Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                
0% found this document useful (0 votes)
73 views36 pages

Ucc 27321

Download as pdf or txt
Download as pdf or txt
Download as pdf or txt
You are on page 1/ 36

Product Sample & Technical Tools & Support &

Folder Buy Documents Software Community

UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

UCC2732x/UCC3732x Single 9-A High-Speed Low-Side Mosfet Driver With Enable


1 Features 2 Applications
1• Industry-Standard Pin-Out With Addition of Enable • Switch Mode Power Supplies
Function • DC-DC Converters
• High-Peak Current Drive Capability of ±9 A at • Motor Controllers
theMiller plateau region Using TrueDrive • Class-D Switching Amplifiers
• Efficient Constant Current Sourcing Using a • Line Drivers
Unique BiPolar and CMOS Output Stage
• Pulse Transformer Drivers
• TTL/CMOS Compatible Inputs Independent of
Supply Voltage 3 Description
• 20-ns Typical Rise and Fall Times With 10-nF The UCC2732x/UCC3732x family of high-speed
Load drivers deliver 9 A of peak drive current in an industry
• Typical Propagation Delay Times of 25 ns With standard pinout. These drivers can drive the largest
Input Falling and 35 ns With Input Rising of MOSFETs for systems requiring extreme Miller
current due to high dV/dt transitions. This eliminates
• 4-V to 15-V Supply Voltage
additional external circuits and can replace multiple
• Available in Thermally Enhanced MSOP components to reduce space, design complexity, and
PowerPAD™ Package With 4.7°C/W θjc assembly cost. Two standard logic options are
• Rated From –40°C to +105°C offered, inverting (UCC37321) and noninverting
• Pb-Free Finish (CU NIPDAU) on 8-pin SOIC and (UCC37322).
PDIP Packages
Device Information(1)
PART
PACKAGE BODY SIZE (NOM)
NUMBER
MSOP-PowerPAD (8) 3.00 mm × 3.00 mm
UCC2732x
SOIC (8) 3.91 mm × 4.90 mm
UCC3732x
PDIP (8) 6.35 mm × 9.81 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.

Block Diagram

VDD 1 8 VDD
INVERTING

7 OUT
VDD
NON--
IN 2 INVERTING 6 OUT

RENBL
ENBL 3 100 kΩ

AGND 4
5 PGND

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

Table of Contents
1 Features .................................................................. 1 8.4 Device Functional Modes........................................ 14
2 Applications ........................................................... 1 9 Application and Implementation ........................ 15
3 Description ............................................................. 1 9.1 Application Information............................................ 15
4 Revision History..................................................... 2 9.2 Typical Application ................................................. 15
5 Description (continued)......................................... 3 10 Power Supply Recommendations ..................... 19
6 Pin Configuration and Functions ......................... 3 11 Layout................................................................... 19
11.1 Layout Guidelines ................................................. 19
7 Specifications......................................................... 4
11.2 Layout Example .................................................... 20
7.1 Absolute Maximum Ratings ...................................... 4
11.3 Thermal Information .............................................. 20
7.2 ESD Ratings.............................................................. 4
7.3 Recommended Operating Conditions....................... 4 12 Device and Documentation Support ................. 21
7.4 Thermal Information .................................................. 4 12.1 Device Support...................................................... 21
7.5 Electrical Characteristics........................................... 5 12.2 Documentation Support ........................................ 21
7.6 Switching Characteristics .......................................... 6 12.3 Related Links ........................................................ 21
7.7 Power Dissipation Ratings ........................................ 6 12.4 Community Resources.......................................... 21
7.8 Typical Characteristics .............................................. 8 12.5 Trademarks ........................................................... 21
12.6 Electrostatic Discharge Caution ............................ 22
8 Detailed Description ............................................ 12
12.7 Glossary ................................................................ 22
8.1 Overview ................................................................. 12
8.2 Functional Block Diagram ....................................... 12 13 Mechanical, Packaging, and Orderable
8.3 Feature Description................................................. 12
Information ........................................................... 22

4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.

Changes from Revision G (May 2013) to Revision H Page

• Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................. 1

Changes from Revision F (March 2012) to Revision G Page

• Updated AGND pin description. ............................................................................................................................................ 3


• Changed minimum value for input voltage from –5 to –0.3 V in the Absolute Maximum Ratings table. ............................... 4
• Added CLOAD = 10 nF to Fall Time vs Supply Voltage graph ................................................................................................. 8
• Changed Changed x-axis values from 1, 10, 100 to 0.1, 1, 10 in Rise Time vs Load Capacitance graph ........................... 8
• Changed Changed x-axis values from 1, 10, 100 to 0.1, 1, 10 in Fall Time vs Output Capacitance graph .......................... 8

2 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

5 Description (continued)
Using a design that inherently minimizes shoot-through current, the outputs of these can provide high gate drive
current where it is most needed at theMiller plateau region during the MOSFET switching transition. A unique
hybrid output stage paralleling bipolar and MOSFET transistors (TrueDrive) allows efficient current delivery at low
supply voltages. With this drive architecture, UCC3732x can be used in industry standard 6-A, 9-A and many 12-
A driver applications. Latch up and ESD protection circuitries are also included. Finally, the UCC3732x provides
an enable (ENBL) function to have better control of the operation of the driver applications. ENBL is implemented
on pin 3, which was previously left unused in the industry standard pinout. It is internally pulled up to VDD for
active high logic and can be left open for standard operation.
In addition to the 8-pin SOIC (D) and 8-pin PDIP (P) package offerings, the UCC3732x also comes in the
thermally enhanced but tiny 8-pin MSOP PowerPAD™ (DGN) package. The PowerPAD package drastically
lowers the thermal resistance to extend the temperature operation range and improve the long-term reliability.

6 Pin Configuration and Functions

P, D, and DGN Packages


8-Pin PDIP, SOIC, and MSOP With PowerPAD
Top View

VDD 1 8 VDD
IN 2 7 OUT
ENBL 3 6 OUT
AGND 4 5 PGND

Pin Functions
PIN
I/O DESCRIPTION
NAME NO.
The AGND and the PGND must be connected by a single thick trace directly under the
device. There must be a low ESR, low ESL capacitor of 0.1 µF between VDD (pin 8) and
PGND and a separate 0.1-µF capacitor between VDD (pin 1) and AGND. The power
AGND 4 —
MOSFETs must be located on the PGND side of the device while the control circuit must be
on the AGND side of the device. The control circuit ground must be common with the AGND
while the PGND must be common with the source of the power FETs.
Enable input for the driver with logic compatible threshold and hysteresis. The driver output
can be enabled and disabled with this pin. It is internally pulled up to VDD with 100-kΩ
ENBL 3 I
resistor for active high operation. When the device is disabled, the output state is, low
regardless of the input state.
IN 2 I Input signal of the driver which has logic compatible threshold and hysteresis.
Driver outputs that must be connected together externally. The output stage is capable of
OUT 6, 7 O
providing 9-A peak drive current to the gate of a power MOSFET.
Common ground for output stage. This ground must be connected very closely to the source
PGND 5 — of the power MOSFET which the driver is driving. Grounds are separated to minimize ringing
affects due to output switching di/dt which can affect the input threshold.
Supply voltage and the power input connections for this device. Two pins must be connected
VDD 1, 8 I
together externally.

