Ucc 27321
Ucc 27321
Ucc 27321
UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016
Block Diagram
VDD 1 8 VDD
INVERTING
7 OUT
VDD
NON--
IN 2 INVERTING 6 OUT
RENBL
ENBL 3 100 kΩ
AGND 4
5 PGND
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com
Table of Contents
1 Features .................................................................. 1 8.4 Device Functional Modes........................................ 14
2 Applications ........................................................... 1 9 Application and Implementation ........................ 15
3 Description ............................................................. 1 9.1 Application Information............................................ 15
4 Revision History..................................................... 2 9.2 Typical Application ................................................. 15
5 Description (continued)......................................... 3 10 Power Supply Recommendations ..................... 19
6 Pin Configuration and Functions ......................... 3 11 Layout................................................................... 19
11.1 Layout Guidelines ................................................. 19
7 Specifications......................................................... 4
11.2 Layout Example .................................................... 20
7.1 Absolute Maximum Ratings ...................................... 4
11.3 Thermal Information .............................................. 20
7.2 ESD Ratings.............................................................. 4
7.3 Recommended Operating Conditions....................... 4 12 Device and Documentation Support ................. 21
7.4 Thermal Information .................................................. 4 12.1 Device Support...................................................... 21
7.5 Electrical Characteristics........................................... 5 12.2 Documentation Support ........................................ 21
7.6 Switching Characteristics .......................................... 6 12.3 Related Links ........................................................ 21
7.7 Power Dissipation Ratings ........................................ 6 12.4 Community Resources.......................................... 21
7.8 Typical Characteristics .............................................. 8 12.5 Trademarks ........................................................... 21
12.6 Electrostatic Discharge Caution ............................ 22
8 Detailed Description ............................................ 12
12.7 Glossary ................................................................ 22
8.1 Overview ................................................................. 12
8.2 Functional Block Diagram ....................................... 12 13 Mechanical, Packaging, and Orderable
8.3 Feature Description................................................. 12
Information ........................................................... 22
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
• Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................. 1
5 Description (continued)
Using a design that inherently minimizes shoot-through current, the outputs of these can provide high gate drive
current where it is most needed at theMiller plateau region during the MOSFET switching transition. A unique
hybrid output stage paralleling bipolar and MOSFET transistors (TrueDrive) allows efficient current delivery at low
supply voltages. With this drive architecture, UCC3732x can be used in industry standard 6-A, 9-A and many 12-
A driver applications. Latch up and ESD protection circuitries are also included. Finally, the UCC3732x provides
an enable (ENBL) function to have better control of the operation of the driver applications. ENBL is implemented
on pin 3, which was previously left unused in the industry standard pinout. It is internally pulled up to VDD for
active high logic and can be left open for standard operation.
In addition to the 8-pin SOIC (D) and 8-pin PDIP (P) package offerings, the UCC3732x also comes in the
thermally enhanced but tiny 8-pin MSOP PowerPAD™ (DGN) package. The PowerPAD package drastically
lowers the thermal resistance to extend the temperature operation range and improve the long-term reliability.
VDD 1 8 VDD
IN 2 7 OUT
ENBL 3 6 OUT
AGND 4 5 PGND
Pin Functions
PIN
I/O DESCRIPTION
NAME NO.
The AGND and the PGND must be connected by a single thick trace directly under the
device. There must be a low ESR, low ESL capacitor of 0.1 µF between VDD (pin 8) and
PGND and a separate 0.1-µF capacitor between VDD (pin 1) and AGND. The power
AGND 4 —
MOSFETs must be located on the PGND side of the device while the control circuit must be
on the AGND side of the device. The control circuit ground must be common with the AGND
while the PGND must be common with the source of the power FETs.
Enable input for the driver with logic compatible threshold and hysteresis. The driver output
can be enabled and disabled with this pin. It is internally pulled up to VDD with 100-kΩ
ENBL 3 I
resistor for active high operation. When the device is disabled, the output state is, low
regardless of the input state.
