Smart Four Channel Highside Power Switch: BTS711L1
Smart Four Channel Highside Power Switch: BTS711L1
Smart Four Channel Highside Power Switch: BTS711L1
Overload protection
Current limitation
Short-circuit protection
Thermal shutdown
Overvoltage protection
(including load dump)
Fast demagnetization of inductive loads
Reverse battery protection1)
Undervoltage and overvoltage shutdown
with auto-restart and hysteresis
Open drain diagnostic output
Open load detection in ON-state
CMOS compatible input
Loss of ground and loss of Vbb protection
Electrostatic discharge (ESD) protection
Product Summary
Overvoltage Protection
Operating voltage
active channels:
On-state resistance RON
Nominal load current IL(NOM)
Current limitation
IL(SCr)
43
V
Vbb(AZ)
Vbb(on)
5.0 ... 34
V
two parallel four parallel
one
200
100
50
m
1.9
2.8
4.4
A
4
4
4
A
P-DSO-20
Application
General Description
N channel vertical power FET with charge pump, ground referenced CMOS compatible input and diagnostic
Symbol Function
Vbb
Positive power supply voltage. Design the
wiring for the simultaneous max. short circuit
currents from channel 1 to 4 and also for low
thermal resistance
IN1
Input 1 .. 4, activates channel 1 .. 4 in case of
IN2
logic high signal
IN3
IN4
OUT1
Output 1 .. 4, protected high-side power output
OUT2
of channel 1 .. 4. Design the wiring for the
OUT3
max. short circuit current
OUT4
ST1/2
Diagnostic feedback 1/2 of channel 1 and
channel 2, open drain, low on failure
ST3/4
Diagnostic feedback 3/4 of channel 3 and
channel 4, open drain, low on failure
GND1/2 Ground 1/2 of chip 1 (channel 1 and channel 2)
GND3/4 Ground 3/4 of chip 2 (channel 3 and channel 4)
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
Vbb
Vbb
OUT1
OUT2
Vbb
Vbb
OUT3
OUT4
Vbb
Vbb
With external current limit (e.g. resistor RGND=150 ) in GND connection, resistor in series with ST
connection, reverse load current limited by connected load.
Semiconductor Group
2003-Oct-01
BTS711L1
Block diagram
Four Channels; Open Load detection in on state;
Voltage
source
Overvoltage
protection
Current
limit 1
+ V bb
Gate 1
protection
Channel 1
V Logic
IN1
IN2
ST1/2
Voltage
Level shifter
sensor
Rectifier 1
Logic
ESD
Signal GND
Chip 1
Current
limit 2
Level shifter
Rectifier 2
GND1/2
OUT1
18
Temperature
sensor 1
Open load
Short to Vbb
detection 1
Charge
pump 1
Charge
pump 2
Limit for
unclamped
ind. loads 1
Leadframe
Gate 2
protection
Limit for
unclamped
ind. loads 2
Open load
Short to Vbb
detection 2
Chip 1
Channel 2
OUT2
17
Load
Temperature
sensor 2
R
R
O1
O2
GND1/2
Load GND
+ V bb
Leadframe
Channel 3
OUT3
14
(equivalent to chip 1)
7
IN3
IN4
ST3/4
Channel 4
OUT4
Load
GND3/4
PROFET
Signal GND
Chip 2
13
Chip 2
R
O3
O4
GND3/4
Load GND
Semiconductor Group
2003-Oct-01
BTS711L1
Maximum Ratings at Tj = 25C unless otherwise specified
Parameter
Symbol
Vbb
Vbb
Values
Unit
43
34
V
V
self-limited
60
A
V
Tj
Tstg
Ptot
-40 ...+150
-55 ...+150
3.6
1.9
EAS
150
320
800
mJ
VESD
1.0
kV
V
mA
16
44
35
K/W
IL
VLoad
4)
dump
VIN
IIN
IST
Thermal resistance
junction - soldering point5),6)
junction - ambient5)
2)
3)
4)
5)
6)
each channel:
one channel active:
all channels active:
Rthjs
Rthja
Supply voltages higher than Vbb(AZ) require an external current limit for the GND and status pins, e.g. with a
150 resistor in the GND connection and a 15 k resistor in series with the status pin. A resistor for input
protection is integrated.