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 3


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

7 Specifications
7.1 Absolute Maximum Ratings
(1) (2)
over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
Supply voltage, VDD –0.3 16 V
Output current (OUT) DC, IOUT_DC 0.6 A
Input voltage (IN), VIN –0.3 6 V or VDD + 0.3 (3) V
Enable voltage (ENBL) –0.3 6 V or VDD + 0.3 (3) V
D package 650 mW
Power dissipation at TA = 25°C DGN package 3 W
P package 350 mW
Lead temperature (soldering, 10 s) 300 °C
Junction operating temperature, TJ –55 150 °C
Storage temperature, Tstg –65 150 °C

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating ConditionsRecommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may
affect device reliability.
(2) All voltages are with respect to GND. Currents are positive into, negative out of the specified terminal.
(3) Whichever is larger

7.2 ESD Ratings


VALUE UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2500
V(ESD) Electrostatic discharge Charged-device model (CDM), per JEDEC specification JESD22- V
±1500
C101 (2)

(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

7.3 Recommended Operating Conditions


over operating free-air temperature range (unless otherwise noted)
MIN NOM MAX UNIT
Supply voltage, VDD 4.5 15 V

7.4 Thermal Information


UCC27322 UCC27321
(1) DGN (MSOP-
THERMAL METRIC D (SOIC) P (PDIP) UNIT
PowerPAD)
8 PINS 8 PINS 8 PINS
RθJA Junction-to-ambient thermal resistance 56.6 55.9 56.7 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 52.8 45.3 52.9 °C/W
RθJB Junction-to-board thermal resistance 32.6 32.6 32.7 °C/W
ψJT Junction-to-top characterization parameter 1.8 23.0 1.8 °C/W
ψJB Junction-to-board characterization parameter 32.3 32.5 32.4 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance 5.9 — 5.9 °C/W

(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.

4 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

7.5 Electrical Characteristics


VDD = 4.5 V to 15 V, TA = –40°C to +105°C for UCC2732x, TA = 0°C to 70°C for UCC3732x, TA = TJ, unless otherwise noted.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
INPUT (IN)
VIN_H, logic 1 input threshold 2 V
VIN_L, logic 0 input threshold 1 V
Input current 0 V ≤ VIN ≤ VDD –10 0 10 µA
OUTPUT (OUT)
Peak output current (1) (2) VDD = 14 V, 9 A
VOH, output high level VOH = VDD – VOUT, IOUT = –10 mA 150 300 mV
VOL, output low level IOUT = 10 mA 11 25 mV
Output resistance high (3) IOUT = –10 mA, VDD = 14 V 15 25 Ω
Output resistance low (3) IOUT = 10 mA, VDD = 14 V 1.1 2.2 Ω
(1)
Latch--up protection 500 mA
OVERALL
IN = LOW, EN = LOW, VDD = 15 V 150 225
UCC37321 IN = HIGH, EN = LOW, VDD = 15 V 440 650
UCC27321 IN = LOW, EN = HIGH, VDD = 15 V 370 550
IN = HIGH, EN = HIGH, VDD = 15 V 370 550
IDD, static operating current µA
IN = LOW, EN = LOW, VDD = 15 V 150 225
UCC37322 IN = HIGH, EN = LOW, VDD = 15 V 450 650
UCC27322 IN = LOW, EN = HIGH, VDD = 15 V 75 125
IN = HIGH, EN = HIGH, VDD = 15 V 675 1000
ENABLE (ENBL)
VIN_H, high-level input voltage LOW to HIGH transition 1.7 2.2 2.7 V
VIN_L, low-level input voltage HIGH to LOW transition 1.1 1.6 2
V
Hysteresis 0.25 0.55 0.90
RENBL, enable impedance VDD = 14 V, ENBL = GND 75 100 135 kΩ

(1) Ensured by design. Not tested in production.


(2) The pullup and pulldown circuits of the driver are bipolar and MOSFET transistors in parallel. The peak output current rating is the
combined current from the bipolar and MOSFET transistors.
(3) The pullup and pulldown circuits of the driver are bipolar and MOSFET transistors in parallel. The output resistance is the RDS(ON) of the
MOSFET transistor when the voltage on the driver output is less than the saturation voltage of the bipolar transistor.

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 5


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

7.6 Switching Characteristics


over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ENABLE (ENBL)
tD3, propagation delay time (1) CLOAD = 10 nF 60 90 ns
tD4, propagation delay time (1) CLOAD = 10 nF 60 90 ns
SWITCHING TIME (2)
tR, rise time (OUT) CLOAD = 10 nF 20 70 ns
tF, fall time (OUT) CLOAD = 10 nF 20 30 ns
tD1, propagation delay, IN rising (IN to OUT) CLOAD = 10 nF 25 70 ns
tD2, propagation delay, IN falling (IN to OUT) CLOAD = 10 nF 35 70 ns

(1) See Figure 2.


(2) See Figure 1 for switching waveforms.

7.7 Power Dissipation Ratings


Power Rating Derating Factor
PACKAGE SUFFIX θjc (°C/W) θja (°C/W) (mW) Above
TA = 70°C (1) 70°C (mW/°C) (1)
SOIC-8 D 42 84 to 160 (2) 344 to 655 (2) 6.25 to 11.9 (2)
PDIP-8 P 49 110 500 9
MSOP PowerPAD-8 DGN 4.7 50 to 59 1370 17.1

(1) 125°C operating junction temperature is used for power rating calculations
(2) The range of values indicates the effect of the printed-circuit-board. These values are intended to give the system designer an indication
of the best and worst case conditions. In general, the system designer should attempt to use larger traces on the printed-circuit-board
where possible to spread the heat away form the device more effectively. For additional information on device temperature
management, see the Packaging Information section of the Power Supply Control Products Data Book, (SLUD003).

(a) ( b)

5V

IN VTH VTH IN VTH VTH

0V
tD1 tD2 tD1 tD2
tF
VDD
80% 80% 80% 80%
tR tR tF
OUT OUT

20% 20%
0V

The 20% and 80% thresholds depict the dynamics of the BiPolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.

Figure 1. Switching Waveforms for (a) Inverting Input to (b) Output Times

6 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

5V

ENBL VIN_H VIN_L

0V
tD3 tD4

VDD
80% 80%

OUT tR tF

20%
0V
The 20% and 80% thresholds depict the dynamics of the BiPolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.