IN 2 I Input signal of the driver which has logic compatible threshold and hysteresis.
Driver outputs that must be connected together externally. The output stage is capable of
OUT 6, 7 O
providing 9-A peak drive current to the gate of a power MOSFET.
Common ground for output stage. This ground must be connected very closely to the source
PGND 5 — of the power MOSFET which the driver is driving. Grounds are separated to minimize ringing
affects due to output switching di/dt which can affect the input threshold.
Supply voltage and the power input connections for this device. Two pins must be connected
VDD 1, 8 I
together externally.
7 Specifications
7.1 Absolute Maximum Ratings
(1) (2)
over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
Supply voltage, VDD –0.3 16 V
Output current (OUT) DC, IOUT_DC 0.6 A
Input voltage (IN), VIN –0.3 6 V or VDD + 0.3 (3) V
Enable voltage (ENBL) –0.3 6 V or VDD + 0.3 (3) V
D package 650 mW
Power dissipation at TA = 25°C DGN package 3 W
P package 350 mW
Lead temperature (soldering, 10 s) 300 °C
Junction operating temperature, TJ –55 150 °C
Storage temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating ConditionsRecommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may
affect device reliability.
(2) All voltages are with respect to GND. Currents are positive into, negative out of the specified terminal.
(3) Whichever is larger
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(1) 125°C operating junction temperature is used for power rating calculations
(2) The range of values indicates the effect of the printed-circuit-board. These values are intended to give the system designer an indication
of the best and worst case conditions. In general, the system designer should attempt to use larger traces on the printed-circuit-board
where possible to spread the heat away form the device more effectively. For additional information on device temperature
management, see the Packaging Information section of the Power Supply Control Products Data Book, (SLUD003).
(a) ( b)
5V
0V
tD1 tD2 tD1 tD2
tF
VDD
80% 80% 80% 80%
tR tR tF
OUT OUT
20% 20%
0V
The 20% and 80% thresholds depict the dynamics of the BiPolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.
Figure 1. Switching Waveforms for (a) Inverting Input to (b) Output Times
5V
0V
tD3 tD4
VDD
80% 80%
OUT tR tF
20%
0V
The 20% and 80% thresholds depict the dynamics of the BiPolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.
700 700
600 600
ENBL = 0V
IDD – InputCurrentIdle – μA
IDD – InputCurrentIdle – μA
IN = 5V ENBL = 0V
500 500 IN = 5V
400 400
ENBL = VDD
IN = 5V
ENBL = 0V
300 300 IN = 0V
ENBL = 0V ENBL = VDD
IN = 0V IN = 5V
200 200
ENBL = VDD , IN = 0V
100 100
ENBL = VDD , IN = 0V
0 0
0 2 4 6 8 10 12 14 16 0 2 4 6 8 10 12 14 16
VDD – Supply Voltage – V VDD – Supply Voltage – V
Figure 3. Input Current Idle vs Supply Voltage (UCCx7321) Figure 4. Input Current Idle vs Supply Voltage (UCCx7322)
800 800
IDD – InputCurrentIdle – μA
600 ENBL = HI 600
ENBL = LO ENBL = HI IN = LO
IN = HI IN = HI ENBL = LOW
500 500 IN = HIIGH
400 400
100 100
0 0
-- 50 -- 25 0 25 50 75 100 125 -- 50 -- 25 0 25 50 100 75 125
TJ – Temperature – °C TJ – Temperature – °C
Figure 5. Input Current Idle vs Temperature (UCCx7321) Figure 6. Input Current Idle vs Temperature (UCCx7322)
