Test LVDT
Test LVDT
Test LVDT
0 2000 IEEE
0-7803-5890-2/00/$10.00
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Clamp
2. Implementation and Testing
The DSP design was implemented and tested in a Extension
real-time test bed on a Bridgenorth BN4000 DSP
development board with a BN3216 analog interface
module. The system uses a Texas Instruments Gauge Blocks
TMS320C40 DSP that provides 16 bit resolution at
sample rates up to 100kHz. As shown in Figure 2, the
development board has 2 A/D input channels and 2 D/A Figure 3. Static test fixture.
output channels. A primary excitation of 2.5kHz was
generated on the DSP and sent via a D/A channel to the Table 1. Signal conditioner design specifications.
LVDT. Both the LVDT primary and secondary signals
were digitized via the two A/D channels. The output
I LVDT I Stroke I Excitation I DC 1 core 1
voltage (the demodulated position signal) was routed to
the D/A and made available as an analog signal.
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signal measured. Based on these two measures, a figure
AD598 AD698 DSPSE DSP of merit,
Costas
Max N/A 0.16% 0.18% 0.2% F= ~ ~ ' I o ~ ~ ~ ( S N & , / S dB,
NR~,,) (1)
Linearity
Deviation was computed. The results are shown in Table 3 and
Average N/A 0.05% 0.06% 0.07% indicate that the SE-based algorithm has the best noise
Linearity performance. This is because the SE algorithm averages
Deviation many samples (1024) to determine the output. This is
also the reason why the SE algorithm cannot be used for
dynamic measurements. The AD598 and AD698 signal
AD598 AD698 DSPSE DSP conditioners improved the SNR by 16.5dB, and the
Costas Costas-based DSP signal conditioner had an SNR
Max 0.64% 0.37% 0.79% 0.37% improvement of 18.5dB. This represents a 28% increase
Linearity in absolute (not dB) output SNR relative to the Analog
Deviation
Devices designs.
Linearity
4. Conclusions
vibration system suitable for varying the frequency over Testing and comparison of the new DSP-based LVDT
the range of interest. However, the electrical signals signal conditioning system with other analog and digital
seen by the signal conditioner are identical in each case. signal conditioners has been performed. Test results
The DSP SE-based algorithm does not work for indicate that the new DSP-based LVDT signal
dynamic systems and was not tested. As seen in Figure conditioning system has:
4, the dynamic responses for the AD598 and AD698 Better linearity than the AD598 and SE-based signal
show that the maximum attenuation at 250Hz is nearly conditioners, and matches the linearity of the AD698
6dB. This matches the expected response given by the signal conditioner.
manufacturer. However, the dynamic response using Better frequency response over the entire dynamic
the DSP-based algorithm does not experience any range (0 - 250 Hz) than the other signal conditioners.
significant attenuation for frequencies below 150 Hz. Better electrical noise characteristics than either the
The maximum attenuation at 250Hz is 1.56dB. AD598 or AD698 signal conditioners.
In addition, this system is advantageous because:
3.3 Noise Testing It proctsses both 4-wire and 5-wire LVDTs.
Phase correction is automatically achieved.
The objective was to determine the performance of
each signal conditioner in the presence of noise. To
accomplish this, noise was added to the secondary
output signal of the LVDT, as seen in Figure 5. To
quantify the noise performance, varying noise amounts
were added to a fixed power secondary signal to
produce a range of input signal-to-noise ratio (SNR)
levels. Then, the analog output signal (representing the
position) was digitized, and the SNR of the output
Frequency (Hr)
IO 100 1000 Figure 5. Experimental noise testing setup.
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5 . Acknowledgements [5] F. Yassa and S. Garverick, A Multichannel Digital
Demodulator for LVDT/RVDT Position Sensors, IEEE
Journal of Solid-state Circuits, Vol. 25, No. 2 pp. 441 -
The authors would like to thank Mr. Allen Platz of 450, April 1990.
Lord Coporation for sponsoring this project* We [6] E. E. Herceg, An LVDT Primer, Sensors, Volume 13,
would also like to thank Brian Swahn, an electrical and Issue 6, pp. 27 - 30, June 1996.
computer engineering student at Penn State Erie, for his [7] Analog Devices, LVDT Signal Conditioner, AD598
valuable help with the experimental testing. Application Note, 1989.
[SI Analog Devices, Universal LVDT Signal Conditioner,
6. References AD698 Application Note, 1995.
[9] G. Novacek, Accurate Linear Measurement Using
LVDTs, Circuit Cellar Ink, Issue #106, pp. 20 - 27, May
P. T. Ormiston, Measuring Displacement with LVDT 1999.
Transducers, Electronic Engineering, Volume 50, Issue [lo] D. Crescini, A. Flammini, D. Marioli and A. Taroni,
608, pp. 69-71, June 1978. Application of an FFT-Based Algorithm to Signal
N. Gray, Simplifying LVDT Signal Conditioning, Processing of LVDT Position Sensors, IEEE Transactions
Machine Design, pp. 103 - 106, May 7, 1987. on Instrumentation and Measurement, Vol. 47, No. 5, pp.
S. Saxena and S. Seksena, A Self-compensated Smart 1119 - 1123, October 1998.
LVDT Transducer, IEEE Transactions on [l 11 S. Haykin, Communication Systems, Td edition, Wiley,
Instrumentation and Measurement, Vol. 38, No. 3, pp. 1983.
748 - 753, June 1989. [121 Collins 4-Wire Specification Sheet, Model #A5451.
J. Sylvan, Monolithic Signal Conditioner Simplifies [131 Schaevitz 5-Wire Specification Sheet, Model #2000-HR.
Displacement Sensing, Electronic Engineering, Volume
62, Issue 759, pp. 41 - 46, March 1990.
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