Lecture 12 RT
Lecture 12 RT
Lecture 12 RT
NON DESTRUCTIVE
TEST - NDT
RADIOGRAPHIC
TESTING (RT)
LEVEL II
LECTURE 12
Address : 24 El-Gahez St., Haey Sabeaa, Nasr City, Cairo, Egypt
Phone : +20 01012000780- +20 01012000760
Fax : 02-23877325
Website : www.kit-egy.com
Email : info@kit-egy.com
2
Contents
▪ Film Sensitivity
▪ Contrast Factors
▪ Definition factors
3
Film Sensitivity
Sensitivity and Scatter 4
A) Contrast B) Definition
Film It
X-ray =1.8
➢ Minimum density for and the maximum for both= 4
Gamma ray = 2 with -15% or +30%
(SSD)
(SSD)
Note : This distance from the source to front surface of the object
➢ Film to specimen distance 13
Note : This distance from the front surface of the object to the film.
✓ Optimum geometric unsharpness is obtained when: 14
1) The radiation source is small.
2) The distance from the source to specimen is relatively great.
3) The distance from the specimen to film is small.
Where:
S = Source size
T = The thickness of
the specimen
SSD = Source to specimen
distance
❑ Gamma Ray Exposure Ruler:
15
16
Material
Group
Number Wires
2 T hole
1 T hole
4 T hole
Identification
Number
Image Quality (cont.) 26
❑ Quality typically being determined based on the smallest
hole or wire diameter that is reproduced on the image.
Where:
: Specimen thickness
: Penetrameter thickness
❑ ASME & ASTM of Wire IQIs have Set Identification and each
set represents different diameters of wires mounted next to
one another.