70 70
CLOAD = 10 n F C LOAD = 10 nF
60 60
50 tA = – 40°C 50
tR – Fall Time – ns
tR – Rise Time – ns
40 40
tA = 105°C
tA = 25°C
30 30 tA = 105°C
tA = 25°C
20 20
10 tA = 0°C 10 tA = 0°C
tA = –40°C
0 0
4 6 8 10 12 14 16 4 6 8 10 12 14 16
VDD – Supply Voltage – V VDD -- Supply Voltage -- V
Figure 7. Rise Time vs Supply Voltage Figure 8. Fall Time vs Supply Voltage
VDD = 5 V
VDD = 5 V
160
30 VDD = 10 V
VDD = 10 V VDD = 15 V
tR – Rise Time – ns
tR – Fall Time – ns
VDD = 15 V 120
20
80
10
40
0 0
0.1 1 10 0.1 1 10
CLOAD –- Load Capacitance – nF CLOAD – Load Capacitance – nF
Figure 9. Rise Time vs Load Capacitance Figure 10. Fall Time vs Output Capacitance
70 70
CLOAD = 10 n F CLOAD = 10 n F
60 60 tA = 105°C
tA = 105°C
tA = 25°C
tD1 -– Delay Time -- ns
50 50
40 40
30 30
tA = 0°C
20 20
tA = –40°C tA = –40°C
10 tA = 0°C 10
0 0
4 6 8 10 12 14 16 4 6 8 10 12 14 16
VDD – Supply Voltage – V VDD – Supply Voltage – V
Figure 11. tD1 Delay Time vs Supply Voltage Figure 12. tD2 Delay Time vs Supply Voltage
70 70
VDD = 5 V
60 60
50
tD2 – Delay Time – ns
50
tD1 – Delay Time –- ns
VDD = 5 V VDD = 10 V
40 40
30 30
VDD = 15 V VDD = 10 V
20 20
VDD = 15 V
10 10
0 0
1 10 100 1 10 100
CLOAD – Load Capacitance – nF CLOAD – Load Capacitance – nF
Figure 13. tD1 Delay Time vs Load Capacitance Figure 14. tD2 Delay Time vs Load Capacitance
35
1.7
30
25 1.6
20 VDD = 10 V
1.5
15
VDD = 4. 5 V
tFALL 1.4
10 tD1
1.3
5
0 1.2
0 5 10 15 --50 -- 25 0 25 50 75 100 125
VIN(peak) – Peak Input Voltage – V TJ – Temperature – °C
Figure 15. Propagation Times vs Peak Input Voltage Figure 16. Input Threshold vs Temperature
3.0 150
140
ENBL -- ON
2.5
Enable thresholdand hysteresis – V
130
1.5 100
90
1.0
80
ENBL -- OFF
70
0.5
ENBL -- HYSTERESIS 60
0 50
-- 50 -- 25 0 25 50 75 100 125 -- 50 --25 0 25 50 75 100 125
TJ – Temperature –°C TJ – Temperature – °C
Figure 17. Enable Threshold and Hysteresis vs Temperature Figure 18. Enable Resistance vs Temperature
IN = GND IN = GND
ENBL = V DD ENBL = VDD
VDD – Input Voltage – V
VDD – Input Voltage – V
1 V/div
1 V/div
OUT
VDD
OUT
0V 0V
VDD
Figure 19. Output Behavior vs VDD (UCC37321) Figure 20. Output Behavior vs VDD (UCC37321)
IN = VDD IN = VDD
ENBL = VDD ENBL = VDD
VDD – Supply Voltage – V
1 V/div
VDD
OUT OUT
0V 0V
Figure 21. Output Behavior vs VDD (Inverting) Figure 22. Output Behavior vs VDD (Inverting)
IN = GND IN = GND
ENBL = VDD ENBL = VDD
VDD – Supply Voltage – V
1 V/div
OUT
OUT
0V 0V
Figure 23. Output Behavior vs VDD (Noninverting) Figure 24. Output Behavior vs VDD (Noninverting)
8 Detailed Description
8.1 Overview
The UCC37321 and UCC37322 drivers serve as an interface between low-power controllers and power
MOSFETs. They can also be used as an interface between DSPs and power MOSFETs. High-frequency power
supplies often require high-speed, high-current drivers such as the UCC3732x family. A leading application is the
need to provide a high power buffer stage between the PWM output of the control device and the gates of the
primary power MOSFET or IGBT switching devices. In other cases, the device drives the power device gates
through a drive transformer. Synchronous rectification supplies must simultaneously drive multiple devices which
can present an extremely large load to the control circuitry.