RI = internal resistance of the load dump test pulse generator
VLoad dump is setup without the DUT connected to the generator per ISO 7637-1 and DIN 40839
Device on 50mm*50mm*1.5mm epoxy PCB FR4 with 6cm2 (one layer, 70m thick) copper area for Vbb
connection. PCB is vertical without blown air. See page 15
Soldering point: upper side of solder edge of device pin 15. See page 15
Semiconductor Group
2003-Oct-01
BTS711L1
Electrical Characteristics
Parameter and Conditions, each of the four channels
Symbol
Tj =-40...+150C:
Tj =-40...+150C:
Tj =-40...+25C:
Tj =+150C:
Undervoltage restart of charge pump
see diagram page 14
Tj =-40...+150C:
Undervoltage hysteresis
Vbb(under) = Vbb(u rst) - Vbb(under)
Overvoltage shutdown
Tj =-40...+150C:
Overvoltage restart
Tj =-40...+150C:
Overvoltage hysteresis
Tj =-40...+150C:
Overvoltage protection8)
Tj =-40...+150C:
I bb = 40 mA
7)
8)
Values
min
typ
max
--
Unit
165
320
200
400
1.7
2.6
4.1
83
42
1.9
2.8
4.4
100
50
--
--
--
10
mA
ton
toff
80
80
200
200
400
400
dV/dton
0.1
--
V/s
-dV/dtoff
0.1
--
V/s
Vbb(on)
Vbb(under)
Vbb(u rst)
5.0
3.5
--
----
V
V
V
Vbb(ucp)
--
5.6
34
5.0
5.0
7.0
7.0
Vbb(under)
--
0.2
--
Vbb(over)
Vbb(o rst)
Vbb(over)
Vbb(AZ)
34
33
-42
--0.5
47
43
----
V
V
V
V
IL(NOM)
IL(GNDhigh)
At supply voltage increase up to Vbb = 5.6 V typ without charge pump, VOUT Vbb - 2 V
see also VON(CL) in circuit diagram on page 8.
Semiconductor Group
2003-Oct-01
BTS711L1
Parameter and Conditions, each of the four channels
Symbol
Values
min
typ
max
Unit
----
28
44
--
60
70
12
---
2
8
3
12
mA
Protection Functions10)
Initial peak short circuit current limit, (see timing
diagrams, page 12)
---
5.5
4
---
ms
--
47
--
150
--
-10
---
C
K
---
-610
32
--
V
mV
VON(CL)
Tjt
Tjt
Reverse Battery
Reverse battery voltage 12)
Drain-source diode voltage (Vout > Vbb)
IL = - 1.9 A, Tj = +150C
-Vbb
-VON
9)
Semiconductor Group
2003-Oct-01
BTS711L1
Parameter and Conditions, each of the four channels
Symbol
Values
min
typ
max
Diagnostic Characteristics
Open load detection current, (on-condition)
10
-200
each channel, Tj = -40C: I L (OL)
10
-150
Tj = 25C:
10
-150
Tj = 150C:
twice the current of one channel
two parallel channels
four times the current of one channel
four parallel channels
13
)
Open load detection voltage
Tj =-40..+150C: VOUT(OL)
2
3
4
Internal output pull down
(OUT to GND), VOUT = 5 V
Tj =-40..+150C: RO
4
10
30
1
Unit
mA
V
k
RI
2.5
3.5
VIN(T+)
1.7
--
3.5
VIN(T-)
1.5
--
--
-1
0.5
--
-50
V
A
20
50
90
td(ST OL4)
100
320
800
td(ST OL5)
--
20
td(ST)
--
200
600
5.4
---
6.1
---
-0.4
0.6
Tj =-40..+150C:
13)
14)
VIN(T)
IIN(off)
IIN(on)
VST(high)
VST(low)
External pull up resistor required for open load detection in off state.
If ground resistors RGND are used, add the voltage drop across these resistors.
