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Assignment1 Extended

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ADCMOS

Unit-1

1. Compare nMOS and pMOS transistor.


2. List the effect of body bias voltage.
3. Draw the DC transfer characteristics of CMOS inverter.
4. What are the different operating modes of transistor?
5. Write the threshold voltage equation for nMOS and for pMOS transistor?
6. Define body effect and write the threshold equation including the body effect.
7. Determine whether an nMOS transistor with a threshold voltage of 0.7v is operating in the
saturation region if GSV=2v and DSV=3v.
8. Summarize the equation for describing the channel length modulation effect in nMOS
transistor.
9. Why the tunneling current is higher for nMOS transistors than pMOS transistors with silica
gate?
10. Explain in detail about the
i)ideal I-V characteristics of nMOS and pMOS devices
ii) non-ideal I-V characteristics of nMOS and pMOS devices.
11. Illustrate with necessary diagrams the i) CV characteristics of CMOS
12. )Derive the drain current of MOS device in different operating regions
13. Describe in detail about second order effects in MOS transistor
14. Briefly discuss about the CMOS process enhancement and layout design rules
15. )An nMOS transistor has the following parameters: gate oxide thickness=10nm, relative
permittivity of gate oxide =3.9, electron mobility=520cm2/v-sec , threshold voltage=0.7v,
permittivity of free space=8.85x10-14F/cm and W/L=8. Calculate the drain current when
VGS=2v and VDS=1.2v and VGS=2v and VDS=2v and also compute the gate oxide capacitance
per unit area. Note that W and L refer to the width and length of the channel respectively.
16. An nMOS transistor has a nominal threshold voltage of 0.16v. Determine the shift in
threshold voltage caused by body effect using the following data. The nMOS transistor is
operating at a temperature of 300oK with the following parameters: gate oxide
thicknesstox=0.2x10-6cm, relative permittivity of gate oxide ε ox=3.9, relative permittivity of
silicon ε si=11.7, substrate bias voltage =2.5v, intrinsic electron concentration Ni=1.5 x 1010
cm3, impurity concentration in substrate NA=3 x 1016 cm3. Given Boltzman’s constant
=1.38x10-23J/oK, electron charge =1.6x10-19 coulomb and permittivity of free space
=8.85x10-14F/cm.
17. What are the sources of power dissipation. List the methods to reduce dynamic power
dissipation.
18. Derive the expression for dynamic power dissipation for the CMOS Inverter. If load
capacitance increases, What will happen to CMOS power dissipation?
19. Describethe lambda based design rules used for layout.
20. What is stick diagram? Sketch the stick diagram for 2 input NAND gate.
21. (i)Explain layout design rules in detail with necessary diagrams

(ii)Draw the stick diagram and layout of inverter, NAND and NOR gates

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