Figure 2. Switching Waveform for Enable to Output

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 7


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

7.8 Typical Characteristics

700 700

600 600
ENBL = 0V
IDD – InputCurrentIdle – μA

IDD – InputCurrentIdle – μA
IN = 5V ENBL = 0V
500 500 IN = 5V

400 400
ENBL = VDD
IN = 5V
ENBL = 0V
300 300 IN = 0V
ENBL = 0V ENBL = VDD
IN = 0V IN = 5V
200 200
ENBL = VDD , IN = 0V

100 100

ENBL = VDD , IN = 0V
0 0
0 2 4 6 8 10 12 14 16 0 2 4 6 8 10 12 14 16
VDD – Supply Voltage – V VDD – Supply Voltage – V

Figure 3. Input Current Idle vs Supply Voltage (UCCx7321) Figure 4. Input Current Idle vs Supply Voltage (UCCx7322)
800 800

700 700 ENBL = HIIGH


IN =HIIGH
IDD – InputCurrentIdle – μA

IDD – InputCurrentIdle – μA
600 ENBL = HI 600
ENBL = LO ENBL = HI IN = LO
IN = HI IN = HI ENBL = LOW
500 500 IN = HIIGH

400 400

ENBL = LO 300 ENBL = LOW


300 ENBL = HIIGH
IN = LO IN = LOW
IN = LOW
200 200

100 100

0 0
-- 50 -- 25 0 25 50 75 100 125 -- 50 -- 25 0 25 50 100 75 125
TJ – Temperature – °C TJ – Temperature – °C

Figure 5. Input Current Idle vs Temperature (UCCx7321) Figure 6. Input Current Idle vs Temperature (UCCx7322)
70 70
CLOAD = 10 n F C LOAD = 10 nF

60 60

50 tA = – 40°C 50
tR – Fall Time – ns
tR – Rise Time – ns

40 40
tA = 105°C
tA = 25°C
30 30 tA = 105°C
tA = 25°C

20 20

10 tA = 0°C 10 tA = 0°C
tA = –40°C

0 0
4 6 8 10 12 14 16 4 6 8 10 12 14 16
VDD – Supply Voltage – V VDD -- Supply Voltage -- V

Figure 7. Rise Time vs Supply Voltage Figure 8. Fall Time vs Supply Voltage

8 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

Typical Characteristics (continued)


40 200

VDD = 5 V
VDD = 5 V
160
30 VDD = 10 V

VDD = 10 V VDD = 15 V
tR – Rise Time – ns

tR – Fall Time – ns
VDD = 15 V 120

20

80

10
40

0 0
0.1 1 10 0.1 1 10
CLOAD –- Load Capacitance – nF CLOAD – Load Capacitance – nF

Figure 9. Rise Time vs Load Capacitance Figure 10. Fall Time vs Output Capacitance
70 70
CLOAD = 10 n F CLOAD = 10 n F
60 60 tA = 105°C

tA = 105°C
tA = 25°C
tD1 -– Delay Time -- ns

50 50

tD2 – Delay Time -- ns


tA = 25°C

40 40

30 30
tA = 0°C
20 20

tA = –40°C tA = –40°C
10 tA = 0°C 10

0 0
4 6 8 10 12 14 16 4 6 8 10 12 14 16
VDD – Supply Voltage – V VDD – Supply Voltage – V

Figure 11. tD1 Delay Time vs Supply Voltage Figure 12. tD2 Delay Time vs Supply Voltage
70 70

VDD = 5 V
60 60

50
tD2 – Delay Time – ns

50
tD1 – Delay Time –- ns

VDD = 5 V VDD = 10 V

40 40

30 30
VDD = 15 V VDD = 10 V
20 20
VDD = 15 V

10 10

0 0
1 10 100 1 10 100
CLOAD – Load Capacitance – nF CLOAD – Load Capacitance – nF

Figure 13. tD1 Delay Time vs Load Capacitance Figure 14. tD2 Delay Time vs Load Capacitance

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 9


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

Typical Characteristics (continued)


50 2.0
VDD = 15 V
45 CLOAD = 10 n F
tD2 TA = 25°C 1.9 VDD = 15 V
40

VON – Input Threshold Voltage – V


tRISE 1.8
Propagation Time -- ns

35
1.7
30

25 1.6

20 VDD = 10 V
1.5
15
VDD = 4. 5 V
tFALL 1.4
10 tD1
1.3
5

0 1.2
0 5 10 15 --50 -- 25 0 25 50 75 100 125
VIN(peak) – Peak Input Voltage – V TJ – Temperature – °C

Figure 15. Propagation Times vs Peak Input Voltage Figure 16. Input Threshold vs Temperature
3.0 150

140
ENBL -- ON
2.5
Enable thresholdand hysteresis – V

130

RENBL – Enable Resistance – Ω


120
2.0
110

1.5 100

90
1.0
80
ENBL -- OFF
70
0.5
ENBL -- HYSTERESIS 60

0 50
-- 50 -- 25 0 25 50 75 100 125 -- 50 --25 0 25 50 75 100 125
TJ – Temperature –°C TJ – Temperature – °C

Figure 17. Enable Threshold and Hysteresis vs Temperature Figure 18. Enable Resistance vs Temperature

IN = GND IN = GND
ENBL = V DD ENBL = VDD
VDD – Input Voltage – V
VDD – Input Voltage – V
1 V/div

1 V/div

OUT
VDD

OUT

0V 0V
VDD

10 nF Between Output and GND 10 nF Between Output and GND


50 μs/div 50 μs/div

Figure 19. Output Behavior vs VDD (UCC37321) Figure 20. Output Behavior vs VDD (UCC37321)

10 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

Typical Characteristics (continued)

IN = VDD IN = VDD
ENBL = VDD ENBL = VDD
VDD – Supply Voltage – V

VDD – Supply Voltage – V


VDD
1 V/div

1 V/div
VDD

OUT OUT

0V 0V

10 nF Between Output and GND 10 nF Between Output and GND


50 μs/div 50 μs/div

Figure 21. Output Behavior vs VDD (Inverting) Figure 22. Output Behavior vs VDD (Inverting)

IN = GND IN = GND
ENBL = VDD ENBL = VDD
VDD – Supply Voltage – V

VDD – Supply Voltage – V


VDD VDD
1 V/div

1 V/div
OUT
OUT

0V 0V

10 nF Between Output and GND 10 nF Between Output and GND


50 μs/div 50 μs/div

Figure 23. Output Behavior vs VDD (Noninverting) Figure 24. Output Behavior vs VDD (Noninverting)

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 11


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

8 Detailed Description

8.1 Overview
The UCC37321 and UCC37322 drivers serve as an interface between low-power controllers and power
MOSFETs. They can also be used as an interface between DSPs and power MOSFETs. High-frequency power
supplies often require high-speed, high-current drivers such as the UCC3732x family. A leading application is the
need to provide a high power buffer stage between the PWM output of the control device and the gates of the
primary power MOSFET or IGBT switching devices. In other cases, the device drives the power device gates
through a drive transformer. Synchronous rectification supplies must simultaneously drive multiple devices which
can present an extremely large load to the control circuitry.
The inverting driver (UCC37321) is useful for generating inverted gate drive signals from controllers that have
only outputs of the opposite polarity. For example, this driver can provide a gate signal for ground referenced,
N-channel synchronous rectifier MOSFETs in buck derived converters. This driver can also be used for
generating a gate drive signal for a P-channel MOSFET from a controller that is designed for N-channel
applications.
MOSFET gate drivers are generally used when it is not feasible to have the primary PWM regulator device
directly drive the switching devices for one or more reasons. The PWM device may not have the brute drive
capability required for the intended switching MOSFET, limiting the switching performance in the application. In
other cases there may be a desire to minimize the effect of high-frequency switching noise by placing the high
current driver physically close to the load. Also, newer devices that target the highest operating frequencies may
not incorporate onboard gate drivers at all. Their PWM outputs are only intended to drive the high impedance
input to a driver such as the UCC3732x. Finally, the control device may be under thermal stress due to power
dissipation, and an external driver can help by moving the heat from the controller to an external package.