The inverting driver (UCC37321) is useful for generating inverted gate drive signals from controllers that have
only outputs of the opposite polarity. For example, this driver can provide a gate signal for ground referenced,
N-channel synchronous rectifier MOSFETs in buck derived converters. This driver can also be used for
generating a gate drive signal for a P-channel MOSFET from a controller that is designed for N-channel
applications.
MOSFET gate drivers are generally used when it is not feasible to have the primary PWM regulator device
directly drive the switching devices for one or more reasons. The PWM device may not have the brute drive
capability required for the intended switching MOSFET, limiting the switching performance in the application. In
other cases there may be a desire to minimize the effect of high-frequency switching noise by placing the high
current driver physically close to the load. Also, newer devices that target the highest operating frequencies may
not incorporate onboard gate drivers at all. Their PWM outputs are only intended to drive the high impedance
input to a driver such as the UCC3732x. Finally, the control device may be under thermal stress due to power
dissipation, and an external driver can help by moving the heat from the controller to an external package.
VDD 1 8 VDD
INVERTING
7 OUT
VDD
NON--
IN 2 INVERTING 6 OUT
RENBL
ENBL 3 100 kΩ
AGND 4
5 PGND
UCC37321
4 AGND PGND 5
VSNS
RSNS
1 μF 100 μF 0.1 Ω
CER AL EL
UDG-- 01113
The circuit in Figure 26 is used to test the current source capability with the output clamped to around 5 V with a
string of Zener diodes. The UCC37321 is found to source 9 A at VDD = 15 V.
VDD
UCC37321
4 AGND PGND 5
VSNS
RSNS
1μ F 100 μF 0.1 Ω
CER AL EL
UDG-- 01114
Note that the current sink capability is slightly stronger than the current source capability at lower VDD. This is
due to the differences in the structure of the bipolar-MOSFET power output section, where the current source is
a P-channel MOSFET and the current sink has an N-channel MOSFET.
In most it is advantageous that the turnoff capability of a driver is stronger than the turnon capability. This helps
to ensure that the MOSFET is held OFF during common power supply transients which may turn the device back
ON.
8.3.4 Enable
The UCC37321/2 provides an enable input for improved control of the driver operation. This input also
incorporates logic compatible thresholds with hysteresis. It is internally pulled up to VDD with 100-kΩ resistor for
active high operation. When ENBL is high, the device is enabled and when ENBL is low, the device is disabled.
The default state of the ENBL pin is to enable the device and therefore it can be left open for standard operation.
The output state when the device is disabled is low regardless of the input state. See Table 1 for the operation
using enable logic.
ENBL input is compatible with both logic signals and slow changing analog signals. It can be directly driven or a
power-up delay can be programmed with a capacitor between ENBL and AGND.
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8 VDD 6 Q1
OUT
1 VDD OUT 7
C2 R4
UCC27322D
2 4
IN AGND
INPUT 3 5
ENBL PGND
ENABLE
(1) dVDS/dt is a typical requirement for a given design. This value can
be used to find the peak source/sink currents needed as shown in
Peak Source and Sink Currents.
