frequency as the accelerometer clock, the term appears as an offset. If the difference frequency is outside of the signal bandwidth, the filter attenuates it. However, both the power supply clock and the accelerometer clock may vary with time or temperature, which can cause the interference signal to appear in the output filter bandwidth. The ADXL278 addresses this issue in two ways. First, the high clock frequency eases the task of choosing a power supply clock frequency such that the difference between it and the accelerometer clock remains well outside of the filter bandwidth. Second, the ADXL278 is the only micromachined accelerometer to have a fully differential signal path, including differential sensors. The differential sensors eliminate most of the power supply noise before it reaches the demodulator. Good high frequency supply bypassing, such as a ceramic capacitor close to the supply pins, also minimizes the amount of interference. The clock frequency supply response (CFSR) is the ratio of the response at VOUT to the noise on the power supply near the accelerometer clock frequency. A CFSR of 3 means that the signal at VOUT is 3 the amplitude of an excitation signal at VDD near the accelerometer internal clock frequency. This is analogous to the power supply response, except that the stimulus and the response are at different frequencies. The ADXL278s CFSR is 10 better than a typical single-ended accelerometer system.
SELF-TEST
The fixed fingers in the forcing cells are normally kept at the same potential as that of the movable frame. When the self-test digital input is activated, the voltage on the fixed fingers on one side of the moving plate in the forcing cells is changed. This creates an attractive electrostatic force, which causes the frame to move towards those fixed fingers. The entire signal channel is active; therefore, the sensor displacement causes a change in VOUT. The ADXL278s self-test function is a comprehensive method of verifying the operation of the accelerometer. Because electrostatic force is independent of the polarity of the voltage across capacitor plates, a positive voltage is applied in half of the forcing cells, and its complement in the other half of the forcing cells. Activating self-test causes a step function force to be applied to the sensor, while the capacitive coupling term is canceled. The ADXL278 has improved self-test functionality, including excellent transient response and high speed switching capabilities. Arbitrary force waveforms can be applied to the sensor by modulating the self-test input, such as test signals to measure the system frequency response or even crash signals to verify algorithms within the limits of the self-test swing. The ST pin should never be exposed to voltages greater than VS + 0.3 V. If this cannot be guaranteed due to the system design (for instance, if there are multiple supply voltages), then a low VF clamping diode between ST and VS is recommended.
SIGNAL DISTORTION
Signals from crashes and other events may contain high amplitude, high frequency components. These components contain very little useful information and are reduced by the 2-pole Bessel filter at the output of the accelerometer. However, if the signal saturates at any point, the accelerometer output does not look like a filtered version of the acceleration signal. The signal may saturate anywhere before the filter. For example, if the resonant frequency of the sensor is low, the displacement per unit acceleration is high. The sensor may reach the mechanical limit of travel if the applied acceleration is high enough. This can be remedied by locating the accelerometer where it does not see high values of acceleration and by using a higher resonant frequency sensor, such as the ADXL278. Also, the electronics may saturate in an overload condition between the sensor output and the filter input. Ensuring that internal circuit nodes operate linearly to at least several times the full-scale acceleration value can minimize electrical saturation. The ADXL278 circuit is linear to approximately 8 full scale.
Rev. A | Page 8 of 12
1.27
7 1
0.64 2.50
0.38 DIAMETER
BOTTOM VIEW
Figure 6. 8-Terminal Ceramic Leadless Chip Carrier [LCC] (E-8) Dimensions shown in millimeters
Temperature Range 40C to +105C 40C to +105C 40C to +105C 40C to +105C 40C to +105C 40C to +105C
Package Description 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier
All models are on tape and reel and are Pb-free parts.
Rev. A | Page 9 of 12
ADXL278 NOTES
Rev. A | Page 10 of 12
ADXL278 NOTES
Rev. A | Page 11 of 12
ADXL278 NOTES
2005 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D0536505/05(A)
Rev. A | Page 12 of 12