8.2 Functional Block Diagram

VDD 1 8 VDD
INVERTING

7 OUT
VDD
NON--
IN 2 INVERTING 6 OUT

RENBL
ENBL 3 100 kΩ

AGND 4
5 PGND

8.3 Feature Description


8.3.1 Input Stage
The IN threshold has a 3.3-V logic sensitivity over the full range of VDD voltages; yet, it is equally compatible
with 0 V to VDD signals. The inputs of UCC3732x family of drivers are designed to withstand 500-mA reverse
current without either damage to the device or logic upset. In addition, the input threshold turnoff of the
UCC3732x has been slightly raised for improved noise immunity. The input stage of each driver must be driven
by a signal with a short rise or fall time. This condition is satisfied in typical power supply applications, where the
input signals are provided by a PWM controller or logic gates with fast transition times (< 200 ns). The IN input of
the driver functions as a digital gate, and it is not intended for applications where a slow changing input voltage is
used to generate a switching output when the logic threshold of the input section is reached. While this may not
be harmful to the driver, the output of the driver may switch repeatedly at a high frequency.

12 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

Feature Description (continued)


Users should not attempt to shape the input signals to the driver in an attempt to slow down (or delay) the signal
at the output. If limiting the rise or fall times to the power device is desired, then an external resistance can be
added between the output of the driver and the load device, which is generally a power MOSFET gate. The
external resistor may also help remove power dissipation from the device package, as discussed in Thermal
Information.

8.3.2 Output Stage


The TrueDrive output stage is capable of supplying ±9-A peak current pulses; it swings to both VDD and GND
and can encourage even the most stubborn MOSFETs to switch. The pullup and pulldown circuits of the driver
are constructed of bipolar and MOSFET transistors in parallel. The peak output current rating is the combined
current from the bipolar and MOSFET transistors. The output resistance is the RDS(ON) of the MOSFET transistor
when the voltage on the driver output is less than the saturation voltage of the bipolar transistor. Each output
stage also provides a very low impedance to overshoot and undershoot due to the body diode of the internal
MOSFET. This means that in many cases, external-schottky-clamp diodes are not required.
This unique BiPolar and MOSFET hybrid output architecture (TrueDrive) allows efficient current sourcing at low
supply voltages. The UCC3732x family delivers 9 A of gate drive where it is most needed during the MOSFET
switching transition – at the Miller plateau region – providing improved efficiency gains.

8.3.3 Source and Sink Capabilities during Miller Plateau


Large power MOSFETs present a significant load to the control circuitry. Proper drive is required for efficient,
reliable operation. The UCC3732x drivers have been optimized to provide maximum drive to a power MOSFET
during the Miller plateau region of the switching transition. This interval occurs while the drain voltage is swinging
between the voltage levels dictated by the power topology, requiring the charging or discharging of the drain-gate
capacitance with current supplied or removed by the driver device.
Two circuits are used to test the current capabilities of the UCC3732x driver (see Reference (1)) . In each case
external circuitry is added to clamp the output near 5 V while the device is sinking or sourcing current. An input
pulse of 250 ns is applied at a frequency of 1 kHz in the proper polarity for the respective test. In each test there
is a transient period where the current peaked up and then settled down to a steady-state value. The noted
current measurements are made at a time of 200 ns after the input pulse is applied, after the initial transient.
The circuit in Figure 25 is used to verify the current sink capability when the output of the driver is clamped
around 5 V, a typical value of gate-source voltage during the Miller plateau region. The UCC37321 is found to
sink 9 A at VDD = 15 V.
VDD

UCC37321

INPUT 1 VDD VDD 8


DSCHOTTKY 10 Ω
IN OUT
2 7
C2 C3 + VSUPPLY
OUT
3 ENBL 6 1 μF 100 μF 5.5 V

4 AGND PGND 5
VSNS

RSNS
1 μF 100 μF 0.1 Ω
CER AL EL

UDG-- 01113

Figure 25. Sink Current Test Circuit

The circuit in Figure 26 is used to test the current source capability with the output clamped to around 5 V with a
string of Zener diodes. The UCC37321 is found to source 9 A at VDD = 15 V.

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 13


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

Feature Description (continued)

VDD

UCC37321

INPUT 1 VDD VDD 8


DSCHOTTKY
IN OUT
2 7
C2 C3 4.5 V
OUT 1μ F
3 ENBL 6 100 μF DADJ

4 AGND PGND 5
VSNS

RSNS
1μ F 100 μF 0.1 Ω
CER AL EL

UDG-- 01114

Figure 26. Source Current Test Circuit

Note that the current sink capability is slightly stronger than the current source capability at lower VDD. This is
due to the differences in the structure of the bipolar-MOSFET power output section, where the current source is
a P-channel MOSFET and the current sink has an N-channel MOSFET.
In most it is advantageous that the turnoff capability of a driver is stronger than the turnon capability. This helps
to ensure that the MOSFET is held OFF during common power supply transients which may turn the device back
ON.

8.3.4 Enable
The UCC37321/2 provides an enable input for improved control of the driver operation. This input also
incorporates logic compatible thresholds with hysteresis. It is internally pulled up to VDD with 100-kΩ resistor for
active high operation. When ENBL is high, the device is enabled and when ENBL is low, the device is disabled.
The default state of the ENBL pin is to enable the device and therefore it can be left open for standard operation.
The output state when the device is disabled is low regardless of the input state. See Table 1 for the operation
using enable logic.
ENBL input is compatible with both logic signals and slow changing analog signals. It can be directly driven or a
power-up delay can be programmed with a capacitor between ENBL and AGND.

8.4 Device Functional Modes


Table 1 lists the logic of this device.

Table 1. Device Logic Table


ENBL IN OUT
0 0 0
INVERTING 0 1 0
UCC37321 1 0 1
1 1 0
0 0 0
NON-- 0 1 0
INVERTING
UCC37322 1 0 0
1 1 1

14 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

9 Application and Implementation

NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.