To achieve the targeted Dvds/dt, the gate driver must be capable of providing the Qgd charge in 20 ns or less. In
other words, a peak current of 1.65 A (= 33 nC) / 20 ns) or higher must be provided by the gate driver. The
UCC2732x and UCC3732x devices can provide 9-A peak sourcing/sinking current which clearly exceeds the
design requirement and has the capability to meet the switching speed needed. This 9-A peak sourcing/sinking
current provides an extra margin against part-to-part variations in the Qgd parameter of the power MOSFET along
with additional flexibility to insert external gate resistors and fine tune the switching speed for efficiency versus
EMI optimizations. However, in practical designs the parasitic trace in the gate driver circuit of the PCB will have
a definitive role to play on the power MOSFET switching speed. The effort of this trace inductance is to limit the
di/dt of the output current pulse of the gate driver. To illustrate this effect, consider output current pulse waveform
from the gate driver to be approximated to a triangular profile, where the area under the triangle (0.5 × IPEAK ×
time) would equal the total gate charge of the power MOSFET (Qg parameter in SPP20N60C3 power MOSFET
data sheet= 87 nC typically). If the parasitic trace inductance limits the di/dt then a situation may occur in which
the full peak current capability of the gate driver is not fully achieved in the time required to deliver the Qg
required for the power MOSFET switching. In other words, the time parameter in the equation would dominate
and the IPEAK value of the current pulse would be much less than the true peak current capability of the device,
while the required Qg is still delivered. Because of this, the desired switching speed may not be realized, even
when theoretical calculations indicate the gate driver can achieve the targeted witching speed. Thus, placing the
gate driver device very close to the power MOSFET and designing a tight gate drive-loop with minimal PCB trace
inductance is important to realize the full peak-current capability of the gate driver.
There is an equal amount of energy transferred to ground when the capacitor is discharged. This leads to a
power loss given by Equation 2.
1
P = 2 ´ CV2f
2
where
• f is the switching frequency (2)
This power is dissipated in the resistive elements of the circuit. Thus, with no external resistor between the driver
and gate, this power is dissipated inside the driver. Half of the total power is dissipated when the capacitor is
charged, and the other half is dissipated when the capacitor is discharged. An example using the conditions of
the previous gate-drive waveform should help clarify this.
With VDD = 12 V, CLOAD = 10 nF, and f = 300 kHz, the power loss can be calculated as shown in Equation 4.
P = 10 nF × (12)2 × (300 kHz) = 0.432 W (3)
With a 12-V supply, this would equate, as shown in Equation 4, to a current of:
P 0.432 W
I= = = 0.036A
V 12 V (4)
The switching load presented by a power MOSFETcan be converted to an equivalent capacitance by examining
the gate charge required to switch the device. This gate charge includes the effects of the input capacitance plus
the added charge needed to swing the drain of the device between the ON and OFF states. Most manufacturers
provide specifications that provide the typical and maximum gate charge, in nC, to switch the device under
specified conditions. Using the gate charge Qg, one can determine the power that must be dissipated when
charging a capacitor. This is done by using the equivalence Qg = CeffV to provide Equation 5 for power.
P = C × V2 × f = Qg × V × f (5)
Equation 5 allows a power designer to calculate the bias power required to drive a specific MOSFET gate at a
specific bias voltage.
IN = VDD IN = VDD
ENBL = VDD ENBL = VDD
VDD – Input Voltage – V
1 V/div
VDD
VDD
OUT OUT
0V 0V
Figure 28. Output Behavior vs VDD (UCC37322) Figure 29. Output Behavior vs VDD (UCC37322)
11 Layout
12.5 Trademarks
PowerPAD, E2E are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.
