TVL ST23 04 Ad0
TVL ST23 04 Ad0
TVL ST23 04 Ad0
1. Scope
TVL ST23 04 AD0’s are TVS arrays designed to protect high-speed signal lines from
overvoltage hazard of Electrostatic Discharge (ESD), Electrical Fast Transients (EFT) and
Lightning. These interfaces can be used in USB2.0 power and data lines, notebook and
personal computers, monitors and flat panel displays, IEEE 1394 Firewire Ports, etc.
TVL ST23 04 AD0 incorporates a pair of rail-to-rail diodes with low capacitance for each
of four I/O channels. Additional Zener diode is employed to minimize the influence of supply
voltage. The ESD protection of TVS arrays meets the immunity standard of IEC 61000-4-2,
level 4 (±15kV air, ±8kV contact discharge).
TV L ST23 04 AD0
(1) (2) (3) (4) (5)
6 5 4
1 3 4 6
2 1 2 3
I/O 1 GND I/O 2
Dimensions
Index Millimeter Inches
A 0.60 0.024
B 1.10 0.043
C 0.95 0.037
D 2.50 0.098
E 1.40 0.055
F 3.60 0.141
Notes:This LAND LAYOUT is for reference purposes only. Please consult your manufacturing partners to
ensure your company’s PCB design guidelines are met.
6. Application information
The ESD protection scheme for system I/O connector is shown in the Fig. 1. In Fig. 1, the diodes D1
and D2 are general used to protect data line from ESD stress pulse. If the power-rail ESD clamping circuit
is not placed between VDD and GND rails, the positive pulse ESD current (IESD1) will pass through the
ESD current path1. Thus, the ESD clamping voltage VCL of data line can be described as follow:
VCL = Fwd voltage drop of D1 + supply voltage of VDD rail + L1 × d(IESD1)/dt + L2 × d(IESD1)/dt
Where L1 is the parasitic inductance of data line, and L2 is the parasitic inductance of VDD rail. An
ESD current pulse can rise from zero to its peak value in a very short time. As an example, a level 4
contact discharge per the IEC61000-4-2 standard results in a current pulse that rises from zero to 30A in
1ns. Here d(IESD1)/dt can be approximated by ΔIESD1/Δt, or 30/(1x10-9). So just 10nH of total parasitic
inductance (L1 and L2 combined) will lead to over 300V increment in VCL! Besides, the ESD pulse current
which is directed into the VDD rail may potentially damage any components that are attached to that rail.
Moreover, it is common for the forward voltage drop of discrete diodes to exceed the damage threshold of
the protected IC. This is due to the relatively small junction area of typical discrete components. Of course,
the discrete diode is also possible to be destroyed due to its power dissipation capability is exceeded.
The TVL ST23 04 AD0 has an integrated power-rail ESD clamped circuit between VDD and GND
rails. It can successfully overcome previous disadvantages. During an ESD event, the positive ESD pulse
current (IESD2) will be directed through the integrated power-rail ESD clamped circuit to GND rail (ESD
current path2). The clamping voltage VCL on the data line is small and
protected IC will not be damaged because power-rail ESD clamped circuit offer a low impedance
path to discharge ESD pulse current.
7. MARKING CODE
Marking Code: C96X
Milimeters
Symbol
MIN. MAX.
A 0.95 1.45
A1 0.01 0.15
A2 0.90 1.30
b 0.30 0.50
C 0.08 0.25
D 2.67 3.17
E 1.35 1.85
E1 2.55 3.05
e 0.95BSC
e1 1.70 2.10
L1 0.30 0.60
L 0.70REF
SIDE VIEW L2 0.25BSC
θ 0 8
END VIEW