9.1 Application Information


High-current gate driver devices are required in switching power applications for a variety of reasons. To enable
fast switching of power devices and reduce associated power losses, a powerful gate driver can be employed
between the PWM output of controllers or signal isolation devices and the gates of the power semiconductor
devices. Further, gate drivers are indispensable when sometimes it is just not feasible to have the PWM
controller directly drive the gates of the switching devices. The situation may be encountered because the PWM
signal from a digital controller or signal isolation device is often a 3.3-V or 5-V logic signal which is not capable of
effectively turning on a power switch. A level-shifting circuitry is needed to boost the logic-level signal to the gate-
drive voltage to fully turn on the power device and minimize conduction losses. Traditional buffer drive circuits
based on NPN/PNP bipolar, (or P- N- channel MOSFET), transistors in totem-pole arrangement, being emitter
follower configurations, prove inadequate for this because they lack level-shifting capability and low-drive voltage
protection. Gate drivers effectively combine both the level-shifting and buffer drive functions. Gate drivers may
also minimize the effect of switching noise by locating the high-current driver physically close to the power
switch, drive gate-driver transformers and control floating power device gates, reducing power dissipation and
thermal stress in controllers by absorbing gate-charge power losses.
In summary gate drivers are extremely important components in switching power combining benefits of high-
performance, low-cost, low component count, board-space reduction, and simplified system design.

9.2 Typical Application

8 VDD 6 Q1
OUT
1 VDD OUT 7
C2 R4
UCC27322D
2 4
IN AGND
INPUT 3 5
ENBL PGND

ENABLE

Figure 27. Typical Application Diagram of UCC27322 and UCC37322

9.2.1 Design Requirements


When selecting the proper gate driver device for an end application, some design considerations must be
evaluated first to make the most appropriate selection. The following design parameters should be used when
selecting the proper gate driver device for an end application: input-to-output configuration, the input threshold
type, bias supply voltage levels, peak source and sink currents, availability of independent enable and disable
functions, propagation delay, power dissipation, and package type. See the example design parameters and
requirements in Table 2.

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 15


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

Table 2. Design Parameters


DESIGN PARAMETER EXAMPLE VALUE
Input-to-output configuration Noninverting
Input threshold type CMOS
Bias supply voltage levels 12 V
dVDS/dt (1) 20 V/ns
Enable function Yes
Propagation delay < 50 ns
Power dissipation < 0.45 W
Package type SOIC (8)

(1) dVDS/dt is a typical requirement for a given design. This value can
be used to find the peak source/sink currents needed as shown in
Peak Source and Sink Currents.

9.2.2 Detailed Design Procedure

9.2.2.1 Input-to-Output Configuration


The design should specify which type of input-to-out configuration should be used. If turning on the power
MOSFET or IGBT when the input signal is in high state is preferred, then a device capable of the noninverting
configuration must be selected. If turning off the power MOSFET or IGBT when the input signal is in high state is
preferred, then a device capable of the inverting configuration must be chosen. Based on this noninverting
requirement of this application, the proper device out of the UCC27322 or UCC37322 should be selected.

9.2.2.2 Input Threshold Type


The type of input voltage threshold determines the type of controller that can be used with the gate driver device.
The UCC2732x and UCC3732x devices feature a TTL and CMOS-compatible input threshold logic, with wide
hysteresis. The threshold voltage levels are low voltage and independent of the VDD supply voltage, which allows
compatibility with both logic-level input signals from microcontrollers as well as higher-voltage input signals from
analog controllers. See Electrical Characteristics for the actual input threshold voltage levels and hysteresis
specifications for the UCC2732x and UCC3732x devices.

9.2.2.3 VDD Bias Supply Voltage


The bias supply voltage to be applied to the VDD pins of the device must never exceed the values listed in
Recommended Operating Conditions. However, different power switches require different voltage levels to be
applied at the gate. With a wide operating range from 4.5 V to 15 V, the UCC2732x and UCC3732x can be used
to drive a variety of power switches, such as Si MOSFETs (for example, Vgs = 4.5 V, 10 V, 12 V), IGBTs
(VGE=15 V), and wide-bandgap power semiconductors (such as GaN, certain types of which allow no higher than
6 V to be applied to the gate terminals).

9.2.2.4 Peak Source and Sink Currents


Generally, the switching speed of the power switch during turnon and turnoff must be as fast as possible to
minimize switching power losses. The gate driver device must be able to provide the required peak current for
achieving the targeted switching speeds for the targeted power MOSFET.
Using the example of a power MOSFET, the system requirement for the switching speed is typically described in
terms of the slew rate of the drain-to-source voltage of the power MOSFET (such as dvDS/dt). For example, the
system requirement might state that a SPP20N60C3 power MOSFET must be turned on with a Dvds/dt of 20
V/ns or higher under a DC bus voltage of 400 V in a continuous-conduction-mode (CCM) boost PFC-converter
application. This type of application is an inductive hard-switching application and reducing switching power loss
is critical. This requirement means that the entire drain-to-source voltage swing during power MOSFET turnon
event (from 400 V in the OFF state to VDS(on) in ON state) must be completed in approximately 20 ns or less.
When the drain-to-source voltage swing occurs, the Miller charge of the power MOSFET (Qgd parameter in
SPP20N60C3 power MOSFET data sheet is 33 nC typically) is supplied by the peak current of gate driver.
According to power MOSFET inductive switching mechanism, the gate-to-source voltage of the power MOSFET
at this time is the Miller plateau voltage, which is typically a few volts higher than the threshold voltage of the
power MOSFET, VGS(th)).

16 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

To achieve the targeted Dvds/dt, the gate driver must be capable of providing the Qgd charge in 20 ns or less. In
other words, a peak current of 1.65 A (= 33 nC) / 20 ns) or higher must be provided by the gate driver. The
UCC2732x and UCC3732x devices can provide 9-A peak sourcing/sinking current which clearly exceeds the
design requirement and has the capability to meet the switching speed needed. This 9-A peak sourcing/sinking
current provides an extra margin against part-to-part variations in the Qgd parameter of the power MOSFET along
with additional flexibility to insert external gate resistors and fine tune the switching speed for efficiency versus
EMI optimizations. However, in practical designs the parasitic trace in the gate driver circuit of the PCB will have
a definitive role to play on the power MOSFET switching speed. The effort of this trace inductance is to limit the
di/dt of the output current pulse of the gate driver. To illustrate this effect, consider output current pulse waveform
from the gate driver to be approximated to a triangular profile, where the area under the triangle (0.5 × IPEAK ×
time) would equal the total gate charge of the power MOSFET (Qg parameter in SPP20N60C3 power MOSFET
data sheet= 87 nC typically). If the parasitic trace inductance limits the di/dt then a situation may occur in which
the full peak current capability of the gate driver is not fully achieved in the time required to deliver the Qg
required for the power MOSFET switching. In other words, the time parameter in the equation would dominate
and the IPEAK value of the current pulse would be much less than the true peak current capability of the device,
while the required Qg is still delivered. Because of this, the desired switching speed may not be realized, even
when theoretical calculations indicate the gate driver can achieve the targeted witching speed. Thus, placing the
gate driver device very close to the power MOSFET and designing a tight gate drive-loop with minimal PCB trace
inductance is important to realize the full peak-current capability of the gate driver.

