This document provides specifications for a 0.8 inch single digit LED display (LSD815/65-XX-PF) made by Ligitek Electronics Co. It includes dimensions, pinout diagrams, electrical ratings, typical performance curves, reliability test procedures, and soldering recommendations. The display uses GaAlAs chips with peak wavelength of 660nm and viewing angle of 20 degrees. It is available in either common anode or cathode configurations.
This document provides specifications for a 0.8 inch single digit LED display (LSD815/65-XX-PF) made by Ligitek Electronics Co. It includes dimensions, pinout diagrams, electrical ratings, typical performance curves, reliability test procedures, and soldering recommendations. The display uses GaAlAs chips with peak wavelength of 660nm and viewing angle of 20 degrees. It is available in either common anode or cathode configurations.
This document provides specifications for a 0.8 inch single digit LED display (LSD815/65-XX-PF) made by Ligitek Electronics Co. It includes dimensions, pinout diagrams, electrical ratings, typical performance curves, reliability test procedures, and soldering recommendations. The display uses GaAlAs chips with peak wavelength of 660nm and viewing angle of 20 degrees. It is available in either common anode or cathode configurations.
This document provides specifications for a 0.8 inch single digit LED display (LSD815/65-XX-PF) made by Ligitek Electronics Co. It includes dimensions, pinout diagrams, electrical ratings, typical performance curves, reliability test procedures, and soldering recommendations. The display uses GaAlAs chips with peak wavelength of 660nm and viewing angle of 20 degrees. It is available in either common anode or cathode configurations.
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LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only SINGLE DIGIT LED DISPLAY (0.
8 Inch)
Pb Lead-Free Parts
LSD815/65-XX-PF
DATA SHEET
DOC. NO REV. DATE :
QW0905- LSD815/65-XX-PF A
: 02 - Mar. - 2006
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LSD815/65-XX-PF Page 1/8
Package Dimensions
19.7(0.776")
8.2(0.323")
PIN NO.1
27.5 (1.083")
20.3 (0.8")
2.54X7 =17.78 (0.7")
LSD815/65-XX-PF LIGITEK
2.2(0.087")
0.51 TYP 15.24(0.6")
5.0 0.5
Note : 1.All dimension are in millimeters and (lnch) tolerance is 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LSD815/65-XX-PF Page 2/8
Internal Circuit Diagram
LSD8155-XX-PF 3,5,11,16 A B C D E F G LDPRDP
1 14 12 10 4
2 13 6
LSD8165-XX-PF 3,5,11,16 A B C D E F G LDPRDP
1 14 12 10 4
2 13 6
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
Common Cathode Anode No Pin No Pin Anode Anode RDP D LDP
Common Anode Cathode No Pin No Pin Cathode Cathode RDP D LDP
9 10 11 12 13 14 15 16
Common Cathode Anode Anode Anode No Pin Common Cathode C G B
Common Anode Cathode Cathode Cathode No Pin Common Anode C G B
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LSD815/65-XX-PF Page 4/7
Absolute Maximum Ratings at Ta=25
Ratings Parameter Symbol SR Forward Current Per Chip Peak Forward Current Per Chip (Duty 1/10,0.1ms Pulse Width) Power Dissipation Per Chip Reverse Current Per Any Chip Operating Temperature Storage Temperature IF 30 mA UNIT
IFP
100
mA
PD Ir Topr Tstg
100 10 -25 ~ +85 -25 ~ +85
mW
Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260
Part Selection And Application Information(Ratings at 25)
Electrical
PART NO
common cathode or anode Material Emitted
CHIP Common Cathode GaAlAs
P (nm)
(nm)
Vf(v)
Iv(mcd)
IV-M
Min. Typ. Max. Min. Typ.
LSD8155-XX-PF
Red Common Anode
660
20
1.5
1.8
2.4
6.1
10.5
2:1
LSD8165-XX-PF
Note : 1.The forward voltage data did not including 0.1V testing tolerance. 2. The luminous intensity data did not including 15% testing tolerance.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LSD815/65-XX-PF Page 5/7
Test Condition For Each Parameter
Parameter Forward Voltage Per Chip Luminous Intensity Per Chip Peak Wavelength Spectral Line Half-Width Reverse Current Any Chip Luminous Intensity Matching Ratio
Symbol Vf Iv
Unit volt mcd nm nm
Test Condition If=20mA If=10mA If=20mA If=20mA Vr=5V
P Ir IV-M
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LSD815/65-XX-PF Page 6/7
Typical Electro-Optical Characteristics Curve
SR CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0
1000
Forward Current(mA)
100
Relative Intensity Normalize @20mA
2.5 2.0 1.5 1.0 0.5 0.0
10 1.0
0.1 1.0 2.0 3.0 4.0 5.0
1.0
10
100
1000
Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature
Forward Current(mA) Fig.4 Relative Intensity vs. Temperature
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LSD815/65-XX-PF Page 7/8
Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350 C Max Soldering Time:3 Seconds Max(One Time) Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260 C 2.Wave Soldering Profile Dip Soldering Preheat: 120 C Max Preheat time: 60seconds Max Ramp-up 2 C/sec(max) Ramp-Down:-5 C/sec(max) Solder Bath:260 C Max Dipping Time:3 seconds Max Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260 C
Temp( C) 260 C3sec Max
260 5 /sec max
120 2 /sec max Preheat 60 Seconds Max
25 0 0
50
100
150 Time(sec)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LSD815/65-XX-PF Page 8/8
Reliability Test:
Test Item
Test Condition 1.Under Room Temperature 2.If=10mA 3.t=1000 hrs (-24hrs, +72hrs)
Description This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed.
Reference Standard MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1
Operating Life Test
High Temperature Storage Test
1.Ta=105 5 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of high temperature for hours.
MIL-STD-883:1008 JIS C 7021: B-10
Low Temperature Storage Test
1.Ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.
JIS C 7021: B-12
High Temperature High Humidity Test
1.Ta=65 5 2.RH=90 %~95% 3.t=240hrs 2hrs
The purpose of this test is the resistance of the device under tropical for hours.
The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire.