12.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
www.ti.com 6-Feb-2020
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
UCC27321D ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321DGN ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321DGNR ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321DR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321P ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27321P
(RoHS)
UCC27321PE4 ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27321P
(RoHS)
UCC27322D ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DGN ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DGNR ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DRG4 ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322P ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27322P
(RoHS)
UCC27322PE4 ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27322P
(RoHS)
UCC37321D ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)
UCC37321DGN ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)
UCC37321DGNR ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)
UCC37321DR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 6-Feb-2020
Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Addendum-Page 2
PACKAGE OPTION ADDENDUM
www.ti.com 6-Feb-2020
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
• Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
• Enhanced Product - Supports Defense, Aerospace and Medical Applications
Addendum-Page 3
PACKAGE MATERIALS INFORMATION
www.ti.com 6-Sep-2019
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 6-Sep-2019
Pack Materials-Page 2
PACKAGE OUTLINE
D0008A SCALE 2.800
SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
SEATING PLANE
.228-.244 TYP
[5.80-6.19]
.004 [0.1] C
A PIN 1 ID AREA
6X .050
[1.27]
8
1
.189-.197 2X
[4.81-5.00] .150
NOTE 3 [3.81]
4X (0 -15 )
4
5
8X .012-.020
B .150-.157 [0.31-0.51]
.069 MAX
[3.81-3.98] .010 [0.25] C A B [1.75]
NOTE 4
.005-.010 TYP
[0.13-0.25]
4X (0 -15 )
SEE DETAIL A
.010
[0.25]
.004-.010
0 -8 [0.11-0.25]
.016-.050
[0.41-1.27] DETAIL A
(.041) TYPICAL
[1.04]
4214825/C 02/2019
NOTES:
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed .006 [0.15] per side.
4. This dimension does not include interlead flash.
5. Reference JEDEC registration MS-012, variation AA.
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EXAMPLE BOARD LAYOUT
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55]
SYMM SEE
DETAILS
1
8
8X (.024)
[0.6] SYMM
(R.002 ) TYP
[0.05]
5
4
6X (.050 )
[1.27]
(.213)
[5.4]
EXPOSED
METAL EXPOSED
METAL
.0028 MAX .0028 MIN
[0.07] [0.07]
ALL AROUND ALL AROUND
4214825/C 02/2019
NOTES: (continued)
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EXAMPLE STENCIL DESIGN
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT
8X (.061 )
[1.55] SYMM
1
8
8X (.024)
[0.6] SYMM
(R.002 ) TYP
5 [0.05]
4
6X (.050 )
[1.27]
(.213)
[5.4]
4214825/C 02/2019
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
PACKAGE OUTLINE
TM
DGN0008G SCALE 4.000
PowerPAD VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE
C
5.05
A TYP
4.75 0.1 C
PIN 1 INDEX AREA SEATING
PLANE
6X 0.65
8
1
2X
3.1
1.95
2.9
NOTE 3
4
5 0.38
8X
0.25
3.1 0.13 C A B
B
2.9
NOTE 4
0.23
0.13
SEE DETAIL A
4
5
0.25
GAGE PLANE
2.15
1.95 9 1.1 MAX
8
1 0.7 0.15
0 -8 0.4 0.05
DETAIL A
A 20
1.846
TYPICAL
1.646
4225480/A 11/2019
PowerPAD is a trademark of Texas Instruments.
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-187.
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EXAMPLE BOARD LAYOUT
TM
DGN0008G PowerPAD VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE
(2)
NOTE 9
METAL COVERED
BY SOLDER MASK (1.846)
SYMM SOLDER MASK
DEFINED PAD
8X (1.4) (R0.05) TYP
8
8X (0.45) 1
(3)
9 SYMM NOTE 9
(2.15)
6X (0.65) (1.22)
5
4
( 0.2) TYP
VIA (0.55) SEE DETAILS
(4.4)
4225480/A 11/2019
NOTES: (continued)
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EXAMPLE STENCIL DESIGN
TM
DGN0008G PowerPAD VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE
(1.846)
BASED ON
0.125 THICK
STENCIL
SYMM
8
8X (0.45) 1
(2.15)
SYMM BASED ON
0.125 THICK
STENCIL
6X (0.65)
4 5
4225480/A 11/2019
NOTES: (continued)
10. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
11. Board assembly site may have different recommendations for stencil design.
www.ti.com
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