9.2.2.5 Enable and Disable Function


Certain applications demand independent control of the output state of the driver without involving the input
signal. A pin which offers enable and disable functions achieves the requirements. For these applications, the
UCC2732x and UCC3732x are suitable as they feature an input pin and an Enable pin.

9.2.2.6 Propagation Delay


The acceptable propagation delay from the gate driver is dependent on the switching frequency at which it is
used and the acceptable level of pulse distortion to the system. The UCC2732x and UCC3732x devices feature
25-ns turnon propagation delay and 35-ns turnoff propagation delay (typical), which ensure very little distortion
and allow operation at higher frequencies. See Electrical Characteristics for the propagation and Switching
Characteristics of the UCC2732x and UCC3732x devices.

9.2.2.7 Power Dissipation


The UCC3732x family of drivers are capable of delivering 9-A of current to a MOSFET gate for a period of
several hundred nanoseconds. High peak current is required to turn an N-channel device ON quickly. Then, to
turn the device OFF, the driver is required to sink a similar amount of current to ground. This repeats at the
operating frequency of the power device. An N-channel MOSFET is used in this discussion because it is the
most common type of switching device used in high-frequency power conversion equipment.
References (1) and (2) contain detailed discussions of the drive current required to drive a power MOSFET and
other capacitive-input switching devices. Much information is provided in tabular form to give a range of the
current required for various devices at various frequencies. The information pertinent to calculating gate drive
current requirements will be summarized here; the original document is available from the TI website.
When a driver device is tested with a discrete, capacitive load it is a fairly simple matter to calculate the power
that is required from the bias supply. The energy that must be transferred from the bias supply to charge the
capacitor is given by Equation 1.
1
E = CV2
2
where
• C is the load capacitor
• V is the bias voltage feeding the driver (1)

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 17


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

There is an equal amount of energy transferred to ground when the capacitor is discharged. This leads to a
power loss given by Equation 2.
1
P = 2 ´ CV2f
2
where
• f is the switching frequency (2)
This power is dissipated in the resistive elements of the circuit. Thus, with no external resistor between the driver
and gate, this power is dissipated inside the driver. Half of the total power is dissipated when the capacitor is
charged, and the other half is dissipated when the capacitor is discharged. An example using the conditions of
the previous gate-drive waveform should help clarify this.
With VDD = 12 V, CLOAD = 10 nF, and f = 300 kHz, the power loss can be calculated as shown in Equation 4.
P = 10 nF × (12)2 × (300 kHz) = 0.432 W (3)
With a 12-V supply, this would equate, as shown in Equation 4, to a current of:
P 0.432 W
I= = = 0.036A
V 12 V (4)
The switching load presented by a power MOSFETcan be converted to an equivalent capacitance by examining
the gate charge required to switch the device. This gate charge includes the effects of the input capacitance plus
the added charge needed to swing the drain of the device between the ON and OFF states. Most manufacturers
provide specifications that provide the typical and maximum gate charge, in nC, to switch the device under
specified conditions. Using the gate charge Qg, one can determine the power that must be dissipated when
charging a capacitor. This is done by using the equivalence Qg = CeffV to provide Equation 5 for power.
P = C × V2 × f = Qg × V × f (5)
Equation 5 allows a power designer to calculate the bias power required to drive a specific MOSFET gate at a
specific bias voltage.

9.2.3 Application Curves

IN = VDD IN = VDD
ENBL = VDD ENBL = VDD
VDD – Input Voltage – V

VDD – Input Voltage – V


1 V/div

1 V/div

VDD
VDD

OUT OUT
0V 0V

10 nF Between Output and GND 10 nF Between Output and GND


50 μs/div 50 μs/div

Figure 28. Output Behavior vs VDD (UCC37322) Figure 29. Output Behavior vs VDD (UCC37322)

18 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

10 Power Supply Recommendations


Although quiescent VDD current is very low, total supply current is higher, depending on OUTA and OUTB
current and the operating frequency. Total VDD current is the sum of quiescent VDD current and the average
OUT current. Knowing the operating frequency and the MOSFET gate charge (Qg), average OUT current can be
calculated using Equation 6.
IOUT = Qg × f
where
• f is frequency (6)
For the best high-speed circuit performance, TI recommends two VDD bypass capacitors to prevent noise
problems. TI also highly recommends using surface mount components. A 0.1-µF ceramic capacitor must be
placed closest to the VDD to ground connection. In addition, a larger capacitor (such as 1 µF) with relatively low
ESR should be connected in parallel to help deliver the high current peaks to the load. The parallel combination
of capacitors presents a low impedance characteristic for the expected current levels in the driver application.

11 Layout

11.1 Layout Guidelines


It can be a significant challenge to avoid the overshoot, undershoot, and ringing issues that can arise from circuit
layout. The low impedance of these drivers and their high di/dt can induce ringing between parasitic inductances
and capacitances in the circuit. Utmost care must be used in the circuit layout.
In general, position the driver physically as close to its load as possible. Place a 1-µF bypass capacitor as close
to the output side of the driver as possible, connecting it to pins 1 and 8. Connect a single trace between the two
VDD pins (pin 1 and pin 8); connect a single trace between PGND and AGND (pin 5 and pin 4). If a ground
plane is used, it may be connected to AGND; do not extend the plane beneath the output side of the package
(pins 5 – 8). Connect the load to both OUT pins (pins 7 and 6) with a single trace on the adjacent layer to the
component layer; route the return current path for the output on the component side, directly over the output
path.
Extreme conditions may require decoupling the input power and ground connections from the output power and
ground connections. The UCCx732x has a feature that allows the user to take these extreme measures, if
necessary. There is a small amount of internal impedance of about 15 Ω between the AGND and PGND pins;
there is also a small amount of impedance (approximately 30 Ω) between the two VDD pins. To take advantage
of this feature, connect a 1-µF bypass capacitor between VDD and PGND (pins 5 and 8) and connect a 0.1-µF
bypass capacitor between VDD and AGND (pins 1 and 4). Further decoupling can be achieved by connecting
between the two VDD pins with a jumper that passes through a 40-MHz ferrite bead and connect bias power only
to pin 8. Even more decoupling can be achieved by connecting between AGND and PGND with a pair of anti-
parallel diodes (anode connected to cathode and cathode connected to anode).