Semiconductor Group
2003-Oct-01
BTS711L1
Truth Table
Channel 1 and 2
Channel 3 and 4
(equivalent to channel 1 and 2)
IN1
IN3
Chip 1
Chip 2
Normal operation
Open load
Channel 1 (3)
Channel 2 (4)
Channel 1 (3)
Channel 2 (4)
Overtemperature
both channel
Channel 1 (3)
Channel 2 (4)
Undervoltage/ Overvoltage
L = "Low" Level
H = "High" Level
IN2
IN4
OUT1
OUT3
OUT2
OUT4
L
L
H
H
L
L
H
L
H
L
H
L
H
X
L
L
H
H
Z
Z
H
L
H
L
H
L
H
X
L
H
X
L
L
H
L
L
H
L
H
X
L
H
X
H
H
H
Z
Z
H
L
H
X
L
H
X
L
X
H
L
H
X
X
X
L
L
H
L
H
X
X
X
L
H
X
L
H
X
L
L
L
L
L
X
X
L
H
H
H
L
L
L
X
X
L
L
L
ST1/2
ST3/4
ST1/2
ST3/4
BTS 711L1
BTS 712N1
H
H
H
H
H
H
H
H
L
H
H
H(L15))
H
L
H(L15))
H
L
L
H
H
L16)
H
H
L16)
H
H(L17))
L16)
H
H(L17))
H
L
L
H
L
H
L
H
L16)
H
H
H
L
L
H
L
H
L
H
X = don't care
Z = high impedance, potential depends on external circuit
Status signal valid after the time delay shown in the timing diagrams
Parallel switching of channel 1 and 2 (also channel 3 and 4) is easily possible by connecting the inputs and
outputs in parallel (see truth table). If switching channel 1 to 4 in parallel, the status outputs ST1/2 and ST3/4
have to be configured as a 'Wired OR' function with a single pull-up resistor.
Terms
V
bb
Ibb
V
ON1
V
ON2
Leadframe
I IN1
I IN2
I ST1/2
V
IN1 VIN2 VST1/2
3
5
4
IN1
IN2
Vbb
OUT1
PROFET
Chip 1
OUT2
ST1/2 GND1/2
2
R
I
GND1/2
18
I L1
17
I L2
I IN4
I ST3/4
V
OUT1
V
IN3 VIN4 VST3/4
7
9
8
IN3
IN4
Vbb
OUT3
PROFET
Chip 2
OUT4
ST3/4 GND3/4
6
VOUT2
R
GND1/2
V
ON3
V
ON4
Leadframe
I IN3
I
GND3/4
14
I L3
13
I L4
V
OUT3
VOUT4
GND3/4
Semiconductor Group
2003-Oct-01
BTS711L1
Overvoltage protection of logic part
GND1/2 or GND3/4
+ V bb
ESD-ZD I
RI
IN
Z2
IN
Logic
GND
ST
R ST
Z1
GND
R GND
Signal GND
+5V
R ST(ON)
ST
5V
ESDZD
GND
R ST
IN
- Vbb
RI
Logic
ST
OUT
Power
Inverse
Diode
GND
RGND
Signal GND
RL
Power GND
+Vbb
VZ
V
ON
OUT
PROFET
Power GND
Semiconductor Group
2003-Oct-01
BTS711L1
Open-load detection, OUT1...4
ON-state diagnostic condition:
VON < RONIL(OL); IN high
Vbb
IN2
PROFET
ST
GND
OUT1
IN1
V
VON
ON
IN1
OUT2
IN2
OUT
Open load
detection
Logic
unit
V
bb
ST
GND
Any kind of load. If VGND > VIN - VIN(T+) device stays off
Due to VGND > 0, no VST = low signal available.
EXT
OFF
IN2
PROFET
ST
GND
OUT1
Open load
detection
OUT
OUT2
V
Signal GND
bb
GND disconnect
Consider at your PCB layout that in the case of Vbb disconnection with energized inductive load the whole load
current flows through the GND connection.