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 19


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

11.2 Layout Example

Figure 30. Layout Recommendation

11.3 Thermal Information


The useful range of a driver is greatly affected by the drive power requirements of the load and the thermal
characteristics of the device package. For a power driver to be useful over a particular temperature range the
package must allow for the efficient removal of the heat produced while keeping the junction temperature within
rated limits. The UCC3732x family of drivers is available in three different packages to cover a range of
application requirements.
As shown in the power dissipation rating table, the 8-pin SOIC (D) and 8-pin PDIP (P) packages each have a
power rating of around 0.5 W with TA = 70°C. This limit is imposed in conjunction with the power derating factor
also given in the table. The power dissipation in our earlier example is 0.432 W with a 10-nF load, 12 VDD,
switched at 300 kHz. Thus, only one load of this size could be driven using the D or P package. The difficulties
with heat removal limit the drive available in the D or P packages.
The 8-pin MSOP PowerPAD (DGN) package significantly relieves this concern by offering an effective means of
removing the heat from the semiconductor junction. As illustrated in Reference (3), the PowerPAD packages
offer a leadframe die pad that is exposed at the base of the package. This pad is soldered to the copper on the
PC board directly underneath the device package, reducing the θjc down to 4.7°C/W. Data is presented in
Reference (3) to show that the power dissipation can be quadrupled in the PowerPAD configuration when
compared to the standard packages. The PC board must be designed with thermal lands and thermal vias to
complete the heat removal subsystem, as summarized in Reference (4) .This allows a significant improvement in
heatsinking over that available in theDor P packages, and is shown to more than double the power capability of
the D and P packages.
The PowerPAD is not directly connected to any leads of the package. However, it is electrically and thermally
connected to the substrate which is the ground of the device.

20 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


UCC27321, UCC27322
UCC37321, UCC37322
www.ti.com SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016

12 Device and Documentation Support

12.1 Device Support


12.1.1 Related Products

PRODUCT DESCRIPTION PACKAGES


UCC37323/4/5 Dual 4-A Low-Side Drivers MSOP–8 PowerPAD, SOIC–8, PDIP–8
UCC27423/4/5 Dual 4-A Low-Side Drivers with Enable MSOP–8 PowerPAD, SOIC–8, PDIP–8
TPS2811/12/13 Dual 2-A Low-Side Drivers with Internal Regulator TSSOP–8, SOIC–8, PDIP–8
TPS2814/15 Dual 2-A Low-Side Drivers with Two Inputs per Channel TSSOP–8, SOIC–8, PDIP–8
TPS2816/17/18/19 Single 2-A Low-Side Driver with Internal Regulator 5-Pin SOT–23
TPS2828/29 Single 2-A Low-Side Driver 5-Pin SOT–23

12.2 Documentation Support


12.2.1 Related Documentation
For related documentation see the following:
(1) SEM-1400, Topic 2, A Design and Application Guide for High Speed Power MOSFET Gate Drive Circuits
(2) U-137, Practical Considerations in High PerformanceMOSFET, IGBT andMCTGateDrive Circuits, by Bill Andreycak (SLUA105)
(3) Technical Brief, PowerPad Thermally Enhanced Package (SLMA002)
(4) Application Brief, PowerPAD Made Easy (SLMA004)
(5) Data Book, Power Supply Control Products, (SLUD003)

12.3 Related Links


The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.

Table 3. Related Links


TECHNICAL TOOLS & SUPPORT &
PARTS PRODUCT FOLDER SAMPLE & BUY
DOCUMENTS SOFTWARE COMMUNITY
UCC27321 Click here Click here Click here Click here Click here
UCC27322 Click here Click here Click here Click here Click here
UCC37321 Click here Click here Click here Click here Click here
UCC37322 Click here Click here Click here Click here Click here

12.4 Community Resources


The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.

12.5 Trademarks
PowerPAD, E2E are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.

Copyright © 2002–2016, Texas Instruments Incorporated Submit Documentation Feedback 21


UCC27321, UCC27322
UCC37321, UCC37322
SLUS504H – SEPTEMBER 2002 – REVISED JANUARY 2016 www.ti.com

12.6 Electrostatic Discharge Caution


These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.

12.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.

13 Mechanical, Packaging, and Orderable Information


The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

22 Submit Documentation Feedback Copyright © 2002–2016, Texas Instruments Incorporated


PACKAGE OPTION ADDENDUM

www.ti.com 6-Feb-2020

PACKAGING INFORMATION

Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)

UCC27321D ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321DGN ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321DGNR ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321DR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27321
& no Sb/Br)
UCC27321P ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27321P
(RoHS)
UCC27321PE4 ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27321P
(RoHS)
UCC27322D ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DGN ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DGNR ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322DRG4 ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM -40 to 105 27322
& no Sb/Br)
UCC27322P ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27322P
(RoHS)
UCC27322PE4 ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type -40 to 105 UCC27322P
(RoHS)
UCC37321D ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)
UCC37321DGN ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)
UCC37321DGNR ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)
UCC37321DR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37321
& no Sb/Br)

Addendum-Page 1
PACKAGE OPTION ADDENDUM

www.ti.com 6-Feb-2020

Orderable Device Status Package Type Package Pins Package Eco Plan Lead/Ball Finish MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) (6) (3) (4/5)

UCC37321P ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type 0 to 70 UCC37321P


(RoHS)
UCC37321PE4 ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type 0 to 70 UCC37321P
(RoHS)
UCC37322D ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322DG4 ACTIVE SOIC D 8 75 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322DGN ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322DGNG4 ACTIVE HVSSOP DGN 8 80 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322DGNR ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322DGNRG4 ACTIVE HVSSOP DGN 8 2500 Green (RoHS NIPDAUAG Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322DR ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322DRG4 ACTIVE SOIC D 8 2500 Green (RoHS NIPDAU Level-1-260C-UNLIM 0 to 70 37322
& no Sb/Br)
UCC37322P ACTIVE PDIP P 8 50 Pb-Free NIPDAU N / A for Pkg Type 0 to 70 UCC37322P
(RoHS)

(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.

(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.

(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

Addendum-Page 2
PACKAGE OPTION ADDENDUM

www.ti.com 6-Feb-2020

(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.