Vbb
high
V
Logic
unit
IN1
Ibb
bb
IN1
Vbb
IN2
PROFET
OUT1
OUT2
ST
V
GND
V
V
IN1 IN2 ST
V
GND
Semiconductor Group
2003-Oct-01
BTS711L1
Inductive load switch-off energy
dissipation
E bb
E AS
ELoad
Vbb
IN
450
PROFET
OUT
400
ST
GND
ZL
{
R
EL
ER
Tj = 150C
300
85C
200
EL = 1/2LI L
-40C
100
50
ln (1+ |V
25C
150
IL L
(V + |VOUT(CL)|)
2RL bb
350
250
EAS=
RON [mOhm]
500
ILRL
OUT(CL)|
10
20
30
40
Vbb [V]
IL(OL) [mA]
L [mH]
1000
140
-40C
120
100
80
60
40
10
25C
100
85C
Tj = 150C
20
0
0
1
1
1.5
2.5
10
15
20
25
30
Vbb [V]
IL [A]
Semiconductor Group
10
2003-Oct-01
BTS711L1
Typ. standby current
Ibb(off) = f (Tj ); Vbb = 9...34 V, IN1...4 = low
Ibb(off) [A]
60
50
40
30
20
10
0
-50
50
100
150
200
Tj [C]
0
-50
50
100
150
200
Tj,start [C]
Semiconductor Group
11
2003-Oct-01
BTS711L1
Timing diagrams
Timing diagrams are shown for chip 1 (channel 1/2). For chip 2 (channel 3/4) the diagrams
are valid too. The channels 1 and 2, respectively 3 and 4, are symmetric and consequently
the diagrams are valid for each channel as well as for permuted channels
Figure 2b: Switching an inductive load
IN
IN2
V bb
t d(ST)
ST
*)
OUT1
OUT
OUT2
IL
I L(OL)
ST open drain
IN
IN1
ST
I
L1
OUT
L(SCp)
I
L(SCr)
t
ST
off(SC)
t
t
The initial peak current should be limited by the lamp and not by
the initial short circuit current IL(SCp) = 7.5 A typ. of the device.
Semiconductor Group
12
2003-Oct-01
BTS711L1
Figure 5a: Open load: detection in ON-state, open
load occurs in on-state
IN1
IN1/2
IN2
I
+I
L1
L2
I L(SCp)
VOUT1
I L(SCr)
channel 1:
open
load
I L1
t
ST1/2
off(SC)
t d(ST OL1)
open
load
normal
load
t d(ST OL2)
t d(ST OL1)
t d(ST OL2)
ST
t
t
td(ST OL1) = 30 s typ., td(ST OL2) = 20 s typ
IN
IN1
IN2
ST
V
OUT1
OUT
L1
d(ST)
d(ST OL4)
d(ST)
d(ST OL5)
ST
t
The status delay time td(STOL4) allows to distinguish between the
failure modes "open load in ON-state" and "overtemperature".
Semiconductor Group
13
2003-Oct-01
BTS711L1
Figure 5c: Open load: detection in ON- and OFF-state
(with REXT), turn on/off to open load
VON(CL)
V on
IN1
off-state
OUT1
I L1
bb(u rst)
V
ST
t d(ST)
d(ST)
t d(ST OL5)
bb(over)
off-state
on-state
IN2
bb(o rst)
bb(u cp)
bb(under)
V bb
t
IN = high, normal load conditions.
Charge pump starts at Vbb(ucp) = 5.6 V typ.
IN
IN
Vbb
bb
V
bb(under)
V ON(CL)
Vbb(over)
V bb(o rst)
Vbb(u cp)
Vbb(u rst)
V
OUT
V OUT
ST
ST open drain
t
Semiconductor Group
14
2003-Oct-01
BTS711L1
Ordering Code
Q67060-S7000-A2
Pin 15
Printed circuit board (FR4, 1.5mm thick, one layer 70m, 6cm2 active heatsink area) as a reference for max.
power dissipation Ptot, nominal load current IL(NOM) and thermal resistance Rthja
Semiconductor Group
15
2003-Oct-01
BTS711L1
Published by
Infineon Technologies AG,
St.-Martin-Strasse 53,
D-81669 Mnchen
Infineon Technologies AG 2001
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as a guarantee of characteristics.
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We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and
charts stated herein.
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For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in
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Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in question please contact
your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon
Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to
affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body,
or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or
other persons may be endangered.
Semiconductor Group
16
2003-Oct-01