(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

OTHER QUALIFIED VERSIONS OF UCC27321, UCC27322 :

• Automotive: UCC27321-Q1, UCC27322-Q1


• Enhanced Product: UCC27322-EP

NOTE: Qualified Version Definitions:

• Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
• Enhanced Product - Supports Defense, Aerospace and Medical Applications

Addendum-Page 3
PACKAGE MATERIALS INFORMATION

www.ti.com 6-Sep-2019

TAPE AND REEL INFORMATION

*All dimensions are nominal


Device Package Package Pins SPQ Reel Reel A0 B0 K0 P1 W Pin1
Type Drawing Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
UCC27321DGNR HVSSOP DGN 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
UCC27321DR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
UCC27322DGNR HVSSOP DGN 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
UCC27322DR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
UCC37321DGNR HVSSOP DGN 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
UCC37321DR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1
UCC37322DGNR HVSSOP DGN 8 2500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
UCC37322DR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1

Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION

www.ti.com 6-Sep-2019

*All dimensions are nominal


Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
UCC27321DGNR HVSSOP DGN 8 2500 364.0 364.0 27.0
UCC27321DR SOIC D 8 2500 367.0 367.0 35.0
UCC27322DGNR HVSSOP DGN 8 2500 364.0 364.0 27.0
UCC27322DR SOIC D 8 2500 367.0 367.0 35.0
UCC37321DGNR HVSSOP DGN 8 2500 364.0 364.0 27.0
UCC37321DR SOIC D 8 2500 367.0 367.0 35.0
UCC37322DGNR HVSSOP DGN 8 2500 364.0 364.0 27.0
UCC37322DR SOIC D 8 2500 367.0 367.0 35.0

Pack Materials-Page 2
PACKAGE OUTLINE
D0008A SCALE 2.800
SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT

SEATING PLANE
.228-.244 TYP
[5.80-6.19]
.004 [0.1] C
A PIN 1 ID AREA
6X .050
[1.27]
8
1

.189-.197 2X
[4.81-5.00] .150
NOTE 3 [3.81]

4X (0 -15 )

4
5
8X .012-.020
B .150-.157 [0.31-0.51]
.069 MAX
[3.81-3.98] .010 [0.25] C A B [1.75]
NOTE 4

.005-.010 TYP
[0.13-0.25]

4X (0 -15 )

SEE DETAIL A
.010
[0.25]

.004-.010
0 -8 [0.11-0.25]
.016-.050
[0.41-1.27] DETAIL A
(.041) TYPICAL
[1.04]

4214825/C 02/2019

NOTES:

1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed .006 [0.15] per side.
4. This dimension does not include interlead flash.
5. Reference JEDEC registration MS-012, variation AA.

www.ti.com
EXAMPLE BOARD LAYOUT
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT

8X (.061 )
[1.55]
SYMM SEE
DETAILS
1
8

8X (.024)
[0.6] SYMM

(R.002 ) TYP
[0.05]
5
4
6X (.050 )
[1.27]
(.213)
[5.4]

LAND PATTERN EXAMPLE


EXPOSED METAL SHOWN
SCALE:8X

SOLDER MASK SOLDER MASK


METAL METAL UNDER
OPENING OPENING SOLDER MASK

EXPOSED
METAL EXPOSED
METAL
.0028 MAX .0028 MIN
[0.07] [0.07]
ALL AROUND ALL AROUND

NON SOLDER MASK SOLDER MASK


DEFINED DEFINED

SOLDER MASK DETAILS

4214825/C 02/2019

NOTES: (continued)

6. Publication IPC-7351 may have alternate designs.


7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.

www.ti.com
EXAMPLE STENCIL DESIGN
D0008A SOIC - 1.75 mm max height
SMALL OUTLINE INTEGRATED CIRCUIT

8X (.061 )
[1.55] SYMM

1
8

8X (.024)
[0.6] SYMM

(R.002 ) TYP
5 [0.05]
4
6X (.050 )
[1.27]
(.213)
[5.4]

SOLDER PASTE EXAMPLE


BASED ON .005 INCH [0.125 MM] THICK STENCIL
SCALE:8X

4214825/C 02/2019

NOTES: (continued)

8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.

www.ti.com
PACKAGE OUTLINE
TM
DGN0008G SCALE 4.000
PowerPAD VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE

C
5.05
A TYP
4.75 0.1 C
PIN 1 INDEX AREA SEATING
PLANE
6X 0.65
8
1

2X
3.1
1.95
2.9
NOTE 3

4
5 0.38
8X
0.25
3.1 0.13 C A B
B
2.9
NOTE 4

0.23
0.13

SEE DETAIL A

EXPOSED THERMAL PAD

4
5

0.25
GAGE PLANE
2.15
1.95 9 1.1 MAX

8
1 0.7 0.15
0 -8 0.4 0.05
DETAIL A
A 20

1.846
TYPICAL
1.646

4225480/A 11/2019
PowerPAD is a trademark of Texas Instruments.
NOTES:

1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-187.

www.ti.com
EXAMPLE BOARD LAYOUT
TM
DGN0008G PowerPAD VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE

(2)
NOTE 9
METAL COVERED
BY SOLDER MASK (1.846)
SYMM SOLDER MASK
DEFINED PAD
8X (1.4) (R0.05) TYP

8
8X (0.45) 1

(3)
9 SYMM NOTE 9

(2.15)
6X (0.65) (1.22)
5
4

( 0.2) TYP
VIA (0.55) SEE DETAILS

(4.4)

LAND PATTERN EXAMPLE


EXPOSED METAL SHOWN
SCALE: 15X

SOLDER MASK METAL UNDER SOLDER MASK


METAL
OPENING SOLDER MASK OPENING

EXPOSED METAL EXPOSED METAL

0.05 MAX 0.05 MIN


ALL AROUND ALL AROUND

NON-SOLDER MASK SOLDER MASK


DEFINED DEFINED
(PREFERRED)
SOLDER MASK DETAILS
15.000

4225480/A 11/2019
NOTES: (continued)

6. Publication IPC-7351 may have alternate designs.


7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
8. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
9. Size of metal pad may vary due to creepage requirement.

www.ti.com
EXAMPLE STENCIL DESIGN
TM
DGN0008G PowerPAD VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE

(1.846)
BASED ON
0.125 THICK
STENCIL
SYMM

8X (1.4) (R0.05) TYP

8
8X (0.45) 1

(2.15)
SYMM BASED ON
0.125 THICK
STENCIL

6X (0.65)

4 5

METAL COVERED SEE TABLE FOR


BY SOLDER MASK DIFFERENT OPENINGS
(4.4) FOR OTHER STENCIL
THICKNESSES

SOLDER PASTE EXAMPLE


EXPOSED PAD 9:
100% PRINTED SOLDER COVERAGE BY AREA
SCALE: 15X

STENCIL SOLDER STENCIL


THICKNESS OPENING
0.1 2.06 X 2.40
0.125 1.846 X 2.15 (SHOWN)
0.15 1.69 X 1.96
0.175 1.56 X 1.82

4225480/A 11/2019
NOTES: (continued)

10. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
11. Board assembly site may have different recommendations for stencil design.

www.ti.com
IMPORTANT NOTICE AND DISCLAIMER

TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD
PARTY INTELLECTUAL PROPERTY RIGHTS.
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable
standards, and any other safety, security, or other requirements. These resources are subject to change without notice. TI grants you
permission to use these resources only for development of an application that uses the TI products described in the resource. Other
reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third
party intellectual property right. TI disclaims responsibility for, and you will fully indemnify TI and its representatives against, any claims,
damages, costs, losses, and liabilities arising out of your use of these resources.
TI’s products are provided subject to TI’s Terms of Sale (www.ti.com/legal/termsofsale.html) or other applicable terms available either on
ti.com or provided in conjunction with such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s applicable
warranties or warranty disclaimers for TI products.

Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2020, Texas Instruments Incorporated

You might also like